{"id":"https://openalex.org/W2003128571","doi":"https://doi.org/10.1063/1.346992","title":"Impurity effect on the creation of Ga vacancies in a Si-doped layer grown on Be-doped GaAs by molecular-beam epitaxy","display_name":"Impurity effect on the creation of Ga vacancies in a Si-doped layer grown on Be-doped GaAs by molecular-beam epitaxy","publication_year":1990,"publication_date":"1990-12-01","ids":{"openalex":"https://openalex.org/W2003128571","doi":"https://doi.org/10.1063/1.346992","mag":"2003128571"},"language":"en","primary_location":{"id":"doi:10.1063/1.346992","doi":"https://doi.org/10.1063/1.346992","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.346992","pdf_url":null,"source":{"id":"https://openalex.org/S187991544","display_name":"Journal of Applied Physics","issn_l":"0021-8979","issn":["0021-8979","1089-7550","1520-8850"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-d","jufo-1","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Applied Physics","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5074670180","display_name":"Jong\u2010Lam Lee","orcid":"https://orcid.org/0000-0003-4502-9758","observed_orcids":["https://orcid.org/0000-0003-4502-9758"]},"institutions":[{"id":"https://openalex.org/I146399215","display_name":"University of Tsukuba","ror":"https://ror.org/02956yf07","country_code":"JP","type":"education","lineage":["https://openalex.org/I146399215"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Jong-Lam Lee","raw_affiliation_strings":["Institute of Materials Science, University of Tsukuba, Tsukuba, Ibaraki 305, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Materials Science, University of Tsukuba, Tsukuba, Ibaraki 305, Japan","institution_ids":["https://openalex.org/I146399215"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100786484","display_name":"Long Wei","orcid":"https://orcid.org/0000-0002-9952-7149","observed_orcids":["https://orcid.org/0000-0002-9952-7149"]},"institutions":[{"id":"https://openalex.org/I146399215","display_name":"University of Tsukuba","ror":"https://ror.org/02956yf07","country_code":"JP","type":"education","lineage":["https://openalex.org/I146399215"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Long Wei","raw_affiliation_strings":["Institute of Materials Science, University of Tsukuba, Tsukuba, Ibaraki 305, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Materials Science, University of Tsukuba, Tsukuba, Ibaraki 305, Japan","institution_ids":["https://openalex.org/I146399215"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110021569","display_name":"Shoichiro Tanigawa","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I146399215","display_name":"University of Tsukuba","ror":"https://ror.org/02956yf07","country_code":"JP","type":"education","lineage":["https://openalex.org/I146399215"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shoichiro Tanigawa","raw_affiliation_strings":["Institute of Materials Science, University of Tsukuba, Tsukuba, Ibaraki 305, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Materials Science, University of Tsukuba, Tsukuba, Ibaraki 305, Japan","institution_ids":["https://openalex.org/I146399215"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5113589343","display_name":"Mitsuo Kawabe","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I146399215","display_name":"University of Tsukuba","ror":"https://ror.org/02956yf07","country_code":"JP","type":"education","lineage":["https://openalex.org/I146399215"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Mitsuo Kawabe","raw_affiliation_strings":["Institute of Materials Science, University of Tsukuba, Tsukuba, Ibaraki 305, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Materials Science, University of Tsukuba, Tsukuba, Ibaraki 305, Japan","institution_ids":["https://openalex.org/I146399215"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I146399215"],"apc_list":{"value":3500,"currency":"USD","value_usd":3500},"apc_paid":null,"fwci":2.5158,"has_fulltext":false,"cited_by_count":36,"citation_normalized_percentile":{"value":0.89607289,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":96},"biblio":{"volume":"68","issue":"11","first_page":"5571","last_page":"5575"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12579","display_name":"Muon and positron interactions and applications","score":0.9883000254631042,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12579","display_name":"Muon and positron interactions and applications","score":0.9883000254631042,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.010400000028312206,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.0003000000142492354,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ga-vacancies","display_name":"Ga vacancies","score":0.8849999904632568},{"id":"https://openalex.org/keywords/silicon-doping","display_name":"silicon doping","score":0.6899999976158142},{"id":"https://openalex.org/keywords/impurity-effects","display_name":"impurity effects","score":0.5889999866485596},{"id":"https://openalex.org/keywords/fermi-level-shift","display_name":"Fermi level shift","score":0.7419999837875366},{"id":"https://openalex.org/keywords/silicon-diffusion","display_name":"silicon diffusion","score":0.5569999814033508},{"id":"https://openalex.org/keywords/interfaces","display_name":"interfaces","score":0.40700000524520874},{"id":"https://openalex.org/keywords/slow-positron-beam","display_name":"slow positron beam","score":0.6290000081062317}],"concepts":[{"id":"https://openalex.org/C3792809","wikidata":"https://www.wikidata.org/wiki/Q898542","display_name":"Molecular beam epitaxy","level":4,"score":0.8428717255592346},{"id":"https://openalex.org/C57863236","wikidata":"https://www.wikidata.org/wiki/Q1130571","display_name":"Doping","level":2,"score":0.8316758871078491},{"id":"https://openalex.org/C71987851","wikidata":"https://www.wikidata.org/wiki/Q7216430","display_name":"Impurity","level":2,"score":0.7462791204452515},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6846804618835449},{"id":"https://openalex.org/C110738630","wikidata":"https://www.wikidata.org/wiki/Q1135540","display_name":"Epitaxy","level":3,"score":0.5091142058372498},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.49214595556259155},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.47915858030319214},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.42834970355033875},{"id":"https://openalex.org/C58312451","wikidata":"https://www.wikidata.org/wiki/Q4817200","display_name":"Atom (system on chip)","level":2,"score":0.4244881868362427},{"id":"https://openalex.org/C79794668","wikidata":"https://www.wikidata.org/wiki/Q1616270","display_name":"Heterojunction","level":2,"score":0.4182204604148865},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.3078237771987915},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.21870115399360657},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.17446741461753845},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0641690194606781},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.0},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1063/1.346992","doi":"https://doi.org/10.1063/1.346992","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.346992","pdf_url":null,"source":{"id":"https://openalex.org/S187991544","display_name":"Journal of Applied Physics","issn_l":"0021-8979","issn":["0021-8979","1089-7550","1520-8850"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-d","jufo-1","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Applied Physics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W1968050724","https://openalex.org/W1969695378","https://openalex.org/W1978381903","https://openalex.org/W1986929486","https://openalex.org/W1990825606","https://openalex.org/W1996483943","https://openalex.org/W1998458053","https://openalex.org/W2002152315","https://openalex.org/W2005679078","https://openalex.org/W2009766006","https://openalex.org/W2010088253","https://openalex.org/W2020016651","https://openalex.org/W2023208390","https://openalex.org/W2042716091","https://openalex.org/W2043476146","https://openalex.org/W2045096407","https://openalex.org/W2048184712","https://openalex.org/W2048411946","https://openalex.org/W2053406241","https://openalex.org/W2068035409","https://openalex.org/W2072617649","https://openalex.org/W2073509256","https://openalex.org/W2078613115","https://openalex.org/W2078870752","https://openalex.org/W2079346770","https://openalex.org/W2081120110","https://openalex.org/W2094939145"],"related_works":["https://openalex.org/W2047799062","https://openalex.org/W2086465128","https://openalex.org/W2591600235","https://openalex.org/W2331670375","https://openalex.org/W2009766006","https://openalex.org/W1988046414","https://openalex.org/W2067110497","https://openalex.org/W2087419797","https://openalex.org/W1974449757","https://openalex.org/W2052573056"],"abstract_inverted_index":{"The":[0,39,88],"impurity":[1],"effects":[2],"on":[3,13,118],"the":[4,32,43,47,55,58,62,91,96,106,113],"creation":[5,33,48],"of":[6,28,34,46,49,54,81,86,115],"Ga":[7,35,50],"vacancies":[8,36,51],"in":[9,37,52,57,75,90],"Si-doped":[10,116],"GaAs":[11,76,117],"grown":[12],"a":[14,71,78,119],"Be-doped":[15,101,120],"epilayer":[16],"by":[17,61,105],"molecular-beam":[18],"epitaxy":[19],"were":[20],"investigated":[21],"through":[22],"slow":[23],"positron":[24],"beam":[25],"measurements.":[26],"Doping":[27],"Si":[29,63,72,99],"impurities":[30],"enhances":[31],"GaAs.":[38],"experimental":[40],"results":[41],"support":[42],"theoretical":[44],"prediction":[45],"terms":[53],"change":[56,89],"Fermi-level":[59],"position":[60],"doping":[64],"into":[65],"GaAs,":[66],"and":[67,100],"also":[68],"suggest":[69],"that":[70,85],"atom":[73],"diffuses":[74],"as":[77],"neutral":[79],"complex":[80],"SiGa-VGa":[82],"rather":[83],"than":[84],"SiGa-SiAs.":[87],"S":[92],"parameter":[93],"distribution":[94],"at":[95],"interface":[97],"between":[98],"regions":[102],"is":[103],"explained":[104],"Be":[107],"carryforward":[108],"phenomenon":[109],"which":[110],"occurs":[111],"during":[112],"growth":[114],"epilayer.":[121]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":2}],"updated_date":"2026-05-21T06:26:12.895304","created_date":"2016-06-24T00:00:00"}