{"id":"https://openalex.org/W2007385895","doi":"https://doi.org/10.1524/teme.2006.73.1.26","title":"Anwendung eines Laser-Speckle-Korrelationsverfahrens zur Messung lokaler Dehnungen in Mikromaterialien (Application of a Laser-Speckle Correlation Technique for Measuring Local Strain in Micromaterials)","display_name":"Anwendung eines Laser-Speckle-Korrelationsverfahrens zur Messung lokaler Dehnungen in Mikromaterialien (Application of a Laser-Speckle Correlation Technique for Measuring Local Strain in Micromaterials)","publication_year":2006,"publication_date":"2006-01-01","ids":{"openalex":"https://openalex.org/W2007385895","doi":"https://doi.org/10.1524/teme.2006.73.1.26","mag":"2007385895"},"language":"de","primary_location":{"id":"doi:10.1524/teme.2006.73.1.26","doi":"https://doi.org/10.1524/teme.2006.73.1.26","is_oa":false,"landing_page_url":"https://doi.org/10.1524/teme.2006.73.1.26","pdf_url":null,"source":{"id":"https://openalex.org/S20981179","display_name":"tm - Technisches Messen","issn_l":"0171-8096","issn":["0171-8096","2196-7113"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","norway-1","poland-40","russia-white-list-3"],"host_organization":"https://openalex.org/P4310319967","host_organization_name":"R. Oldenbourg Verlag","host_organization_lineage":["https://openalex.org/P4310319967"],"host_organization_lineage_names":["R. Oldenbourg Verlag"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"teme","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Sebastian C. Schneider","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Sebastian C. Schneider","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076185486","display_name":"Bernhard G. Zagar","orcid":"https://orcid.org/0000-0002-0695-2657","observed_orcids":["https://orcid.org/0000-0002-0695-2657"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Bernhard Zagar","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5007203546","display_name":"Peter Zimprich","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Peter Zimprich","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2400,"currency":"EUR","value_usd":2712},"apc_paid":null,"fwci":0.3548,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.69907895,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":"73","issue":"1","first_page":"26","last_page":"34"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10377","display_name":"Metal and Thin Film Mechanics","score":0.00019999999494757503,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.00019999999494757503,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/local-strain-measurement","display_name":"local strain measurement","score":0.8740000128746033},{"id":"https://openalex.org/keywords/micromaterials","display_name":"micromaterials","score":0.9549999833106995},{"id":"https://openalex.org/keywords/non-contact-strain-measurement","display_name":"non-contact strain measurement","score":0.9020000100135803},{"id":"https://openalex.org/keywords/micromechanical-properties","display_name":"micromechanical properties","score":0.5799999833106995},{"id":"https://openalex.org/keywords/optical-measurement-methods","display_name":"optical measurement methods","score":0.4950000047683716},{"id":"https://openalex.org/keywords/microelectronics","display_name":"microelectronics","score":0.5260000228881836}],"concepts":[{"id":"https://openalex.org/C102290492","wikidata":"https://www.wikidata.org/wiki/Q7575045","display_name":"Speckle pattern","level":2,"score":0.4958818852901459},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.4520086348056793},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.44313088059425354},{"id":"https://openalex.org/C29456083","wikidata":"https://www.wikidata.org/wiki/Q1221899","display_name":"Gynecology","level":1,"score":0.4207397401332855},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.17969676852226257},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.1629839539527893}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1524/teme.2006.73.1.26","doi":"https://doi.org/10.1524/teme.2006.73.1.26","is_oa":false,"landing_page_url":"https://doi.org/10.1524/teme.2006.73.1.26","pdf_url":null,"source":{"id":"https://openalex.org/S20981179","display_name":"tm - Technisches Messen","issn_l":"0171-8096","issn":["0171-8096","2196-7113"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","norway-1","poland-40","russia-white-list-3"],"host_organization":"https://openalex.org/P4310319967","host_organization_name":"R. Oldenbourg Verlag","host_organization_lineage":["https://openalex.org/P4310319967"],"host_organization_lineage_names":["R. Oldenbourg Verlag"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"teme","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2094976679","https://openalex.org/W2054096965","https://openalex.org/W38014321","https://openalex.org/W2086184193","https://openalex.org/W4214904924","https://openalex.org/W2077219997","https://openalex.org/W7045327444","https://openalex.org/W1992687114","https://openalex.org/W1993768071","https://openalex.org/W7048617761"],"abstract_inverted_index":{"Abstract":[0],"Ber\u00fchrungslose":[1],"Dehnungsmessverfahren":[2],"f\u00fcr":[3],"Materialien":[4],"in":[5,9,17,48],"Mikrometerdimensionen,":[6],"wie":[7],"sie":[8],"der":[10,40,60],"Mikroelektronik":[11],"und":[12,62,69],"Mikrosystemtechnik":[13],"Verwendung":[14],"finden,":[15],"gewinnen":[16],"den":[18],"Materialwissenschaften":[19],"zunehmend":[20],"an":[21,33,59],"Bedeutung.":[22],"Die":[23],"mechanischen":[24],"Eigenschaften":[25],"dieser":[26],"\u201eMikromaterialien\u201c":[27],"k\u00f6nnen":[28],"deutlich":[29],"von":[30,42],"jenen,":[31],"die":[32,46,56,74],"Makroproben":[34],"gewonnen":[35],"wurden,":[36],"abweichen.":[37],"Zur":[38],"Erh\u00f6hung":[39],"Zuverl\u00e4ssigkeit":[41],"Mikrosystemen":[43],"ist":[44],"daher":[45],"Materialpr\u00fcfung":[47],"kleinen":[49],"Dimensionen":[50],"notwendig.":[51],"Dabei":[52],"spielen":[53],"optische":[54],"Methoden,":[55],"ohne":[57,63],"Messmarken":[58],"Probenoberfl\u00e4che":[61],"Probenpr\u00e4parierung":[64],"auskommen,":[65],"eine":[66],"besondere":[67],"Rolle":[68],"er\u00f6ffnen":[70],"v\u00f6llig":[71],"neue":[72],"Pr\u00fcfm\u00f6glichkeiten,":[73],"mit":[75],"Standardmethoden":[76],"nicht":[77],"gegeben":[78],"sind.":[79]},"counts_by_year":[{"year":2016,"cited_by_count":1}],"updated_date":"2026-09-29T14:09:16.559479","created_date":"2016-06-24T00:00:00"}