{"id":"https://openalex.org/W2000509292","doi":"https://doi.org/10.1088/0022-3727/1/6/301","title":"The absorption and atomic number corrections in electron-probe X-ray microanalysis","display_name":"The absorption and atomic number corrections in electron-probe X-ray microanalysis","publication_year":1968,"publication_date":"1968-06-01","ids":{"openalex":"https://openalex.org/W2000509292","doi":"https://doi.org/10.1088/0022-3727/1/6/301","mag":"2000509292"},"language":"en","primary_location":{"id":"doi:10.1088/0022-3727/1/6/301","doi":"https://doi.org/10.1088/0022-3727/1/6/301","is_oa":false,"landing_page_url":"https://doi.org/10.1088/0022-3727/1/6/301","pdf_url":null,"source":{"id":"https://openalex.org/S111927887","display_name":"Journal of Physics D Applied Physics","issn_l":"0022-3727","issn":["0022-3727","1361-6463"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-d","jufo-1","ki-jl-1","norway-1","poland-70","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310311669","host_organization_name":"Institute of Physics","host_organization_lineage":["https://openalex.org/P4310311669"],"host_organization_lineage_names":["Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Physics D: Applied Physics","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5068565196","display_name":"H. E. Bishop","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"H E Bishop","raw_affiliation_strings":["Cavendish Laboratory, Cambridge dagger"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Cavendish Laboratory, Cambridge dagger","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":["https://openalex.org/A5068565196"],"corresponding_institution_ids":[],"apc_list":{"value":3325,"currency":"USD","value_usd":3325},"apc_paid":null,"fwci":2.4199,"has_fulltext":false,"cited_by_count":35,"citation_normalized_percentile":{"value":0.87674248,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":"1","issue":"6","first_page":"673","last_page":"684"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.9818999767303467,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.9818999767303467,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11733","display_name":"X-ray Spectroscopy and Fluorescence Analysis","score":0.01759999990463257,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12166","display_name":"Ion-surface interactions and analysis","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electron-probe-microanalysis","display_name":"electron probe microanalysis","score":0.9850000143051147},{"id":"https://openalex.org/keywords/absorption-correction","display_name":"absorption correction","score":0.8859999775886536},{"id":"https://openalex.org/keywords/electron-scattering","display_name":"electron scattering","score":0.7639999985694885},{"id":"https://openalex.org/keywords/monte-carlo-simulation","display_name":"Monte Carlo simulation","score":0.9020000100135803},{"id":"https://openalex.org/keywords/light-element-analysis","display_name":"light element analysis","score":0.7689999938011169},{"id":"https://openalex.org/keywords/correction-factors","display_name":"correction factors","score":0.6990000009536743}],"concepts":[{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.7859704494476318},{"id":"https://openalex.org/C191486275","wikidata":"https://www.wikidata.org/wiki/Q210028","display_name":"Scattering","level":2,"score":0.7044431567192078},{"id":"https://openalex.org/C31033462","wikidata":"https://www.wikidata.org/wiki/Q3058182","display_name":"Microanalysis","level":2,"score":0.6766113042831421},{"id":"https://openalex.org/C146285849","wikidata":"https://www.wikidata.org/wiki/Q1327107","display_name":"Electron scattering","level":3,"score":0.6230922341346741},{"id":"https://openalex.org/C61782718","wikidata":"https://www.wikidata.org/wiki/Q23809","display_name":"Atomic number","level":2,"score":0.6017055511474609},{"id":"https://openalex.org/C125287762","wikidata":"https://www.wikidata.org/wiki/Q1758948","display_name":"Absorption (acoustics)","level":2,"score":0.5790315270423889},{"id":"https://openalex.org/C147120987","wikidata":"https://www.wikidata.org/wiki/Q2225","display_name":"Electron","level":2,"score":0.5778329372406006},{"id":"https://openalex.org/C184779094","wikidata":"https://www.wikidata.org/wiki/Q26383","display_name":"Atomic physics","level":1,"score":0.5631377100944519},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.4960342347621918},{"id":"https://openalex.org/C30475298","wikidata":"https://www.wikidata.org/wiki/Q909554","display_name":"Computational physics","level":1,"score":0.4820581376552582},{"id":"https://openalex.org/C2779328170","wikidata":"https://www.wikidata.org/wiki/Q34777","display_name":"X-ray","level":2,"score":0.43010014295578003},{"id":"https://openalex.org/C2909214062","wikidata":"https://www.wikidata.org/wiki/Q911272","display_name":"Electron probe microanalysis","level":3,"score":0.42541268467903137},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.35136106610298157},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3329302668571472},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.2185540497303009},{"id":"https://openalex.org/C26771246","wikidata":"https://www.wikidata.org/wiki/Q321095","display_name":"Scanning electron microscope","level":2,"score":0.0951712429523468},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.08082938194274902},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.07006442546844482},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1088/0022-3727/1/6/301","doi":"https://doi.org/10.1088/0022-3727/1/6/301","is_oa":false,"landing_page_url":"https://doi.org/10.1088/0022-3727/1/6/301","pdf_url":null,"source":{"id":"https://openalex.org/S111927887","display_name":"Journal of Physics D Applied Physics","issn_l":"0022-3727","issn":["0022-3727","1361-6463"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-d","jufo-1","ki-jl-1","norway-1","poland-70","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310311669","host_organization_name":"Institute of Physics","host_organization_lineage":["https://openalex.org/P4310311669"],"host_organization_lineage_names":["Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Physics D: Applied Physics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320320273","display_name":"University of Cambridge","ror":"https://ror.org/013meh722"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W97191536","https://openalex.org/W1965550751","https://openalex.org/W1972184782","https://openalex.org/W1975170881","https://openalex.org/W2002883724","https://openalex.org/W2036382602","https://openalex.org/W2062312182","https://openalex.org/W2062528201","https://openalex.org/W2066685875","https://openalex.org/W2089126560","https://openalex.org/W2093046009","https://openalex.org/W2168693707","https://openalex.org/W2992143730","https://openalex.org/W4232684513"],"related_works":["https://openalex.org/W2039465928","https://openalex.org/W1982465153","https://openalex.org/W2037614142","https://openalex.org/W2010319873","https://openalex.org/W1985311289","https://openalex.org/W2046720995","https://openalex.org/W4247545333","https://openalex.org/W1974350874","https://openalex.org/W1991286143","https://openalex.org/W3036656525"],"abstract_inverted_index":{"The":[0],"Monte":[1,70],"Carlo":[2,71],"model":[3],"for":[4,40,48,80,87],"electron":[5],"scattering":[6],"described":[7],"in":[8,23,52],"an":[9],"earlier":[10],"paper":[11],"has":[12],"been":[13],"used":[14],"to":[15,94],"calculate":[16],"the":[17,34,37,41,53,66,74,81,95],"absorption":[18,62],"and":[19,92],"back-scattering":[20,82],"corrections":[21,63,67],"met":[22],"electron-probe":[24],"x-ray":[25],"microanalysis.":[26],"Although":[27],"agreement":[28],"with":[29],"experimental":[30],"data":[31,72],"is":[32],"on":[33],"whole":[35],"good,":[36],"calculated":[38,68,86],"values":[39],"correction":[42,83],"factors":[43],"are":[44,64,73,98],"not":[45],"sufficiently":[46],"accurate":[47],"general":[49],"use.":[50],"However,":[51],"case":[54],"of":[55],"light":[56],"element":[57],"analysis":[58],"where":[59],"very":[60],"high":[61],"needed,":[65],"from":[69],"best":[75],"available":[76],"at":[77],"present.":[78],"Values":[79],"factor":[84],"R":[85],"incident":[88],"beam":[89],"angles":[90],"22\u00b75\u00b0":[91],"45\u00b0":[93],"normal":[96],"surface":[97],"given.":[99]},"counts_by_year":[{"year":2014,"cited_by_count":1}],"updated_date":"2026-08-21T09:56:20.448147","created_date":"2016-06-24T00:00:00"}