{"id":"https://openalex.org/W2005693038","doi":"https://doi.org/10.1063/1.106862","title":"Tip artifacts of microfabricated force sensors for atomic force microscopy","display_name":"Tip artifacts of microfabricated force sensors for atomic force microscopy","publication_year":1992,"publication_date":"1992-06-01","ids":{"openalex":"https://openalex.org/W2005693038","doi":"https://doi.org/10.1063/1.106862","mag":"2005693038"},"language":"en","primary_location":{"id":"doi:10.1063/1.106862","doi":"https://doi.org/10.1063/1.106862","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.106862","pdf_url":null,"source":{"id":"https://openalex.org/S105243760","display_name":"Applied Physics Letters","issn_l":"0003-6951","issn":["0003-6951","1077-3118","1520-8842"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-3","ki-jl-1","norway-2"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Applied Physics Letters","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"http://escholarship.mcgill.ca/downloads/2z10wv24b","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5081818835","display_name":"Peter Gr\u00fctter","orcid":"https://orcid.org/0000-0003-1719-8239","observed_orcids":["https://orcid.org/0000-0003-1719-8239"]},"institutions":[{"id":"https://openalex.org/I1850255","display_name":"University of Basel","ror":"https://ror.org/02s6k3f65","country_code":"CH","type":"education","lineage":["https://openalex.org/I1850255"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"P. Gr\u00fctter","raw_affiliation_strings":["Institut f\u00fcr Physik, Universit\u00e4t Basel, Klingelbergstrasse 82, 4056 Basel, Switzerland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut f\u00fcr Physik, Universit\u00e4t Basel, Klingelbergstrasse 82, 4056 Basel, Switzerland","institution_ids":["https://openalex.org/I1850255"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047026057","display_name":"W. Zimmermann-Edling","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1850255","display_name":"University of Basel","ror":"https://ror.org/02s6k3f65","country_code":"CH","type":"education","lineage":["https://openalex.org/I1850255"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"W. Zimmermann-Edling","raw_affiliation_strings":["Institut f\u00fcr Physik, Universit\u00e4t Basel, Klingelbergstrasse 82, 4056 Basel, Switzerland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut f\u00fcr Physik, Universit\u00e4t Basel, Klingelbergstrasse 82, 4056 Basel, Switzerland","institution_ids":["https://openalex.org/I1850255"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108759141","display_name":"D. Brodbeck","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1850255","display_name":"University of Basel","ror":"https://ror.org/02s6k3f65","country_code":"CH","type":"education","lineage":["https://openalex.org/I1850255"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"D. Brodbeck","raw_affiliation_strings":["Institut f\u00fcr Physik, Universit\u00e4t Basel, Klingelbergstrasse 82, 4056 Basel, Switzerland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut f\u00fcr Physik, Universit\u00e4t Basel, Klingelbergstrasse 82, 4056 Basel, Switzerland","institution_ids":["https://openalex.org/I1850255"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I1850255"],"apc_list":null,"apc_paid":null,"fwci":8.085,"has_fulltext":true,"cited_by_count":94,"citation_normalized_percentile":{"value":0.98592446,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":88,"max":98},"biblio":{"volume":"60","issue":"22","first_page":"2741","last_page":"2743"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/atomic-force-microscope-tip","display_name":"atomic force microscope tip","score":0.8560000061988831},{"id":"https://openalex.org/keywords/surface-roughness","display_name":"surface roughness","score":0.6019999980926514}],"concepts":[{"id":"https://openalex.org/C527607","wikidata":"https://www.wikidata.org/wiki/Q175538","display_name":"Microfabrication","level":4,"score":0.8427996039390564},{"id":"https://openalex.org/C177731217","wikidata":"https://www.wikidata.org/wiki/Q2622244","display_name":"Mesoscopic physics","level":2,"score":0.706666111946106},{"id":"https://openalex.org/C102951782","wikidata":"https://www.wikidata.org/wiki/Q49295","display_name":"Atomic force microscopy","level":2,"score":0.6930046677589417},{"id":"https://openalex.org/C206008964","wikidata":"https://www.wikidata.org/wiki/Q5159384","display_name":"Conductive atomic force microscopy","level":3,"score":0.692651093006134},{"id":"https://openalex.org/C181635281","wikidata":"https://www.wikidata.org/wiki/Q2799395","display_name":"Magnetic force microscope","level":4,"score":0.6522059440612793},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6282662153244019},{"id":"https://openalex.org/C43826995","wikidata":"https://www.wikidata.org/wiki/Q17014103","display_name":"Atomic force acoustic microscopy","level":5,"score":0.6261975765228271},{"id":"https://openalex.org/C147080431","wikidata":"https://www.wikidata.org/wiki/Q1074953","display_name":"Microscopy","level":2,"score":0.5412738919258118},{"id":"https://openalex.org/C71246147","wikidata":"https://www.wikidata.org/wiki/Q16029538","display_name":"Non-contact atomic force microscopy","level":4,"score":0.5149365067481995},{"id":"https://openalex.org/C26771246","wikidata":"https://www.wikidata.org/wiki/Q321095","display_name":"Scanning electron microscope","level":2,"score":0.5131129026412964},{"id":"https://openalex.org/C83898325","wikidata":"https://www.wikidata.org/wiki/Q1324110","display_name":"Kelvin probe force microscope","level":3,"score":0.5117557048797607},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.48351624608039856},{"id":"https://openalex.org/C66823137","wikidata":"https://www.wikidata.org/wiki/Q757568","display_name":"Atomic units","level":2,"score":0.456287682056427},{"id":"https://openalex.org/C180541679","wikidata":"https://www.wikidata.org/wiki/Q5090460","display_name":"Chemical force microscopy","level":5,"score":0.44567397236824036},{"id":"https://openalex.org/C16777580","wikidata":"https://www.wikidata.org/wiki/Q7430068","display_name":"Scanning ion-conductance microscopy","level":4,"score":0.434886634349823},{"id":"https://openalex.org/C36628996","wikidata":"https://www.wikidata.org/wiki/Q907287","display_name":"Scanning probe microscopy","level":2,"score":0.41891324520111084},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3342347741127014},{"id":"https://openalex.org/C187921700","wikidata":"https://www.wikidata.org/wiki/Q7430074","display_name":"Scanning confocal electron microscopy","level":3,"score":0.22433310747146606},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.14464300870895386},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.11772847175598145},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.07847031950950623},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C142724271","wikidata":"https://www.wikidata.org/wiki/Q7208","display_name":"Pathology","level":1,"score":0.0},{"id":"https://openalex.org/C204787440","wikidata":"https://www.wikidata.org/wiki/Q188504","display_name":"Alternative medicine","level":2,"score":0.0},{"id":"https://openalex.org/C136525101","wikidata":"https://www.wikidata.org/wiki/Q5428139","display_name":"Fabrication","level":3,"score":0.0},{"id":"https://openalex.org/C115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C32546565","wikidata":"https://www.wikidata.org/wiki/Q856711","display_name":"Magnetization","level":3,"score":0.0}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.1063/1.106862","doi":"https://doi.org/10.1063/1.106862","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.106862","pdf_url":null,"source":{"id":"https://openalex.org/S105243760","display_name":"Applied Physics Letters","issn_l":"0003-6951","issn":["0003-6951","1077-3118","1520-8842"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-3","ki-jl-1","norway-2"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Applied Physics Letters","raw_type":"journal-article"},{"id":"pmh:oai:escholarship.mcgill.ca:kw52jc61x","doi":null,"is_oa":true,"landing_page_url":"https://escholarship.mcgill.ca/concern/articles/kw52jc61x","pdf_url":"http://escholarship.mcgill.ca/downloads/2z10wv24b","source":{"id":"https://openalex.org/S4306401568","display_name":"eScholarship@McGill (McGill)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I5023651","host_organization_name":"McGill University","host_organization_lineage":["https://openalex.org/I5023651"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://aip.scitation.org/doi/10.1063/1.106862","raw_type":"Article"},{"id":"pmh:oai:digitool.library.mcgill.ca:95816","doi":null,"is_oa":false,"landing_page_url":"http://digitool.Library.McGill.CA:80/R/?func=dbin-jump-full&object_id=95816","pdf_url":null,"source":{"id":"https://openalex.org/S4306401568","display_name":"eScholarship@McGill (McGill)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I5023651","host_organization_name":"McGill University","host_organization_lineage":["https://openalex.org/I5023651"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://aip.scitation.org/doi/10.1063/1.106862","raw_type":"PostPrint"},{"id":"pmh:oai:mcgill.scholaris.ca:20.500.14905/79258","doi":null,"is_oa":false,"landing_page_url":"https://hdl.handle.net/20.500.14905/79258","pdf_url":null,"source":{"id":"https://openalex.org/S4306401568","display_name":"eScholarship@McGill (McGill)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I5023651","host_organization_name":"McGill University","host_organization_lineage":["https://openalex.org/I5023651"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"https://vocabularies.coar-repositories.org/resource_types/c_6501/"}],"best_oa_location":{"id":"pmh:oai:escholarship.mcgill.ca:kw52jc61x","doi":null,"is_oa":true,"landing_page_url":"https://escholarship.mcgill.ca/concern/articles/kw52jc61x","pdf_url":"http://escholarship.mcgill.ca/downloads/2z10wv24b","source":{"id":"https://openalex.org/S4306401568","display_name":"eScholarship@McGill (McGill)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I5023651","host_organization_name":"McGill University","host_organization_lineage":["https://openalex.org/I5023651"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://aip.scitation.org/doi/10.1063/1.106862","raw_type":"Article"},"sustainable_development_goals":[],"sustainable_development_goals_aurora":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2005693038.pdf","grobid_xml":"https://content.openalex.org/works/W2005693038.grobid-xml"},"referenced_works_count":12,"referenced_works":["https://openalex.org/W1984906414","https://openalex.org/W2009905036","https://openalex.org/W2012391978","https://openalex.org/W2029499202","https://openalex.org/W2036411543","https://openalex.org/W2037246726","https://openalex.org/W2040916297","https://openalex.org/W2043966586","https://openalex.org/W2052734619","https://openalex.org/W2128193161","https://openalex.org/W2150212867","https://openalex.org/W3150248096"],"related_works":["https://openalex.org/W1486910393","https://openalex.org/W2052929500","https://openalex.org/W99870850","https://openalex.org/W2112760685","https://openalex.org/W1993749717","https://openalex.org/W2080446735","https://openalex.org/W2289275160","https://openalex.org/W2035319756","https://openalex.org/W2087155073","https://openalex.org/W2083769693"],"abstract_inverted_index":{"It":[0],"is":[1],"demonstrated":[2],"that":[3],"due":[4],"to":[5,76],"inevitable":[6],"intrinsic":[7],"imperfections":[8],"in":[9,74],"the":[10,33,50,67,71],"microfabrication":[11],"process":[12],"of":[13,20,42,49,63,69],"atomic":[14],"force":[15],"microscopy":[16,47],"(AFM)":[17],"tips,":[18],"images":[19,31,48],"rough":[21],"surfaces":[22],"can":[23],"be":[24],"totally":[25],"dominated":[26],"by":[27],"tip":[28,35,51,55,72],"artifacts.":[29],"These":[30,54],"reflect":[32],"mesoscopic":[34],"shape":[36,73],"as":[37],"concluded":[38],"from":[39],"a":[40,61],"comparison":[41],"AFM":[43],"and":[44,52],"scanning":[45],"electron":[46],"sample.":[53],"artifacts":[56],"have":[57],"been":[58],"found":[59],"on":[60],"scale":[62],"20\u2013600":[64],"nm,":[65],"showing":[66],"necessity":[68],"characterizing":[70],"order":[75],"make":[77],"reliable":[78],"sample-specific":[79],"statements.":[80]},"counts_by_year":[{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":1},{"year":2012,"cited_by_count":4}],"updated_date":"2026-09-02T18:50:13.731487","created_date":"2025-10-10T00:00:00"}