{"id":"https://openalex.org/W2004114887","doi":"https://doi.org/10.1080/08957959008246019","title":"DX-Like behavior of Se-impurity centers in gasb under hydrostatic pressure","display_name":"DX-Like behavior of Se-impurity centers in gasb under hydrostatic pressure","publication_year":1990,"publication_date":"1990-04-01","ids":{"openalex":"https://openalex.org/W2004114887","doi":"https://doi.org/10.1080/08957959008246019","mag":"2004114887"},"language":"en","primary_location":{"id":"doi:10.1080/08957959008246019","doi":"https://doi.org/10.1080/08957959008246019","is_oa":false,"landing_page_url":"https://doi.org/10.1080/08957959008246019","pdf_url":null,"source":{"id":"https://openalex.org/S108258784","display_name":"High Pressure Research","issn_l":"0895-7959","issn":["0895-7959","1026-7522","1477-2299"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320547","host_organization_name":"Taylor & Francis","host_organization_lineage":["https://openalex.org/P4310320547","https://openalex.org/P4310320449"],"host_organization_lineage_names":["Taylor & Francis","Informa"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"High Pressure Research","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5041687059","display_name":"Karima Zitouni","orcid":"https://orcid.org/0000-0002-3091-9873","observed_orcids":["https://orcid.org/0000-0002-3091-9873"]},"institutions":[{"id":"https://openalex.org/I137407579","display_name":"Universit\u00e9 Oran 1 Ahmed Ben Bella","ror":"https://ror.org/059et2b68","country_code":"DZ","type":"education","lineage":["https://openalex.org/I137407579"]}],"countries":["DZ"],"is_corresponding":false,"raw_author_name":"K. Zitouni","raw_affiliation_strings":["a   Micro Opto Electronics Laboratory, Department of Physics , University of ORAN-ES-SENIA , 31100,  ORAN ,  ALGERIA","Micro Opto Electronics Laboratory, Department of Physics , University of ORAN-ES-SENIA , 31100, ORAN , ALGERIA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"a   Micro Opto Electronics Laboratory, Department of Physics , University of ORAN-ES-SENIA , 31100,  ORAN ,  ALGERIA","institution_ids":["https://openalex.org/I137407579"]},{"raw_affiliation_string":"Micro Opto Electronics Laboratory, Department of Physics , University of ORAN-ES-SENIA , 31100, ORAN , ALGERIA","institution_ids":["https://openalex.org/I137407579"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082895727","display_name":"Asma Kadri","orcid":"https://orcid.org/0000-0002-5987-2386","observed_orcids":["https://orcid.org/0000-0002-5987-2386"]},"institutions":[{"id":"https://openalex.org/I137407579","display_name":"Universit\u00e9 Oran 1 Ahmed Ben Bella","ror":"https://ror.org/059et2b68","country_code":"DZ","type":"education","lineage":["https://openalex.org/I137407579"]}],"countries":["DZ"],"is_corresponding":false,"raw_author_name":"A. Kadri","raw_affiliation_strings":["a   Micro Opto Electronics Laboratory, Department of Physics , University of ORAN-ES-SENIA , 31100,  ORAN ,  ALGERIA","Micro Opto Electronics Laboratory, Department of Physics , University of ORAN-ES-SENIA , 31100, ORAN , ALGERIA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"a   Micro Opto Electronics Laboratory, Department of Physics , University of ORAN-ES-SENIA , 31100,  ORAN ,  ALGERIA","institution_ids":["https://openalex.org/I137407579"]},{"raw_affiliation_string":"Micro Opto Electronics Laboratory, Department of Physics , University of ORAN-ES-SENIA , 31100, ORAN , ALGERIA","institution_ids":["https://openalex.org/I137407579"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061611330","display_name":"L. Ko\u0144czewicz","orcid":"https://orcid.org/0000-0001-6022-7985","observed_orcids":["https://orcid.org/0000-0001-6022-7985"]},"institutions":[{"id":"https://openalex.org/I4210091332","display_name":"Institute of High Pressure Physics","ror":"https://ror.org/00fb7yx07","country_code":"PL","type":"facility","lineage":["https://openalex.org/I4210091332","https://openalex.org/I99542240"]},{"id":"https://openalex.org/I99542240","display_name":"Polish Academy of Sciences","ror":"https://ror.org/01dr6c206","country_code":"PL","type":"government","lineage":["https://openalex.org/I99542240"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"L. Konczewicz","raw_affiliation_strings":["b  High Pressure Research Centre, Unipress, Polish Academy of Sciences ,  Ul. Sokolowska 29 , 01\u2013142,  WARSAW ,  POLAND"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"b  High Pressure Research Centre, Unipress, Polish Academy of Sciences ,  Ul. Sokolowska 29 , 01\u2013142,  WARSAW ,  POLAND","institution_ids":["https://openalex.org/I4210091332","https://openalex.org/I99542240"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111553659","display_name":"R.L. Aulombard","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"R. L. Aulombard","raw_affiliation_strings":["c  Groupe d'Etudes des Semiconducteurs (C.N.R.S.-U.A. 357), U.S.T.L. , Pl. E. Bataillon 34060,  MONTPELLIER ,  FRANCE","Groupe d'Etudes des Semiconducteurs (C.N.R.S.-U.A. 357), U.S.T.L. , Pl. E. Bataillon 34060, MONTPELLIER , FRANCE"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"c  Groupe d'Etudes des Semiconducteurs (C.N.R.S.-U.A. 357), U.S.T.L. , Pl. E. Bataillon 34060,  MONTPELLIER ,  FRANCE","institution_ids":["https://openalex.org/I1294671590"]},{"raw_affiliation_string":"Groupe d'Etudes des Semiconducteurs (C.N.R.S.-U.A. 357), U.S.T.L. , Pl. E. Bataillon 34060, MONTPELLIER , FRANCE","institution_ids":["https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085930237","display_name":"B. Goutiers","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"B. Goutiers","raw_affiliation_strings":["d   I.N.S.A.-C.N.R.S.  , 156 Av. de Rangueil 31077,  TOULOUSE","e   S.N.C.I.-C.N.R.S. , Av. des Martyrs , 38042,  GRENOBLE ,  FRANCE","I.N.S.A.-C.N.R.S. , 156 Av. de Rangueil 31077, TOULOUSE","S.N.C.I.-C.N.R.S. , Av. des Martyrs , 38042, GRENOBLE , FRANCE"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"d   I.N.S.A.-C.N.R.S.  , 156 Av. de Rangueil 31077,  TOULOUSE","institution_ids":[]},{"raw_affiliation_string":"e   S.N.C.I.-C.N.R.S. , Av. des Martyrs , 38042,  GRENOBLE ,  FRANCE","institution_ids":["https://openalex.org/I1294671590"]},{"raw_affiliation_string":"I.N.S.A.-C.N.R.S. , 156 Av. de Rangueil 31077, TOULOUSE","institution_ids":[]},{"raw_affiliation_string":"S.N.C.I.-C.N.R.S. , Av. des Martyrs , 38042, GRENOBLE , FRANCE","institution_ids":["https://openalex.org/I1294671590"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5113625186","display_name":"J.C. Portal","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"J. C. Portal","raw_affiliation_strings":["d   I.N.S.A.-C.N.R.S.  , 156 Av. de Rangueil 31077,  TOULOUSE","e   S.N.C.I.-C.N.R.S. , Av. des Martyrs , 38042,  GRENOBLE ,  FRANCE","I.N.S.A.-C.N.R.S. , 156 Av. de Rangueil 31077, TOULOUSE","S.N.C.I.-C.N.R.S. , Av. des Martyrs , 38042, GRENOBLE , FRANCE"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"d   I.N.S.A.-C.N.R.S.  , 156 Av. de Rangueil 31077,  TOULOUSE","institution_ids":[]},{"raw_affiliation_string":"e   S.N.C.I.-C.N.R.S. , Av. des Martyrs , 38042,  GRENOBLE ,  FRANCE","institution_ids":["https://openalex.org/I1294671590"]},{"raw_affiliation_string":"I.N.S.A.-C.N.R.S. , 156 Av. de Rangueil 31077, TOULOUSE","institution_ids":[]},{"raw_affiliation_string":"S.N.C.I.-C.N.R.S. , Av. des Martyrs , 38042, GRENOBLE , FRANCE","institution_ids":["https://openalex.org/I1294671590"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"3","issue":"1-6","first_page":"18","last_page":"20"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.8618000149726868,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.8618000149726868,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10413","display_name":"High-pressure geophysics and materials","score":0.09269999712705612,"subfield":{"id":"https://openalex.org/subfields/1908","display_name":"Geophysics"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.01140000019222498,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/gasb","display_name":"GaSb","score":0.8730000257492065},{"id":"https://openalex.org/keywords/hydrostatic-pressure","display_name":"hydrostatic pressure","score":0.7170000076293945},{"id":"https://openalex.org/keywords/electron-trapping","display_name":"electron trapping","score":0.8889999985694885},{"id":"https://openalex.org/keywords/thermionic-emission","display_name":"thermionic emission","score":0.8140000104904175},{"id":"https://openalex.org/keywords/lattice-relaxation","display_name":"lattice relaxation","score":0.7850000262260437},{"id":"https://openalex.org/keywords/hall-coefficient","display_name":"Hall coefficient","score":0.9710000157356262},{"id":"https://openalex.org/keywords/electrical-resistivity","display_name":"electrical resistivity","score":0.9490000009536743}],"concepts":[{"id":"https://openalex.org/C71987851","wikidata":"https://www.wikidata.org/wiki/Q7216430","display_name":"Impurity","level":2,"score":0.8889976739883423},{"id":"https://openalex.org/C2910081258","wikidata":"https://www.wikidata.org/wiki/Q177807","display_name":"Hydrostatic pressure","level":2,"score":0.8242694139480591},{"id":"https://openalex.org/C69990965","wikidata":"https://www.wikidata.org/wiki/Q65402698","display_name":"Electrical resistivity and conductivity","level":2,"score":0.5721223950386047},{"id":"https://openalex.org/C147120987","wikidata":"https://www.wikidata.org/wiki/Q2225","display_name":"Electron","level":2,"score":0.5692735314369202},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.554431140422821},{"id":"https://openalex.org/C134853933","wikidata":"https://www.wikidata.org/wiki/Q208641","display_name":"Hydrostatic equilibrium","level":2,"score":0.5283161997795105},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5272936820983887},{"id":"https://openalex.org/C134112204","wikidata":"https://www.wikidata.org/wiki/Q10656","display_name":"Hall effect","level":3,"score":0.514717161655426},{"id":"https://openalex.org/C2776029896","wikidata":"https://www.wikidata.org/wiki/Q3935810","display_name":"Relaxation (psychology)","level":2,"score":0.4727640748023987},{"id":"https://openalex.org/C39353612","wikidata":"https://www.wikidata.org/wiki/Q5283759","display_name":"Atmospheric temperature range","level":2,"score":0.46983808279037476},{"id":"https://openalex.org/C41994538","wikidata":"https://www.wikidata.org/wiki/Q1260777","display_name":"Pressure coefficient","level":2,"score":0.4373123347759247},{"id":"https://openalex.org/C57863236","wikidata":"https://www.wikidata.org/wiki/Q1130571","display_name":"Doping","level":2,"score":0.4367278516292572},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.28522223234176636},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.12289327383041382},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10787078738212585},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C77805123","wikidata":"https://www.wikidata.org/wiki/Q161272","display_name":"Social psychology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1080/08957959008246019","doi":"https://doi.org/10.1080/08957959008246019","is_oa":false,"landing_page_url":"https://doi.org/10.1080/08957959008246019","pdf_url":null,"source":{"id":"https://openalex.org/S108258784","display_name":"High Pressure Research","issn_l":"0895-7959","issn":["0895-7959","1026-7522","1477-2299"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320547","host_organization_name":"Taylor & Francis","host_organization_lineage":["https://openalex.org/P4310320547","https://openalex.org/P4310320449"],"host_organization_lineage_names":["Taylor & Francis","Informa"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"High Pressure Research","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W1965807054","https://openalex.org/W1977056912","https://openalex.org/W1994140039","https://openalex.org/W2024445931","https://openalex.org/W2081279811"],"related_works":["https://openalex.org/W2021879196","https://openalex.org/W1994140039","https://openalex.org/W179501009","https://openalex.org/W1977056912","https://openalex.org/W2015656253","https://openalex.org/W126538218","https://openalex.org/W1985330605","https://openalex.org/W2064707666","https://openalex.org/W2001353110","https://openalex.org/W2065481497"],"abstract_inverted_index":{"Hall":[0],"coefficient":[1],"(RH)":[2],"and":[3,18,21],"electrical":[4],"resistivity":[5],"measurements":[6],"have":[7],"been":[8],"performed":[9],"as":[10],"a":[11,30,59,83,94],"function":[12],"of":[13,32,67],"temperature":[14],"(between":[15],"77":[16],"K":[17],"300":[19,51],"K)":[20],"under":[22],"hydrostatic":[23],"pressures":[24],"(up":[25],"to":[26,71],"15":[27],"kbar)":[28],"on":[29],"set":[31],"Se-doped":[33],"GaSb":[34],"samples":[35],"with":[36],"impurity":[37,61,100],"concentrations":[38],"in":[39],"the":[40,53,99],"range":[41],"8\u00d71017":[42],"cm\u22123":[43],"-":[44],"1\u00d71018":[45],"cm\u22123.":[46],"With":[47],"increasing":[48],"pressure":[49,64],"at":[50,74],"K,":[52],"electrons":[54],"are":[55],"strongly":[56],"trapped":[57],"into":[58],"resonant":[60],"level.":[62],"The":[63,77],"induced":[65],"occupation":[66],"this":[68],"level":[69],"leads":[70],"time-dependent":[72],"effects":[73],"T<120":[75],"K.":[76],"activated":[78],"thermal":[79],"electron":[80],"emission":[81],"over":[82],"potential":[84],"barrier":[85],"E<sb>B":[86],"=":[87],"300\u00d730":[88],"meV":[89],"gives":[90],"clear":[91],"evidence":[92],"for":[93,103],"large":[95],"lattice":[96],"relaxation":[97],"around":[98],"centers":[101],"characteristic":[102],"DX-like":[104],"behavior.":[105]},"counts_by_year":[],"updated_date":"2026-11-08T12:12:28.789561","created_date":"2016-06-24T00:00:00"}