{"id":"https://openalex.org/W2008792748","doi":"https://doi.org/10.1116/1.579719","title":"Using scanning tunneling microscopy to understand diffraction oscillations: Fe growth on Cu(100)","display_name":"Using scanning tunneling microscopy to understand diffraction oscillations: Fe growth on Cu(100)","publication_year":1995,"publication_date":"1995-05-01","ids":{"openalex":"https://openalex.org/W2008792748","doi":"https://doi.org/10.1116/1.579719","mag":"2008792748"},"language":"en","primary_location":{"id":"doi:10.1116/1.579719","doi":"https://doi.org/10.1116/1.579719","is_oa":false,"landing_page_url":"https://doi.org/10.1116/1.579719","pdf_url":null,"source":{"id":"https://openalex.org/S4210190837","display_name":"Journal of Vacuum Science & Technology A Vacuum Surfaces and Films","issn_l":"0734-2101","issn":["0734-2101","1520-8559"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","ki-jl-1","norway-1","poland-70","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5082400487","display_name":"David D. Chambliss","orcid":"https://orcid.org/0000-0003-0171-5166","observed_orcids":["https://orcid.org/0000-0003-0171-5166"]},"institutions":[{"id":"https://openalex.org/I4210085935","display_name":"IBM Research - Almaden","ror":"https://ror.org/005w8dd04","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210085935","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"David D. Chambliss","raw_affiliation_strings":["IBM Research Division, Almaden Research Center, San Jose, California 95120"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Research Division, Almaden Research Center, San Jose, California 95120","institution_ids":["https://openalex.org/I4210085935"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5017711501","display_name":"Kevin E. Johnson","orcid":"https://orcid.org/0000-0001-8968-6974","observed_orcids":["https://orcid.org/0000-0001-8968-6974"]},"institutions":[{"id":"https://openalex.org/I4210149261","display_name":"Pacific University","ror":"https://ror.org/059z5w858","country_code":"US","type":"education","lineage":["https://openalex.org/I4210149261"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kevin E. Johnson","raw_affiliation_strings":["Department of Chemistry, Pacific University, Forest Grove, Oregon 97116"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Chemistry, Pacific University, Forest Grove, Oregon 97116","institution_ids":["https://openalex.org/I4210149261"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2112,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.40580807,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"13","issue":"3","first_page":"1522","last_page":"1526"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13531","display_name":"Surface and Thin Film Phenomena","score":0.9854000210762024,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13531","display_name":"Surface and Thin Film Phenomena","score":0.9854000210762024,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.011699999682605267,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12285","display_name":"Surface Chemistry and Catalysis","score":0.00139999995008111,"subfield":{"id":"https://openalex.org/subfields/1606","display_name":"Physical and Theoretical Chemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fe-cu-100","display_name":"Fe/Cu(100)","score":0.8539999723434448},{"id":"https://openalex.org/keywords/thin-film-growth","display_name":"thin film growth","score":0.6940000057220459},{"id":"https://openalex.org/keywords/kinematical-diffraction-theory","display_name":"kinematical diffraction theory","score":0.8259999752044678},{"id":"https://openalex.org/keywords/scanning-tunneling-microscopy","display_name":"scanning tunneling microscopy","score":0.5889999866485596},{"id":"https://openalex.org/keywords/room-temperature-growth","display_name":"room-temperature growth","score":0.6710000038146973},{"id":"https://openalex.org/keywords/length-scales","display_name":"length scales","score":0.46000000834465027}],"concepts":[{"id":"https://openalex.org/C6518042","wikidata":"https://www.wikidata.org/wiki/Q175646","display_name":"Scanning tunneling microscope","level":2,"score":0.8595189452171326},{"id":"https://openalex.org/C207114421","wikidata":"https://www.wikidata.org/wiki/Q133900","display_name":"Diffraction","level":2,"score":0.7871755361557007},{"id":"https://openalex.org/C26771246","wikidata":"https://www.wikidata.org/wiki/Q321095","display_name":"Scanning electron microscope","level":2,"score":0.6247684955596924},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.46297141909599304},{"id":"https://openalex.org/C77557913","wikidata":"https://www.wikidata.org/wiki/Q864822","display_name":"Electron diffraction","level":3,"score":0.4593968093395233},{"id":"https://openalex.org/C120398109","wikidata":"https://www.wikidata.org/wiki/Q175751","display_name":"Quantum tunnelling","level":2,"score":0.4534953534603119},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.40266644954681396},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3730912208557129},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.3629705309867859},{"id":"https://openalex.org/C159467904","wikidata":"https://www.wikidata.org/wiki/Q2001702","display_name":"Chemical physics","level":1,"score":0.33997076749801636},{"id":"https://openalex.org/C8010536","wikidata":"https://www.wikidata.org/wiki/Q160398","display_name":"Crystallography","level":1,"score":0.32088345289230347},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2993205785751343},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.2829028069972992}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1116/1.579719","doi":"https://doi.org/10.1116/1.579719","is_oa":false,"landing_page_url":"https://doi.org/10.1116/1.579719","pdf_url":null,"source":{"id":"https://openalex.org/S4210190837","display_name":"Journal of Vacuum Science & Technology A Vacuum Surfaces and Films","issn_l":"0734-2101","issn":["0734-2101","1520-8559"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","ki-jl-1","norway-1","poland-70","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2027074518","https://openalex.org/W4253066157","https://openalex.org/W2051567897","https://openalex.org/W2146717925","https://openalex.org/W6903033751","https://openalex.org/W2112765646","https://openalex.org/W1520990074","https://openalex.org/W2240810007","https://openalex.org/W1977614162","https://openalex.org/W3036185156"],"abstract_inverted_index":{"In":[0],"this":[1,56],"article":[2],"we":[3],"use":[4],"scanning":[5],"tunneling":[6],"microscope":[7],"(STM)":[8],"measurements":[9],"to":[10,21],"improve":[11],"our":[12],"understanding":[13,79],"of":[14,26,49,68,73],"diffraction":[15,52],"as":[16,41],"a":[17],"growth":[18,24],"diagnostic":[19],"applied":[20],"the":[22,63,69,74,80],"complex":[23],"behavior":[25],"Fe":[27],"on":[28,55],"Cu(100)":[29],"at":[30],"room":[31],"temperature.":[32],"We":[33],"find":[34],"that":[35,65],"kinematical":[36],"calculations":[37],"using":[38],"STM":[39],"images":[40],"input":[42],"can":[43],"account":[44],"quantitatively":[45],"for":[46,78],"many":[47],"aspects":[48],"medium-energy":[50],"electron":[51],"(MEED)":[53],"results":[54,64],"system.":[57],"It":[58],"is":[59,76],"also":[60],"apparent":[61],"in":[62],"an":[66],"awareness":[67],"different":[70],"length":[71],"scales":[72],"problem":[75],"important":[77],"MEED":[81],"data.":[82]},"counts_by_year":[],"updated_date":"2026-09-22T06:50:58.402377","created_date":"2016-06-24T00:00:00"}