{"id":"https://openalex.org/W2008779489","doi":"https://doi.org/10.1109/apemc.2012.6238005","title":"Bandgap circuitry with high immunity to harsh EMC disturbances","display_name":"Bandgap circuitry with high immunity to harsh EMC disturbances","publication_year":2012,"publication_date":"2012-05-01","ids":{"openalex":"https://openalex.org/W2008779489","doi":"https://doi.org/10.1109/apemc.2012.6238005","mag":"2008779489"},"language":"en","primary_location":{"id":"doi:10.1109/apemc.2012.6238005","doi":"https://doi.org/10.1109/apemc.2012.6238005","is_oa":false,"landing_page_url":"https://doi.org/10.1109/apemc.2012.6238005","pdf_url":null,"source":{"id":"https://openalex.org/S4363605167","display_name":"Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 Asia-Pacific Symposium on Electromagnetic Compatibility","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102976965","display_name":"Yuan Gao","orcid":"https://orcid.org/0000-0002-2739-0470","observed_orcids":["https://orcid.org/0000-0002-2739-0470"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yuan Gao","raw_affiliation_strings":["Freescale Semiconductor, Inc., Toulouse, France","Freescale Semiconductors. Inc., 134, Avenue du G\u00e9n\u00e9ral Eisenhower, 31100 Toulouse, FRANCE"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Freescale Semiconductor, Inc., Toulouse, France","institution_ids":[]},{"raw_affiliation_string":"Freescale Semiconductors. Inc., 134, Avenue du G\u00e9n\u00e9ral Eisenhower, 31100 Toulouse, FRANCE","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075808611","display_name":"Kamel Abouda","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Kamel Abouda","raw_affiliation_strings":["Freescale Semiconductor, Inc., Toulouse, France","Freescale Semiconductors. Inc., 134, Avenue du G\u00e9n\u00e9ral Eisenhower, 31100 Toulouse, FRANCE"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Freescale Semiconductor, Inc., Toulouse, France","institution_ids":[]},{"raw_affiliation_string":"Freescale Semiconductors. Inc., 134, Avenue du G\u00e9n\u00e9ral Eisenhower, 31100 Toulouse, FRANCE","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5013109933","display_name":"Alexis Huot-Marchand","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Alexis Huot-Marchand","raw_affiliation_strings":["Freescale Semiconductor, Inc., Toulouse, France","Freescale Semiconductors. Inc., 134, Avenue du G\u00e9n\u00e9ral Eisenhower, 31100 Toulouse, FRANCE"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Freescale Semiconductor, Inc., Toulouse, France","institution_ids":[]},{"raw_affiliation_string":"Freescale Semiconductors. Inc., 134, Avenue du G\u00e9n\u00e9ral Eisenhower, 31100 Toulouse, FRANCE","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.8125,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.64958591,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"389","last_page":"392"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.7689999938011169,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.7689999938011169,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.2037000060081482,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.00989999994635582,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/bandgap-voltage-reference","display_name":"bandgap voltage reference","score":0.9819999933242798},{"id":"https://openalex.org/keywords/electromagnetic-compatibility","display_name":"electromagnetic compatibility","score":0.9300000071525574},{"id":"https://openalex.org/keywords/bulk-current-injection","display_name":"bulk current injection","score":0.7480000257492065},{"id":"https://openalex.org/keywords/substrate-injection","display_name":"substrate injection","score":0.7210000157356262},{"id":"https://openalex.org/keywords/direct-power-injection","display_name":"direct power injection","score":0.6809999942779541},{"id":"https://openalex.org/keywords/automotive-electronics","display_name":"automotive electronics","score":0.49399998784065247},{"id":"https://openalex.org/keywords/operational-transconductance-amplifier","display_name":"operational transconductance amplifier","score":0.8240000009536743},{"id":"https://openalex.org/keywords/isolation-layer","display_name":"isolation layer","score":0.8009999990463257},{"id":"https://openalex.org/keywords/circuit-optimization","display_name":"circuit optimization","score":0.32899999618530273}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5801694393157959},{"id":"https://openalex.org/C184892835","wikidata":"https://www.wikidata.org/wiki/Q1474513","display_name":"Electromagnetic interference","level":2,"score":0.5786332488059998},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5253348350524902},{"id":"https://openalex.org/C2777289219","wikidata":"https://www.wikidata.org/wiki/Q7632154","display_name":"Substrate (aquarium)","level":2,"score":0.5112929344177246},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4719585180282593},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4570986032485962},{"id":"https://openalex.org/C125470083","wikidata":"https://www.wikidata.org/wiki/Q747288","display_name":"Electromagnetic compatibility","level":2,"score":0.4459003806114197},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4373813271522522},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.433630108833313},{"id":"https://openalex.org/C32022120","wikidata":"https://www.wikidata.org/wiki/Q797225","display_name":"Interference (communication)","level":3,"score":0.43227192759513855},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.38371866941452026},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20896145701408386},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10648024082183838},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.09403061866760254},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.07140922546386719},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C111368507","wikidata":"https://www.wikidata.org/wiki/Q43518","display_name":"Oceanography","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/apemc.2012.6238005","doi":"https://doi.org/10.1109/apemc.2012.6238005","is_oa":false,"landing_page_url":"https://doi.org/10.1109/apemc.2012.6238005","pdf_url":null,"source":{"id":"https://openalex.org/S4363605167","display_name":"Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 Asia-Pacific Symposium on Electromagnetic Compatibility","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7207000255584717,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W2033472203","https://openalex.org/W2122561791","https://openalex.org/W2134916987","https://openalex.org/W2152109520","https://openalex.org/W2746395757","https://openalex.org/W4206893935"],"related_works":["https://openalex.org/W2744017040","https://openalex.org/W2601559193","https://openalex.org/W2128993416","https://openalex.org/W4405718218","https://openalex.org/W2746395757","https://openalex.org/W4394841749","https://openalex.org/W4206893935","https://openalex.org/W2152109520","https://openalex.org/W2134916987","https://openalex.org/W6982838477"],"abstract_inverted_index":{"This":[0],"work":[1],"evaluates":[2],"the":[3,23,40,49,90,105,115],"susceptibility":[4],"of":[5,43,46,52,66],"a":[6,58,67],"bandgap":[7,132],"voltage":[8,55],"reference":[9,56],"to":[10,71,74,93,103,109],"high":[11,59],"electromagnetic":[12],"interference":[13],"superimposed":[14],"at":[15],"direct":[16],"power":[17,20,72,110],"injection":[18,26,77,84,125,128],"on":[19,27,54],"supply":[21,73,82],"and":[22,48,126,136],"majority":[24],"carriers":[25],"substrate":[28,76,127],"phenomena":[29],"(typically":[30],"observed":[31],"during":[32,81],"Bulk":[33],"Current":[34],"Injection,":[35],"BCI).":[36],"The":[37],"investigation":[38],"shows":[39],"significant":[41],"impact":[42],"input":[44],"pair":[45],"OTA,":[47],"isolation":[50,64,106],"connection":[51],"components":[53],"in":[57,114],"disturbance":[60],"automotive":[61],"environment.":[62],"When":[63],"layer":[65,107],"device":[68],"is":[69,86,134],"connected":[70,108],"increase":[75,94],"immunity,":[78],"DPI":[79],"performance":[80,129],"pin":[83],"(PSDPI)":[85],"highly":[87],"degraded.":[88],"On":[89],"other":[91],"hand,":[92],"Power":[95,124],"Supply":[96],"Immunity":[97],"(PSI),":[98],"it":[99],"would":[100],"be":[101],"better":[102],"remove":[104],"supply;":[111],"this":[112,131],"results":[113],"Substrate":[116],"Injection":[117],"immunity":[118],"decrease.":[119],"A":[120],"good":[121],"compromise":[122],"between":[123],"for":[130],"circuitry":[133],"introduced":[135],"illustrated":[137],"with":[138],"optimisations.":[139]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":2},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2026-11-06T12:05:46.655746","created_date":"2016-06-24T00:00:00"}