{"id":"https://openalex.org/W2005019233","doi":"https://doi.org/10.1063/1.366513","title":"Effects of thermal annealing on emission characteristics and surface properties of field emitter arrays","display_name":"Effects of thermal annealing on emission characteristics and surface properties of field emitter arrays","publication_year":1997,"publication_date":"1997-12-15","ids":{"openalex":"https://openalex.org/W2005019233","doi":"https://doi.org/10.1063/1.366513","mag":"2005019233"},"language":"en","primary_location":{"id":"doi:10.1063/1.366513","doi":"https://doi.org/10.1063/1.366513","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.366513","pdf_url":null,"source":{"id":"https://openalex.org/S187991544","display_name":"Journal of Applied Physics","issn_l":"0021-8979","issn":["0021-8979","1089-7550","1520-8850"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-d","jufo-1","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Applied Physics","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5084008957","display_name":"Fuminori Ito","orcid":"https://orcid.org/0000-0002-3491-3321","observed_orcids":["https://orcid.org/0000-0002-3491-3321"]},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Fuminori Ito","raw_affiliation_strings":["Silicon Systems Research Laboratories, NEC Corporation, 1120 Shimokuzawa, Sagamihara, Kanagawa 229-11, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Silicon Systems Research Laboratories, NEC Corporation, 1120 Shimokuzawa, Sagamihara, Kanagawa 229-11, Japan","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080487540","display_name":"K. Konuma","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kazuo Konuma","raw_affiliation_strings":["Silicon Systems Research Laboratories, NEC Corporation, 1120 Shimokuzawa, Sagamihara, Kanagawa 229-11, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Silicon Systems Research Laboratories, NEC Corporation, 1120 Shimokuzawa, Sagamihara, Kanagawa 229-11, Japan","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110825441","display_name":"Akihiko Okamoto","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Akihiko Okamoto","raw_affiliation_strings":["Silicon Systems Research Laboratories, NEC Corporation, 1120 Shimokuzawa, Sagamihara, Kanagawa 229-11, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Silicon Systems Research Laboratories, NEC Corporation, 1120 Shimokuzawa, Sagamihara, Kanagawa 229-11, Japan","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Akihiro Yano","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Akihiro Yano","raw_affiliation_strings":["Electronic Component Development Division, NEC Corporation, 1120 Shimokuzawa, Sagamihara, Kanagawa 229-11, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronic Component Development Division, NEC Corporation, 1120 Shimokuzawa, Sagamihara, Kanagawa 229-11, Japan","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5022809372","display_name":"Souichiro Miyano","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Souichiro Miyano","raw_affiliation_strings":["Electronic Component Development Division, NEC Corporation, 1120 Shimokuzawa, Sagamihara, Kanagawa 229-11, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronic Component Development Division, NEC Corporation, 1120 Shimokuzawa, Sagamihara, Kanagawa 229-11, Japan","institution_ids":["https://openalex.org/I118347220"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I118347220"],"apc_list":{"value":3500,"currency":"USD","value_usd":3500},"apc_paid":null,"fwci":0.4751,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.56502371,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"82","issue":"12","first_page":"6267","last_page":"6272"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11175","display_name":"Gyrotron and Vacuum Electronics Research","score":0.5830000042915344,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11175","display_name":"Gyrotron and Vacuum Electronics Research","score":0.5830000042915344,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13418","display_name":"Photocathodes and Microchannel Plates","score":0.334199994802475,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.014499999582767487,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/field-emitter-arrays","display_name":"field emitter arrays","score":0.8930000066757202},{"id":"https://openalex.org/keywords/annealing","display_name":"annealing","score":0.9750000238418579},{"id":"https://openalex.org/keywords/molybdenum-emitters","display_name":"molybdenum emitters","score":0.8460000157356262},{"id":"https://openalex.org/keywords/field-emission","display_name":"field emission","score":0.5410000085830688},{"id":"https://openalex.org/keywords/anodic-current","display_name":"anode current","score":0.6439999938011169},{"id":"https://openalex.org/keywords/surface-oxide-layer","display_name":"surface oxide layer","score":0.3540000021457672},{"id":"https://openalex.org/keywords/emission-enhancement","display_name":"emission enhancement","score":0.47699999809265137}],"concepts":[{"id":"https://openalex.org/C2777855556","wikidata":"https://www.wikidata.org/wiki/Q4339544","display_name":"Annealing (glass)","level":2,"score":0.8102759122848511},{"id":"https://openalex.org/C162711632","wikidata":"https://www.wikidata.org/wiki/Q905514","display_name":"Desorption","level":3,"score":0.736282467842102},{"id":"https://openalex.org/C46918542","wikidata":"https://www.wikidata.org/wiki/Q1648344","display_name":"Common emitter","level":2,"score":0.7292957901954651},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7291296720504761},{"id":"https://openalex.org/C89395315","wikidata":"https://www.wikidata.org/wiki/Q181232","display_name":"Anode","level":3,"score":0.7249733209609985},{"id":"https://openalex.org/C175708663","wikidata":"https://www.wikidata.org/wiki/Q899559","display_name":"X-ray photoelectron spectroscopy","level":2,"score":0.723828136920929},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.6539211273193359},{"id":"https://openalex.org/C121029787","wikidata":"https://www.wikidata.org/wiki/Q902877","display_name":"Field electron emission","level":3,"score":0.6035633683204651},{"id":"https://openalex.org/C155916967","wikidata":"https://www.wikidata.org/wiki/Q2402805","display_name":"Thermal desorption spectroscopy","level":4,"score":0.5787885785102844},{"id":"https://openalex.org/C2781059571","wikidata":"https://www.wikidata.org/wiki/Q3706001","display_name":"Thermal desorption","level":4,"score":0.543120265007019},{"id":"https://openalex.org/C155891486","wikidata":"https://www.wikidata.org/wiki/Q3694418","display_name":"Saturation current","level":3,"score":0.5275927186012268},{"id":"https://openalex.org/C9930424","wikidata":"https://www.wikidata.org/wiki/Q7426587","display_name":"Saturation (graph theory)","level":2,"score":0.41456714272499084},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.30705195665359497},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.24598371982574463},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.15325191617012024},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.14612245559692383},{"id":"https://openalex.org/C46141821","wikidata":"https://www.wikidata.org/wiki/Q209402","display_name":"Nuclear magnetic resonance","level":1,"score":0.14401525259017944},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.08913964033126831},{"id":"https://openalex.org/C150394285","wikidata":"https://www.wikidata.org/wiki/Q180254","display_name":"Adsorption","level":2,"score":0.0856514573097229},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.07766309380531311},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.058481305837631226},{"id":"https://openalex.org/C147120987","wikidata":"https://www.wikidata.org/wiki/Q2225","display_name":"Electron","level":2,"score":0.05395469069480896},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1063/1.366513","doi":"https://doi.org/10.1063/1.366513","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.366513","pdf_url":null,"source":{"id":"https://openalex.org/S187991544","display_name":"Journal of Applied Physics","issn_l":"0021-8979","issn":["0021-8979","1089-7550","1520-8850"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-d","jufo-1","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Applied Physics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1530306380","https://openalex.org/W1557681670","https://openalex.org/W1984237315","https://openalex.org/W1984814873","https://openalex.org/W1985664505","https://openalex.org/W1995638634","https://openalex.org/W1996423908","https://openalex.org/W1999458822","https://openalex.org/W2003725343","https://openalex.org/W2015654445","https://openalex.org/W2021834599","https://openalex.org/W2040031884","https://openalex.org/W2066683734","https://openalex.org/W2068787064","https://openalex.org/W2070513119","https://openalex.org/W2073039105","https://openalex.org/W2074751312","https://openalex.org/W2079195107","https://openalex.org/W2117631851","https://openalex.org/W2161606023","https://openalex.org/W4211037856"],"related_works":["https://openalex.org/W2987155011","https://openalex.org/W2003881576","https://openalex.org/W2045503452","https://openalex.org/W1782660570","https://openalex.org/W2087129990","https://openalex.org/W2055688962","https://openalex.org/W2092592418","https://openalex.org/W2099474447","https://openalex.org/W2033644596","https://openalex.org/W2055271341"],"abstract_inverted_index":{"The":[0,24,68],"effects":[1],"of":[2,27,70],"thermal":[3],"annealing":[4,33],"below":[5],"500":[6,66],"\u00b0C":[7],"on":[8,59],"Spindt-type":[9],"Mo":[10,21,61],"field":[11],"emitter":[12],"arrays":[13],"(FEAs)":[14],"were":[15],"studied":[16],"through":[17],"emission":[18],"characteristics":[19],"and":[20,35,51],"surface":[22,62],"analysis.":[23],"anode":[25,72],"current":[26,73,92],"the":[28,60,71,81],"FEAs":[29],"increases":[30],"with":[31],"increasing":[32],"time":[34],"then":[36],"saturates":[37],"after":[38],"a":[39],"certain":[40],"period":[41,82],"that":[42,56,89],"is":[43,74],"shorter":[44],"for":[45,84,91],"higher-temperature":[46],"annealing.":[47],"X-ray":[48],"photoelectron":[49],"spectroscopy":[50],"temperature":[52],"programmed":[53],"desorption":[54,86],"show":[55],"MoO3":[57,78,85],"formed":[58],"desorbs":[63],"at":[64],"around":[65],"\u00b0C.":[67],"enhancement":[69],"caused":[75],"mainly":[76],"by":[77],"desorption,":[79],"since":[80],"required":[83,90],"corresponds":[87],"to":[88],"saturation.":[93]},"counts_by_year":[],"updated_date":"2026-11-04T10:54:05.112534","created_date":"2016-06-24T00:00:00"}