{"id":"https://openalex.org/W2009282987","doi":"https://doi.org/10.1007/s10836-007-0759-5","title":"IEEE Standard 1500 Compatible Oscillation Ring Test Methodology for Interconnect Delay and Crosstalk Detection","display_name":"IEEE Standard 1500 Compatible Oscillation Ring Test Methodology for Interconnect Delay and Crosstalk Detection","publication_year":2007,"publication_date":"2007-06-05","ids":{"openalex":"https://openalex.org/W2009282987","doi":"https://doi.org/10.1007/s10836-007-0759-5","mag":"2009282987"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-007-0759-5","doi":"https://doi.org/10.1007/s10836-007-0759-5","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-007-0759-5","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5021549162","display_name":"Katherine Shu-Min Li","orcid":"https://orcid.org/0000-0002-9942-5185","observed_orcids":["https://orcid.org/0000-0002-9942-5185"]},"institutions":[{"id":"https://openalex.org/I142974352","display_name":"National Sun Yat-sen University","ror":"https://ror.org/00mjawt10","country_code":"TW","type":"education","lineage":["https://openalex.org/I142974352"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Katherine Shu-Min Li","raw_affiliation_strings":["Department of Computer Science and Engineering, National Sun Yat-Sen University, Kaohsiung, Taiwan, Republic of China","Department of Computer Science and Engineering, National Sun Yat-sen University, Kaohsiung, Republic of China#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering, National Sun Yat-Sen University, Kaohsiung, Taiwan, Republic of China","institution_ids":["https://openalex.org/I142974352"]},{"raw_affiliation_string":"Department of Computer Science and Engineering, National Sun Yat-sen University, Kaohsiung, Republic of China#TAB#","institution_ids":["https://openalex.org/I142974352"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004690730","display_name":"Chung-Len Lee","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chung-Len Lee","raw_affiliation_strings":["Department of Electronics Engineering, National Chiao Tung University, Hsinchu, Taiwan, People\u2019s Republic of China","Department of Electronics Engineering, National Chiao Tung University, Hsinchu, People's Republic of China#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering, National Chiao Tung University, Hsinchu, Taiwan, People\u2019s Republic of China","institution_ids":["https://openalex.org/I148366613"]},{"raw_affiliation_string":"Department of Electronics Engineering, National Chiao Tung University, Hsinchu, People's Republic of China#TAB#","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110221070","display_name":"Chauchin Su","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chauchin Su","raw_affiliation_strings":["Department of Electronic Control, National Chiao Tung University, Hsinchu, Taiwan, People\u2019s Republic of China","Department of Electronic Control, National Chiao Tung University, Hsinchu, People's Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic Control, National Chiao Tung University, Hsinchu, Taiwan, People\u2019s Republic of China","institution_ids":["https://openalex.org/I148366613"]},{"raw_affiliation_string":"Department of Electronic Control, National Chiao Tung University, Hsinchu, People's Republic of China","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5064869482","display_name":"Jwu-E Chen","orcid":"https://orcid.org/0000-0002-7806-013X","observed_orcids":["https://orcid.org/0000-0002-7806-013X"]},"institutions":[{"id":"https://openalex.org/I22265921","display_name":"National Central University","ror":"https://ror.org/00944ve71","country_code":"TW","type":"education","lineage":["https://openalex.org/I22265921"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Jwu E Chen","raw_affiliation_strings":["Department of Electrical Engineering, National Central University, Chungli, Taiwan, People\u2019s Republic of China","Department of Electrical Engineering, National Central University, Chungli, People\u2019s Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Central University, Chungli, Taiwan, People\u2019s Republic of China","institution_ids":["https://openalex.org/I22265921"]},{"raw_affiliation_string":"Department of Electrical Engineering, National Central University, Chungli, People\u2019s Republic of China","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5021549162"],"corresponding_institution_ids":["https://openalex.org/I142974352"],"apc_list":{"value":3290,"currency":"USD","value_usd":3290},"apc_paid":null,"fwci":1.96,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":{"value":0.8950111,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"23","issue":"4","first_page":"341","last_page":"355"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/interconnect-testing","display_name":"interconnect testing","score":0.7850000262260437},{"id":"https://openalex.org/keywords/delay-faults","display_name":"delay faults","score":0.6079999804496765},{"id":"https://openalex.org/keywords/stuck-at-faults","display_name":"stuck-at faults","score":0.6959999799728394},{"id":"https://openalex.org/keywords/open-faults","display_name":"open faults","score":0.9700000286102295},{"id":"https://openalex.org/keywords/system-on-chip","display_name":"system-on-chip","score":0.722000002861023},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"fault coverage","score":0.6779999732971191}],"concepts":[{"id":"https://openalex.org/C123745756","wikidata":"https://www.wikidata.org/wiki/Q1665949","display_name":"Interconnection","level":2,"score":0.6760295033454895},{"id":"https://openalex.org/C169822122","wikidata":"https://www.wikidata.org/wiki/Q230187","display_name":"Crosstalk","level":2,"score":0.6646950244903564},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5971158742904663},{"id":"https://openalex.org/C2778439541","wikidata":"https://www.wikidata.org/wiki/Q7106412","display_name":"Oscillation (cell signaling)","level":2,"score":0.4644598662853241},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4500867426395416},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3943920433521271},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3781636953353882},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.16566020250320435},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.05219137668609619},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-007-0759-5","doi":"https://doi.org/10.1007/s10836-007-0759-5","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-007-0759-5","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"sustainable_development_goals_aurora":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":34,"referenced_works":["https://openalex.org/W1487165447","https://openalex.org/W1501987125","https://openalex.org/W1511158165","https://openalex.org/W1573161323","https://openalex.org/W1583788531","https://openalex.org/W1862469596","https://openalex.org/W1930731203","https://openalex.org/W1979477906","https://openalex.org/W2006097283","https://openalex.org/W2013560002","https://openalex.org/W2040265583","https://openalex.org/W2049458920","https://openalex.org/W2077251002","https://openalex.org/W2097811636","https://openalex.org/W2100158488","https://openalex.org/W2104500469","https://openalex.org/W2106746132","https://openalex.org/W2111670167","https://openalex.org/W2117040048","https://openalex.org/W2121626067","https://openalex.org/W2141968733","https://openalex.org/W2145884136","https://openalex.org/W2149966432","https://openalex.org/W2150667030","https://openalex.org/W2151465592","https://openalex.org/W2151937515","https://openalex.org/W2152439077","https://openalex.org/W2153309090","https://openalex.org/W2153593246","https://openalex.org/W2162281676","https://openalex.org/W2399801569","https://openalex.org/W4235073116","https://openalex.org/W4285719527","https://openalex.org/W6605234255"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2622826586","https://openalex.org/W2167472940","https://openalex.org/W2155019192","https://openalex.org/W2014709025","https://openalex.org/W4280525841","https://openalex.org/W2560789951","https://openalex.org/W2492758367","https://openalex.org/W4249035840","https://openalex.org/W1551902604"],"abstract_inverted_index":null,"counts_by_year":[{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":4}],"updated_date":"2026-09-26T08:19:03.415552","created_date":"2025-10-10T00:00:00"}