{"id":"https://openalex.org/W2004368000","doi":"https://doi.org/10.1116/1.1884119","title":"Characterization of an advanced high-efficiency electron emission device","display_name":"Characterization of an advanced high-efficiency electron emission device","publication_year":2005,"publication_date":"2005-03-01","ids":{"openalex":"https://openalex.org/W2004368000","doi":"https://doi.org/10.1116/1.1884119","mag":"2004368000"},"language":"en","primary_location":{"id":"doi:10.1116/1.1884119","doi":"https://doi.org/10.1116/1.1884119","is_oa":false,"landing_page_url":"https://doi.org/10.1116/1.1884119","pdf_url":null,"source":{"id":"https://openalex.org/S4210169477","display_name":"Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena","issn_l":"1071-1023","issn":["1071-1023","1520-8567"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","poland-70"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5077892002","display_name":"Nobuyasu Negishi","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210104019","display_name":"Pioneer (Japan)","ror":"https://ror.org/014kzp326","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210104019"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Nobuyasu Negishi","raw_affiliation_strings":["Corporate R&D Laboratories, Pioneer Corporation , Fujimi 6-1-1, Tsurugashima, Saitama 350-2288, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Corporate R&D Laboratories, Pioneer Corporation , Fujimi 6-1-1, Tsurugashima, Saitama 350-2288, Japan","institution_ids":["https://openalex.org/I4210104019"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103484646","display_name":"Tomonari Nakada","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210104019","display_name":"Pioneer (Japan)","ror":"https://ror.org/014kzp326","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210104019"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tomonari Nakada","raw_affiliation_strings":["Corporate R&D Laboratories, Pioneer Corporation , Fujimi 6-1-1, Tsurugashima, Saitama 350-2288, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Corporate R&D Laboratories, Pioneer Corporation , Fujimi 6-1-1, Tsurugashima, Saitama 350-2288, Japan","institution_ids":["https://openalex.org/I4210104019"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048283883","display_name":"Kazuto Sakemura","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210104019","display_name":"Pioneer (Japan)","ror":"https://ror.org/014kzp326","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210104019"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kazuto Sakemura","raw_affiliation_strings":["Corporate R&D Laboratories, Pioneer Corporation , Fujimi 6-1-1, Tsurugashima, Saitama 350-2288, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Corporate R&D Laboratories, Pioneer Corporation , Fujimi 6-1-1, Tsurugashima, Saitama 350-2288, Japan","institution_ids":["https://openalex.org/I4210104019"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Yoshiyuki Okuda","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210104019","display_name":"Pioneer (Japan)","ror":"https://ror.org/014kzp326","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210104019"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yoshiyuki Okuda","raw_affiliation_strings":["Corporate R&D Laboratories, Pioneer Corporation , Fujimi 6-1-1, Tsurugashima, Saitama 350-2288, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Corporate R&D Laboratories, Pioneer Corporation , Fujimi 6-1-1, Tsurugashima, Saitama 350-2288, Japan","institution_ids":["https://openalex.org/I4210104019"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084415014","display_name":"Hideo Satoh","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210104019","display_name":"Pioneer (Japan)","ror":"https://ror.org/014kzp326","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210104019"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hideo Satoh","raw_affiliation_strings":["Corporate R&D Laboratories, Pioneer Corporation , Fujimi 6-1-1, Tsurugashima, Saitama 350-2288, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Corporate R&D Laboratories, Pioneer Corporation , Fujimi 6-1-1, Tsurugashima, Saitama 350-2288, Japan","institution_ids":["https://openalex.org/I4210104019"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045721673","display_name":"Atsushi Watanabe","orcid":"https://orcid.org/0000-0003-0876-0672","observed_orcids":["https://orcid.org/0000-0003-0876-0672"]},"institutions":[{"id":"https://openalex.org/I4210104019","display_name":"Pioneer (Japan)","ror":"https://ror.org/014kzp326","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210104019"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Atsushi Watanabe","raw_affiliation_strings":["Corporate R&D Laboratories, Pioneer Corporation , Fujimi 6-1-1, Tsurugashima, Saitama 350-2288, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Corporate R&D Laboratories, Pioneer Corporation , Fujimi 6-1-1, Tsurugashima, Saitama 350-2288, Japan","institution_ids":["https://openalex.org/I4210104019"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Takamasa Yoshikawa","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210104019","display_name":"Pioneer (Japan)","ror":"https://ror.org/014kzp326","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210104019"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takamasa Yoshikawa","raw_affiliation_strings":["Corporate R&D Laboratories, Pioneer Corporation , Fujimi 6-1-1, Tsurugashima, Saitama 350-2288, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Corporate R&D Laboratories, Pioneer Corporation , Fujimi 6-1-1, Tsurugashima, Saitama 350-2288, Japan","institution_ids":["https://openalex.org/I4210104019"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041825481","display_name":"Kiyohide Ogasawara","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210104019","display_name":"Pioneer (Japan)","ror":"https://ror.org/014kzp326","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210104019"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kiyohide Ogasawara","raw_affiliation_strings":["Corporate R&D Laboratories, Pioneer Corporation , Fujimi 6-1-1, Tsurugashima, Saitama 350-2288, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Corporate R&D Laboratories, Pioneer Corporation , Fujimi 6-1-1, Tsurugashima, Saitama 350-2288, Japan","institution_ids":["https://openalex.org/I4210104019"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5081377650","display_name":"Nobuyoshi Koshida","orcid":"https://orcid.org/0000-0002-2424-0821","observed_orcids":["https://orcid.org/0000-0002-2424-0821"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Nobuyoshi Koshida","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Tokyo University of A & T , 2-24-16 Nakamachi, Koganei, Tokyo 184-8588, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Tokyo University of A & T , 2-24-16 Nakamachi, Koganei, Tokyo 184-8588, Japan","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":5.5401,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.96071829,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":"23","issue":"2","first_page":"682","last_page":"686"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13418","display_name":"Photocathodes and Microchannel Plates","score":0.9458000063896179,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13418","display_name":"Photocathodes and Microchannel Plates","score":0.9458000063896179,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11175","display_name":"Gyrotron and Vacuum Electronics Research","score":0.039900001138448715,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.00430000014603138,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cold-electron-emission","display_name":"cold electron emission","score":0.6520000100135803},{"id":"https://openalex.org/keywords/emission-current-density","display_name":"emission current density","score":0.7360000014305115},{"id":"https://openalex.org/keywords/emission-uniformity","display_name":"emission uniformity","score":0.878000020980835},{"id":"https://openalex.org/keywords/electron-energy-spectrum","display_name":"electron energy spectrum","score":0.7210000157356262},{"id":"https://openalex.org/keywords/device-lifetime","display_name":"device lifetime","score":0.8209999799728394},{"id":"https://openalex.org/keywords/low-voltage-operation","display_name":"low-voltage operation","score":0.6140000224113464}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7054815292358398},{"id":"https://openalex.org/C96141758","wikidata":"https://www.wikidata.org/wiki/Q216817","display_name":"Emission spectrum","level":3,"score":0.5832974910736084},{"id":"https://openalex.org/C147120987","wikidata":"https://www.wikidata.org/wiki/Q2225","display_name":"Electron","level":2,"score":0.5611478686332703},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5414966940879822},{"id":"https://openalex.org/C83581075","wikidata":"https://www.wikidata.org/wiki/Q1361503","display_name":"Excitation","level":2,"score":0.5083808302879333},{"id":"https://openalex.org/C121029787","wikidata":"https://www.wikidata.org/wiki/Q902877","display_name":"Field electron emission","level":3,"score":0.4809128940105438},{"id":"https://openalex.org/C212702","wikidata":"https://www.wikidata.org/wiki/Q178150","display_name":"Insulator (electricity)","level":2,"score":0.462943434715271},{"id":"https://openalex.org/C2985930086","wikidata":"https://www.wikidata.org/wiki/Q65037198","display_name":"Light emission","level":2,"score":0.45133477449417114},{"id":"https://openalex.org/C13892213","wikidata":"https://www.wikidata.org/wiki/Q905140","display_name":"Secondary emission","level":3,"score":0.42925459146499634},{"id":"https://openalex.org/C4839761","wikidata":"https://www.wikidata.org/wiki/Q212111","display_name":"Spectral line","level":2,"score":0.33617228269577026},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1738905906677246},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.13670614361763},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.06676238775253296},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1116/1.1884119","doi":"https://doi.org/10.1116/1.1884119","is_oa":false,"landing_page_url":"https://doi.org/10.1116/1.1884119","pdf_url":null,"source":{"id":"https://openalex.org/S4210169477","display_name":"Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena","issn_l":"1071-1023","issn":["1071-1023","1520-8567"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","poland-70"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1986226876","https://openalex.org/W2003458117","https://openalex.org/W2010356565","https://openalex.org/W2032094768","https://openalex.org/W2054128665","https://openalex.org/W2056347609","https://openalex.org/W2062138228","https://openalex.org/W2068787064","https://openalex.org/W2079063280","https://openalex.org/W2083428884","https://openalex.org/W2083993865"],"related_works":["https://openalex.org/W1531073176","https://openalex.org/W2079063280","https://openalex.org/W1653630945","https://openalex.org/W1996394108","https://openalex.org/W3208526779","https://openalex.org/W2159257809","https://openalex.org/W2169168432","https://openalex.org/W2028842018","https://openalex.org/W2100864145","https://openalex.org/W2090159231"],"abstract_inverted_index":{"As":[0],"previously":[1],"reported,":[2],"the":[3,21,29,47,51,55,64,68,81,116,122,132,139],"emission":[4,10,22,57,95,102,106,134],"characteristics":[5,30],"of":[6,31,39,63,67,91,118,127],"metal-insulator-semiconductor":[7],"(MIS)":[8],"electron":[9,34,73],"devices":[11],"could":[12],"be":[13,136],"significantly":[14],"improved":[15],"by":[16,138],"introducing":[17],"microdimple":[18],"structures":[19],"into":[20],"sites.":[23],"In":[24],"this":[25],"paper,":[26],"we":[27],"describe":[28],"efficient":[32],"cold":[33],"emitters":[35],"from":[36,115],"a":[37,61,93,98,125],"viewpoint":[38],"application":[40],"to":[41,53],"flat":[42],"panel":[43],"display":[44],"(FPD).":[45],"First,":[46],"forming":[48],"operation":[49,100],"for":[50],"device":[52,82,123],"activate":[54],"dynamic":[56],"is":[58,78,112],"discussed":[59],"on":[60],"basis":[62],"experimental":[65],"analyses":[66],"electrical":[69],"properties":[70],"and":[71,104,130],"output":[72],"energy":[74],"spectra.":[75],"Next":[76],"it":[77],"demonstrated":[79],"that":[80,121,131],"has":[83],"some":[84],"desirable":[85],"features":[86],"as":[87],"an":[88],"excitation":[89],"source":[90],"FPD:":[92],"high":[94],"current":[96],"density,":[97],"low":[99],"voltage,":[101],"uniformity,":[103],"stable":[105],"with":[107],"small":[108],"angle":[109],"dispersion.":[110],"It":[111],"also":[113],"shown":[114],"result":[117],"lifetime":[119],"evaluation":[120],"shows":[124],"half-life":[126],"3000":[128],"h,":[129],"deteriorated":[133],"can":[135],"recovered":[137],"dc":[140],"reactivation":[141],"treatment.":[142]},"counts_by_year":[{"year":2016,"cited_by_count":1}],"updated_date":"2026-09-29T14:09:16.559479","created_date":"2016-06-24T00:00:00"}