{"id":"https://openalex.org/W2005241383","doi":"https://doi.org/10.1109/irmmw-thz.2011.6104794","title":"Study of the effect of nanofabricated surface roughness on conductivity in the terahertz regime with a high-Q resonator","display_name":"Study of the effect of nanofabricated surface roughness on conductivity in the terahertz regime with a high-Q resonator","publication_year":2011,"publication_date":"2011-10-01","ids":{"openalex":"https://openalex.org/W2005241383","doi":"https://doi.org/10.1109/irmmw-thz.2011.6104794","mag":"2005241383"},"language":"en","primary_location":{"id":"doi:10.1109/irmmw-thz.2011.6104794","doi":"https://doi.org/10.1109/irmmw-thz.2011.6104794","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irmmw-thz.2011.6104794","pdf_url":null,"source":{"id":"https://openalex.org/S4363607742","display_name":"International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 International Conference on Infrared, Millimeter, and Terahertz Waves","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5108458345","display_name":"Benjamin B. Yang","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I135310074","display_name":"University of Wisconsin\u2013Madison","ror":"https://ror.org/01y2jtd41","country_code":"US","type":"education","lineage":["https://openalex.org/I135310074"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Benjamin B. Yang","raw_affiliation_strings":["ECE Department, University of Wisconsin-Madison, Madison, WI, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ECE Department, University of Wisconsin-Madison, Madison, WI, USA","institution_ids":["https://openalex.org/I135310074"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111611786","display_name":"Matt P. Kirley","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I135310074","display_name":"University of Wisconsin\u2013Madison","ror":"https://ror.org/01y2jtd41","country_code":"US","type":"education","lineage":["https://openalex.org/I135310074"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Matt Kirley","raw_affiliation_strings":["ECE Department, University of Wisconsin-Madison, Madison, WI, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ECE Department, University of Wisconsin-Madison, Madison, WI, USA","institution_ids":["https://openalex.org/I135310074"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5044756052","display_name":"John H. Booske","orcid":"https://orcid.org/0000-0001-5051-602X","observed_orcids":["https://orcid.org/0000-0001-5051-602X"]},"institutions":[{"id":"https://openalex.org/I135310074","display_name":"University of Wisconsin\u2013Madison","ror":"https://ror.org/01y2jtd41","country_code":"US","type":"education","lineage":["https://openalex.org/I135310074"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"John H. Booske","raw_affiliation_strings":["ECE Department, University of Wisconsin-Madison, Madison, WI, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ECE Department, University of Wisconsin-Madison, Madison, WI, USA","institution_ids":["https://openalex.org/I135310074"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I135310074"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.09038435,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":"238","issue":null,"first_page":"1","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10752","display_name":"Terahertz technology and applications","score":0.7964000105857849,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10752","display_name":"Terahertz technology and applications","score":0.7964000105857849,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.08879999816417694,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.026399999856948853,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/surface-roughness","display_name":"surface roughness","score":0.9079999923706055},{"id":"https://openalex.org/keywords/effective-conductivity","display_name":"effective conductivity","score":0.6759999990463257},{"id":"https://openalex.org/keywords/terahertz-conductivity","display_name":"terahertz conductivity","score":0.9079999923706055},{"id":"https://openalex.org/keywords/high-q-resonators","display_name":"high-Q resonators","score":0.8650000095367432},{"id":"https://openalex.org/keywords/quasi-optical-resonator","display_name":"quasi-optical resonator","score":0.9639999866485596},{"id":"https://openalex.org/keywords/nanoimprint-lithography","display_name":"nanoimprint lithography","score":0.7110000252723694},{"id":"https://openalex.org/keywords/liga-process","display_name":"LIGA process","score":0.9079999923706055},{"id":"https://openalex.org/keywords/nanostructured-metals","display_name":"nanostructured metals","score":0.6340000033378601},{"id":"https://openalex.org/keywords/400-ghz","display_name":"400 GHz","score":0.906000018119812},{"id":"https://openalex.org/keywords/650-ghz","display_name":"650 GHz","score":1.0}],"concepts":[{"id":"https://openalex.org/C107816215","wikidata":"https://www.wikidata.org/wiki/Q647887","display_name":"Terahertz radiation","level":2,"score":0.9276390671730042},{"id":"https://openalex.org/C131540310","wikidata":"https://www.wikidata.org/wiki/Q907564","display_name":"Conductivity","level":2,"score":0.804332971572876},{"id":"https://openalex.org/C97126364","wikidata":"https://www.wikidata.org/wiki/Q349669","display_name":"Resonator","level":2,"score":0.7218236327171326},{"id":"https://openalex.org/C107365816","wikidata":"https://www.wikidata.org/wiki/Q114817","display_name":"Surface roughness","level":2,"score":0.7153713703155518},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7101432681083679},{"id":"https://openalex.org/C71039073","wikidata":"https://www.wikidata.org/wiki/Q3439090","display_name":"Surface finish","level":2,"score":0.5959107875823975},{"id":"https://openalex.org/C91145125","wikidata":"https://www.wikidata.org/wiki/Q7645963","display_name":"Surface conductivity","level":3,"score":0.4969976246356964},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.445137083530426},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.4271451532840729},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.3353155851364136},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.24373015761375427},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.12616795301437378},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irmmw-thz.2011.6104794","doi":"https://doi.org/10.1109/irmmw-thz.2011.6104794","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irmmw-thz.2011.6104794","pdf_url":null,"source":{"id":"https://openalex.org/S4363607742","display_name":"International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 International Conference on Infrared, Millimeter, and Terahertz Waves","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W2002629899","https://openalex.org/W2024573549"],"related_works":["https://openalex.org/W2074271288","https://openalex.org/W1998472253","https://openalex.org/W4417402615","https://openalex.org/W2092862793","https://openalex.org/W2037063196","https://openalex.org/W2068379392","https://openalex.org/W2180018597","https://openalex.org/W3000445701","https://openalex.org/W2088406194","https://openalex.org/W2011757625"],"abstract_inverted_index":{"A":[0],"high-Q":[1],"quasi-optical":[2],"resonator":[3],"operating":[4],"at":[5],"400":[6],"GHz":[7,10],"and":[8],"650":[9],"is":[11],"used":[12],"to":[13],"measure":[14],"the":[15,32,41],"conductivity":[16,39],"of":[17,34],"metal":[18],"samples":[19],"with":[20],"nano-scale":[21],"textures":[22],"made":[23],"using":[24],"a":[25],"LIGA-like":[26],"nanoimprinting":[27],"process.":[28],"The":[29],"results":[30],"explore":[31],"effect":[33],"surface":[35],"roughness":[36],"on":[37],"effective":[38],"in":[40],"terahertz":[42],"regime.":[43]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2026-10-30T12:39:25.321706","created_date":"2016-06-24T00:00:00"}