{"id":"https://openalex.org/W2000725739","doi":"https://doi.org/10.1016/j.vlsi.2007.04.005","title":"Crosstalk fault modeling in defective pair of interconnects","display_name":"Crosstalk fault modeling in defective pair of interconnects","publication_year":2007,"publication_date":"2007-05-02","ids":{"openalex":"https://openalex.org/W2000725739","doi":"https://doi.org/10.1016/j.vlsi.2007.04.005","mag":"2000725739"},"language":"en","primary_location":{"id":"doi:10.1016/j.vlsi.2007.04.005","doi":"https://doi.org/10.1016/j.vlsi.2007.04.005","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.vlsi.2007.04.005","pdf_url":null,"source":{"id":"https://openalex.org/S139392130","display_name":"Integration","issn_l":"0167-9260","issn":["0167-9260","1872-7522"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["ccf-c","cwts-core","dongbi-d","jufo-1","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Integration","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109231876","display_name":"Ajoy K. Palit","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I180437899","display_name":"University of Bremen","ror":"https://ror.org/04ers2y35","country_code":"DE","type":"education","lineage":["https://openalex.org/I180437899"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Ajoy K. Palit","raw_affiliation_strings":["University of Bremen, FB1/ITEM, Otto-Hahn-Allee-1, D-28359 Bremen, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Bremen, FB1/ITEM, Otto-Hahn-Allee-1, D-28359 Bremen, Germany","institution_ids":["https://openalex.org/I180437899"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057161155","display_name":"Kishore K. Duganapalli","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I180437899","display_name":"University of Bremen","ror":"https://ror.org/04ers2y35","country_code":"DE","type":"education","lineage":["https://openalex.org/I180437899"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Kishore K. Duganapalli","raw_affiliation_strings":["University of Bremen, FB1/ITEM, Otto-Hahn-Allee-1, D-28359 Bremen, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Bremen, FB1/ITEM, Otto-Hahn-Allee-1, D-28359 Bremen, Germany","institution_ids":["https://openalex.org/I180437899"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5083499070","display_name":"Walter Anheier","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I180437899","display_name":"University of Bremen","ror":"https://ror.org/04ers2y35","country_code":"DE","type":"education","lineage":["https://openalex.org/I180437899"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Walter Anheier","raw_affiliation_strings":["University of Bremen, FB1/ITEM, Otto-Hahn-Allee-1, D-28359 Bremen, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Bremen, FB1/ITEM, Otto-Hahn-Allee-1, D-28359 Bremen, Germany","institution_ids":["https://openalex.org/I180437899"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5109231876"],"corresponding_institution_ids":["https://openalex.org/I180437899"],"apc_list":{"value":2230,"currency":"USD","value_usd":2230},"apc_paid":null,"fwci":4.5753,"has_fulltext":false,"cited_by_count":14,"citation_normalized_percentile":{"value":0.94407895,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"41","issue":"1","first_page":"27","last_page":"37"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.8988999724388123,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.8988999724388123,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.06700000166893005,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","score":0.009700000286102295,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/interconnect-defects","display_name":"interconnect defects","score":0.8259999752044678},{"id":"https://openalex.org/keywords/coupling-capacitance","display_name":"coupling capacitance","score":0.8629999756813049},{"id":"https://openalex.org/keywords/signal-integrity","display_name":"signal integrity","score":0.7170000076293945},{"id":"https://openalex.org/keywords/timing-violations","display_name":"timing violations","score":0.8299999833106995}],"concepts":[{"id":"https://openalex.org/C169822122","wikidata":"https://www.wikidata.org/wiki/Q230187","display_name":"Crosstalk","level":2,"score":0.6853878498077393},{"id":"https://openalex.org/C123745756","wikidata":"https://www.wikidata.org/wiki/Q1665949","display_name":"Interconnection","level":2,"score":0.63258296251297},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5642288327217102},{"id":"https://openalex.org/C44938667","wikidata":"https://www.wikidata.org/wiki/Q4503810","display_name":"Signal integrity","level":3,"score":0.5058414936065674},{"id":"https://openalex.org/C191287063","wikidata":"https://www.wikidata.org/wiki/Q543281","display_name":"Glitch","level":3,"score":0.48555848002433777},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.48538482189178467},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.38390427827835083},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.36954259872436523},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.32942479848861694},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.29967910051345825},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.18114829063415527},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.150154709815979},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.07704958319664001}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/j.vlsi.2007.04.005","doi":"https://doi.org/10.1016/j.vlsi.2007.04.005","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.vlsi.2007.04.005","pdf_url":null,"source":{"id":"https://openalex.org/S139392130","display_name":"Integration","issn_l":"0167-9260","issn":["0167-9260","1872-7522"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["ccf-c","cwts-core","dongbi-d","jufo-1","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Integration","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W2117340982","https://openalex.org/W2142140475","https://openalex.org/W2150153665","https://openalex.org/W2158401235","https://openalex.org/W2167478831","https://openalex.org/W4242674290","https://openalex.org/W6600075554","https://openalex.org/W6606259080"],"related_works":["https://openalex.org/W1580365282","https://openalex.org/W2142140475","https://openalex.org/W2162218526","https://openalex.org/W4242674290","https://openalex.org/W6983497923","https://openalex.org/W2526087092","https://openalex.org/W2105687607","https://openalex.org/W3033849146","https://openalex.org/W2588578081","https://openalex.org/W2068424533"],"abstract_inverted_index":null,"counts_by_year":[{"year":2018,"cited_by_count":2},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2012,"cited_by_count":2}],"updated_date":"2026-10-01T08:54:57.152042","created_date":"2016-06-24T00:00:00"}