{"id":"https://openalex.org/W2007449335","doi":"https://doi.org/10.1016/j.nimb.2005.01.102","title":"Radiation effects microscopy for failure analysis of microelectronic devices","display_name":"Radiation effects microscopy for failure analysis of microelectronic devices","publication_year":2005,"publication_date":"2005-03-19","ids":{"openalex":"https://openalex.org/W2007449335","doi":"https://doi.org/10.1016/j.nimb.2005.01.102","mag":"2007449335"},"language":"en","primary_location":{"id":"doi:10.1016/j.nimb.2005.01.102","doi":"https://doi.org/10.1016/j.nimb.2005.01.102","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.nimb.2005.01.102","pdf_url":null,"source":{"id":"https://openalex.org/S113542562","display_name":"Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms","issn_l":"0168-583X","issn":["0168-583X","1872-9584"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-2","ki-jl-1","norway-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5079858243","display_name":"Gy\u00f6rgy Vizkelethy","orcid":"https://orcid.org/0000-0002-3652-2519","observed_orcids":["https://orcid.org/0000-0002-3652-2519"]},"institutions":[{"id":"https://openalex.org/I4210104735","display_name":"Sandia National Laboratories","ror":"https://ror.org/01apwpt12","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I198811213","https://openalex.org/I4210104735"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"G. Vizkelethy","raw_affiliation_strings":["Sandia National Laboratories, P.O. Box 5800, MS-1056, Albuquerque, NM 87185-1056, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sandia National Laboratories, P.O. Box 5800, MS-1056, Albuquerque, NM 87185-1056, USA","institution_ids":["https://openalex.org/I4210104735"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109938434","display_name":"Barney L. Doyle","orcid":"https://orcid.org/0009-0002-7559-1346","observed_orcids":["https://orcid.org/0009-0002-7559-1346"]},"institutions":[{"id":"https://openalex.org/I4210104735","display_name":"Sandia National Laboratories","ror":"https://ror.org/01apwpt12","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I198811213","https://openalex.org/I4210104735"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"B.L. Doyle","raw_affiliation_strings":["Sandia National Laboratories, P.O. Box 5800, MS-1056, Albuquerque, NM 87185-1056, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sandia National Laboratories, P.O. Box 5800, MS-1056, Albuquerque, NM 87185-1056, USA","institution_ids":["https://openalex.org/I4210104735"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045472916","display_name":"D.K. Brice","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210104735","display_name":"Sandia National Laboratories","ror":"https://ror.org/01apwpt12","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I198811213","https://openalex.org/I4210104735"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"D.K. Brice","raw_affiliation_strings":["Sandia National Laboratories, P.O. Box 5800, MS-1056, Albuquerque, NM 87185-1056, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sandia National Laboratories, P.O. Box 5800, MS-1056, Albuquerque, NM 87185-1056, USA","institution_ids":["https://openalex.org/I4210104735"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111564267","display_name":"P.E. Dodd","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210104735","display_name":"Sandia National Laboratories","ror":"https://ror.org/01apwpt12","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I198811213","https://openalex.org/I4210104735"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"P.E. Dodd","raw_affiliation_strings":["Sandia National Laboratories, P.O. Box 5800, MS-1056, Albuquerque, NM 87185-1056, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sandia National Laboratories, P.O. Box 5800, MS-1056, Albuquerque, NM 87185-1056, USA","institution_ids":["https://openalex.org/I4210104735"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011631892","display_name":"Marty R. Shaneyfelt","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210104735","display_name":"Sandia National Laboratories","ror":"https://ror.org/01apwpt12","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I198811213","https://openalex.org/I4210104735"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M.R. Shaneyfelt","raw_affiliation_strings":["Sandia National Laboratories, P.O. Box 5800, MS-1056, Albuquerque, NM 87185-1056, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sandia National Laboratories, P.O. Box 5800, MS-1056, Albuquerque, NM 87185-1056, USA","institution_ids":["https://openalex.org/I4210104735"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110251610","display_name":"J.R. Schwank","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210104735","display_name":"Sandia National Laboratories","ror":"https://ror.org/01apwpt12","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I198811213","https://openalex.org/I4210104735"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J.R. Schwank","raw_affiliation_strings":["Sandia National Laboratories, P.O. Box 5800, MS-1056, Albuquerque, NM 87185-1056, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sandia National Laboratories, P.O. Box 5800, MS-1056, Albuquerque, NM 87185-1056, USA","institution_ids":["https://openalex.org/I4210104735"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5079858243"],"corresponding_institution_ids":["https://openalex.org/I4210104735"],"apc_list":{"value":2810,"currency":"USD","value_usd":2810},"apc_paid":null,"fwci":1.8983,"has_fulltext":false,"cited_by_count":36,"citation_normalized_percentile":{"value":0.85111892,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":96},"biblio":{"volume":"231","issue":"1-4","first_page":"467","last_page":"475"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9922000169754028,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9922000169754028,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.005400000140070915,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11044","display_name":"Particle Detector Development and Performance","score":0.000699999975040555,"subfield":{"id":"https://openalex.org/subfields/3106","display_name":"Nuclear and High Energy Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/single-event-effects","display_name":"single event effects","score":0.9110000133514404},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"single event upset","score":0.7630000114440918},{"id":"https://openalex.org/keywords/single-event-transients","display_name":"single event transients","score":0.9779999852180481},{"id":"https://openalex.org/keywords/ion-beam-induced-charge","display_name":"ion beam induced charge","score":0.9190000295639038},{"id":"https://openalex.org/keywords/failure-analysis","display_name":"failure analysis","score":0.656000018119812},{"id":"https://openalex.org/keywords/microelectronic-devices","display_name":"microelectronic devices","score":0.902999997138977},{"id":"https://openalex.org/keywords/cosmic-rays","display_name":"cosmic rays","score":0.6370000243186951},{"id":"https://openalex.org/keywords/terrestrial-radiation","display_name":"terrestrial radiation","score":0.9350000023841858},{"id":"https://openalex.org/keywords/integrated-circuits","display_name":"integrated circuits","score":0.6769999861717224},{"id":"https://openalex.org/keywords/radiation-hardness","display_name":"radioresistance","score":0.7570000290870667},{"id":"https://openalex.org/keywords/heavy-ion-beams","display_name":"heavy ion beams","score":0.44200000166893005}],"concepts":[{"id":"https://openalex.org/C2778002589","wikidata":"https://www.wikidata.org/wiki/Q2406791","display_name":"Upset","level":2,"score":0.7492031455039978},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.741475522518158},{"id":"https://openalex.org/C2777152588","wikidata":"https://www.wikidata.org/wiki/Q6839237","display_name":"Microbeam","level":2,"score":0.7053824663162231},{"id":"https://openalex.org/C187937830","wikidata":"https://www.wikidata.org/wiki/Q175403","display_name":"Microelectronics","level":2,"score":0.6913982629776001},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.5497111678123474},{"id":"https://openalex.org/C153385146","wikidata":"https://www.wikidata.org/wiki/Q18335","display_name":"Radiation","level":2,"score":0.5366361141204834},{"id":"https://openalex.org/C111309251","wikidata":"https://www.wikidata.org/wiki/Q11547","display_name":"Cosmic ray","level":2,"score":0.5143226385116577},{"id":"https://openalex.org/C119349744","wikidata":"https://www.wikidata.org/wiki/Q3026015","display_name":"Radiation hardening","level":3,"score":0.5117313861846924},{"id":"https://openalex.org/C153428861","wikidata":"https://www.wikidata.org/wiki/Q152749","display_name":"Radiation damage","level":3,"score":0.4519871473312378},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.426718145608902},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.41728562116622925},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.38269686698913574},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.37721577286720276},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3680673837661743},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.34272751212120056},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.2876439094543457},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.19509074091911316},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.17095869779586792},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1629108488559723},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.14047378301620483},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/j.nimb.2005.01.102","doi":"https://doi.org/10.1016/j.nimb.2005.01.102","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.nimb.2005.01.102","pdf_url":null,"source":{"id":"https://openalex.org/S113542562","display_name":"Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms","issn_l":"0168-583X","issn":["0168-583X","1872-9584"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-2","ki-jl-1","norway-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W586566244","https://openalex.org/W1590134320","https://openalex.org/W1596360820","https://openalex.org/W1999594880","https://openalex.org/W2019085291","https://openalex.org/W2023193561","https://openalex.org/W2043439851","https://openalex.org/W2045487092","https://openalex.org/W2047164150","https://openalex.org/W2048604700","https://openalex.org/W2068684228","https://openalex.org/W2073956966","https://openalex.org/W2080084409","https://openalex.org/W2091628914","https://openalex.org/W2095969016","https://openalex.org/W2100855482","https://openalex.org/W2114058303","https://openalex.org/W2141068710","https://openalex.org/W2158443609","https://openalex.org/W2163283337","https://openalex.org/W4241299622","https://openalex.org/W4388322781"],"related_works":["https://openalex.org/W2588440039","https://openalex.org/W2124024901","https://openalex.org/W2109856740","https://openalex.org/W1830203822","https://openalex.org/W2086449885","https://openalex.org/W2352253959","https://openalex.org/W172811126","https://openalex.org/W109231967","https://openalex.org/W2070617411","https://openalex.org/W6987245755"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":2}],"updated_date":"2026-10-30T12:39:25.321706","created_date":"2016-06-24T00:00:00"}