{"id":"https://openalex.org/W2000421317","doi":"https://doi.org/10.1109/tim.1982.6312518","title":"Utilization of the tunability of the lead-salt diode laser for a fast and local measurement of specific gas density","display_name":"Utilization of the tunability of the lead-salt diode laser for a fast and local measurement of specific gas density","publication_year":1982,"publication_date":"1982-03-01","ids":{"openalex":"https://openalex.org/W2000421317","doi":"https://doi.org/10.1109/tim.1982.6312518","mag":"2000421317"},"language":"en","primary_location":{"id":"doi:10.1109/tim.1982.6312518","doi":"https://doi.org/10.1109/tim.1982.6312518","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.1982.6312518","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-3","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5112072169","display_name":"Hiroya Sano","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I163770644","display_name":"Okayama University","ror":"https://ror.org/02pc6pc55","country_code":"JP","type":"education","lineage":["https://openalex.org/I163770644"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hiroya Sano","raw_affiliation_strings":["Department of Electronics, Okayama University, Tsushima, Okayama, Japan","Department of Electronics, Okayama University, Tsushima, Okayama 700, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronics, Okayama University, Tsushima, Okayama, Japan","institution_ids":["https://openalex.org/I163770644"]},{"raw_affiliation_string":"Department of Electronics, Okayama University, Tsushima, Okayama 700, Japan","institution_ids":["https://openalex.org/I163770644"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113598900","display_name":"Ryuji Koga","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I163770644","display_name":"Okayama University","ror":"https://ror.org/02pc6pc55","country_code":"JP","type":"education","lineage":["https://openalex.org/I163770644"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Ryuji Koga","raw_affiliation_strings":["Department of Electronics, Okayama University, Tsushima, Okayama, Japan","Department of Electronics, Okayama University, Tsushima, Okayama 700, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronics, Okayama University, Tsushima, Okayama, Japan","institution_ids":["https://openalex.org/I163770644"]},{"raw_affiliation_string":"Department of Electronics, Okayama University, Tsushima, Okayama 700, Japan","institution_ids":["https://openalex.org/I163770644"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112714626","display_name":"Megumi Kosaka","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I163770644","display_name":"Okayama University","ror":"https://ror.org/02pc6pc55","country_code":"JP","type":"education","lineage":["https://openalex.org/I163770644"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Megumi Kosaka","raw_affiliation_strings":["Department of Electronics, Okayama University, Tsushima, Okayama, Japan","Department of Electronics, Okayama University, Tsushima, Okayama 700, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronics, Okayama University, Tsushima, Okayama, Japan","institution_ids":["https://openalex.org/I163770644"]},{"raw_affiliation_string":"Department of Electronics, Okayama University, Tsushima, Okayama 700, Japan","institution_ids":["https://openalex.org/I163770644"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111539954","display_name":"Koji Shinohara","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I2252096349","display_name":"Fujitsu (Japan)","ror":"https://ror.org/038e2g226","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Koji Shinohara","raw_affiliation_strings":["Fujitsu Laboratories Limited, Kobe, Japan","Fujitsu Laboratories Ltd, Gosho-dori, Hygo-ku, Kobe 652, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fujitsu Laboratories Limited, Kobe, Japan","institution_ids":["https://openalex.org/I2252096349"]},{"raw_affiliation_string":"Fujitsu Laboratories Ltd, Gosho-dori, Hygo-ku, Kobe 652, Japan","institution_ids":["https://openalex.org/I2252096349"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2645,"currency":"USD","value_usd":2645},"apc_paid":null,"fwci":0.5357,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.53329465,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"IM-31","issue":"1","first_page":"66","last_page":"69"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11111","display_name":"Spectroscopy and Laser Applications","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1607","display_name":"Spectroscopy"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11111","display_name":"Spectroscopy and Laser Applications","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1607","display_name":"Spectroscopy"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/lead-salt-diode-lasers","display_name":"lead-salt diode lasers","score":0.9810000061988831},{"id":"https://openalex.org/keywords/tunable-diode-laser","display_name":"tunable diode laser","score":0.7049999833106995},{"id":"https://openalex.org/keywords/methane-detection","display_name":"methane detection","score":0.7680000066757202},{"id":"https://openalex.org/keywords/gas-density-measurement","display_name":"gas density measurement","score":0.8999999761581421},{"id":"https://openalex.org/keywords/spectral-scanning","display_name":"spectral scanning","score":0.6489999890327454},{"id":"https://openalex.org/keywords/non-contact-sensing","display_name":"non-contact sensing","score":0.7689999938011169},{"id":"https://openalex.org/keywords/atmospheric-methane","display_name":"atmospheric methane","score":0.5070000290870667}],"concepts":[{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.6750612258911133},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6556174755096436},{"id":"https://openalex.org/C32022120","wikidata":"https://www.wikidata.org/wiki/Q797225","display_name":"Interference (communication)","level":3,"score":0.640048086643219},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.6195186972618103},{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.5910629630088806},{"id":"https://openalex.org/C516920438","wikidata":"https://www.wikidata.org/wiki/Q37129","display_name":"Methane","level":2,"score":0.5106440186500549},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.4825124740600586},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4642314314842224},{"id":"https://openalex.org/C60548495","wikidata":"https://www.wikidata.org/wiki/Q7575205","display_name":"Spectral sensitivity","level":3,"score":0.43116825819015503},{"id":"https://openalex.org/C2777093003","wikidata":"https://www.wikidata.org/wiki/Q6508345","display_name":"Lead (geology)","level":2,"score":0.42027753591537476},{"id":"https://openalex.org/C184892835","wikidata":"https://www.wikidata.org/wiki/Q1474513","display_name":"Electromagnetic interference","level":2,"score":0.41979312896728516},{"id":"https://openalex.org/C6260449","wikidata":"https://www.wikidata.org/wiki/Q41364","display_name":"Wavelength","level":2,"score":0.22119656205177307},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.16403701901435852},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.1612662971019745},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.15728682279586792},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1354377269744873},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C114793014","wikidata":"https://www.wikidata.org/wiki/Q52109","display_name":"Geomorphology","level":1,"score":0.0},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.1982.6312518","doi":"https://doi.org/10.1109/tim.1982.6312518","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.1982.6312518","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-3","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W7145007892","https://openalex.org/W2144228425","https://openalex.org/W2075880379","https://openalex.org/W2335456962","https://openalex.org/W2319483359","https://openalex.org/W149983480","https://openalex.org/W2236147159","https://openalex.org/W1987467629","https://openalex.org/W1521863879","https://openalex.org/W1979399987"],"abstract_inverted_index":{"In":[0],"the":[1,16,27,71],"optical":[2],"gas":[3],"monitoring":[4],"method":[5],"using":[6],"a":[7,11,49,55,79],"lead-salt":[8],"diode":[9,17],"laser,":[10],"spectral":[12,22,74],"scanning":[13],"operation":[14],"of":[15,29,51,58,81],"brings":[18],"an":[19],"immunity":[20,72],"against":[21],"interference":[23,75],"which":[24],"has":[25],"limited":[26],"sensitivity":[28,50,80],"prevailing":[30],"methods.":[31],"Local,":[32],"sensitive,":[33],"and":[34,70],"noncontacting":[35],"features":[36],"as":[37,39],"well":[38],"quickness":[40],"are":[41],"attained":[42],"simultaneously.":[43],"Experiments":[44],"for":[45,73,84],"atmospheric":[46],"methane":[47],"showed":[48],"0.3":[52],"ppm":[53,83],"over":[54],"path":[56],"length":[57],"only":[59],"1":[60,85],"m.":[61],"Density":[62],"data":[63],"were":[64],"obtained":[65],"at":[66],"every":[67],"4":[68],"s":[69],"was":[76],"demonstrated.":[77],"Theoretically,":[78],"0.015":[82],"m":[86],"is":[87],"expected.":[88]},"counts_by_year":[],"updated_date":"2026-08-21T09:56:20.448147","created_date":"2016-06-24T00:00:00"}