{"id":"https://openalex.org/W2004451899","doi":"https://doi.org/10.1016/j.susc.2012.03.006","title":"Passivation of GaAs(001) surface by the growth of high quality c-GaN ultra-thin film using low power glow discharge nitrogen plasma source","display_name":"Passivation of GaAs(001) surface by the growth of high quality c-GaN ultra-thin film using low power glow discharge nitrogen plasma source","publication_year":2012,"publication_date":"2012-03-18","ids":{"openalex":"https://openalex.org/W2004451899","doi":"https://doi.org/10.1016/j.susc.2012.03.006","mag":"2004451899"},"language":"en","primary_location":{"id":"doi:10.1016/j.susc.2012.03.006","doi":"https://doi.org/10.1016/j.susc.2012.03.006","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.susc.2012.03.006","pdf_url":null,"source":{"id":"https://openalex.org/S137865625","display_name":"Surface Science","issn_l":"0039-6028","issn":["0039-6028","1879-2758"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-100","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Surface Science","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5086053787","display_name":"Guillaume Monier","orcid":"https://orcid.org/0000-0002-2368-3110","observed_orcids":["https://orcid.org/0000-0002-2368-3110"]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I169645620","display_name":"Institut Pascal","ror":"https://ror.org/03vgfxd91","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I169645620","https://openalex.org/I198244214","https://openalex.org/I4210095849","https://openalex.org/I4210128870"]},{"id":"https://openalex.org/I4405258658","display_name":"Universit\u00e9 Blaise Pascal","ror":"https://ror.org/0119hgk08","country_code":"FR","type":"education","lineage":["https://openalex.org/I198244214","https://openalex.org/I4405258658"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"G. Monier","raw_affiliation_strings":["CNRS, UMR 6602, LASMEA, F-63177 Aubiere, France","Clermont Universit\u00e9, Universit\u00e9 Blaise Pascal, LASMEA, BP 10448, F-63000 Clermont-Ferrand, France","CNRS, UMR 6602, LASMEA, F-63177 Aubi\u00e8re, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CNRS, UMR 6602, LASMEA, F-63177 Aubiere, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I169645620"]},{"raw_affiliation_string":"Clermont Universit\u00e9, Universit\u00e9 Blaise Pascal, LASMEA, BP 10448, F-63000 Clermont-Ferrand, France","institution_ids":["https://openalex.org/I4405258658"]},{"raw_affiliation_string":"CNRS, UMR 6602, LASMEA, F-63177 Aubi\u00e8re, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I169645620"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037047341","display_name":"L. Bideux","orcid":"https://orcid.org/0000-0002-7280-8565","observed_orcids":["https://orcid.org/0000-0002-7280-8565"]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I169645620","display_name":"Institut Pascal","ror":"https://ror.org/03vgfxd91","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I169645620","https://openalex.org/I198244214","https://openalex.org/I4210095849","https://openalex.org/I4210128870"]},{"id":"https://openalex.org/I4405258658","display_name":"Universit\u00e9 Blaise Pascal","ror":"https://ror.org/0119hgk08","country_code":"FR","type":"education","lineage":["https://openalex.org/I198244214","https://openalex.org/I4405258658"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"L. Bideux","raw_affiliation_strings":["CNRS, UMR 6602, LASMEA, F-63177 Aubiere, France","Clermont Universit\u00e9, Universit\u00e9 Blaise Pascal, LASMEA, BP 10448, F-63000 Clermont-Ferrand, France","CNRS, UMR 6602, LASMEA, F-63177 Aubi\u00e8re, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CNRS, UMR 6602, LASMEA, F-63177 Aubiere, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I169645620"]},{"raw_affiliation_string":"Clermont Universit\u00e9, Universit\u00e9 Blaise Pascal, LASMEA, BP 10448, F-63000 Clermont-Ferrand, France","institution_ids":["https://openalex.org/I4405258658"]},{"raw_affiliation_string":"CNRS, UMR 6602, LASMEA, F-63177 Aubi\u00e8re, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I169645620"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102877394","display_name":"Christine Robert\u2010Goumet","orcid":"https://orcid.org/0000-0003-4215-8124","observed_orcids":["https://orcid.org/0000-0003-4215-8124","https://orcid.org/0000-0002-5005-263X"]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I169645620","display_name":"Institut Pascal","ror":"https://ror.org/03vgfxd91","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I169645620","https://openalex.org/I198244214","https://openalex.org/I4210095849","https://openalex.org/I4210128870"]},{"id":"https://openalex.org/I4405258658","display_name":"Universit\u00e9 Blaise Pascal","ror":"https://ror.org/0119hgk08","country_code":"FR","type":"education","lineage":["https://openalex.org/I198244214","https://openalex.org/I4405258658"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"C. Robert-Goumet","raw_affiliation_strings":["CNRS, UMR 6602, LASMEA, F-63177 Aubiere, France","Clermont Universit\u00e9, Universit\u00e9 Blaise Pascal, LASMEA, BP 10448, F-63000 Clermont-Ferrand, France","CNRS, UMR 6602, LASMEA, F-63177 Aubi\u00e8re, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CNRS, UMR 6602, LASMEA, F-63177 Aubiere, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I169645620"]},{"raw_affiliation_string":"Clermont Universit\u00e9, Universit\u00e9 Blaise Pascal, LASMEA, BP 10448, F-63000 Clermont-Ferrand, France","institution_ids":["https://openalex.org/I4405258658"]},{"raw_affiliation_string":"CNRS, UMR 6602, LASMEA, F-63177 Aubi\u00e8re, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I169645620"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5107446378","display_name":"B. Gruzza","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I169645620","display_name":"Institut Pascal","ror":"https://ror.org/03vgfxd91","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I169645620","https://openalex.org/I198244214","https://openalex.org/I4210095849","https://openalex.org/I4210128870"]},{"id":"https://openalex.org/I4405258658","display_name":"Universit\u00e9 Blaise Pascal","ror":"https://ror.org/0119hgk08","country_code":"FR","type":"education","lineage":["https://openalex.org/I198244214","https://openalex.org/I4405258658"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"B. Gruzza","raw_affiliation_strings":["CNRS, UMR 6602, LASMEA, F-63177 Aubiere, France","Clermont Universit\u00e9, Universit\u00e9 Blaise Pascal, LASMEA, BP 10448, F-63000 Clermont-Ferrand, France","CNRS, UMR 6602, LASMEA, F-63177 Aubi\u00e8re, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CNRS, UMR 6602, LASMEA, F-63177 Aubiere, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I169645620"]},{"raw_affiliation_string":"Clermont Universit\u00e9, Universit\u00e9 Blaise Pascal, LASMEA, BP 10448, F-63000 Clermont-Ferrand, France","institution_ids":["https://openalex.org/I4405258658"]},{"raw_affiliation_string":"CNRS, UMR 6602, LASMEA, F-63177 Aubi\u00e8re, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I169645620"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014771093","display_name":"Matthieu Petit","orcid":"https://orcid.org/0000-0003-3267-9938","observed_orcids":["https://orcid.org/0000-0003-3267-9938"]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I21491767","display_name":"Aix-Marseille Universit\u00e9","ror":"https://ror.org/035xkbk20","country_code":"FR","type":"education","lineage":["https://openalex.org/I21491767"]},{"id":"https://openalex.org/I4210160450","display_name":"Centre Interdisciplinaire de Nanoscience de Marseille","ror":"https://ror.org/0550dmh35","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I21491767","https://openalex.org/I4210160450"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"M. Petit","raw_affiliation_strings":["Aix-Marseille Univ, CINaM UPR3118, 13288 Marseille Cedex 9, France","CNRS, CINaM UPR3118, 13288 Marseille Cedex 9, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Aix-Marseille Univ, CINaM UPR3118, 13288 Marseille Cedex 9, France","institution_ids":["https://openalex.org/I21491767","https://openalex.org/I4210160450"]},{"raw_affiliation_string":"CNRS, CINaM UPR3118, 13288 Marseille Cedex 9, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I4210160450"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056960995","display_name":"J\u00e1nos L. L\u00e1b\u00e1r","orcid":"https://orcid.org/0000-0002-3944-8350","observed_orcids":["https://orcid.org/0000-0002-3944-8350"]},"institutions":[{"id":"https://openalex.org/I4210132191","display_name":"Institute for Technical Physics and Materials Science","ror":"https://ror.org/03ftngr23","country_code":"HU","type":"facility","lineage":["https://openalex.org/I4210132191","https://openalex.org/I4210162307","https://openalex.org/I4387152226"]},{"id":"https://openalex.org/I7597260","display_name":"Hungarian Academy of Sciences","ror":"https://ror.org/02ks8qq67","country_code":"HU","type":"government","lineage":["https://openalex.org/I7597260"]}],"countries":["HU"],"is_corresponding":false,"raw_author_name":"J.L. L\u00e1b\u00e1r","raw_affiliation_strings":["MTA MFA, Thin Films Physics Laboratory, Research Institute for Technical Physics and Materials Science, Budapest H-1525 P.O. Box\u00a049, Hungary"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"MTA MFA, Thin Films Physics Laboratory, Research Institute for Technical Physics and Materials Science, Budapest H-1525 P.O. Box\u00a049, Hungary","institution_ids":["https://openalex.org/I4210132191","https://openalex.org/I7597260"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5083583856","display_name":"Miklos Menyhard","orcid":"https://orcid.org/0000-0003-4581-5337","observed_orcids":["https://orcid.org/0000-0003-4581-5337"]},"institutions":[{"id":"https://openalex.org/I4210132191","display_name":"Institute for Technical Physics and Materials Science","ror":"https://ror.org/03ftngr23","country_code":"HU","type":"facility","lineage":["https://openalex.org/I4210132191","https://openalex.org/I4210162307","https://openalex.org/I4387152226"]},{"id":"https://openalex.org/I7597260","display_name":"Hungarian Academy of Sciences","ror":"https://ror.org/02ks8qq67","country_code":"HU","type":"government","lineage":["https://openalex.org/I7597260"]}],"countries":["HU"],"is_corresponding":false,"raw_author_name":"M. Menyh\u00e1rd","raw_affiliation_strings":["MTA MFA, Thin Films Physics Laboratory, Research Institute for Technical Physics and Materials Science, Budapest H-1525 P.O. Box\u00a049, Hungary"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"MTA MFA, Thin Films Physics Laboratory, Research Institute for Technical Physics and Materials Science, Budapest H-1525 P.O. Box\u00a049, Hungary","institution_ids":["https://openalex.org/I4210132191","https://openalex.org/I7597260"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5086053787"],"corresponding_institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I169645620","https://openalex.org/I4405258658"],"apc_list":{"value":3340,"currency":"USD","value_usd":3340},"apc_paid":null,"fwci":1.4284,"has_fulltext":false,"cited_by_count":30,"citation_normalized_percentile":{"value":0.79513465,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":98},"biblio":{"volume":"606","issue":"13-14","first_page":"1093","last_page":"1099"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":0.9775000214576721,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":0.9775000214576721,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.00839999970048666,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.006399999838322401,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cubic-gan","display_name":"cubic GaN","score":0.746999979019165},{"id":"https://openalex.org/keywords/surface-oxidation-protection","display_name":"surface oxidation protection","score":0.7279999852180481}],"concepts":[{"id":"https://openalex.org/C175708663","wikidata":"https://www.wikidata.org/wiki/Q899559","display_name":"X-ray photoelectron spectroscopy","level":2,"score":0.7538915872573853},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6823751330375671},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.594200849533081},{"id":"https://openalex.org/C56052488","wikidata":"https://www.wikidata.org/wiki/Q103382","display_name":"Amorphous solid","level":2,"score":0.5872368216514587},{"id":"https://openalex.org/C194760766","wikidata":"https://www.wikidata.org/wiki/Q410851","display_name":"Nitride","level":3,"score":0.5629016757011414},{"id":"https://openalex.org/C82706917","wikidata":"https://www.wikidata.org/wiki/Q10251","display_name":"Plasma","level":2,"score":0.5426201820373535},{"id":"https://openalex.org/C33574316","wikidata":"https://www.wikidata.org/wiki/Q917260","display_name":"Passivation","level":3,"score":0.5326088666915894},{"id":"https://openalex.org/C2777855556","wikidata":"https://www.wikidata.org/wiki/Q4339544","display_name":"Annealing (glass)","level":2,"score":0.5066969990730286},{"id":"https://openalex.org/C2776595061","wikidata":"https://www.wikidata.org/wiki/Q1427934","display_name":"Glow discharge","level":3,"score":0.5019512176513672},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.47611671686172485},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4599081873893738},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.3385530114173889},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.19947180151939392},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.17317453026771545},{"id":"https://openalex.org/C8010536","wikidata":"https://www.wikidata.org/wiki/Q160398","display_name":"Crystallography","level":1,"score":0.14802902936935425},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.10556396842002869},{"id":"https://openalex.org/C42360764","wikidata":"https://www.wikidata.org/wiki/Q83588","display_name":"Chemical engineering","level":1,"score":0.07161667943000793},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1016/j.susc.2012.03.006","doi":"https://doi.org/10.1016/j.susc.2012.03.006","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.susc.2012.03.006","pdf_url":null,"source":{"id":"https://openalex.org/S137865625","display_name":"Surface Science","issn_l":"0039-6028","issn":["0039-6028","1879-2758"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-100","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Surface Science","raw_type":"journal-article"},{"id":"pmh:oai:HAL:hal-00724331v1","doi":null,"is_oa":false,"landing_page_url":"https://hal.science/hal-00724331","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4405252976","host_organization_name":"Centre pour la Communication Scientifique Directe","host_organization_lineage":["https://openalex.org/I4405252976"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Surface Science : A Journal Devoted to the Physics and Chemistry of Interfaces, 2012, 606 (13-14), pp.1093-1099","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W1609155227","https://openalex.org/W1632006457","https://openalex.org/W1632754551","https://openalex.org/W1964685296","https://openalex.org/W1968139516","https://openalex.org/W1969708417","https://openalex.org/W1972714236","https://openalex.org/W1976645762","https://openalex.org/W1977139749","https://openalex.org/W1981354000","https://openalex.org/W1993985916","https://openalex.org/W1994277358","https://openalex.org/W1997033676","https://openalex.org/W2001200374","https://openalex.org/W2003933418","https://openalex.org/W2010220441","https://openalex.org/W2023488790","https://openalex.org/W2025969085","https://openalex.org/W2029526589","https://openalex.org/W2040743899","https://openalex.org/W2046353096","https://openalex.org/W2055034145","https://openalex.org/W2056167320","https://openalex.org/W2061918714","https://openalex.org/W2069939896","https://openalex.org/W2075444877","https://openalex.org/W2077675560","https://openalex.org/W2082831390","https://openalex.org/W2093629193","https://openalex.org/W2096885486","https://openalex.org/W2168312129"],"related_works":["https://openalex.org/W2093629193","https://openalex.org/W2076281865","https://openalex.org/W1976645762","https://openalex.org/W3202766088","https://openalex.org/W4389977030","https://openalex.org/W1993985916","https://openalex.org/W2043454690","https://openalex.org/W2083999545","https://openalex.org/W1632754551","https://openalex.org/W2324373880"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":3}],"updated_date":"2026-11-04T10:54:05.112534","created_date":"2016-06-24T00:00:00"}