{"id":"https://openalex.org/W2008936216","doi":"https://doi.org/10.1016/j.optlaseng.2012.07.018","title":"Measuring the refractive index of transparent materials using high precision circular heterodyne interferometry","display_name":"Measuring the refractive index of transparent materials using high precision circular heterodyne interferometry","publication_year":2012,"publication_date":"2012-08-11","ids":{"openalex":"https://openalex.org/W2008936216","doi":"https://doi.org/10.1016/j.optlaseng.2012.07.018","mag":"2008936216"},"language":"en","primary_location":{"id":"doi:10.1016/j.optlaseng.2012.07.018","doi":"https://doi.org/10.1016/j.optlaseng.2012.07.018","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.optlaseng.2012.07.018","pdf_url":null,"source":{"id":"https://openalex.org/S102728161","display_name":"Optics and Lasers in Engineering","issn_l":"0143-8166","issn":["0143-8166","1873-0302"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-c","jufo-1","ki-jl-1","norway-1","poland-140","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Optics and Lasers in Engineering","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101088381","display_name":"Cheng-Chih Hsu","orcid":"https://orcid.org/0009-0007-6447-3703","observed_orcids":["https://orcid.org/0009-0007-6447-3703"]},"institutions":[{"id":"https://openalex.org/I99908691","display_name":"Yuan Ze University","ror":"https://ror.org/01fv1ds98","country_code":"TW","type":"education","lineage":["https://openalex.org/I99908691"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Cheng-Chih Hsu","raw_affiliation_strings":["Department of Photonics Engineering, Yuan Ze University, 135, Yuan-Tung Road, Chung-Li, 32003 Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Photonics Engineering, Yuan Ze University, 135, Yuan-Tung Road, Chung-Li, 32003 Taiwan","institution_ids":["https://openalex.org/I99908691"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Shu-Yu Chen","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I99908691","display_name":"Yuan Ze University","ror":"https://ror.org/01fv1ds98","country_code":"TW","type":"education","lineage":["https://openalex.org/I99908691"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Shu-Yu Chen","raw_affiliation_strings":["Department of Photonics Engineering, Yuan Ze University, 135, Yuan-Tung Road, Chung-Li, 32003 Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Photonics Engineering, Yuan Ze University, 135, Yuan-Tung Road, Chung-Li, 32003 Taiwan","institution_ids":["https://openalex.org/I99908691"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100769175","display_name":"Yi\u2010Cheng Chen","orcid":"https://orcid.org/0000-0002-9497-9672","observed_orcids":["https://orcid.org/0000-0002-9497-9672"]},"institutions":[{"id":"https://openalex.org/I99908691","display_name":"Yuan Ze University","ror":"https://ror.org/01fv1ds98","country_code":"TW","type":"education","lineage":["https://openalex.org/I99908691"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Yi-Cheng Chen","raw_affiliation_strings":["Department of Photonics Engineering, Yuan Ze University, 135, Yuan-Tung Road, Chung-Li, 32003 Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Photonics Engineering, Yuan Ze University, 135, Yuan-Tung Road, Chung-Li, 32003 Taiwan","institution_ids":["https://openalex.org/I99908691"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I99908691"],"apc_list":{"value":4020,"currency":"USD","value_usd":4020},"apc_paid":null,"fwci":2.0542,"has_fulltext":false,"cited_by_count":14,"citation_normalized_percentile":{"value":0.87162801,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":98},"biblio":{"volume":"50","issue":"12","first_page":"1689","last_page":"1693"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9897000193595886,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9897000193595886,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.005100000184029341,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12050","display_name":"Optical Polarization and Ellipsometry","score":0.0010999999940395355,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/refractive-index-measurement","display_name":"refractive index measurement","score":0.996999979019165},{"id":"https://openalex.org/keywords/transparent-materials","display_name":"transparent materials","score":0.7509999871253967},{"id":"https://openalex.org/keywords/glass","display_name":"glass","score":0.8899999856948853},{"id":"https://openalex.org/keywords/phase-error","display_name":"phase error","score":0.9139999747276306},{"id":"https://openalex.org/keywords/error-analysis","display_name":"error analysis","score":0.7459999918937683},{"id":"https://openalex.org/keywords/incidence-angle","display_name":"angle of incidence","score":0.7730000019073486},{"id":"https://openalex.org/keywords/optical-setup","display_name":"optical configuration","score":0.33799999952316284}],"concepts":[{"id":"https://openalex.org/C166689943","wikidata":"https://www.wikidata.org/wiki/Q850283","display_name":"Interferometry","level":2,"score":0.7624475955963135},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.7126197814941406},{"id":"https://openalex.org/C2780497637","wikidata":"https://www.wikidata.org/wiki/Q16938394","display_name":"Heterodyne (poetry)","level":2,"score":0.6599613428115845},{"id":"https://openalex.org/C42067758","wikidata":"https://www.wikidata.org/wiki/Q174102","display_name":"Refractive index","level":2,"score":0.6358171105384827},{"id":"https://openalex.org/C2777382242","wikidata":"https://www.wikidata.org/wiki/Q6017816","display_name":"Index (typography)","level":2,"score":0.5377865433692932},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.401142418384552},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2709302306175232},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.20565742254257202},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.11605039238929749},{"id":"https://openalex.org/C136764020","wikidata":"https://www.wikidata.org/wiki/Q466","display_name":"World Wide Web","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/j.optlaseng.2012.07.018","doi":"https://doi.org/10.1016/j.optlaseng.2012.07.018","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.optlaseng.2012.07.018","pdf_url":null,"source":{"id":"https://openalex.org/S102728161","display_name":"Optics and Lasers in Engineering","issn_l":"0143-8166","issn":["0143-8166","1873-0302"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-c","jufo-1","ki-jl-1","norway-1","poland-140","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Optics and Lasers in Engineering","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321040","display_name":"National Science Council","ror":"https://ror.org/02kv4zf79"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1967729923","https://openalex.org/W1972803085","https://openalex.org/W1986759568","https://openalex.org/W1995474419","https://openalex.org/W2024116900","https://openalex.org/W2027082521","https://openalex.org/W2032417906","https://openalex.org/W2039772847","https://openalex.org/W2050821102","https://openalex.org/W2066101279","https://openalex.org/W2089678927","https://openalex.org/W2151512332","https://openalex.org/W2167813745","https://openalex.org/W3022302466"],"related_works":["https://openalex.org/W2031937964","https://openalex.org/W2075821591","https://openalex.org/W122031591","https://openalex.org/W2033805165","https://openalex.org/W2050821102","https://openalex.org/W7100651929","https://openalex.org/W3027967379","https://openalex.org/W2063836637","https://openalex.org/W2365512043","https://openalex.org/W1972293337"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":5},{"year":2013,"cited_by_count":2}],"updated_date":"2026-11-07T11:25:07.637180","created_date":"2016-06-24T00:00:00"}