{"id":"https://openalex.org/W2003520005","doi":"https://doi.org/10.1117/12.61043","title":"Stabilized and accelerated speckle strain gauge","display_name":"Stabilized and accelerated speckle strain gauge","publication_year":1993,"publication_date":"1993-03-01","ids":{"openalex":"https://openalex.org/W2003520005","doi":"https://doi.org/10.1117/12.61043","mag":"2003520005"},"language":"en","primary_location":{"id":"doi:10.1117/12.61043","doi":"https://doi.org/10.1117/12.61043","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.61043","pdf_url":null,"source":{"id":"https://openalex.org/S175543413","display_name":"Optical Engineering","issn_l":"0091-3286","issn":["0091-3286","1560-2303"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","jufo-1","ki-jl-1","norway-1","poland-40","russia-white-list-3"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Optical Engineering","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5110744090","display_name":"Ichirou Yamaguchi","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210110652","display_name":"RIKEN","ror":"https://ror.org/01sjwvz98","country_code":"JP","type":"facility","lineage":["https://openalex.org/I4210110652"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Ichirou Yamaguchi","raw_affiliation_strings":["RIKEN--Institute of Physical and Chemical Research","RIKEN--Institute of Physical and Chemical Research (Japan)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"RIKEN--Institute of Physical and Chemical Research","institution_ids":["https://openalex.org/I4210110652"]},{"raw_affiliation_string":"RIKEN--Institute of Physical and Chemical Research (Japan)","institution_ids":["https://openalex.org/I4210110652"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110045845","display_name":"Tamiki Takemori","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I150993360","display_name":"Hamamatsu Photonics (Japan)","ror":"https://ror.org/03natb733","country_code":"JP","type":"company","lineage":["https://openalex.org/I150993360"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tamiki Takemori","raw_affiliation_strings":["Hamamatsu Photonics K.K","Hamamatsu Photonics K. K., Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hamamatsu Photonics K.K","institution_ids":["https://openalex.org/I150993360"]},{"raw_affiliation_string":"Hamamatsu Photonics K. K., Japan","institution_ids":["https://openalex.org/I150993360"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5040531473","display_name":"Koichi Kobayashi","orcid":"https://orcid.org/0000-0002-3358-0254","observed_orcids":["https://orcid.org/0000-0002-3358-0254"]},"institutions":[{"id":"https://openalex.org/I4405285782","display_name":"Toyo Seiki (Japan)","ror":"https://ror.org/008mfjv93","country_code":"JP","type":"company","lineage":["https://openalex.org/I4405285782"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Koichi Kobayashi","raw_affiliation_strings":["Toyo Seiki Co","Toyo Seiki Co. (Japan)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Toyo Seiki Co","institution_ids":["https://openalex.org/I4405285782"]},{"raw_affiliation_string":"Toyo Seiki Co. (Japan)","institution_ids":["https://openalex.org/I4405285782"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.7837,"has_fulltext":false,"cited_by_count":22,"citation_normalized_percentile":{"value":0.84730379,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":"32","issue":"03","first_page":"618","last_page":"625"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.0005000000237487257,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","score":0.0005000000237487257,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/speckle-displacement","display_name":"speckle displacement","score":0.8889999985694885},{"id":"https://openalex.org/keywords/strain-measurement","display_name":"strain measurement","score":0.8090000152587891},{"id":"https://openalex.org/keywords/cross-correlation-function","display_name":"cross correlation function","score":0.6539999842643738},{"id":"https://openalex.org/keywords/real-time-correlators","display_name":"real-time correlators","score":0.6639999747276306},{"id":"https://openalex.org/keywords/image-sensors","display_name":"image sensors","score":0.6079999804496765},{"id":"https://openalex.org/keywords/polymer-films","display_name":"polymer films","score":0.7480000257492065},{"id":"https://openalex.org/keywords/dynamic-strain","display_name":"dynamic strain","score":0.8399999737739563},{"id":"https://openalex.org/keywords/measurement-stability","display_name":"measurement stability","score":0.6129999756813049},{"id":"https://openalex.org/keywords/time-response","display_name":"time response","score":0.7820000052452087}],"concepts":[{"id":"https://openalex.org/C102290492","wikidata":"https://www.wikidata.org/wiki/Q7575045","display_name":"Speckle pattern","level":2,"score":0.9008699059486389},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.7727054357528687},{"id":"https://openalex.org/C60584519","wikidata":"https://www.wikidata.org/wiki/Q610723","display_name":"Strain gauge","level":2,"score":0.6868982315063477},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.6063104271888733},{"id":"https://openalex.org/C107551265","wikidata":"https://www.wikidata.org/wiki/Q1458245","display_name":"Displacement (psychology)","level":2,"score":0.5826278924942017},{"id":"https://openalex.org/C172991262","wikidata":"https://www.wikidata.org/wiki/Q5358427","display_name":"Electronic speckle pattern interferometry","level":3,"score":0.5231308341026306},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.5034529566764832},{"id":"https://openalex.org/C168834538","wikidata":"https://www.wikidata.org/wiki/Q3705329","display_name":"Beam (structure)","level":2,"score":0.43340128660202026},{"id":"https://openalex.org/C204366326","wikidata":"https://www.wikidata.org/wiki/Q3027650","display_name":"Deformation (meteorology)","level":2,"score":0.42655646800994873},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.2670326232910156},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C542102704","wikidata":"https://www.wikidata.org/wiki/Q183257","display_name":"Psychotherapist","level":1,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1117/12.61043","doi":"https://doi.org/10.1117/12.61043","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.61043","pdf_url":null,"source":{"id":"https://openalex.org/S175543413","display_name":"Optical Engineering","issn_l":"0091-3286","issn":["0091-3286","1560-2303"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","jufo-1","ki-jl-1","norway-1","poland-40","russia-white-list-3"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Optical Engineering","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W1979984633","https://openalex.org/W2746319170","https://openalex.org/W2156690433","https://openalex.org/W1995892098","https://openalex.org/W2004932507","https://openalex.org/W130202193","https://openalex.org/W1613055756","https://openalex.org/W1992678955","https://openalex.org/W2746360463","https://openalex.org/W1519646676"],"abstract_inverted_index":{"We":[0],"have":[1],"improved":[2],"the":[3,9,25,42,46,67,70,74,82,96,112,135,148,156,160,173],"stability":[4],"and":[5,37,77,114,142,159],"temporal":[6],"response":[7],"of":[8,54,69,81,107,117,120,124,131,140,147,155,167,172],"laser":[10,29,116],"speckle":[11,18,38],"strain":[12,16,130,182],"gauge":[13],"that":[14],"detects":[15],"from":[17],"displacement":[19,59],"caused":[20],"by":[21,51,62,111],"surface":[22],"deformation.":[23],"In":[24],"gauge,":[26,149],"a":[27,34,52,63,78,102,105,115,121,138,164],"narrow":[28],"beam":[30],"is":[31,60,93,163,183],"incident":[32],"on":[33,153],"diffuse":[35],"surface,":[36],"patterns":[39],"appearing":[40],"in":[41],"light":[43],"scattered":[44],"through":[45],"symmetrical":[47],"angles":[48],"are":[49],"detected":[50],"pair":[53,106],"linear":[55],"image":[56,108],"sensors.":[57],"Speckle":[58],"derived":[61],"real-time":[64],"correlator":[65],"as":[66],"peak":[68,98],"cross":[71],"correlation":[72,97],"between":[73,137],"current":[75],"frame":[76,80,92],"reference":[79,91],"sensor":[83,161],"driven":[84],"at":[85,134],"1000":[86],"frames":[87],"per":[88],"second.":[89],"The":[90,145,169],"fixed":[94],"until":[95],"becomes":[99],"lower":[100],"than":[101],"threshold.":[103],"Using":[104],"sensors,":[109],"followed":[110],"correlators,":[113],"output":[118],"power":[119],"few":[122,165],"tens":[123,166],"milliwatts,":[125],"we":[126],"could":[127],"measure":[128],"dynamic":[129],"polymer":[132],"films":[133],"frequency":[136],"fraction":[139],"hertz":[141],"100":[143],"Hz.":[144],"resolution":[146],"which":[150],"only":[151],"depends":[152],"geometry":[154],"optical":[157],"system":[158],"pitch,":[162],"microstrains.":[168],"upper":[170],"limit":[171],"measurement":[174],"can":[175],"be":[176],"extended":[177],"arbitrarily":[178],"because":[179],"small":[180],"incremental":[181],"integrated.":[184]},"counts_by_year":[{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-10-24T09:50:30.924529","created_date":"2016-06-24T00:00:00"}