{"id":"https://openalex.org/W2000681367","doi":"https://doi.org/10.1016/s0040-6090(96)09361-3","title":"Dielectric filters made of PS: advanced performance by oxidation and new layer structures","display_name":"Dielectric filters made of PS: advanced performance by oxidation and new layer structures","publication_year":1997,"publication_date":"1997-04-01","ids":{"openalex":"https://openalex.org/W2000681367","doi":"https://doi.org/10.1016/s0040-6090(96)09361-3","mag":"2000681367"},"language":"en","primary_location":{"id":"doi:10.1016/s0040-6090(96)09361-3","doi":"https://doi.org/10.1016/s0040-6090(96)09361-3","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0040-6090(96)09361-3","pdf_url":null,"source":{"id":"https://openalex.org/S84339699","display_name":"Thin Solid Films","issn_l":"0040-6090","issn":["0040-6090","1879-2731"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-1","norway-1","poland-70","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Thin Solid Films","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5079229467","display_name":"M. Berger","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I171892758","display_name":"Forschungszentrum J\u00fclich","ror":"https://ror.org/02nv7yv05","country_code":"DE","type":"facility","lineage":["https://openalex.org/I1305996414","https://openalex.org/I171892758"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"M.G Berger","raw_affiliation_strings":["Institut f\u00fcr Schicht- und Ionentechnik (ISI), KFA J\u00fclich, D-52425, J\u00fclich, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut f\u00fcr Schicht- und Ionentechnik (ISI), KFA J\u00fclich, D-52425, J\u00fclich, Germany","institution_ids":["https://openalex.org/I171892758"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109925547","display_name":"R. Arens-Fischer","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I171892758","display_name":"Forschungszentrum J\u00fclich","ror":"https://ror.org/02nv7yv05","country_code":"DE","type":"facility","lineage":["https://openalex.org/I1305996414","https://openalex.org/I171892758"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"R Arens-Fischer","raw_affiliation_strings":["Institut f\u00fcr Schicht- und Ionentechnik (ISI), KFA J\u00fclich, D-52425, J\u00fclich, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut f\u00fcr Schicht- und Ionentechnik (ISI), KFA J\u00fclich, D-52425, J\u00fclich, Germany","institution_ids":["https://openalex.org/I171892758"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003541352","display_name":"Markus Th\u00f6nissen","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I171892758","display_name":"Forschungszentrum J\u00fclich","ror":"https://ror.org/02nv7yv05","country_code":"DE","type":"facility","lineage":["https://openalex.org/I1305996414","https://openalex.org/I171892758"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"M Th\u00f6nissen","raw_affiliation_strings":["Institut f\u00fcr Schicht- und Ionentechnik (ISI), KFA J\u00fclich, D-52425, J\u00fclich, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut f\u00fcr Schicht- und Ionentechnik (ISI), KFA J\u00fclich, D-52425, J\u00fclich, Germany","institution_ids":["https://openalex.org/I171892758"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009668134","display_name":"Michael B. Kruger","orcid":"https://orcid.org/0000-0002-6188-9179","observed_orcids":["https://orcid.org/0000-0002-6188-9179","https://orcid.org/0000-0002-0567-5301"]},"institutions":[{"id":"https://openalex.org/I171892758","display_name":"Forschungszentrum J\u00fclich","ror":"https://ror.org/02nv7yv05","country_code":"DE","type":"facility","lineage":["https://openalex.org/I1305996414","https://openalex.org/I171892758"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"M Kr\u00fcger","raw_affiliation_strings":["Institut f\u00fcr Schicht- und Ionentechnik (ISI), KFA J\u00fclich, D-52425, J\u00fclich, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut f\u00fcr Schicht- und Ionentechnik (ISI), KFA J\u00fclich, D-52425, J\u00fclich, Germany","institution_ids":["https://openalex.org/I171892758"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065563882","display_name":"S. Billat","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I171892758","display_name":"Forschungszentrum J\u00fclich","ror":"https://ror.org/02nv7yv05","country_code":"DE","type":"facility","lineage":["https://openalex.org/I1305996414","https://openalex.org/I171892758"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"S Billat","raw_affiliation_strings":["Institut f\u00fcr Schicht- und Ionentechnik (ISI), KFA J\u00fclich, D-52425, J\u00fclich, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut f\u00fcr Schicht- und Ionentechnik (ISI), KFA J\u00fclich, D-52425, J\u00fclich, Germany","institution_ids":["https://openalex.org/I171892758"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084136571","display_name":"Hans Luth","orcid":"https://orcid.org/0000-0003-1617-3355","observed_orcids":["https://orcid.org/0000-0003-1617-3355"]},"institutions":[{"id":"https://openalex.org/I171892758","display_name":"Forschungszentrum J\u00fclich","ror":"https://ror.org/02nv7yv05","country_code":"DE","type":"facility","lineage":["https://openalex.org/I1305996414","https://openalex.org/I171892758"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"H L\u00fcth","raw_affiliation_strings":["Institut f\u00fcr Schicht- und Ionentechnik (ISI), KFA J\u00fclich, D-52425, J\u00fclich, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut f\u00fcr Schicht- und Ionentechnik (ISI), KFA J\u00fclich, D-52425, J\u00fclich, Germany","institution_ids":["https://openalex.org/I171892758"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075175044","display_name":"S. Hilbrich","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I887968799","display_name":"RWTH Aachen University","ror":"https://ror.org/04xfq0f34","country_code":"DE","type":"education","lineage":["https://openalex.org/I887968799"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"S Hilbrich","raw_affiliation_strings":["Physikalisches Institut der RWTH Aachen, D-52056, Aachen, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Physikalisches Institut der RWTH Aachen, D-52056, Aachen, Germany","institution_ids":["https://openalex.org/I887968799"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015952250","display_name":"Wolfgang Thei\u00df","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I887968799","display_name":"RWTH Aachen University","ror":"https://ror.org/04xfq0f34","country_code":"DE","type":"education","lineage":["https://openalex.org/I887968799"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"W Thei\u00df","raw_affiliation_strings":["Physikalisches Institut der RWTH Aachen, D-52056, Aachen, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Physikalisches Institut der RWTH Aachen, D-52056, Aachen, Germany","institution_ids":["https://openalex.org/I887968799"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5012942378","display_name":"Peter Gro\u00dfe","orcid":"https://orcid.org/0009-0005-1866-5697","observed_orcids":["https://orcid.org/0009-0005-1866-5697"]},"institutions":[{"id":"https://openalex.org/I887968799","display_name":"RWTH Aachen University","ror":"https://ror.org/04xfq0f34","country_code":"DE","type":"education","lineage":["https://openalex.org/I887968799"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"P Grosse","raw_affiliation_strings":["Physikalisches Institut der RWTH Aachen, D-52056, Aachen, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Physikalisches Institut der RWTH Aachen, D-52056, Aachen, Germany","institution_ids":["https://openalex.org/I887968799"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":3120,"currency":"USD","value_usd":3120},"apc_paid":null,"fwci":5.9397,"has_fulltext":false,"cited_by_count":150,"citation_normalized_percentile":{"value":0.97035168,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":88,"max":99},"biblio":{"volume":"297","issue":"1-2","first_page":"237","last_page":"240"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11723","display_name":"Optical Coatings and Gratings","score":0.8036999702453613,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11723","display_name":"Optical Coatings and Gratings","score":0.8036999702453613,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12340","display_name":"Anodic Oxide Films and Nanostructures","score":0.13109999895095825,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.019700000062584877,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/polystyrene","display_name":"polystyrene","score":0.703000009059906},{"id":"https://openalex.org/keywords/dielectric-filters","display_name":"dielectric filters","score":0.8539999723434448},{"id":"https://openalex.org/keywords/interference-filter","display_name":"interference filters","score":0.7450000047683716},{"id":"https://openalex.org/keywords/rugate-filters","display_name":"rugate filters","score":0.7459999918937683},{"id":"https://openalex.org/keywords/thermal-oxidation","display_name":"thermal oxidation","score":0.7459999918937683},{"id":"https://openalex.org/keywords/anodization","display_name":"anodic oxidation","score":0.7870000004768372},{"id":"https://openalex.org/keywords/effective-dielectric-function","display_name":"effective dielectric function","score":0.7739999890327454},{"id":"https://openalex.org/keywords/refractive-index","display_name":"refractive index","score":0.8339999914169312},{"id":"https://openalex.org/keywords/porosity","display_name":"porosity","score":0.6850000023841858},{"id":"https://openalex.org/keywords/native-oxidation","display_name":"native oxidation","score":0.5479999780654907},{"id":"https://openalex.org/keywords/age-related-changes","display_name":"age-related changes","score":0.6110000014305115},{"id":"https://openalex.org/keywords/etch-rate","display_name":"etch rate","score":0.593999981880188},{"id":"https://openalex.org/keywords/spectral-reflectance","display_name":"spectral reflectance","score":0.6729999780654907},{"id":"https://openalex.org/keywords/multilayer-structures","display_name":"multilayer structures","score":0.5090000033378601}],"concepts":[{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.7053311467170715},{"id":"https://openalex.org/C42067758","wikidata":"https://www.wikidata.org/wiki/Q174102","display_name":"Refractive index","level":2,"score":0.6862918138504028},{"id":"https://openalex.org/C2779281663","wikidata":"https://www.wikidata.org/wiki/Q1549368","display_name":"Thermal oxidation","level":3,"score":0.6582196950912476},{"id":"https://openalex.org/C150493377","wikidata":"https://www.wikidata.org/wiki/Q1427863","display_name":"Transmittance","level":2,"score":0.6507089734077454},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6411068439483643},{"id":"https://openalex.org/C2777289219","wikidata":"https://www.wikidata.org/wiki/Q7632154","display_name":"Substrate (aquarium)","level":2,"score":0.4972439110279083},{"id":"https://openalex.org/C6648577","wikidata":"https://www.wikidata.org/wiki/Q622669","display_name":"Porosity","level":2,"score":0.46942904591560364},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.45732298493385315},{"id":"https://openalex.org/C125287762","wikidata":"https://www.wikidata.org/wiki/Q1758948","display_name":"Absorption (acoustics)","level":2,"score":0.42491552233695984},{"id":"https://openalex.org/C57863236","wikidata":"https://www.wikidata.org/wiki/Q1130571","display_name":"Doping","level":2,"score":0.4246622323989868},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.4208143651485443},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.41217175126075745},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.39605608582496643},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.2142394483089447},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C111368507","wikidata":"https://www.wikidata.org/wiki/Q43518","display_name":"Oceanography","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1016/s0040-6090(96)09361-3","doi":"https://doi.org/10.1016/s0040-6090(96)09361-3","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0040-6090(96)09361-3","pdf_url":null,"source":{"id":"https://openalex.org/S84339699","display_name":"Thin Solid Films","issn_l":"0040-6090","issn":["0040-6090","1879-2731"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-1","norway-1","poland-70","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Thin Solid Films","raw_type":"journal-article"},{"id":"pmh:oai:publications.rwth-aachen.de:142037","doi":null,"is_oa":false,"landing_page_url":"http://publications.rwth-aachen.de/search?p=id:%22RWTH-CONV-022111%22","pdf_url":null,"source":{"id":"https://openalex.org/S4306401362","display_name":"RWTH Publications (RWTH Aachen)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I887968799","host_organization_name":"RWTH Aachen University","host_organization_lineage":["https://openalex.org/I887968799"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Thin solid films 297, 237-240 (1997).","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1993990537","https://openalex.org/W2027095126","https://openalex.org/W2027773709","https://openalex.org/W2028447175","https://openalex.org/W2037730232","https://openalex.org/W2040908110","https://openalex.org/W2046139271","https://openalex.org/W2055322604","https://openalex.org/W2069391716","https://openalex.org/W2085779737","https://openalex.org/W2097673313","https://openalex.org/W2127412981","https://openalex.org/W2323253648","https://openalex.org/W2953757653"],"related_works":["https://openalex.org/W1982171827","https://openalex.org/W2323527116","https://openalex.org/W1981430576","https://openalex.org/W2120997116","https://openalex.org/W2049578961","https://openalex.org/W166327005","https://openalex.org/W4404896297","https://openalex.org/W2054539147","https://openalex.org/W2463047775","https://openalex.org/W2040908110"],"abstract_inverted_index":null,"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":7},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":11},{"year":2016,"cited_by_count":6},{"year":2015,"cited_by_count":6},{"year":2014,"cited_by_count":8},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":4}],"updated_date":"2026-11-05T12:25:35.769452","created_date":"2016-06-24T00:00:00"}