{"id":"https://openalex.org/W2005276431","doi":"https://doi.org/10.1364/ao.49.002588","title":"Height measurement of transparent objects by adopting differential interference contrast technology","display_name":"Height measurement of transparent objects by adopting differential interference contrast technology","publication_year":2010,"publication_date":"2010-04-30","ids":{"openalex":"https://openalex.org/W2005276431","doi":"https://doi.org/10.1364/ao.49.002588","mag":"2005276431"},"language":"en","primary_location":{"id":"doi:10.1364/ao.49.002588","doi":"https://doi.org/10.1364/ao.49.002588","is_oa":false,"landing_page_url":"https://doi.org/10.1364/ao.49.002588","pdf_url":null,"source":{"id":"https://openalex.org/S4210211917","display_name":"Applied Optics","issn_l":"0003-6935","issn":["0003-6935","1539-4522","1540-8981","1559-128X","2155-3165"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["anvur-scientific","dongbi-c","jufo-1","medline","norway-1","poland-100","russia-white-list-2"],"host_organization":"https://openalex.org/P4310315679","host_organization_name":"Optica Publishing Group","host_organization_lineage":["https://openalex.org/P4310315679"],"host_organization_lineage_names":["Optica Publishing Group"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Applied Optics","raw_type":"journal-article"},"parent_works":[],"lineage":["https://openalex.org/W2005276431"],"child_works_count":0,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5045646363","display_name":"Sheng\u2010Kang Yu","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Sheng-Kang Yu","raw_affiliation_strings":["Department of Power Mechanical Engineering, National Tsing Hua University, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Power Mechanical Engineering, National Tsing Hua University, Taiwan","institution_ids":["https://openalex.org/I25846049"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023357798","display_name":"Ting\u2010Kun Liu","orcid":"https://orcid.org/0000-0002-2656-1071","observed_orcids":["https://orcid.org/0000-0002-2656-1071"]},"institutions":[{"id":"https://openalex.org/I4210148468","display_name":"Industrial Technology Research Institute","ror":"https://ror.org/05szzwt63","country_code":"TW","type":"nonprofit","lineage":["https://openalex.org/I4210148468"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Ting-Kun Liu","raw_affiliation_strings":["Center for Measurement Standards, Industrial Technology Research Institute, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Measurement Standards, Industrial Technology Research Institute, Taiwan","institution_ids":["https://openalex.org/I4210148468"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102155314","display_name":"Shih\u2010Chieh Lin","orcid":"https://orcid.org/0000-0002-0759-7095","observed_orcids":["https://orcid.org/0000-0002-0759-7095"]},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Shih-Chieh Lin","raw_affiliation_strings":["Department of Power Mechanical Engineering, National Tsing Hua University, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Power Mechanical Engineering, National Tsing Hua University, Taiwan","institution_ids":["https://openalex.org/I25846049"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5102155314"],"corresponding_institution_ids":["https://openalex.org/I25846049"],"apc_list":null,"apc_paid":null,"fwci":0.9201,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.76843107,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":87,"max":95},"biblio":{"volume":"49","issue":"14","first_page":"2588","last_page":"2588"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9940999746322632,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9940999746322632,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11897","display_name":"Digital Holography and Microscopy","score":0.004800000227987766,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.00019999999494757503,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/differential-interference-contrast-microscopy","display_name":"differential interference contrast microscopy","score":0.9330000281333923},{"id":"https://openalex.org/keywords/transparent-objects","display_name":"transparent objects","score":0.7400000095367432},{"id":"https://openalex.org/keywords/height-measurement","display_name":"height measurement","score":0.9279999732971191},{"id":"https://openalex.org/keywords/noise-reduction","display_name":"noise reduction","score":0.7839999794960022},{"id":"https://openalex.org/keywords/surface-profile-reconstruction","display_name":"surface profile reconstruction","score":0.9700000286102295},{"id":"https://openalex.org/keywords/dimensional-metrology","display_name":"dimensional metrology","score":0.42800000309944153}],"concepts":[{"id":"https://openalex.org/C109986877","wikidata":"https://www.wikidata.org/wiki/Q899173","display_name":"Differential interference contrast microscopy","level":3,"score":0.838398277759552},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.8072085380554199},{"id":"https://openalex.org/C32022120","wikidata":"https://www.wikidata.org/wiki/Q797225","display_name":"Interference (communication)","level":3,"score":0.7416089773178101},{"id":"https://openalex.org/C2776502983","wikidata":"https://www.wikidata.org/wiki/Q690182","display_name":"Contrast (vision)","level":2,"score":0.5813643336296082},{"id":"https://openalex.org/C152194808","wikidata":"https://www.wikidata.org/wiki/Q12715702","display_name":"Interference microscopy","level":3,"score":0.5390536189079285},{"id":"https://openalex.org/C2778465081","wikidata":"https://www.wikidata.org/wiki/Q5275356","display_name":"Differential phase","level":3,"score":0.49886178970336914},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.4978172779083252},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.4886026978492737},{"id":"https://openalex.org/C100921725","wikidata":"https://www.wikidata.org/wiki/Q1650811","display_name":"Spatial frequency","level":2,"score":0.488209992647171},{"id":"https://openalex.org/C202799725","wikidata":"https://www.wikidata.org/wiki/Q272035","display_name":"Accuracy and precision","level":2,"score":0.42731761932373047},{"id":"https://openalex.org/C102519508","wikidata":"https://www.wikidata.org/wiki/Q6520159","display_name":"Fourier transform","level":2,"score":0.4203771948814392},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.38957512378692627},{"id":"https://openalex.org/C67649825","wikidata":"https://www.wikidata.org/wiki/Q196538","display_name":"Microscope","level":2,"score":0.33768242597579956},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.32548537850379944},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.32193154096603394},{"id":"https://openalex.org/C147080431","wikidata":"https://www.wikidata.org/wiki/Q1074953","display_name":"Microscopy","level":2,"score":0.24569818377494812},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.2367965579032898},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2241811454296112},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.08824014663696289},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1364/ao.49.002588","doi":"https://doi.org/10.1364/ao.49.002588","is_oa":false,"landing_page_url":"https://doi.org/10.1364/ao.49.002588","pdf_url":null,"source":{"id":"https://openalex.org/S4210211917","display_name":"Applied Optics","issn_l":"0003-6935","issn":["0003-6935","1539-4522","1540-8981","1559-128X","2155-3165"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["anvur-scientific","dongbi-c","jufo-1","medline","norway-1","poland-100","russia-white-list-2"],"host_organization":"https://openalex.org/P4310315679","host_organization_name":"Optica Publishing Group","host_organization_lineage":["https://openalex.org/P4310315679"],"host_organization_lineage_names":["Optica Publishing Group"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Applied Optics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1964425328","https://openalex.org/W1974866859","https://openalex.org/W1995967773","https://openalex.org/W1998665327","https://openalex.org/W1998826016","https://openalex.org/W2023204304","https://openalex.org/W2031786832","https://openalex.org/W2069979051","https://openalex.org/W2081106695","https://openalex.org/W2084741739","https://openalex.org/W2094762783","https://openalex.org/W2121905230","https://openalex.org/W2150002612","https://openalex.org/W2165334370","https://openalex.org/W2170561503","https://openalex.org/W2172158914"],"related_works":["https://openalex.org/W2009867135","https://openalex.org/W2364983525","https://openalex.org/W2358986782","https://openalex.org/W2281091892","https://openalex.org/W2639538996","https://openalex.org/W2007241555","https://openalex.org/W4221034167","https://openalex.org/W1967058590","https://openalex.org/W2043480752","https://openalex.org/W2140695791"],"abstract_inverted_index":{"In":[0,73],"this":[1,74],"study,":[2,75],"the":[3,16,23,28,35,41,44,48,56,85,98,104,115,119,123,135,143,161],"differential":[4],"interference":[5,163],"contrast":[6,17],"(DIC)":[7],"approach":[8,100],"originally":[9],"used":[10],"for":[11,27,67,70,127],"image":[12,38,71],"enhancement":[13],"to":[14,83,113,149],"increase":[15],"between":[18],"a":[19,76,138,167],"transparent":[20,32,128,139],"object":[21,50,129],"and":[22],"background":[24],"is":[25,64,81,146],"adopted":[26],"dimension":[29],"measurement":[30,68,170],"of":[31,47,61,87,106,117,137],"structures.":[33],"With":[34],"phase":[36,45,57,79],"difference":[37],"retrieved":[39],"using":[40,118,142,152,160],"DIC":[42,121,144],"technique,":[43],"map":[46],"examined":[49],"can":[51,101],"be":[52],"approximated":[53],"by":[54],"integrating":[55],"difference.":[58],"The":[59,93,131],"need":[60],"integration":[62,80,125],"accuracy":[63],"much":[65,168],"higher":[66],"than":[69,171],"enhancement.":[72],"modified":[77],"Fourier":[78],"proposed":[82,99,124],"reduce":[84,103],"effects":[86,105],"noise":[88],"on":[89],"surface":[90],"profile":[91],"reconstruction.":[92],"simulation":[94],"results":[95,109,132],"show":[96,133],"that":[97,134],"effectively":[102],"noise.":[107],"Experimental":[108],"are":[110],"also":[111],"conducted":[112],"study":[114],"feasibility":[116],"transmitted":[120],"with":[122],"method":[126,145,164],"measurement.":[130],"height":[136],"structure":[140],"measured":[141,151,159],"quite":[147],"close":[148],"those":[150,158],"an":[153],"atomic":[154],"force":[155],"microscope,":[156],"while":[157],"white-light":[162],"result":[165],"in":[166],"larger":[169],"all":[172],"others.":[173]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":2}],"updated_date":"2026-11-15T12:55:33.944570","created_date":"2016-06-24T00:00:00"}