{"id":"https://openalex.org/W2007157799","doi":"https://doi.org/10.1016/0040-6090(87)90436-6","title":"Structure of GaAs-In0.2Ga0.8As heterojunction interface studied by electron spectroscopies: X-ray photoelectron spectroscopy, tunable electron energy loss spectroscopy and Auger electron spectroscopy","display_name":"Structure of GaAs-In0.2Ga0.8As heterojunction interface studied by electron spectroscopies: X-ray photoelectron spectroscopy, tunable electron energy loss spectroscopy and Auger electron spectroscopy","publication_year":1987,"publication_date":"1987-02-01","ids":{"openalex":"https://openalex.org/W2007157799","doi":"https://doi.org/10.1016/0040-6090(87)90436-6","mag":"2007157799"},"language":"en","primary_location":{"id":"doi:10.1016/0040-6090(87)90436-6","doi":"https://doi.org/10.1016/0040-6090(87)90436-6","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0040-6090(87)90436-6","pdf_url":null,"source":{"id":"https://openalex.org/S84339699","display_name":"Thin Solid Films","issn_l":"0040-6090","issn":["0040-6090","1879-2731"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-1","norway-1","poland-70","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Thin Solid Films","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5078524981","display_name":"Motohiro Iwami","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I163770644","display_name":"Okayama University","ror":"https://ror.org/02pc6pc55","country_code":"JP","type":"education","lineage":["https://openalex.org/I163770644"]},{"id":"https://openalex.org/I4405285966","display_name":"Research Laboratory for Surface Science, Okayama University","ror":"https://ror.org/00sv8p705","country_code":"JP","type":"facility","lineage":["https://openalex.org/I163770644","https://openalex.org/I4405285966"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"M. Iwami","raw_affiliation_strings":["Research Laboratory for Surface Science, Faculty of Science, Okayama University, Okayama, 700, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research Laboratory for Surface Science, Faculty of Science, Okayama University, Okayama, 700, Japan","institution_ids":["https://openalex.org/I163770644","https://openalex.org/I4405285966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110102048","display_name":"Yohei Watanabe","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I206011266","display_name":"Kwansei Gakuin University","ror":"https://ror.org/02qf2tx24","country_code":"JP","type":"education","lineage":["https://openalex.org/I206011266"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Y. Watanabe","raw_affiliation_strings":["Faculty of Science, Kwansei Gakuin University, Nishinomiya 662, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Science, Kwansei Gakuin University, Nishinomiya 662, Japan","institution_ids":["https://openalex.org/I206011266"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111866041","display_name":"Hiromu Kato","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I206011266","display_name":"Kwansei Gakuin University","ror":"https://ror.org/02qf2tx24","country_code":"JP","type":"education","lineage":["https://openalex.org/I206011266"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"H. Kato","raw_affiliation_strings":["Faculty of Science, Kwansei Gakuin University, Nishinomiya 662, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Science, Kwansei Gakuin University, Nishinomiya 662, Japan","institution_ids":["https://openalex.org/I206011266"]}]},{"author_position":"middle","author":{"id":null,"display_name":"M. Nakayama","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I206011266","display_name":"Kwansei Gakuin University","ror":"https://ror.org/02qf2tx24","country_code":"JP","type":"education","lineage":["https://openalex.org/I206011266"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"M. Nakayama","raw_affiliation_strings":["Faculty of Science, Kwansei Gakuin University, Nishinomiya 662, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Science, Kwansei Gakuin University, Nishinomiya 662, Japan","institution_ids":["https://openalex.org/I206011266"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5080299718","display_name":"Nobuyuki Sano","orcid":"https://orcid.org/0000-0002-6143-2080","observed_orcids":["https://orcid.org/0000-0002-6143-2080"]},"institutions":[{"id":"https://openalex.org/I206011266","display_name":"Kwansei Gakuin University","ror":"https://ror.org/02qf2tx24","country_code":"JP","type":"education","lineage":["https://openalex.org/I206011266"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"N. Sano","raw_affiliation_strings":["Faculty of Science, Kwansei Gakuin University, Nishinomiya 662, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Science, Kwansei Gakuin University, Nishinomiya 662, Japan","institution_ids":["https://openalex.org/I206011266"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":3120,"currency":"USD","value_usd":3120},"apc_paid":null,"fwci":0.2728,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.42942033,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":94},"biblio":{"volume":"146","issue":"3","first_page":"291","last_page":"297"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.8895999789237976,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.8895999789237976,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.09719999879598618,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.0038999998942017555,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/band-discontinuity","display_name":"band discontinuity","score":0.9520000219345093},{"id":"https://openalex.org/keywords/diffuse-interface","display_name":"diffuse interface","score":0.6370000243186951},{"id":"https://openalex.org/keywords/interface-thickness","display_name":"interface thickness","score":0.7889999747276306},{"id":"https://openalex.org/keywords/electronic-structure","display_name":"electronic structure","score":0.5080000162124634},{"id":"https://openalex.org/keywords/iii-v-semiconductors","display_name":"III-V semiconductors","score":0.7250000238418579}],"concepts":[{"id":"https://openalex.org/C175708663","wikidata":"https://www.wikidata.org/wiki/Q899559","display_name":"X-ray photoelectron spectroscopy","level":2,"score":0.8372430801391602},{"id":"https://openalex.org/C25442681","wikidata":"https://www.wikidata.org/wiki/Q28087","display_name":"Auger electron spectroscopy","level":2,"score":0.8065862655639648},{"id":"https://openalex.org/C33893257","wikidata":"https://www.wikidata.org/wiki/Q905243","display_name":"Electron spectroscopy","level":3,"score":0.7032116055488586},{"id":"https://openalex.org/C32891209","wikidata":"https://www.wikidata.org/wiki/Q483666","display_name":"Spectroscopy","level":2,"score":0.7021658420562744},{"id":"https://openalex.org/C79794668","wikidata":"https://www.wikidata.org/wiki/Q1616270","display_name":"Heterojunction","level":2,"score":0.6166671514511108},{"id":"https://openalex.org/C178187954","wikidata":"https://www.wikidata.org/wiki/Q902328","display_name":"Electron energy loss spectroscopy","level":3,"score":0.6103160381317139},{"id":"https://openalex.org/C147120987","wikidata":"https://www.wikidata.org/wiki/Q2225","display_name":"Electron","level":2,"score":0.5931562185287476},{"id":"https://openalex.org/C25032081","wikidata":"https://www.wikidata.org/wiki/Q1532011","display_name":"Soft X-ray emission spectroscopy","level":4,"score":0.566290020942688},{"id":"https://openalex.org/C143481972","wikidata":"https://www.wikidata.org/wiki/Q901775","display_name":"X-ray spectroscopy","level":3,"score":0.553753674030304},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.49260836839675903},{"id":"https://openalex.org/C147438087","wikidata":"https://www.wikidata.org/wiki/Q386334","display_name":"Energy-dispersive X-ray spectroscopy","level":3,"score":0.45886465907096863},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.4322403073310852},{"id":"https://openalex.org/C171627272","wikidata":"https://www.wikidata.org/wiki/Q719512","display_name":"Auger effect","level":3,"score":0.42609700560569763},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.35967597365379333},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.20393291115760803},{"id":"https://openalex.org/C26771246","wikidata":"https://www.wikidata.org/wiki/Q321095","display_name":"Scanning electron microscope","level":2,"score":0.19699737429618835},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.17982211709022522},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.1689242720603943},{"id":"https://openalex.org/C46141821","wikidata":"https://www.wikidata.org/wiki/Q209402","display_name":"Nuclear magnetic resonance","level":1,"score":0.15891841053962708},{"id":"https://openalex.org/C133279788","wikidata":"https://www.wikidata.org/wiki/Q7804835","display_name":"Time-resolved spectroscopy","level":3,"score":0.1531243622303009},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/0040-6090(87)90436-6","doi":"https://doi.org/10.1016/0040-6090(87)90436-6","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0040-6090(87)90436-6","pdf_url":null,"source":{"id":"https://openalex.org/S84339699","display_name":"Thin Solid Films","issn_l":"0040-6090","issn":["0040-6090","1879-2731"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-1","norway-1","poland-70","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Thin Solid Films","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W579351848","https://openalex.org/W1641884523","https://openalex.org/W1969482299","https://openalex.org/W1970164715","https://openalex.org/W1976628376","https://openalex.org/W2004967694","https://openalex.org/W2014686790","https://openalex.org/W2016777395","https://openalex.org/W2026848063","https://openalex.org/W2028711483","https://openalex.org/W2029241703","https://openalex.org/W2046528357","https://openalex.org/W2075234137","https://openalex.org/W2089334184","https://openalex.org/W2104007248"],"related_works":["https://openalex.org/W2042011693","https://openalex.org/W2127272795","https://openalex.org/W2080406034","https://openalex.org/W2019380456","https://openalex.org/W1983155550","https://openalex.org/W2050451203","https://openalex.org/W2037414205","https://openalex.org/W2041342224","https://openalex.org/W4230688591","https://openalex.org/W4232058153"],"abstract_inverted_index":null,"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1}],"updated_date":"2026-10-24T09:50:30.924529","created_date":"2016-06-24T00:00:00"}