{"id":"https://openalex.org/W2005145852","doi":"https://doi.org/10.1140/epjb/e2005-00183-6","title":"Exchange bias on epitaxial Ni films due to ultrathin NiO layer","display_name":"Exchange bias on epitaxial Ni films due to ultrathin NiO layer","publication_year":2005,"publication_date":"2005-05-01","ids":{"openalex":"https://openalex.org/W2005145852","doi":"https://doi.org/10.1140/epjb/e2005-00183-6","mag":"2005145852"},"language":"en","primary_location":{"id":"doi:10.1140/epjb/e2005-00183-6","doi":"https://doi.org/10.1140/epjb/e2005-00183-6","is_oa":false,"landing_page_url":"https://doi.org/10.1140/epjb/e2005-00183-6","pdf_url":null,"source":{"id":"https://openalex.org/S9051360","display_name":"The European Physical Journal B","issn_l":"1434-6028","issn":["1434-6028","1434-6036"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-d","jufo-1","norway-1","poland-40","russia-white-list-3"],"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"The European Physical Journal B","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5110624465","display_name":"R. A. Lukaszew","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I90871651","display_name":"University of Toledo","ror":"https://ror.org/01pbdzh19","country_code":"US","type":"education","lineage":["https://openalex.org/I90871651"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"R. A. Lukaszew","raw_affiliation_strings":["University of Toledo, Toledo, OH, 43606, USA","University of Toledo"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Toledo, Toledo, OH, 43606, USA","institution_ids":["https://openalex.org/I90871651"]},{"raw_affiliation_string":"University of Toledo","institution_ids":["https://openalex.org/I90871651"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001655082","display_name":"M. Mitra","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I90871651","display_name":"University of Toledo","ror":"https://ror.org/01pbdzh19","country_code":"US","type":"education","lineage":["https://openalex.org/I90871651"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M. Mitra","raw_affiliation_strings":["University of Toledo, Toledo, OH, 43606, USA","University of Toledo"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Toledo, Toledo, OH, 43606, USA","institution_ids":["https://openalex.org/I90871651"]},{"raw_affiliation_string":"University of Toledo","institution_ids":["https://openalex.org/I90871651"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081666846","display_name":"Ziyi Zhang","orcid":"https://orcid.org/0009-0000-4303-4620","observed_orcids":["https://orcid.org/0009-0000-4303-4620"]},"institutions":[{"id":"https://openalex.org/I90871651","display_name":"University of Toledo","ror":"https://ror.org/01pbdzh19","country_code":"US","type":"education","lineage":["https://openalex.org/I90871651"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Z. Zhang","raw_affiliation_strings":["University of Toledo, Toledo, OH, 43606, USA","University of Toledo"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Toledo, Toledo, OH, 43606, USA","institution_ids":["https://openalex.org/I90871651"]},{"raw_affiliation_string":"University of Toledo","institution_ids":["https://openalex.org/I90871651"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5080234253","display_name":"Mark Yeadon","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I165932596","display_name":"National University of Singapore","ror":"https://ror.org/01tgyzw49","country_code":"SG","type":"education","lineage":["https://openalex.org/I165932596"]},{"id":"https://openalex.org/I4210123095","display_name":"Institute of Materials Research and Engineering","ror":"https://ror.org/02sepg748","country_code":"SG","type":"facility","lineage":["https://openalex.org/I115228651","https://openalex.org/I4210123095","https://openalex.org/I91275662"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"M. Yeadon","raw_affiliation_strings":["IMRE, National University of Singapore, Singapore, 117602, Singapore","IMRE, National University of Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IMRE, National University of Singapore, Singapore, 117602, Singapore","institution_ids":["https://openalex.org/I165932596","https://openalex.org/I4210123095"]},{"raw_affiliation_string":"IMRE, National University of Singapore","institution_ids":["https://openalex.org/I165932596","https://openalex.org/I4210123095"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5110624465"],"corresponding_institution_ids":["https://openalex.org/I90871651"],"apc_list":{"value":3490,"currency":"USD","value_usd":3490},"apc_paid":null,"fwci":0.2058,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.45926477,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":97},"biblio":{"volume":"45","issue":"2","first_page":"181","last_page":"184"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11782","display_name":"Magnetic Properties of Alloys","score":0.0003000000142492354,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10922","display_name":"Magnetic Properties and Synthesis of Ferrites","score":0.0003000000142492354,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/exchange-bias","display_name":"exchange bias","score":1.0},{"id":"https://openalex.org/keywords/ferromagnet-antiferromagnet-interface","display_name":"ferromagnet/antiferromagnet interface","score":0.828000009059906},{"id":"https://openalex.org/keywords/coercivity-enhancement","display_name":"coercivity enhancement","score":0.7620000243186951},{"id":"https://openalex.org/keywords/hysteresis-loop-shift","display_name":"hysteresis loop shift","score":0.9279999732971191},{"id":"https://openalex.org/keywords/annealing","display_name":"annealing","score":0.8529999852180481},{"id":"https://openalex.org/keywords/mgo-substrate","display_name":"MgO substrate","score":0.9179999828338623},{"id":"https://openalex.org/keywords/metal-oxide-interface","display_name":"metal-oxide interface","score":0.3370000123977661}],"concepts":[{"id":"https://openalex.org/C95914496","wikidata":"https://www.wikidata.org/wiki/Q4329387","display_name":"Exchange bias","level":5,"score":0.8363149166107178},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.8252968788146973},{"id":"https://openalex.org/C82217956","wikidata":"https://www.wikidata.org/wiki/Q184207","display_name":"Ferromagnetism","level":2,"score":0.7820942997932434},{"id":"https://openalex.org/C126530901","wikidata":"https://www.wikidata.org/wiki/Q432635","display_name":"Coercivity","level":2,"score":0.7695899605751038},{"id":"https://openalex.org/C155355069","wikidata":"https://www.wikidata.org/wiki/Q575224","display_name":"Antiferromagnetism","level":2,"score":0.7449005246162415},{"id":"https://openalex.org/C110738630","wikidata":"https://www.wikidata.org/wiki/Q1135540","display_name":"Epitaxy","level":3,"score":0.7370871901512146},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7003364562988281},{"id":"https://openalex.org/C74575197","wikidata":"https://www.wikidata.org/wiki/Q9941","display_name":"Non-blocking I/O","level":3,"score":0.5952752232551575},{"id":"https://openalex.org/C47441113","wikidata":"https://www.wikidata.org/wiki/Q9691942","display_name":"Magnetic hysteresis","level":4,"score":0.5832054615020752},{"id":"https://openalex.org/C2777855556","wikidata":"https://www.wikidata.org/wiki/Q4339544","display_name":"Annealing (glass)","level":2,"score":0.5124078392982483},{"id":"https://openalex.org/C32938098","wikidata":"https://www.wikidata.org/wiki/Q918398","display_name":"Magnetic anisotropy","level":4,"score":0.49573028087615967},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.4571076035499573},{"id":"https://openalex.org/C123299182","wikidata":"https://www.wikidata.org/wiki/Q190837","display_name":"Hysteresis","level":2,"score":0.4564287066459656},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.4230422377586365},{"id":"https://openalex.org/C2777289219","wikidata":"https://www.wikidata.org/wiki/Q7632154","display_name":"Substrate (aquarium)","level":2,"score":0.4125685393810272},{"id":"https://openalex.org/C32546565","wikidata":"https://www.wikidata.org/wiki/Q856711","display_name":"Magnetization","level":3,"score":0.2632256746292114},{"id":"https://openalex.org/C115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","level":2,"score":0.20907989144325256},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.13561338186264038},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.1341809332370758},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.13271090388298035},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07103624939918518},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.04657566547393799},{"id":"https://openalex.org/C111368507","wikidata":"https://www.wikidata.org/wiki/Q43518","display_name":"Oceanography","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C161790260","wikidata":"https://www.wikidata.org/wiki/Q82264","display_name":"Catalysis","level":2,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.1140/epjb/e2005-00183-6","doi":"https://doi.org/10.1140/epjb/e2005-00183-6","is_oa":false,"landing_page_url":"https://doi.org/10.1140/epjb/e2005-00183-6","pdf_url":null,"source":{"id":"https://openalex.org/S9051360","display_name":"The European Physical Journal B","issn_l":"1434-6028","issn":["1434-6028","1434-6036"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-d","jufo-1","norway-1","poland-40","russia-white-list-3"],"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"The European Physical Journal B","raw_type":"journal-article"},{"id":"pmh:oai:edpsciences.org:dkey/10.1140/epjb/e2005-00183-6","doi":null,"is_oa":false,"landing_page_url":"http://www.springerlink.com/content/fulltext.pdf?id=doi:10.1140/epjb/e2005-00183-6","pdf_url":"http://www.springerlink.com/content/fulltext.pdf?id=doi:10.1140/epjb/e2005-00183-6","source":{"id":"https://openalex.org/S4306400744","display_name":"Springer Link (Chiba Institute of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I8488066","host_organization_name":"Chiba Institute of Technology","host_organization_lineage":["https://openalex.org/I8488066"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"https://doi.org/10.1140/epjb/e2005-00183-6","raw_type":"Text"},{"id":"pmh:oai:scholarbank.nus.edu.sg:10635/107035","doi":null,"is_oa":false,"landing_page_url":"http://scholarbank.nus.edu.sg/handle/10635/107035","pdf_url":null,"source":{"id":"https://openalex.org/S7407052290","display_name":"National University of Singapore","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Scopus","raw_type":"Article"},{"id":"pmh:oai:RePEc:spr:eurphb:v:45:y:2005:i:2:p:181-184","doi":null,"is_oa":false,"landing_page_url":"http://hdl.handle.net/10.1140/epjb/e2005-00183-6","pdf_url":null,"source":{"id":"https://openalex.org/S4306401271","display_name":"RePEc: Research Papers in Economics","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I77793887","host_organization_name":"Federal Reserve Bank of St. Louis","host_organization_lineage":["https://openalex.org/I77793887"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W97037421","https://openalex.org/W1494295884","https://openalex.org/W1973080648","https://openalex.org/W1974775942","https://openalex.org/W1980958992","https://openalex.org/W1983224600","https://openalex.org/W1985357031","https://openalex.org/W2006357625","https://openalex.org/W2010440623","https://openalex.org/W2020071267","https://openalex.org/W2032810288","https://openalex.org/W2041367497","https://openalex.org/W2043368023","https://openalex.org/W2047221284","https://openalex.org/W2059586564","https://openalex.org/W2060108004","https://openalex.org/W2068370053","https://openalex.org/W2078737087","https://openalex.org/W2499057124"],"related_works":["https://openalex.org/W2038281218","https://openalex.org/W2752101487","https://openalex.org/W1989743155","https://openalex.org/W2063450869","https://openalex.org/W2898932713","https://openalex.org/W1974851987","https://openalex.org/W2055808139","https://openalex.org/W4229930801","https://openalex.org/W1973543013","https://openalex.org/W4410196623"],"abstract_inverted_index":null,"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":3},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-09-22T06:50:58.402377","created_date":"2016-06-24T00:00:00"}