{"id":"https://openalex.org/W2000996042","doi":"https://doi.org/10.1109/imws-amp.2015.7325043","title":"A short-open calibration (SOC) technique to calculate the propagation characteristics of substrate integrated waveguide","display_name":"A short-open calibration (SOC) technique to calculate the propagation characteristics of substrate integrated waveguide","publication_year":2015,"publication_date":"2015-07-01","ids":{"openalex":"https://openalex.org/W2000996042","doi":"https://doi.org/10.1109/imws-amp.2015.7325043","mag":"2000996042"},"language":"en","primary_location":{"id":"doi:10.1109/imws-amp.2015.7325043","doi":"https://doi.org/10.1109/imws-amp.2015.7325043","is_oa":false,"landing_page_url":"https://doi.org/10.1109/imws-amp.2015.7325043","pdf_url":null,"source":{"id":"https://openalex.org/S4363606194","display_name":"IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101527706","display_name":"Zheng Liu","orcid":"https://orcid.org/0000-0002-0707-0330","observed_orcids":["https://orcid.org/0000-0002-0707-0330"]},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zheng Liu","raw_affiliation_strings":["Shanghai Jiao Tong University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Lei Zhu","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I204512498","display_name":"University of Macau","ror":"https://ror.org/01r4q9n85","country_code":"MO","type":"education","lineage":["https://openalex.org/I204512498"]}],"countries":["MO"],"is_corresponding":false,"raw_author_name":"Lei Zhu","raw_affiliation_strings":["University of Macau, Macau, China","University of Macau , Macau, SAR, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Macau, Macau, China","institution_ids":["https://openalex.org/I204512498"]},{"raw_affiliation_string":"University of Macau , Macau, SAR, China","institution_ids":["https://openalex.org/I204512498"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050249106","display_name":"Qiong Sen Wu","orcid":"https://orcid.org/0009-0002-5836-3755","observed_orcids":["https://orcid.org/0009-0002-5836-3755"]},"institutions":[{"id":"https://openalex.org/I204512498","display_name":"University of Macau","ror":"https://ror.org/01r4q9n85","country_code":"MO","type":"education","lineage":["https://openalex.org/I204512498"]}],"countries":["MO"],"is_corresponding":false,"raw_author_name":"Qiong Sen Wu","raw_affiliation_strings":["University of Macau, Macau, China","University of Macau , Macau, SAR, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Macau, Macau, China","institution_ids":["https://openalex.org/I204512498"]},{"raw_affiliation_string":"University of Macau , Macau, SAR, China","institution_ids":["https://openalex.org/I204512498"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077403467","display_name":"Gaobiao Xiao","orcid":"https://orcid.org/0000-0001-5547-9475","observed_orcids":["https://orcid.org/0000-0001-5547-9475"]},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Gao Biao Xiao","raw_affiliation_strings":["Shanghai Jiao Tong University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.4158,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.43804627,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":"54","issue":null,"first_page":"1","last_page":"3"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.989300012588501,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.989300012588501,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.0071000000461936,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11263","display_name":"Electromagnetic Simulation and Numerical Methods","score":0.0005000000237487257,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/substrate-integrated-waveguide","display_name":"substrate integrated waveguide","score":0.9950000047683716},{"id":"https://openalex.org/keywords/de-embedding","display_name":"de-embedding","score":0.8349999785423279},{"id":"https://openalex.org/keywords/equivalent-circuit-network","display_name":"equivalent circuit network","score":0.8199999928474426},{"id":"https://openalex.org/keywords/phase-constant","display_name":"phase constant","score":0.7110000252723694},{"id":"https://openalex.org/keywords/attenuation-coefficient","display_name":"attenuation coefficient","score":0.9959999918937683},{"id":"https://openalex.org/keywords/leakage-characteristics","display_name":"leakage characteristics","score":0.6790000200271606},{"id":"https://openalex.org/keywords/electromagnetic-simulation","display_name":"electromagnetic simulation","score":0.7509999871253967}],"concepts":[{"id":"https://openalex.org/C52638558","wikidata":"https://www.wikidata.org/wiki/Q1434913","display_name":"Propagation constant","level":2,"score":0.8100327253341675},{"id":"https://openalex.org/C184652730","wikidata":"https://www.wikidata.org/wiki/Q2357982","display_name":"Attenuation","level":2,"score":0.6655680537223816},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.6031432151794434},{"id":"https://openalex.org/C200687136","wikidata":"https://www.wikidata.org/wiki/Q11233438","display_name":"Waveguide","level":2,"score":0.6019114851951599},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.515282154083252},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.49015507102012634},{"id":"https://openalex.org/C41608201","wikidata":"https://www.wikidata.org/wiki/Q980509","display_name":"Embedding","level":2,"score":0.48548558354377747},{"id":"https://openalex.org/C2777289219","wikidata":"https://www.wikidata.org/wiki/Q7632154","display_name":"Substrate (aquarium)","level":2,"score":0.47356951236724854},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4645196199417114},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.45931747555732727},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.44198018312454224},{"id":"https://openalex.org/C2777027219","wikidata":"https://www.wikidata.org/wiki/Q1284190","display_name":"Constant (computer programming)","level":2,"score":0.44179999828338623},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.43750476837158203},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.37220078706741333},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.30835843086242676},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.29053109884262085},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.23902201652526855},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2373581826686859},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.23331820964813232},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C111368507","wikidata":"https://www.wikidata.org/wiki/Q43518","display_name":"Oceanography","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/imws-amp.2015.7325043","doi":"https://doi.org/10.1109/imws-amp.2015.7325043","is_oa":false,"landing_page_url":"https://doi.org/10.1109/imws-amp.2015.7325043","pdf_url":null,"source":{"id":"https://openalex.org/S4363606194","display_name":"IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1975678813","https://openalex.org/W1987942246","https://openalex.org/W1997992498","https://openalex.org/W2007492147","https://openalex.org/W2100446044","https://openalex.org/W2110777019","https://openalex.org/W2136474897","https://openalex.org/W2146214773","https://openalex.org/W2147046398","https://openalex.org/W2147891027","https://openalex.org/W2160564469","https://openalex.org/W2165804878"],"related_works":["https://openalex.org/W1894602728","https://openalex.org/W2782592257","https://openalex.org/W2129094277","https://openalex.org/W1997664152","https://openalex.org/W1997992498","https://openalex.org/W2161750295","https://openalex.org/W2242720756","https://openalex.org/W2292555956","https://openalex.org/W1175258506","https://openalex.org/W2583862557"],"abstract_inverted_index":{"In":[0,91],"this":[1],"letter,":[2],"a":[3],"numerical":[4],"short-open-calibration":[5],"(SOC)":[6],"technique":[7],"is":[8,84],"developed":[9],"to":[10,86,102],"be":[11,40],"directly":[12],"integrated":[13,27],"with":[14,30,70],"the":[15,93,104],"commercial":[16],"electromagnetic":[17],"software":[18,51],"for":[19,61],"accurate":[20],"extraction":[21],"of":[22,25,45,68,98,109],"propagation":[23,66,82,105],"constant":[24,83],"substrate":[26],"waveguide":[28],"(SIW)":[29],"longitudinally":[31],"periodic":[32],"metallic":[33],"posts.":[34],"Short-":[35],"and":[36,47,79,95,106],"open-end":[37],"circuits":[38],"can":[39],"exactly":[41],"realized":[42],"by":[43],"means":[44],"electric":[46],"magnetic":[48],"wall":[49],"in":[50],"respectively.":[52],"After":[53],"three":[54],"distinctive":[55],"equivalent":[56],"circuit":[57],"networks":[58],"are":[59,73,100],"described":[60],"SOC":[62,89],"de-embedding":[63],"procedure.":[64],"The":[65],"constants":[67,97],"SIW":[69,99],"different":[71],"dimensions":[72],"extracted.":[74],"Comparison":[75],"between":[76],"our":[77,88],"extracted":[78],"those":[80],"reported":[81],"made":[85],"validate":[87],"technique.":[90],"final,":[92],"phase":[94],"attenuation":[96],"derived":[101],"demonstrate":[103],"leakage":[107],"characteristics":[108],"SIW.":[110]},"counts_by_year":[{"year":2018,"cited_by_count":1}],"updated_date":"2026-10-30T12:39:25.321706","created_date":"2016-06-24T00:00:00"}