{"id":"https://openalex.org/W2007172767","doi":"https://doi.org/10.1117/12.140444","title":"Holographic interferometry with single-mode imaging fiber bundle for vibration analyses","display_name":"Holographic interferometry with single-mode imaging fiber bundle for vibration analyses","publication_year":1993,"publication_date":"1993-03-02","ids":{"openalex":"https://openalex.org/W2007172767","doi":"https://doi.org/10.1117/12.140444","mag":"2007172767"},"language":"en","primary_location":{"id":"doi:10.1117/12.140444","doi":"https://doi.org/10.1117/12.140444","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.140444","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109173825","display_name":"Yunlu Zou","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Yunlu Zou","raw_affiliation_strings":["Stuttgart Univ. (United States)","Stuttgart Univ. (USA)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Stuttgart Univ. (United States)","institution_ids":["https://openalex.org/I100066346"]},{"raw_affiliation_string":"Stuttgart Univ. (USA)","institution_ids":["https://openalex.org/I100066346"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5109173825"],"corresponding_institution_ids":["https://openalex.org/I100066346"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.22501012,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"1732","issue":null,"first_page":"577","last_page":"586"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9951000213623047,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9951000213623047,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10205","display_name":"Advanced Fiber Optic Sensors","score":0.0020000000949949026,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11897","display_name":"Digital Holography and Microscopy","score":0.0013000000035390258,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/holographic-interferometry","display_name":"holographic interferometry","score":1.0},{"id":"https://openalex.org/keywords/vibration-measurement","display_name":"vibration measurement","score":0.9470000267028809},{"id":"https://openalex.org/keywords/surface-vibrations","display_name":"surface vibrations","score":0.49300000071525574}],"concepts":[{"id":"https://openalex.org/C187590223","wikidata":"https://www.wikidata.org/wiki/Q527628","display_name":"Holography","level":2,"score":0.8021072149276733},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.7960313558578491},{"id":"https://openalex.org/C128289946","wikidata":"https://www.wikidata.org/wiki/Q5884113","display_name":"Holographic interferometry","level":3,"score":0.7830029726028442},{"id":"https://openalex.org/C172991262","wikidata":"https://www.wikidata.org/wiki/Q5358427","display_name":"Electronic speckle pattern interferometry","level":3,"score":0.7343655228614807},{"id":"https://openalex.org/C166689943","wikidata":"https://www.wikidata.org/wiki/Q850283","display_name":"Interferometry","level":2,"score":0.6782587170600891},{"id":"https://openalex.org/C2778134712","wikidata":"https://www.wikidata.org/wiki/Q1047307","display_name":"Bundle","level":2,"score":0.6429930925369263},{"id":"https://openalex.org/C194232370","wikidata":"https://www.wikidata.org/wiki/Q162","display_name":"Optical fiber","level":2,"score":0.5563720464706421},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.44257062673568726},{"id":"https://openalex.org/C204366326","wikidata":"https://www.wikidata.org/wiki/Q3027650","display_name":"Deformation (meteorology)","level":2,"score":0.4252052307128906},{"id":"https://openalex.org/C44403416","wikidata":"https://www.wikidata.org/wiki/Q178873","display_name":"Stroboscope","level":2,"score":0.4103277325630188},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3711230754852295},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.29041847586631775},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1117/12.140444","doi":"https://doi.org/10.1117/12.140444","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.140444","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2019968359","https://openalex.org/W2079310910","https://openalex.org/W2064496366","https://openalex.org/W2029333703","https://openalex.org/W3176515674","https://openalex.org/W2044451122","https://openalex.org/W30716966","https://openalex.org/W2342779862","https://openalex.org/W2049903407","https://openalex.org/W1967485040"],"abstract_inverted_index":{"Holographic":[0],"interferometry":[1],"in":[2,47],"conjunction":[3],"with":[4,60],"fiber":[5,27],"optics":[6],"is":[7,40,66],"specially":[8],"useful":[9],"for":[10],"the":[11],"measurements":[12],"of":[13,56],"a":[14,18,57],"small":[15],"area":[16],"deformation,":[17],"micromovement,":[19],"or":[20],"an":[21,43],"intracavity":[22],"deformation.":[23],"A":[24],"single-mode":[25],"imaging":[26],"bundle":[28],"can":[29],"give":[30],"higher":[31],"resolution,":[32],"better":[33],"coherency,":[34],"and":[35,52],"less":[36],"sensitivity":[37],"if":[38],"it":[39],"used":[41],"as":[42],"image":[44],"guide":[45],"system":[46],"holographic":[48],"interferometry.":[49],"Time-average":[50],"hologram":[51,55],"stroboscopic":[53],"double-exposure":[54],"vibrating":[58],"surface":[59],"acceptable":[61],"signal":[62],"to":[63],"noise":[64],"ratio":[65],"presented.":[67]},"counts_by_year":[],"updated_date":"2026-08-21T09:56:20.448147","created_date":"2016-06-24T00:00:00"}