{"id":"https://openalex.org/W2007354244","doi":"https://doi.org/10.1063/1.358926","title":"Optical properties of PbSe","display_name":"Optical properties of PbSe","publication_year":1995,"publication_date":"1995-02-01","ids":{"openalex":"https://openalex.org/W2007354244","doi":"https://doi.org/10.1063/1.358926","mag":"2007354244"},"language":"en","primary_location":{"id":"doi:10.1063/1.358926","doi":"https://doi.org/10.1063/1.358926","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.358926","pdf_url":null,"source":{"id":"https://openalex.org/S187991544","display_name":"Journal of Applied Physics","issn_l":"0021-8979","issn":["0021-8979","1089-7550","1520-8850"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-d","jufo-1","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Applied Physics","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100725281","display_name":"N. Suzuki","orcid":"https://orcid.org/0000-0001-7003-1003","observed_orcids":["https://orcid.org/0000-0001-7003-1003"]},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Norihiro Suzuki","raw_affiliation_strings":["Department of Electronic Engineering, Faculty of Engineering, Gunma University, Kiryu-shi, Gunma 376, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Faculty of Engineering, Gunma University, Kiryu-shi, Gunma 376, Japan","institution_ids":["https://openalex.org/I165735259"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033617382","display_name":"Katsuyuki Sawai","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Katsuyuki Sawai","raw_affiliation_strings":["Department of Electronic Engineering, Faculty of Engineering, Gunma University, Kiryu-shi, Gunma 376, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Faculty of Engineering, Gunma University, Kiryu-shi, Gunma 376, Japan","institution_ids":["https://openalex.org/I165735259"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5059427005","display_name":"Sadao Adachi","orcid":"https://orcid.org/0000-0002-2124-1757","observed_orcids":["https://orcid.org/0000-0002-2124-1757","https://orcid.org/0000-0003-4735-0449"]},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Sadao Adachi","raw_affiliation_strings":["Department of Electronic Engineering, Faculty of Engineering, Gunma University, Kiryu-shi, Gunma 376, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Faculty of Engineering, Gunma University, Kiryu-shi, Gunma 376, Japan","institution_ids":["https://openalex.org/I165735259"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I165735259"],"apc_list":{"value":3500,"currency":"USD","value_usd":3500},"apc_paid":null,"fwci":2.7783,"has_fulltext":false,"cited_by_count":87,"citation_normalized_percentile":{"value":0.88904016,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":93,"max":99},"biblio":{"volume":"77","issue":"3","first_page":"1249","last_page":"1255"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.2538999915122986,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.2538999915122986,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12050","display_name":"Optical Polarization and Ellipsometry","score":0.17319999635219574,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11315","display_name":"Phase-change materials and chalcogenides","score":0.08760000020265579,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/lead-selenide","display_name":"lead selenide","score":0.984000027179718},{"id":"https://openalex.org/keywords/dielectric-function","display_name":"dielectric function","score":0.9810000061988831},{"id":"https://openalex.org/keywords/optical-constants","display_name":"optical constants","score":0.652999997138977},{"id":"https://openalex.org/keywords/critical-point-model","display_name":"critical point model","score":0.8980000019073486},{"id":"https://openalex.org/keywords/refractive-index","display_name":"refractive index","score":0.781000018119812},{"id":"https://openalex.org/keywords/absorption-coefficient","display_name":"absorption coefficient","score":0.9900000095367432},{"id":"https://openalex.org/keywords/reflectivity","display_name":"reflectivity","score":0.8180000185966492},{"id":"https://openalex.org/keywords/optical-properties-of-semiconductors","display_name":"semiconductor optical properties","score":0.6029999852180481}],"concepts":[{"id":"https://openalex.org/C42067758","wikidata":"https://www.wikidata.org/wiki/Q174102","display_name":"Refractive index","level":2,"score":0.7661994695663452},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.7520161271095276},{"id":"https://openalex.org/C18293161","wikidata":"https://www.wikidata.org/wiki/Q898774","display_name":"Ellipsometry","level":3,"score":0.7414283752441406},{"id":"https://openalex.org/C196298200","wikidata":"https://www.wikidata.org/wiki/Q577705","display_name":"Critical point (mathematics)","level":2,"score":0.6795638203620911},{"id":"https://openalex.org/C196224560","wikidata":"https://www.wikidata.org/wiki/Q1424764","display_name":"Kramers\u2013Kronig relations","level":3,"score":0.6579405069351196},{"id":"https://openalex.org/C2988029435","wikidata":"https://www.wikidata.org/wiki/Q211569","display_name":"Dielectric function","level":3,"score":0.6149977445602417},{"id":"https://openalex.org/C2778785133","wikidata":"https://www.wikidata.org/wiki/Q25303639","display_name":"Photon energy","level":3,"score":0.564236581325531},{"id":"https://openalex.org/C159774933","wikidata":"https://www.wikidata.org/wiki/Q902086","display_name":"Attenuation coefficient","level":2,"score":0.5392682552337646},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5281184911727905},{"id":"https://openalex.org/C4839761","wikidata":"https://www.wikidata.org/wiki/Q212111","display_name":"Spectral line","level":2,"score":0.4625960886478424},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.4537111520767212},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.41889747977256775},{"id":"https://openalex.org/C125287762","wikidata":"https://www.wikidata.org/wiki/Q1758948","display_name":"Absorption (acoustics)","level":2,"score":0.4108765721321106},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.40339264273643494},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.3801625967025757},{"id":"https://openalex.org/C41999313","wikidata":"https://www.wikidata.org/wiki/Q489328","display_name":"Molecular physics","level":1,"score":0.34705549478530884},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.3284000754356384},{"id":"https://openalex.org/C159317903","wikidata":"https://www.wikidata.org/wiki/Q3198","display_name":"Photon","level":2,"score":0.2758052349090576},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.22549191117286682},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.18639901280403137},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.1673198938369751},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.09327277541160583},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.08441179990768433},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.07357186079025269},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1063/1.358926","doi":"https://doi.org/10.1063/1.358926","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.358926","pdf_url":null,"source":{"id":"https://openalex.org/S187991544","display_name":"Journal of Applied Physics","issn_l":"0021-8979","issn":["0021-8979","1089-7550","1520-8850"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-d","jufo-1","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Applied Physics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1964015061","https://openalex.org/W1977722766","https://openalex.org/W1986980054","https://openalex.org/W2001041131","https://openalex.org/W2004947809","https://openalex.org/W2005104023","https://openalex.org/W2011425618","https://openalex.org/W2013703013","https://openalex.org/W2020098813","https://openalex.org/W2025969085","https://openalex.org/W2034010375","https://openalex.org/W2038713379","https://openalex.org/W2052967780","https://openalex.org/W2057345945","https://openalex.org/W2060751552","https://openalex.org/W2069081836","https://openalex.org/W2081990200","https://openalex.org/W2083405147","https://openalex.org/W2092536762","https://openalex.org/W2094307297","https://openalex.org/W2134139628","https://openalex.org/W2162123284","https://openalex.org/W4243826237","https://openalex.org/W4247312983"],"related_works":["https://openalex.org/W2052967780","https://openalex.org/W2043679481","https://openalex.org/W1565907160","https://openalex.org/W3033052264","https://openalex.org/W4235192021","https://openalex.org/W2153327589","https://openalex.org/W2773352101","https://openalex.org/W2081641672","https://openalex.org/W2000381633","https://openalex.org/W1986667873"],"abstract_inverted_index":{"The":[0,29],"real":[1],"(\u03b51)":[2],"and":[3,42,58,71,117],"imaginary":[4],"(\u03b52)":[5],"parts":[6],"of":[7,12,120],"the":[8,21,49,54,67,77,87,95,100,111],"dielectric":[9,56,69,89],"function,":[10],"\u03b5(E)=\u03b51(E)+i\u03b52(E),":[11],"PbSe":[13,121],"have":[14],"been":[15],"measured":[16,30,78],"by":[17],"spectroscopic":[18],"ellipsometry":[19],"in":[20],"1.15\u20135.4":[22],"eV":[23],"photon-energy":[24],"range":[25],"at":[26,36],"room":[27],"temperature.":[28],"spectroscopic-ellipsometry":[31],"data":[32,45],"reveal":[33],"distinct":[34],"structures":[35],"three":[37],"critical-point":[38,60,73,102],"energies":[39],"(E1,":[40],"E2,":[41],"E3).":[43],"These":[44],"are":[46,122],"analyzed":[47],"using":[48],"two":[50],"theoretical":[51],"models,":[52],"namely,":[53],"model":[55,68,74,88,103],"function":[57,70,90],"standard":[59,72,101],"model.":[61],"It":[62,82],"is":[63,83],"found":[64,85],"that":[65,86],"both":[66],"successfully":[75],"explain":[76],"derivative":[79],"spectra,":[80,98],"d2\u03b5/dE2.":[81],"also":[84,123],"shows":[91],"excellent":[92],"agreement":[93],"with":[94],"experimental":[96],"\u03b5(E)":[97],"but":[99],"does":[104],"not.":[105],"Dielectric-related":[106],"optical":[107],"constants,":[108],"such":[109],"as":[110],"complex":[112],"refractive":[113],"index,":[114],"absorption":[115],"coefficient,":[116],"normal-incidence":[118],"reflectivity,":[119],"presented.":[124]},"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2025,"cited_by_count":7},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":5},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":2},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":8}],"updated_date":"2026-11-07T11:25:07.637180","created_date":"2016-06-24T00:00:00"}