{"id":"https://openalex.org/W2007387401","doi":"https://doi.org/10.1016/j.orgel.2012.01.029","title":"Quantitative characterization of carrier injection across metal\u2013organic interfaces using Bardeen theory","display_name":"Quantitative characterization of carrier injection across metal\u2013organic interfaces using Bardeen theory","publication_year":2012,"publication_date":"2012-02-11","ids":{"openalex":"https://openalex.org/W2007387401","doi":"https://doi.org/10.1016/j.orgel.2012.01.029","mag":"2007387401"},"language":"en","primary_location":{"id":"doi:10.1016/j.orgel.2012.01.029","doi":"https://doi.org/10.1016/j.orgel.2012.01.029","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.orgel.2012.01.029","pdf_url":null,"source":{"id":"https://openalex.org/S99846442","display_name":"Organic Electronics","issn_l":"1566-1199","issn":["1566-1199","1878-5530"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-b","jufo-2","ki-jl-1","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Organic Electronics","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5009179622","display_name":"Mohammadreza Fathollahi","orcid":"https://orcid.org/0000-0001-5577-7632","observed_orcids":["https://orcid.org/0000-0001-5577-7632"]},"institutions":[{"id":"https://openalex.org/I80543232","display_name":"K. N. Toosi University of Technology","ror":"https://ror.org/0433abe34","country_code":"IR","type":"education","lineage":["https://openalex.org/I80543232"]}],"countries":["IR"],"is_corresponding":true,"raw_author_name":"Mohammad-Reza Fathollahi","raw_affiliation_strings":["Faculty of Electrical and Computer Engineering, K.N. Toosi University of Technology, P.O. Box 16315-1355, Tehran 1431714191, Iran"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Electrical and Computer Engineering, K.N. Toosi University of Technology, P.O. Box 16315-1355, Tehran 1431714191, Iran","institution_ids":["https://openalex.org/I80543232"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031872941","display_name":"Farhad Akbari Boroumand","orcid":"https://orcid.org/0000-0002-7202-594X","observed_orcids":["https://orcid.org/0000-0002-7202-594X"]},"institutions":[{"id":"https://openalex.org/I80543232","display_name":"K. N. Toosi University of Technology","ror":"https://ror.org/0433abe34","country_code":"IR","type":"education","lineage":["https://openalex.org/I80543232"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Farhad Akbari Boroumand","raw_affiliation_strings":["Faculty of Electrical and Computer Engineering, K.N. Toosi University of Technology, P.O. Box 16315-1355, Tehran 1431714191, Iran"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Electrical and Computer Engineering, K.N. Toosi University of Technology, P.O. Box 16315-1355, Tehran 1431714191, Iran","institution_ids":["https://openalex.org/I80543232"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055706070","display_name":"Farshid Raissi","orcid":"https://orcid.org/0000-0003-0900-5951","observed_orcids":["https://orcid.org/0000-0003-0900-5951"]},"institutions":[{"id":"https://openalex.org/I80543232","display_name":"K. N. Toosi University of Technology","ror":"https://ror.org/0433abe34","country_code":"IR","type":"education","lineage":["https://openalex.org/I80543232"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Farshid Raissi","raw_affiliation_strings":["Faculty of Electrical and Computer Engineering, K.N. Toosi University of Technology, P.O. Box 16315-1355, Tehran 1431714191, Iran"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Electrical and Computer Engineering, K.N. Toosi University of Technology, P.O. Box 16315-1355, Tehran 1431714191, Iran","institution_ids":["https://openalex.org/I80543232"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5048406263","display_name":"Mohammad-Javad Sharifi","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I48379061","display_name":"Shahid Beheshti University","ror":"https://ror.org/0091vmj44","country_code":"IR","type":"education","lineage":["https://openalex.org/I48379061"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Mohammad-Javad Sharifi","raw_affiliation_strings":["Faculty of Electrical and Computer Engineering, Shahid Beheshti University, G.C., Evin, Tehran 19839, Iran"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Electrical and Computer Engineering, Shahid Beheshti University, G.C., Evin, Tehran 19839, Iran","institution_ids":["https://openalex.org/I48379061"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5009179622"],"corresponding_institution_ids":["https://openalex.org/I80543232"],"apc_list":{"value":3650,"currency":"USD","value_usd":3650},"apc_paid":null,"fwci":0.3907,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.63578938,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":96},"biblio":{"volume":"13","issue":"5","first_page":"905","last_page":"913"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10045","display_name":"Organic Electronics and Photovoltaics","score":0.951200008392334,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10045","display_name":"Organic Electronics and Photovoltaics","score":0.951200008392334,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10611","display_name":"Organic Light-Emitting Diodes Research","score":0.033399999141693115,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10660","display_name":"Conducting polymers and applications","score":0.004000000189989805,"subfield":{"id":"https://openalex.org/subfields/2507","display_name":"Polymers and Plastics"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/charge-injection","display_name":"charge injection","score":0.9509999752044678},{"id":"https://openalex.org/keywords/metal-organic-interface","display_name":"metal-organic interfaces","score":0.8820000290870667},{"id":"https://openalex.org/keywords/hopping-rate","display_name":"hopping rate","score":0.6759999990463257},{"id":"https://openalex.org/keywords/localized-carriers","display_name":"localized carriers","score":0.7149999737739563},{"id":"https://openalex.org/keywords/polyfluorene","display_name":"polyfluorene","score":0.902999997138977},{"id":"https://openalex.org/keywords/electrode-contact","display_name":"electrode contact","score":0.5199999809265137},{"id":"https://openalex.org/keywords/organic-semiconductors","display_name":"organic semiconductors","score":0.8360000252723694}],"concepts":[{"id":"https://openalex.org/C94003879","wikidata":"https://www.wikidata.org/wiki/Q1933714","display_name":"Organic semiconductor","level":2,"score":0.7001583576202393},{"id":"https://openalex.org/C2777903423","wikidata":"https://www.wikidata.org/wiki/Q3395565","display_name":"Polyfluorene","level":4,"score":0.6073977947235107},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.5890495777130127},{"id":"https://openalex.org/C521977710","wikidata":"https://www.wikidata.org/wiki/Q81163","display_name":"Polymer","level":2,"score":0.5684095025062561},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5512043237686157},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.5197851061820984},{"id":"https://openalex.org/C108225325","wikidata":"https://www.wikidata.org/wiki/Q11456","display_name":"Semiconductor","level":2,"score":0.5133382678031921},{"id":"https://openalex.org/C159467904","wikidata":"https://www.wikidata.org/wiki/Q2001702","display_name":"Chemical physics","level":1,"score":0.5083634257316589},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.44859305024147034},{"id":"https://openalex.org/C544153396","wikidata":"https://www.wikidata.org/wiki/Q11426","display_name":"Metal","level":2,"score":0.44392433762550354},{"id":"https://openalex.org/C104232198","wikidata":"https://www.wikidata.org/wiki/Q865807","display_name":"Charge carrier","level":2,"score":0.4338463246822357},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3548423647880554},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.3473544120788574},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.2603788375854492},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.14412590861320496},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.11805537343025208},{"id":"https://openalex.org/C15920480","wikidata":"https://www.wikidata.org/wiki/Q421281","display_name":"Copolymer","level":3,"score":0.06913328170776367},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/j.orgel.2012.01.029","doi":"https://doi.org/10.1016/j.orgel.2012.01.029","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.orgel.2012.01.029","pdf_url":null,"source":{"id":"https://openalex.org/S99846442","display_name":"Organic Electronics","issn_l":"1566-1199","issn":["1566-1199","1878-5530"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-b","jufo-2","ki-jl-1","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Organic Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1963571270","https://openalex.org/W1974585980","https://openalex.org/W1976090618","https://openalex.org/W1980055244","https://openalex.org/W1984485098","https://openalex.org/W1984521855","https://openalex.org/W1985854442","https://openalex.org/W1995763968","https://openalex.org/W1996909248","https://openalex.org/W2005501037","https://openalex.org/W2005761411","https://openalex.org/W2006008336","https://openalex.org/W2006083158","https://openalex.org/W2014359419","https://openalex.org/W2016152397","https://openalex.org/W2027849148","https://openalex.org/W2048697904","https://openalex.org/W2055068944","https://openalex.org/W2063843497","https://openalex.org/W2066821117","https://openalex.org/W2079787688","https://openalex.org/W2083919021","https://openalex.org/W2084450819","https://openalex.org/W2084825579","https://openalex.org/W2104932900","https://openalex.org/W2106960391"],"related_works":["https://openalex.org/W2070401821","https://openalex.org/W2088752452","https://openalex.org/W2071562203","https://openalex.org/W1977327652","https://openalex.org/W1963571270","https://openalex.org/W2885917498","https://openalex.org/W6989954349","https://openalex.org/W4230217993","https://openalex.org/W2318196538","https://openalex.org/W2130359658"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-10-30T12:39:25.321706","created_date":"2016-06-24T00:00:00"}