{"id":"https://openalex.org/W2002942235","doi":"https://doi.org/10.4028/www.scientific.net/amr.501.257","title":"Structural and Electrical Properties of Pb1-xYbxSeyTe1-y Quaternary Compound Synthesized by Solid State Microwave Assisted Plasma","display_name":"Structural and Electrical Properties of Pb1-xYbxSeyTe1-y Quaternary Compound Synthesized by Solid State Microwave Assisted Plasma","publication_year":2012,"publication_date":"2012-04-01","ids":{"openalex":"https://openalex.org/W2002942235","doi":"https://doi.org/10.4028/www.scientific.net/amr.501.257","mag":"2002942235"},"language":"en","primary_location":{"id":"doi:10.4028/www.scientific.net/amr.501.257","doi":"https://doi.org/10.4028/www.scientific.net/amr.501.257","is_oa":false,"landing_page_url":"https://doi.org/10.4028/www.scientific.net/amr.501.257","pdf_url":null,"source":{"id":"https://openalex.org/S67425620","display_name":"Advanced materials research","issn_l":"1022-6680","issn":["1022-6680","1662-8985"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310317839","host_organization_name":"Trans Tech Publications","host_organization_lineage":["https://openalex.org/P4310317839"],"host_organization_lineage_names":["Trans Tech Publications"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Advanced Materials Research","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5110179362","display_name":"Arshad Hmood","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I139322472","display_name":"Universiti Sains Malaysia","ror":"https://ror.org/02rgb2k63","country_code":"MY","type":"education","lineage":["https://openalex.org/I139322472"]}],"countries":["MY"],"is_corresponding":false,"raw_author_name":"Arshad Hmood","raw_affiliation_strings":["Universiti Sains, Malaysia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Universiti Sains, Malaysia","institution_ids":["https://openalex.org/I139322472"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110298335","display_name":"Arej Kadhim","orcid":"https://orcid.org/0000-0001-7493-6061","observed_orcids":["https://orcid.org/0000-0001-7493-6061"]},"institutions":[{"id":"https://openalex.org/I139322472","display_name":"Universiti Sains Malaysia","ror":"https://ror.org/02rgb2k63","country_code":"MY","type":"education","lineage":["https://openalex.org/I139322472"]}],"countries":["MY"],"is_corresponding":false,"raw_author_name":"Arej Kadhim","raw_affiliation_strings":["Universiti Sains, Malaysia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Universiti Sains, Malaysia","institution_ids":["https://openalex.org/I139322472"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5066085076","display_name":"Abu Hassan Haslan","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I139322472","display_name":"Universiti Sains Malaysia","ror":"https://ror.org/02rgb2k63","country_code":"MY","type":"education","lineage":["https://openalex.org/I139322472"]}],"countries":["MY"],"is_corresponding":false,"raw_author_name":"Abu Hassan Haslan","raw_affiliation_strings":["University Sains Malaysia (USM)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University Sains Malaysia (USM)","institution_ids":["https://openalex.org/I139322472"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I139322472"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"501","issue":null,"first_page":"257","last_page":"260"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10440","display_name":"Advanced Thermoelectric Materials and Devices","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10440","display_name":"Advanced Thermoelectric Materials and Devices","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10590","display_name":"Chalcogenide Semiconductor Thin Films","score":0.0020000000949949026,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.00019999999494757503,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ytterbium-doping","display_name":"ytterbium doping","score":0.8949999809265137},{"id":"https://openalex.org/keywords/solid-state-synthesis","display_name":"solid-state synthesis","score":0.781000018119812},{"id":"https://openalex.org/keywords/polycrystalline-thin-films","display_name":"polycrystalline thin films","score":0.8799999952316284},{"id":"https://openalex.org/keywords/rock-salt-structure","display_name":"rock salt structure","score":0.8309999704360962},{"id":"https://openalex.org/keywords/thermoelectric-properties","display_name":"thermoelectric properties","score":0.902999997138977},{"id":"https://openalex.org/keywords/seebeck-coefficient","display_name":"Seebeck coefficient","score":0.9919999837875366},{"id":"https://openalex.org/keywords/thermoelectric-materials","display_name":"thermoelectric materials","score":0.5099999904632568}],"concepts":[{"id":"https://openalex.org/C137637335","wikidata":"https://www.wikidata.org/wiki/Q899604","display_name":"Crystallite","level":2,"score":0.7730109691619873},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7568831443786621},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.6657990217208862},{"id":"https://openalex.org/C63024428","wikidata":"https://www.wikidata.org/wiki/Q552456","display_name":"Thermoelectric effect","level":2,"score":0.49750402569770813},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.494594544172287},{"id":"https://openalex.org/C192191005","wikidata":"https://www.wikidata.org/wiki/Q466491","display_name":"Grain size","level":2,"score":0.48230981826782227},{"id":"https://openalex.org/C26771246","wikidata":"https://www.wikidata.org/wiki/Q321095","display_name":"Scanning electron microscope","level":2,"score":0.4632799029350281},{"id":"https://openalex.org/C47908070","wikidata":"https://www.wikidata.org/wiki/Q900515","display_name":"Grain boundary","level":3,"score":0.43919411301612854},{"id":"https://openalex.org/C57863236","wikidata":"https://www.wikidata.org/wiki/Q1130571","display_name":"Doping","level":2,"score":0.41389700770378113},{"id":"https://openalex.org/C199289684","wikidata":"https://www.wikidata.org/wiki/Q83353","display_name":"Mineralogy","level":1,"score":0.3749290108680725},{"id":"https://openalex.org/C8010536","wikidata":"https://www.wikidata.org/wiki/Q160398","display_name":"Crystallography","level":1,"score":0.329220712184906},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.2915169596672058},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.2605118155479431},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.1993979811668396},{"id":"https://openalex.org/C87976508","wikidata":"https://www.wikidata.org/wiki/Q1498213","display_name":"Microstructure","level":2,"score":0.17697477340698242},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.12910819053649902},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.10597264766693115},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.4028/www.scientific.net/amr.501.257","doi":"https://doi.org/10.4028/www.scientific.net/amr.501.257","is_oa":false,"landing_page_url":"https://doi.org/10.4028/www.scientific.net/amr.501.257","pdf_url":null,"source":{"id":"https://openalex.org/S67425620","display_name":"Advanced materials research","issn_l":"1022-6680","issn":["1022-6680","1662-8985"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310317839","host_organization_name":"Trans Tech Publications","host_organization_lineage":["https://openalex.org/P4310317839"],"host_organization_lineage_names":["Trans Tech Publications"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Advanced Materials Research","raw_type":"journal-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.826.2442","doi":null,"is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.826.2442","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.scientific.net/AMR.501.257.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1976756432","https://openalex.org/W1986730211","https://openalex.org/W2033601042","https://openalex.org/W2047581302","https://openalex.org/W2049309075","https://openalex.org/W2071802472"],"related_works":["https://openalex.org/W2030680764","https://openalex.org/W2059565853","https://openalex.org/W2004073189","https://openalex.org/W1976069853","https://openalex.org/W2084716924","https://openalex.org/W2052143524","https://openalex.org/W2054734798","https://openalex.org/W2011334002","https://openalex.org/W1978922951","https://openalex.org/W2044202732"],"abstract_inverted_index":{"Solid-state":[0],"microwave":[1],"as":[2],"a":[3,40],"method":[4],"was":[5],"used":[6],"to":[7,15],"synthesize":[8],"quaternary":[9],"compounds":[10],"Pb1-xYbxSe0.2Te0.8":[11,26,62],"from":[12],"initial":[13],"components":[14],"obtain":[16],"polycrystalline":[17,41],"ingots":[18],"with":[19,65,95],"large":[20],"grain":[21,70],"size.":[22],"Thin":[23],"films":[24,64,80,93],"of":[25,78,92],"were":[27,81],"then":[28],"deposited":[29],"onto":[30],"glass":[31],"substrates":[32],"using":[33],"thermal":[34],"evaporation":[35],"in":[36,83],"vacuum,":[37],"which":[38],"have":[39,67],"rock":[42],"salt":[43],"(NaCl)":[44],"structure":[45],"for":[46,104],"powders,":[47],"and":[48,72,100],"thin":[49,63,79],"films.":[50],"The":[51,75,89],"field":[52],"emission":[53],"scanning":[54],"electron":[55],"microscopy":[56],"(FESEM)":[57],"images":[58],"reveal":[59],"that":[60],"the":[61,84],"Yb-doped":[66],"uniform":[68],"crystal":[69],"size":[71],"dense":[73],"nanostructure.":[74],"thermoelectric":[76],"properties":[77],"measured":[82],"temperature":[85],"range":[86],"298\u2013523":[87],"K.":[88],"Seebeck":[90],"coefficient":[91],"increased":[94],"x":[96],"when":[97],"x=0.015,":[98],"0.03":[99],"0.045,":[101],"while":[102],"decreased":[103],"x=0.06\u22120.105.":[105]},"counts_by_year":[],"updated_date":"2026-11-04T10:54:05.112534","created_date":"2016-06-24T00:00:00"}