{"id":"https://openalex.org/W1999554262","doi":"https://doi.org/10.1063/1.3695451","title":"Cleaning graphene using atomic force microscope","display_name":"Cleaning graphene using atomic force microscope","publication_year":2012,"publication_date":"2012-03-15","ids":{"openalex":"https://openalex.org/W1999554262","doi":"https://doi.org/10.1063/1.3695451","mag":"1999554262"},"language":"en","primary_location":{"id":"doi:10.1063/1.3695451","doi":"https://doi.org/10.1063/1.3695451","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.3695451","pdf_url":null,"source":{"id":"https://openalex.org/S187991544","display_name":"Journal of Applied Physics","issn_l":"0021-8979","issn":["0021-8979","1089-7550","1520-8850"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-d","jufo-1","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Applied Physics","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5030235508","display_name":"Niclas Lindvall","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I66862912","display_name":"Chalmers University of Technology","ror":"https://ror.org/040wg7k59","country_code":"SE","type":"education","lineage":["https://openalex.org/I66862912"]}],"countries":["SE"],"is_corresponding":false,"raw_author_name":"Niclas Lindvall","raw_affiliation_strings":["Chalmers University of Technology 1 Department of Microtechnology and Nanoscience, , SE-41296 Gothenburg, Sweden"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chalmers University of Technology 1 Department of Microtechnology and Nanoscience, , SE-41296 Gothenburg, Sweden","institution_ids":["https://openalex.org/I66862912"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5104018787","display_name":"Alexey S. Kalabukhov","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I19880235","display_name":"Lomonosov Moscow State University","ror":"https://ror.org/010pmpe69","country_code":"RU","type":"education","lineage":["https://openalex.org/I19880235"]},{"id":"https://openalex.org/I66862912","display_name":"Chalmers University of Technology","ror":"https://ror.org/040wg7k59","country_code":"SE","type":"education","lineage":["https://openalex.org/I66862912"]}],"countries":["RU","SE"],"is_corresponding":false,"raw_author_name":"Alexey Kalabukhov","raw_affiliation_strings":["Chalmers University of Technology 1 Department of Microtechnology and Nanoscience, , SE-41296 Gothenburg, Sweden","Moscow State University 2 Skobeltsyn Institute of Nuclear Physics, , Moscow, Russian Federation"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chalmers University of Technology 1 Department of Microtechnology and Nanoscience, , SE-41296 Gothenburg, Sweden","institution_ids":["https://openalex.org/I66862912"]},{"raw_affiliation_string":"Moscow State University 2 Skobeltsyn Institute of Nuclear Physics, , Moscow, Russian Federation","institution_ids":["https://openalex.org/I19880235"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5080244543","display_name":"August Yurgens","orcid":"https://orcid.org/0000-0002-3038-1911","observed_orcids":["https://orcid.org/0000-0002-3038-1911"]},"institutions":[{"id":"https://openalex.org/I66862912","display_name":"Chalmers University of Technology","ror":"https://ror.org/040wg7k59","country_code":"SE","type":"education","lineage":["https://openalex.org/I66862912"]}],"countries":["SE"],"is_corresponding":false,"raw_author_name":"August Yurgens","raw_affiliation_strings":["Chalmers University of Technology 1 Department of Microtechnology and Nanoscience, , SE-41296 Gothenburg, Sweden"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chalmers University of Technology 1 Department of Microtechnology and Nanoscience, , SE-41296 Gothenburg, Sweden","institution_ids":["https://openalex.org/I66862912"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":3500,"currency":"USD","value_usd":3500},"apc_paid":null,"fwci":2.4773,"has_fulltext":false,"cited_by_count":100,"citation_normalized_percentile":{"value":0.89698708,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":93,"max":100},"biblio":{"volume":"111","issue":"6","first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10083","display_name":"Graphene research and applications","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10083","display_name":"Graphene research and applications","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","score":0.0015999999595806003,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10275","display_name":"2D Materials and Applications","score":0.00019999999494757503,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/graphene","display_name":"graphene","score":0.906000018119812},{"id":"https://openalex.org/keywords/mechanical-cleaning","display_name":"mechanical cleaning","score":0.8849999904632568},{"id":"https://openalex.org/keywords/atomic-force-microscopy","display_name":"atomic force microscopy","score":0.8059999942779541},{"id":"https://openalex.org/keywords/contact-mode-afm","display_name":"contact mode AFM","score":0.5270000100135803},{"id":"https://openalex.org/keywords/surface-roughness","display_name":"surface roughness","score":0.9210000038146973},{"id":"https://openalex.org/keywords/charge-neutrality-point","display_name":"charge neutrality point","score":0.9279999732971191},{"id":"https://openalex.org/keywords/charge-carrier-mobility","display_name":"carrier mobility","score":0.8960000276565552},{"id":"https://openalex.org/keywords/graphene-based-devices","display_name":"graphene devices","score":0.4269999861717224}],"concepts":[{"id":"https://openalex.org/C30080830","wikidata":"https://www.wikidata.org/wiki/Q169917","display_name":"Graphene","level":2,"score":0.8836638927459717},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6744495034217834},{"id":"https://openalex.org/C102951782","wikidata":"https://www.wikidata.org/wiki/Q49295","display_name":"Atomic force microscopy","level":2,"score":0.5661494731903076},{"id":"https://openalex.org/C206008964","wikidata":"https://www.wikidata.org/wiki/Q5159384","display_name":"Conductive atomic force microscopy","level":3,"score":0.5452213883399963},{"id":"https://openalex.org/C107365816","wikidata":"https://www.wikidata.org/wiki/Q114817","display_name":"Surface roughness","level":2,"score":0.5199305415153503},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.506424069404602},{"id":"https://openalex.org/C140807948","wikidata":"https://www.wikidata.org/wiki/Q4148055","display_name":"Graphene nanoribbons","level":3,"score":0.4965277314186096},{"id":"https://openalex.org/C71039073","wikidata":"https://www.wikidata.org/wiki/Q3439090","display_name":"Surface finish","level":2,"score":0.4908202588558197},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.46215134859085083},{"id":"https://openalex.org/C53524968","wikidata":"https://www.wikidata.org/wiki/Q7315582","display_name":"Resist","level":3,"score":0.45633476972579956},{"id":"https://openalex.org/C82764429","wikidata":"https://www.wikidata.org/wiki/Q7187730","display_name":"Photoconductive atomic force microscopy","level":5,"score":0.45259690284729004},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.43139001727104187},{"id":"https://openalex.org/C71907059","wikidata":"https://www.wikidata.org/wiki/Q223323","display_name":"Root mean square","level":2,"score":0.4246440529823303},{"id":"https://openalex.org/C26771246","wikidata":"https://www.wikidata.org/wiki/Q321095","display_name":"Scanning electron microscope","level":2,"score":0.4088943600654602},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.3378371000289917},{"id":"https://openalex.org/C99752389","wikidata":"https://www.wikidata.org/wiki/Q9337610","display_name":"Scanning capacitance microscopy","level":4,"score":0.24329885840415955},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.19216808676719666},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.12869665026664734},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07893058657646179},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C187921700","wikidata":"https://www.wikidata.org/wiki/Q7430074","display_name":"Scanning confocal electron microscopy","level":3,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1063/1.3695451","doi":"https://doi.org/10.1063/1.3695451","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.3695451","pdf_url":null,"source":{"id":"https://openalex.org/S187991544","display_name":"Journal of Applied Physics","issn_l":"0021-8979","issn":["0021-8979","1089-7550","1520-8850"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-d","jufo-1","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Applied Physics","raw_type":"journal-article"},{"id":"pmh:oai:research.chalmers.se:158011","doi":null,"is_oa":false,"landing_page_url":"https://research.chalmers.se/en/publication/158011","pdf_url":null,"source":{"id":"https://openalex.org/S4306402469","display_name":"Chalmers Research (Chalmers University of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I66862912","host_organization_name":"Chalmers University of Technology","host_organization_lineage":["https://openalex.org/I66862912"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W1497079952","https://openalex.org/W1635273272","https://openalex.org/W1927677023","https://openalex.org/W1963903100","https://openalex.org/W1976963421","https://openalex.org/W1981430594","https://openalex.org/W1991859775","https://openalex.org/W1996649959","https://openalex.org/W2014935324","https://openalex.org/W2022436277","https://openalex.org/W2025071099","https://openalex.org/W2029530202","https://openalex.org/W2051365563","https://openalex.org/W2058122340","https://openalex.org/W2060386610","https://openalex.org/W2078792724","https://openalex.org/W2090037320","https://openalex.org/W2097773259","https://openalex.org/W2115581621","https://openalex.org/W2118492507","https://openalex.org/W2123070389","https://openalex.org/W2126176150","https://openalex.org/W2134233006","https://openalex.org/W2134985338","https://openalex.org/W2141484758","https://openalex.org/W2150486237","https://openalex.org/W2154133049","https://openalex.org/W2167712193","https://openalex.org/W2170068899","https://openalex.org/W2170539287"],"related_works":["https://openalex.org/W1497079952","https://openalex.org/W2573049906","https://openalex.org/W2953682100","https://openalex.org/W2266808848","https://openalex.org/W2160228561","https://openalex.org/W3108461327","https://openalex.org/W3030363853","https://openalex.org/W4328010620","https://openalex.org/W2279771669","https://openalex.org/W2030682524"],"abstract_inverted_index":{"We":[0,35],"mechanically":[1],"clean":[2],"graphene":[3,39],"devices":[4],"using":[5],"an":[6,13,73],"atomic":[7],"force":[8],"microscope":[9],"(AFM).":[10],"By":[11],"scanning":[12],"AFM":[14],"tip":[15],"in":[16,19,59,75],"contact":[17],"mode":[18],"a":[20,41,60],"broom-like":[21],"way":[22],"over":[23],"the":[24,32,63],"sample,":[25],"resist":[26],"residues":[27],"are":[28],"pushed":[29],"away":[30],"from":[31],"desired":[33],"area.":[34],"obtain":[36],"atomically":[37],"flat":[38],"with":[40],"root":[42],"mean":[43],"square":[44],"(rms)":[45],"roughness":[46],"as":[47,49,70,72],"low":[48],"0.12":[50],"nm":[51],"after":[52],"this":[53],"procedure.":[54],"The":[55],"cleaning":[56],"also":[57],"results":[58],"shift":[61],"of":[62],"charge-neutrality":[64],"point":[65],"toward":[66],"zero":[67],"gate":[68],"voltage,":[69],"well":[71],"increase":[74],"charge":[76],"carrier":[77],"mobility.":[78]},"counts_by_year":[{"year":2026,"cited_by_count":14},{"year":2025,"cited_by_count":7},{"year":2024,"cited_by_count":8},{"year":2023,"cited_by_count":7},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":9},{"year":2020,"cited_by_count":9},{"year":2019,"cited_by_count":12},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":8},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":7},{"year":2012,"cited_by_count":2}],"updated_date":"2026-11-10T11:39:43.021295","created_date":"2016-06-24T00:00:00"}