{"id":"https://openalex.org/W2005263754","doi":"https://doi.org/10.1049/ip-smt:20049036","title":"Time domain surface impedance concept for low frequency electromagnetic problems\u2014Part II: Application to transient skin and proximity effect problems in cylindrical conductors","display_name":"Time domain surface impedance concept for low frequency electromagnetic problems\u2014Part II: Application to transient skin and proximity effect problems in cylindrical conductors","publication_year":2005,"publication_date":"2005-09-09","ids":{"openalex":"https://openalex.org/W2005263754","doi":"https://doi.org/10.1049/ip-smt:20049036","mag":"2005263754"},"language":"en","primary_location":{"id":"doi:10.1049/ip-smt:20049036","doi":"https://doi.org/10.1049/ip-smt:20049036","is_oa":false,"landing_page_url":"https://doi.org/10.1049/ip-smt:20049036","pdf_url":null,"source":{"id":"https://openalex.org/S4210219245","display_name":"IEE Proceedings - Science Measurement and Technology","issn_l":"1350-2344","issn":["1350-2344","1359-7094"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310311714","host_organization_name":"Institution of Engineering and Technology","host_organization_lineage":["https://openalex.org/P4310311714"],"host_organization_lineage_names":["Institution of Engineering and Technology"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEE Proceedings - Science, Measurement and Technology","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5049515782","display_name":"Sami Barmada","orcid":"https://orcid.org/0000-0003-1414-1114","observed_orcids":["https://orcid.org/0000-0003-1414-1114"]},"institutions":[{"id":"https://openalex.org/I108290504","display_name":"University of Pisa","ror":"https://ror.org/03ad39j10","country_code":"IT","type":"education","lineage":["https://openalex.org/I108290504"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"S. Barmada","raw_affiliation_strings":["Universit\u00e0 di Pisa, Via Diotisalvi 2, Pisa, 56126, Italy","Universit\u00e0 di Pisa, Pisa, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Universit\u00e0 di Pisa, Via Diotisalvi 2, Pisa, 56126, Italy","institution_ids":["https://openalex.org/I108290504"]},{"raw_affiliation_string":"Universit\u00e0 di Pisa, Pisa, Italy","institution_ids":["https://openalex.org/I108290504"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077870654","display_name":"Luca Di Rienzo","orcid":"https://orcid.org/0000-0002-8718-1777","observed_orcids":["https://orcid.org/0000-0002-8718-1777"]},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"L. Di Rienzo","raw_affiliation_strings":["Politecnico di Milano, P.za L. Da Vinci 32, Milano, 20133, Italy","Politecnico di Milano, Milano, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Politecnico di Milano, P.za L. Da Vinci 32, Milano, 20133, Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"Politecnico di Milano, Milano, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055478873","display_name":"Nathan Ida","orcid":"https://orcid.org/0000-0002-4806-9926","observed_orcids":["https://orcid.org/0000-0002-4806-9926"]},"institutions":[{"id":"https://openalex.org/I110152177","display_name":"University of Akron","ror":"https://ror.org/02kyckx55","country_code":"US","type":"education","lineage":["https://openalex.org/I110152177"]},{"id":"https://openalex.org/I2738502077","display_name":"Nokia (Finland)","ror":"https://ror.org/04pkc8m17","country_code":"FI","type":"company","lineage":["https://openalex.org/I2738502077"]}],"countries":["FI","US"],"is_corresponding":false,"raw_author_name":"N. Ida","raw_affiliation_strings":["ECE. Dept., University of Akron, Akron, OH 44325-3904, USA","Nokia Corporation, Tampere, Finland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ECE. Dept., University of Akron, Akron, OH 44325-3904, USA","institution_ids":["https://openalex.org/I110152177"]},{"raw_affiliation_string":"Nokia Corporation, Tampere, Finland","institution_ids":["https://openalex.org/I2738502077"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5112200907","display_name":"Sergey V. Yuferev","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I110152177","display_name":"University of Akron","ror":"https://ror.org/02kyckx55","country_code":"US","type":"education","lineage":["https://openalex.org/I110152177"]},{"id":"https://openalex.org/I2738502077","display_name":"Nokia (Finland)","ror":"https://ror.org/04pkc8m17","country_code":"FI","type":"company","lineage":["https://openalex.org/I2738502077"]}],"countries":["FI","US"],"is_corresponding":false,"raw_author_name":"S. Yuferev","raw_affiliation_strings":["Nokia Corporation, P.O.Box 1000, Tampere, FIN-33721, Finland","ECE. Dept., University of Akron, Akron, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nokia Corporation, P.O.Box 1000, Tampere, FIN-33721, Finland","institution_ids":["https://openalex.org/I2738502077"]},{"raw_affiliation_string":"ECE. Dept., University of Akron, Akron, USA","institution_ids":["https://openalex.org/I110152177"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.6142,"has_fulltext":false,"cited_by_count":16,"citation_normalized_percentile":{"value":0.64262971,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":97},"biblio":{"volume":"152","issue":"5","first_page":"207","last_page":"216"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10739","display_name":"Electromagnetic Scattering and Analysis","score":0.9556000232696533,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10739","display_name":"Electromagnetic Scattering and Analysis","score":0.9556000232696533,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11263","display_name":"Electromagnetic Simulation and Numerical Methods","score":0.04280000180006027,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11245","display_name":"Advanced Numerical Analysis Techniques","score":0.00039999998989515007,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/time-domain-boundary-element-method","display_name":"time-domain boundary element method","score":0.8619999885559082},{"id":"https://openalex.org/keywords/surface-impedance-boundary-condition","display_name":"surface impedance boundary condition","score":0.9789999723434448},{"id":"https://openalex.org/keywords/transient-eddy-currents","display_name":"transient eddy currents","score":0.8479999899864197},{"id":"https://openalex.org/keywords/skin-effect","display_name":"skin effect","score":0.7889999747276306},{"id":"https://openalex.org/keywords/proximity-effect","display_name":"proximity effect","score":0.9959999918937683},{"id":"https://openalex.org/keywords/cylindrical-conductor","display_name":"cylindrical conductor","score":0.9959999918937683},{"id":"https://openalex.org/keywords/perturbation-method","display_name":"perturbation method","score":0.6759999990463257},{"id":"https://openalex.org/keywords/rytov-approximation","display_name":"Rytov approximation","score":0.902999997138977},{"id":"https://openalex.org/keywords/separation-of-variables","display_name":"separation of variables","score":0.7839999794960022},{"id":"https://openalex.org/keywords/time-dependent-fundamental-solution","display_name":"time-dependent fundamental solution","score":0.7080000042915344},{"id":"https://openalex.org/keywords/low-frequency-electromagnetic-problems","display_name":"low-frequency electromagnetic problems","score":0.7519999742507935}],"concepts":[{"id":"https://openalex.org/C151482245","wikidata":"https://www.wikidata.org/wiki/Q664150","display_name":"Skin effect","level":2,"score":0.6589290499687195},{"id":"https://openalex.org/C27016315","wikidata":"https://www.wikidata.org/wiki/Q580101","display_name":"Integral equation","level":2,"score":0.6128080487251282},{"id":"https://openalex.org/C103824480","wikidata":"https://www.wikidata.org/wiki/Q185889","display_name":"Time domain","level":2,"score":0.6055459976196289},{"id":"https://openalex.org/C34800285","wikidata":"https://www.wikidata.org/wiki/Q5159395","display_name":"Conductor","level":2,"score":0.5999404788017273},{"id":"https://openalex.org/C131357438","wikidata":"https://www.wikidata.org/wiki/Q208598","display_name":"Eddy current","level":2,"score":0.582779049873352},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.5801399946212769},{"id":"https://openalex.org/C202374169","wikidata":"https://www.wikidata.org/wiki/Q124291","display_name":"Electrical conductor","level":2,"score":0.5729367733001709},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.559711217880249},{"id":"https://openalex.org/C182310444","wikidata":"https://www.wikidata.org/wiki/Q1332643","display_name":"Boundary value problem","level":2,"score":0.46593350172042847},{"id":"https://openalex.org/C63632240","wikidata":"https://www.wikidata.org/wiki/Q1935004","display_name":"Boundary element method","level":3,"score":0.4393070936203003},{"id":"https://openalex.org/C85761212","wikidata":"https://www.wikidata.org/wiki/Q1974593","display_name":"Transient response","level":2,"score":0.43809065222740173},{"id":"https://openalex.org/C16519606","wikidata":"https://www.wikidata.org/wiki/Q897715","display_name":"Perfect conductor","level":3,"score":0.43352681398391724},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.42662298679351807},{"id":"https://openalex.org/C19118579","wikidata":"https://www.wikidata.org/wiki/Q786423","display_name":"Frequency domain","level":2,"score":0.4247528612613678},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.2412601113319397},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.22473278641700745},{"id":"https://openalex.org/C135628077","wikidata":"https://www.wikidata.org/wiki/Q220184","display_name":"Finite element method","level":2,"score":0.15205523371696472},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.15046429634094238},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.1473734974861145},{"id":"https://openalex.org/C191486275","wikidata":"https://www.wikidata.org/wiki/Q210028","display_name":"Scattering","level":2,"score":0.1151464581489563},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1049/ip-smt:20049036","doi":"https://doi.org/10.1049/ip-smt:20049036","is_oa":false,"landing_page_url":"https://doi.org/10.1049/ip-smt:20049036","pdf_url":null,"source":{"id":"https://openalex.org/S4210219245","display_name":"IEE Proceedings - Science Measurement and Technology","issn_l":"1350-2344","issn":["1350-2344","1359-7094"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310311714","host_organization_name":"Institution of Engineering and Technology","host_organization_lineage":["https://openalex.org/P4310311714"],"host_organization_lineage_names":["Institution of Engineering and Technology"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEE Proceedings - Science, Measurement and Technology","raw_type":"journal-article"},{"id":"pmh:oai:arpi.unipi.it:11568/95490","doi":null,"is_oa":false,"landing_page_url":"http://hdl.handle.net/11568/95490","pdf_url":null,"source":{"id":"https://openalex.org/S4377196265","display_name":"CINECA IRIS Institutial research information system (University of Pisa)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I108290504","host_organization_name":"University of Pisa","host_organization_lineage":["https://openalex.org/I108290504"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/article"},{"id":"pmh:oai:re.public.polimi.it:11311/554496","doi":null,"is_oa":false,"landing_page_url":"http://hdl.handle.net/11311/554496","pdf_url":null,"source":{"id":"https://openalex.org/S4306400312","display_name":"Virtual Community of Pathological Anatomy (University of Castilla La Mancha)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I79189158","host_organization_name":"University of Castilla-La Mancha","host_organization_lineage":["https://openalex.org/I79189158"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":null,"sustainable_development_goals":[],"sustainable_development_goals_aurora":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W8052360","https://openalex.org/W1555206904","https://openalex.org/W1967845737","https://openalex.org/W1989790048","https://openalex.org/W1991386800","https://openalex.org/W2003212634","https://openalex.org/W2015456357","https://openalex.org/W2033080132","https://openalex.org/W2036021295","https://openalex.org/W2136706119","https://openalex.org/W2143035549","https://openalex.org/W2154615371","https://openalex.org/W2164509927","https://openalex.org/W2168550881"],"related_works":["https://openalex.org/W2136706119","https://openalex.org/W2593654910","https://openalex.org/W2134903782","https://openalex.org/W2157400242","https://openalex.org/W2098285072","https://openalex.org/W2139926387","https://openalex.org/W7165682235","https://openalex.org/W3176094033","https://openalex.org/W2098128170","https://openalex.org/W3092443085"],"abstract_inverted_index":{"A":[0],"time":[1,63,136,148,161],"domain":[2,64,149],"boundary":[3,10],"element":[4],"formulation":[5,57,176],"employing":[6],"the":[7,16,34,38,43,46,53,78,89,94,99,109,153,164,174,179,184,194,200,203],"surface":[8,65],"impedance":[9],"conditions":[11],"(SIBCs)":[12],"is":[13,86,124,171],"developed":[14],"for":[15],"3-dimensional":[17],"transient":[18],"eddy":[19],"current":[20,205],"problem":[21,170],"of":[22,26,29,45,52,59,62,84,91,93,131,166,189,196,202],"cylindrical":[23],"conductors.":[24],"SIBCs":[25],"different":[27],"orders":[28],"approximation":[30,92,112],"are":[31,115,191,210],"implemented":[32],"using":[33,77],"perturbation":[35],"technique":[36],"in":[37,98,108],"small":[39],"parameter":[40],"proportional":[41],"to":[42,156],"ratio":[44],"skin":[47],"depth":[48],"and":[49,73,107,119,135,177,193,207],"characteristic":[50],"size":[51],"conductor":[54,102],"cross-section.":[55],"The":[56,82],"consists":[58],"a":[60,138,168],"set":[61],"integral":[66,154],"equations":[67,85,155],"that":[68,126,140,151],"have":[69],"identical":[70],"left-hand":[71],"sides":[72],"can":[74],"be":[75,157],"solved":[76,158,172],"same":[79],"program":[80],"procedure.":[81],"number":[83],"determined":[87],"by":[88,117,173,178],"order":[90],"SIBC,":[95],"namely:":[96],"solutions":[97],"perfect":[100],"electrical":[101],"(PEC)":[103],"limit":[104],"(lowest":[105],"order)":[106,114],"so-called":[110],"Rytov":[111],"(highest":[113],"given":[116],"one":[118],"four":[120],"equations,":[121],"respectively.":[122],"It":[123],"demonstrated":[125],"each":[127,160],"equation":[128],"admits":[129],"separation":[130],"variables":[132],"into":[133],"space":[134],"components,":[137],"property":[139],"significantly":[141],"reduces":[142],"computational":[143],"costs":[144],"compared":[145],"with":[146],"traditional":[147],"formulations":[150],"require":[152],"at":[159],"step.":[162],"For":[163],"purpose":[165],"validation,":[167],"test":[169],"proposed":[175],"\u2018original\u2019":[180],"BEM":[181],"based":[182],"on":[183],"time-dependent":[185],"fundamental":[186],"solution.":[187],"Conditions":[188],"applicability":[190],"discussed":[192],"effect":[195,209],"such":[197],"factors":[198],"as":[199],"shape":[201],"incident":[204],"pulse":[206],"proximity":[208],"considered.":[211]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2018,"cited_by_count":3},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2026-10-10T09:11:00.788812","created_date":"2016-06-24T00:00:00"}