{"id":"https://openalex.org/W2007658701","doi":"https://doi.org/10.1049/el:20030650","title":"Measurement of Q degradation due to polarisation mode dispersion using multiple importance sampling","display_name":"Measurement of Q degradation due to polarisation mode dispersion using multiple importance sampling","publication_year":2003,"publication_date":"2003-06-26","ids":{"openalex":"https://openalex.org/W2007658701","doi":"https://doi.org/10.1049/el:20030650","mag":"2007658701"},"language":"en","primary_location":{"id":"doi:10.1049/el:20030650","doi":"https://doi.org/10.1049/el:20030650","is_oa":false,"landing_page_url":"https://doi.org/10.1049/el:20030650","pdf_url":null,"source":{"id":"https://openalex.org/S149016011","display_name":"Electronics Letters","issn_l":"0013-5194","issn":["0013-5194","1350-911X"],"is_oa":false,"is_in_doaj":true,"is_core":true,"listed_in":["cwts-core","doaj","dongbi-d","jufo-1","norway-1","oarl","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310311714","host_organization_name":"Institution of Engineering and Technology","host_organization_lineage":["https://openalex.org/P4310311714"],"host_organization_lineage_names":["Institution of Engineering and Technology"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Electronics Letters","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100768480","display_name":"Lianshan Yan","orcid":"https://orcid.org/0000-0002-3633-7161","observed_orcids":["https://orcid.org/0000-0002-3633-7161"]},"institutions":[{"id":"https://openalex.org/I1174212","display_name":"University of Southern California","ror":"https://ror.org/03taz7m60","country_code":"US","type":"education","lineage":["https://openalex.org/I1174212"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"L.-S. Yan","raw_affiliation_strings":["Department of Electrical Engineering\u2013Systems, University of Southern California, Los Angeles, CA 90089-2565, USA","Department of Electrical Engineering\u2013Systems, University of Southern California, Los Angeles, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering\u2013Systems, University of Southern California, Los Angeles, CA 90089-2565, USA","institution_ids":["https://openalex.org/I1174212"]},{"raw_affiliation_string":"Department of Electrical Engineering\u2013Systems, University of Southern California, Los Angeles, USA","institution_ids":["https://openalex.org/I1174212"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027703006","display_name":"Christoph Hauer","orcid":"https://orcid.org/0000-0001-8704-2198","observed_orcids":["https://orcid.org/0000-0001-8704-2198"]},"institutions":[{"id":"https://openalex.org/I1174212","display_name":"University of Southern California","ror":"https://ror.org/03taz7m60","country_code":"US","type":"education","lineage":["https://openalex.org/I1174212"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M.C. Hauer","raw_affiliation_strings":["Department of Electrical Engineering\u2013Systems, University of Southern California, Los Angeles, CA 90089-2565, USA","Department of Electrical Engineering\u2013Systems, University of Southern California, Los Angeles, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering\u2013Systems, University of Southern California, Los Angeles, CA 90089-2565, USA","institution_ids":["https://openalex.org/I1174212"]},{"raw_affiliation_string":"Department of Electrical Engineering\u2013Systems, University of Southern California, Los Angeles, USA","institution_ids":["https://openalex.org/I1174212"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014072185","display_name":"P. Ebrahimi","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1174212","display_name":"University of Southern California","ror":"https://ror.org/03taz7m60","country_code":"US","type":"education","lineage":["https://openalex.org/I1174212"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"P. Ebrahimi","raw_affiliation_strings":["Department of Electrical Engineering\u2013Systems, University of Southern California, Los Angeles, CA 90089-2565, USA","Department of Electrical Engineering\u2013Systems, University of Southern California, Los Angeles, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering\u2013Systems, University of Southern California, Los Angeles, CA 90089-2565, USA","institution_ids":["https://openalex.org/I1174212"]},{"raw_affiliation_string":"Department of Electrical Engineering\u2013Systems, University of Southern California, Los Angeles, USA","institution_ids":["https://openalex.org/I1174212"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028703192","display_name":"Y. Wang","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1174212","display_name":"University of Southern California","ror":"https://ror.org/03taz7m60","country_code":"US","type":"education","lineage":["https://openalex.org/I1174212"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Y. Wang","raw_affiliation_strings":["Department of Electrical Engineering\u2013Systems, University of Southern California, Los Angeles, CA 90089-2565, USA","Department of Electrical Engineering\u2013Systems, University of Southern California, Los Angeles, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering\u2013Systems, University of Southern California, Los Angeles, CA 90089-2565, USA","institution_ids":["https://openalex.org/I1174212"]},{"raw_affiliation_string":"Department of Electrical Engineering\u2013Systems, University of Southern California, Los Angeles, USA","institution_ids":["https://openalex.org/I1174212"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013244196","display_name":"Yongqiang Shi","orcid":"https://orcid.org/0000-0002-8296-6559","observed_orcids":["https://orcid.org/0000-0002-8296-6559"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Y.Q. Shi","raw_affiliation_strings":["General Photonics Corp., Chino, CA 91710, USA","General Photonics Corp., Chino, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"General Photonics Corp., Chino, CA 91710, USA","institution_ids":[]},{"raw_affiliation_string":"General Photonics Corp., Chino, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055678695","display_name":"X. Steve Yao","orcid":"https://orcid.org/0000-0002-1777-2723","observed_orcids":["https://orcid.org/0000-0002-1777-2723","https://orcid.org/0000-0002-0982-1943"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"X. Steve Yao","raw_affiliation_strings":["General Photonics Corp., Chino, CA 91710, USA","General Photonics Corp., Chino, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"General Photonics Corp., Chino, CA 91710, USA","institution_ids":[]},{"raw_affiliation_string":"General Photonics Corp., Chino, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023448163","display_name":"Alan Eli Willner","orcid":"https://orcid.org/0000-0002-7339-4376","observed_orcids":["https://orcid.org/0000-0002-7339-4376"]},"institutions":[{"id":"https://openalex.org/I1174212","display_name":"University of Southern California","ror":"https://ror.org/03taz7m60","country_code":"US","type":"education","lineage":["https://openalex.org/I1174212"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A.E. Willner","raw_affiliation_strings":["Department of Electrical Engineering\u2013Systems, University of Southern California, Los Angeles, CA 90089-2565, USA","Department of Electrical Engineering\u2013Systems, University of Southern California, Los Angeles, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering\u2013Systems, University of Southern California, Los Angeles, CA 90089-2565, USA","institution_ids":["https://openalex.org/I1174212"]},{"raw_affiliation_string":"Department of Electrical Engineering\u2013Systems, University of Southern California, Los Angeles, USA","institution_ids":["https://openalex.org/I1174212"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5024500333","display_name":"William L. Kath","orcid":"https://orcid.org/0000-0003-3867-4783","observed_orcids":["https://orcid.org/0000-0003-3867-4783"]},"institutions":[{"id":"https://openalex.org/I111979921","display_name":"Northwestern University","ror":"https://ror.org/000e0be47","country_code":"US","type":"education","lineage":["https://openalex.org/I111979921"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"W.L. Kath","raw_affiliation_strings":["Department of Engineering Science and Applied Mathematics, Northwestern University, Evanston, IL 60208, USA","Department of Engineering Science and Applied Mathematics, Northwestern University, Evanston, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Engineering Science and Applied Mathematics, Northwestern University, Evanston, IL 60208, USA","institution_ids":["https://openalex.org/I111979921"]},{"raw_affiliation_string":"Department of Engineering Science and Applied Mathematics, Northwestern University, Evanston, USA","institution_ids":["https://openalex.org/I111979921"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2590,"currency":"USD","value_usd":2590},"apc_paid":null,"fwci":1.3383,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.81283249,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"39","issue":"13","first_page":"974","last_page":"975"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10232","display_name":"Optical Network Technologies","score":0.9746000170707703,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10232","display_name":"Optical Network Technologies","score":0.9746000170707703,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10767","display_name":"Advanced Photonic Communication Systems","score":0.002099999925121665,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10125","display_name":"Advanced Wireless Communication Techniques","score":0.0012000000569969416,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/polarization-mode-dispersion","display_name":"polarization mode dispersion","score":0.8659999966621399},{"id":"https://openalex.org/keywords/multiple-importance-sampling","display_name":"multiple importance sampling","score":0.9520000219345093},{"id":"https://openalex.org/keywords/differential-group-delay","display_name":"differential group delay","score":0.6740000247955322},{"id":"https://openalex.org/keywords/optical-fiber-communication","display_name":"optical fiber communication","score":0.3889999985694885}],"concepts":[{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.7040496468544006},{"id":"https://openalex.org/C177562468","wikidata":"https://www.wikidata.org/wiki/Q182893","display_name":"Dispersion (optics)","level":2,"score":0.6844467520713806},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.6376539468765259},{"id":"https://openalex.org/C178557918","wikidata":"https://www.wikidata.org/wiki/Q435910","display_name":"Polarization mode dispersion","level":3,"score":0.6148496270179749},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.5752080082893372},{"id":"https://openalex.org/C48677424","wikidata":"https://www.wikidata.org/wiki/Q6888088","display_name":"Mode (computer interface)","level":2,"score":0.5282696485519409},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.4864771068096161},{"id":"https://openalex.org/C131584629","wikidata":"https://www.wikidata.org/wiki/Q4308705","display_name":"Coupling (piping)","level":2,"score":0.4864663779735565},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.40793052315711975},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.38750970363616943},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.372650146484375},{"id":"https://openalex.org/C30475298","wikidata":"https://www.wikidata.org/wiki/Q909554","display_name":"Computational physics","level":1,"score":0.36604005098342896},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2639501690864563},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18598109483718872},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1049/el:20030650","doi":"https://doi.org/10.1049/el:20030650","is_oa":false,"landing_page_url":"https://doi.org/10.1049/el:20030650","pdf_url":null,"source":{"id":"https://openalex.org/S149016011","display_name":"Electronics Letters","issn_l":"0013-5194","issn":["0013-5194","1350-911X"],"is_oa":false,"is_in_doaj":true,"is_core":true,"listed_in":["cwts-core","doaj","dongbi-d","jufo-1","norway-1","oarl","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310311714","host_organization_name":"Institution of Engineering and Technology","host_organization_lineage":["https://openalex.org/P4310311714"],"host_organization_lineage_names":["Institution of Engineering and Technology"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Electronics Letters","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"sustainable_development_goals_aurora":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W2020399168","https://openalex.org/W2108511266","https://openalex.org/W2116212313","https://openalex.org/W2167451895","https://openalex.org/W3123853447"],"related_works":["https://openalex.org/W2151531467","https://openalex.org/W2098909409","https://openalex.org/W2119053719","https://openalex.org/W6884882830","https://openalex.org/W2108511266","https://openalex.org/W2102715864","https://openalex.org/W2003316165","https://openalex.org/W2020399168","https://openalex.org/W2091702964","https://openalex.org/W1946695381"],"abstract_inverted_index":{"Multiple":[0],"importance-sampling":[1],"(IS)":[2],"is":[3],"used":[4],"to":[5,11,34],"measure":[6],"the":[7,12],"Q":[8],"degradation":[9],"due":[10],"polarisation":[13,24],"mode":[14],"dispersion":[15],"generated":[16],"by":[17],"three":[18],"programmable":[19],"DGD":[20],"elements":[21],"with":[22,36],"uniform":[23],"coupling":[25],"between":[26],"sections.":[27],"The":[28],"measured":[29],"Q-penalty":[30],"probability":[31],"distribution":[32],"extends":[33],"<10\u221217":[35],"only":[37],"1800":[38],"experimental":[39],"samples.":[40]},"counts_by_year":[],"updated_date":"2026-09-24T07:57:37.273135","created_date":"2016-06-24T00:00:00"}