{"id":"https://openalex.org/W2007455520","doi":"https://doi.org/10.1109/tcad.1987.1270267","title":"Algorithms for an Advanced Fault Simulation System in MOTIS","display_name":"Algorithms for an Advanced Fault Simulation System in MOTIS","publication_year":1987,"publication_date":"1987-03-01","ids":{"openalex":"https://openalex.org/W2007455520","doi":"https://doi.org/10.1109/tcad.1987.1270267","mag":"2007455520"},"language":"en","primary_location":{"id":"doi:10.1109/tcad.1987.1270267","doi":"https://doi.org/10.1109/tcad.1987.1270267","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.1987.1270267","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["ccf-a","cwts-core","dongbi-a","jufo-2","norway-1","poland-100","russia-white-list-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5110229027","display_name":"Chi-Yuan Lo","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1283103587","display_name":"AT&T (United States)","ror":"https://ror.org/02bbd5539","country_code":"US","type":"company","lineage":["https://openalex.org/I1283103587"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Chi-Yuan Lo","raw_affiliation_strings":["AT and T Bell Laboratories, Inc., Murray Hill, NJ, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"AT and T Bell Laboratories, Inc., Murray Hill, NJ, USA","institution_ids":["https://openalex.org/I1283103587"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051224932","display_name":"H. N. Nham","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1283103587","display_name":"AT&T (United States)","ror":"https://ror.org/02bbd5539","country_code":"US","type":"company","lineage":["https://openalex.org/I1283103587"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"H.N. Nham","raw_affiliation_strings":["AT and T Bell Laboratories, Inc., Murray Hill, NJ, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"AT and T Bell Laboratories, Inc., Murray Hill, NJ, USA","institution_ids":["https://openalex.org/I1283103587"]}]},{"author_position":"last","author":{"id":null,"display_name":"A.K. Bose","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1283103587","display_name":"AT&T (United States)","ror":"https://ror.org/02bbd5539","country_code":"US","type":"company","lineage":["https://openalex.org/I1283103587"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A.K. Bose","raw_affiliation_strings":["AT and T Bell Laboratories, Inc., Murray Hill, NJ, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"AT and T Bell Laboratories, Inc., Murray Hill, NJ, USA","institution_ids":["https://openalex.org/I1283103587"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I1283103587"],"apc_list":{"value":2645,"currency":"USD","value_usd":2645},"apc_paid":null,"fwci":0.3797,"has_fulltext":false,"cited_by_count":29,"citation_normalized_percentile":{"value":0.66083576,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":"6","issue":"2","first_page":"232","last_page":"240"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.0010999999940395355,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.0003000000142492354,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-simulation","display_name":"fault simulation","score":0.9890000224113464},{"id":"https://openalex.org/keywords/fault-modeling","display_name":"fault modeling","score":0.8579999804496765},{"id":"https://openalex.org/keywords/fault-collapsing","display_name":"fault collapsing","score":0.9649999737739563},{"id":"https://openalex.org/keywords/parallel-fault-simulation","display_name":"parallel fault simulation","score":0.6800000071525574},{"id":"https://openalex.org/keywords/simulation-acceleration","display_name":"simulation acceleration","score":0.7789999842643738},{"id":"https://openalex.org/keywords/memory-reduction","display_name":"memory reduction","score":0.7509999871253967}],"concepts":[{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.7475498914718628},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6552343368530273},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.4610781669616699},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.45417520403862},{"id":"https://openalex.org/C50712370","wikidata":"https://www.wikidata.org/wiki/Q4269346","display_name":"Software fault tolerance","level":3,"score":0.4103134274482727},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.4041852056980133},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.37432578206062317},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.3710004389286041},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.315753698348999},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1963767111301422},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.14841672778129578},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.054152876138687134},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcad.1987.1270267","doi":"https://doi.org/10.1109/tcad.1987.1270267","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.1987.1270267","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["ccf-a","cwts-core","dongbi-a","jufo-2","norway-1","poland-100","russia-white-list-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1970983802","https://openalex.org/W1981782019","https://openalex.org/W1996007494","https://openalex.org/W2005007154","https://openalex.org/W2025029285","https://openalex.org/W2027285904","https://openalex.org/W2034468751","https://openalex.org/W2046817879","https://openalex.org/W2076000316","https://openalex.org/W2120201314","https://openalex.org/W4229852702","https://openalex.org/W4237713722","https://openalex.org/W4240448989","https://openalex.org/W4241855679","https://openalex.org/W4249958171"],"related_works":["https://openalex.org/W2340645003","https://openalex.org/W2085966211","https://openalex.org/W2331323624","https://openalex.org/W2110404100","https://openalex.org/W2545809352","https://openalex.org/W4239966953","https://openalex.org/W3148474785","https://openalex.org/W2057301315","https://openalex.org/W1964839541","https://openalex.org/W2135620942"],"abstract_inverted_index":{"In":[0,19],"this":[1],"paper,":[2],"we":[3],"will":[4],"present":[5],"algorithms":[6,33],"developed":[7],"for":[8],"an":[9,68,78],"advanced":[10],"fault":[11,25,36,43,62,73],"simulation":[12,17,37,74],"system":[13],"in":[14,40,82,87],"the":[15,21],"MOTIS":[16],"environment.":[18],"particular,":[20],"algorithm":[22,75],"to":[23,34,58],"perform":[24,35],"modeling":[26],"and":[27,46,84],"collapsing":[28],"is":[29,66],"first":[30],"reviewed.":[31],"Efficient":[32],"are":[38],"discussed":[39],"terms":[41],"of":[42,56],"list":[44],"manipulation":[45],"primitive":[47],"evaluation.":[48],"The":[49],"simulator":[50],"realizes":[51],"a":[52],"speed":[53,83],"gain":[54],"factor":[55],"787":[57],"2088":[59],"over":[60],"serial":[61],"simulation.":[63],"Special":[64],"emphasis":[65],"on":[67],"innovative":[69],"fast":[70],"unit":[71],"delay":[72],"that":[76],"achieves":[77],"additional":[79],"33-39-percent":[80],"improvement":[81,86],"20-28-percent":[85],"memory":[88],"usage.":[89]},"counts_by_year":[{"year":2014,"cited_by_count":1}],"updated_date":"2026-11-04T10:54:05.112534","created_date":"2016-06-24T00:00:00"}