{"id":"https://openalex.org/W2005296248","doi":"https://doi.org/10.15676/ijeei.2014.6.4.5","title":"Electric Field Distribution around Contaminating Wire Particles Inside Gas Insulated Bus Duct","display_name":"Electric Field Distribution around Contaminating Wire Particles Inside Gas Insulated Bus Duct","publication_year":2014,"publication_date":"2014-12-30","ids":{"openalex":"https://openalex.org/W2005296248","doi":"https://doi.org/10.15676/ijeei.2014.6.4.5","mag":"2005296248"},"language":"en","primary_location":{"id":"doi:10.15676/ijeei.2014.6.4.5","doi":"https://doi.org/10.15676/ijeei.2014.6.4.5","is_oa":true,"landing_page_url":"https://doi.org/10.15676/ijeei.2014.6.4.5","pdf_url":"https://doi.org/10.15676/ijeei.2014.6.4.5","source":{"id":"https://openalex.org/S4210198151","display_name":"International Journal on Electrical Engineering and Informatics","issn_l":"2085-6830","issn":["2085-6830","2087-5886"],"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":["norway-1","poland-20","russia-white-list-3"],"host_organization":"https://openalex.org/P4310315045","host_organization_name":"School of Electrical Engineering and Informatics","host_organization_lineage":["https://openalex.org/P4310315045"],"host_organization_lineage_names":["School of Electrical Engineering and Informatics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal on Electrical Engineering and Informatics","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"https://doi.org/10.15676/ijeei.2014.6.4.5","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102340943","display_name":"Mousa A. Abd\u2010Allah","orcid":"https://orcid.org/0000-0002-5765-8562","observed_orcids":["https://orcid.org/0000-0002-5765-8562"]},"institutions":[{"id":"https://openalex.org/I207547235","display_name":"Benha University","ror":"https://ror.org/03tn5ee41","country_code":"EG","type":"education","lineage":["https://openalex.org/I207547235"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Mousa A Abd-Allah","raw_affiliation_strings":["Electrical Engineering Department, Faculty of Engineering at Shoubra, Benha University, Cairo, Egypt"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, Faculty of Engineering at Shoubra, Benha University, Cairo, Egypt","institution_ids":["https://openalex.org/I207547235"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000142013","display_name":"Sayed A. Ward","orcid":"https://orcid.org/0000-0002-2638-3543","observed_orcids":["https://orcid.org/0000-0002-2638-3543"]},"institutions":[{"id":"https://openalex.org/I207547235","display_name":"Benha University","ror":"https://ror.org/03tn5ee41","country_code":"EG","type":"education","lineage":["https://openalex.org/I207547235"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Sayed A Ward","raw_affiliation_strings":["Electrical Engineering Department, Faculty of Engineering at Shoubra, Benha University, Cairo, Egypt"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, Faculty of Engineering at Shoubra, Benha University, Cairo, Egypt","institution_ids":["https://openalex.org/I207547235"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5035855535","display_name":"Amr A. Youssef","orcid":"https://orcid.org/0000-0002-4721-9531","observed_orcids":["https://orcid.org/0000-0002-4721-9531"]},"institutions":[{"id":"https://openalex.org/I207547235","display_name":"Benha University","ror":"https://ror.org/03tn5ee41","country_code":"EG","type":"education","lineage":["https://openalex.org/I207547235"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Amr A Youssef","raw_affiliation_strings":["Electrical Engineering Department, Faculty of Engineering at Shoubra, Benha University, Cairo, Egypt"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, Faculty of Engineering at Shoubra, Benha University, Cairo, Egypt","institution_ids":["https://openalex.org/I207547235"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I207547235"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":{"value":0.06929705,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"6","issue":"4","first_page":"698","last_page":"716"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12077","display_name":"Vacuum and Plasma Arcs","score":0.0006000000284984708,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14502","display_name":"High-Voltage Power Transmission Systems","score":0.00019999999494757503,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electric-field-distribution","display_name":"electric field distribution","score":0.9490000009536743},{"id":"https://openalex.org/keywords/particulate-contamination","display_name":"particulate contamination","score":0.6349999904632568},{"id":"https://openalex.org/keywords/electrostatic-modeling","display_name":"electrostatic modeling","score":0.8650000095367432},{"id":"https://openalex.org/keywords/dielectric-coating","display_name":"dielectric coating","score":0.8899999856948853},{"id":"https://openalex.org/keywords/insulation-breakdown","display_name":"insulation failure","score":0.777999997138977}],"concepts":[{"id":"https://openalex.org/C2781212128","wikidata":"https://www.wikidata.org/wiki/Q2256181","display_name":"Duct (anatomy)","level":2,"score":0.5769535899162292},{"id":"https://openalex.org/C60799052","wikidata":"https://www.wikidata.org/wiki/Q46221","display_name":"Electric field","level":2,"score":0.5423595905303955},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4378502666950226},{"id":"https://openalex.org/C39432304","wikidata":"https://www.wikidata.org/wiki/Q188847","display_name":"Environmental science","level":0,"score":0.38708651065826416},{"id":"https://openalex.org/C57879066","wikidata":"https://www.wikidata.org/wiki/Q41217","display_name":"Mechanics","level":1,"score":0.34805065393447876},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.33016133308410645},{"id":"https://openalex.org/C171146098","wikidata":"https://www.wikidata.org/wiki/Q124192","display_name":"Automotive engineering","level":1,"score":0.3214600086212158},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.276436984539032},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.18754631280899048},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.08815810084342957},{"id":"https://openalex.org/C142724271","wikidata":"https://www.wikidata.org/wiki/Q7208","display_name":"Pathology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.15676/ijeei.2014.6.4.5","doi":"https://doi.org/10.15676/ijeei.2014.6.4.5","is_oa":true,"landing_page_url":"https://doi.org/10.15676/ijeei.2014.6.4.5","pdf_url":"https://doi.org/10.15676/ijeei.2014.6.4.5","source":{"id":"https://openalex.org/S4210198151","display_name":"International Journal on Electrical Engineering and Informatics","issn_l":"2085-6830","issn":["2085-6830","2087-5886"],"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":["norway-1","poland-20","russia-white-list-3"],"host_organization":"https://openalex.org/P4310315045","host_organization_name":"School of Electrical Engineering and Informatics","host_organization_lineage":["https://openalex.org/P4310315045"],"host_organization_lineage_names":["School of Electrical Engineering and Informatics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal on Electrical Engineering and Informatics","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.15676/ijeei.2014.6.4.5","doi":"https://doi.org/10.15676/ijeei.2014.6.4.5","is_oa":true,"landing_page_url":"https://doi.org/10.15676/ijeei.2014.6.4.5","pdf_url":"https://doi.org/10.15676/ijeei.2014.6.4.5","source":{"id":"https://openalex.org/S4210198151","display_name":"International Journal on Electrical Engineering and Informatics","issn_l":"2085-6830","issn":["2085-6830","2087-5886"],"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":["norway-1","poland-20","russia-white-list-3"],"host_organization":"https://openalex.org/P4310315045","host_organization_name":"School of Electrical Engineering and Informatics","host_organization_lineage":["https://openalex.org/P4310315045"],"host_organization_lineage_names":["School of Electrical Engineering and Informatics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal on Electrical Engineering and Informatics","raw_type":"journal-article"},"sustainable_development_goals":[],"sustainable_development_goals_aurora":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2005296248.pdf","grobid_xml":"https://content.openalex.org/works/W2005296248.grobid-xml"},"referenced_works_count":3,"referenced_works":["https://openalex.org/W200962776","https://openalex.org/W2057615351","https://openalex.org/W2342460586"],"related_works":["https://openalex.org/W2082380173","https://openalex.org/W7096898894","https://openalex.org/W7098751807","https://openalex.org/W2007285510","https://openalex.org/W7218243184","https://openalex.org/W4229926775","https://openalex.org/W7118183343","https://openalex.org/W2323229591","https://openalex.org/W7084389620","https://openalex.org/W2117918977"],"abstract_inverted_index":{"The":[0],"presence":[1],"of":[2,10,15,27,61,73,89,93,97,121,126,130,159],"metallic":[3],"contaminating":[4,132],"particles":[5,104,133],"lowered":[6],"the":[7,11,16,25,28,48,53,58,82,90,94,111,135,157,166],"dielectric":[8,91],"strength":[9],"gas":[12,20,62],"sharply.The":[13],"determination":[14],"insulation":[17],"breakdown":[18],"inside":[19,31,52],"insulated":[21,63],"bus":[22,54,64],"duct":[23,65],"requires":[24],"knowledge":[26],"field":[29,50,84,113,137,142,168],"distribution":[30,51,114,143],"it.Finite":[32],"Element":[33],"Method":[34],"(FEM)":[35],"has":[36],"been":[37],"used":[38],"throughout":[39],"this":[40,56,108,116],"work,":[41],"for":[42],"its":[43],"favorable":[44],"accuracy,":[45],"to":[46],"calculate":[47],"electric":[49,83,112,136,167],"duct.In":[55],"paper,":[57],"electrostatic":[59],"modeling":[60],"(GIBD)":[66],"with":[67,146],"particle":[68,74,122,129,151,162],"contamination":[69,152],"is":[70,86,99,118,153,170],"studied.The":[71],"effect":[72,88,120,158],"length,":[75],"hemi-spherical":[76],"radius":[77,125],"and":[78,101,110,124,147,155,163],"ratio":[79],"(L/r)":[80],"on":[81,134,165],"values":[85,138,169],"presented.The":[87,119],"coating":[92],"inner":[95],"surface":[96],"enclosure,":[98],"presented":[100,154],"discussed.Multi-contaminating":[102],"fixed":[103,128],"are":[105,139],"considered":[106],"in":[107,115],"work":[109],"case":[117],"length":[123],"middle":[127],"multi":[131],"also":[140,171],"studied.Electric":[141],"around":[144],"disc-spacer":[145],"without":[148],"an":[149],"earthed":[150],"discussed.Finally,":[156],"distance":[160],"between":[161],"spacer":[164],"studied.":[172]},"counts_by_year":[],"updated_date":"2026-10-30T12:39:25.321706","created_date":"2016-06-24T00:00:00"}