{"id":"https://openalex.org/W1999548574","doi":"https://doi.org/10.1007/bf00975843","title":"Method for adjusting lasers with spherical mirrors","display_name":"Method for adjusting lasers with spherical mirrors","publication_year":1966,"publication_date":"1966-03-01","ids":{"openalex":"https://openalex.org/W1999548574","doi":"https://doi.org/10.1007/bf00975843","mag":"1999548574"},"language":"en","primary_location":{"id":"doi:10.1007/bf00975843","doi":"https://doi.org/10.1007/bf00975843","is_oa":false,"landing_page_url":"https://doi.org/10.1007/bf00975843","pdf_url":null,"source":{"id":"https://openalex.org/S127523745","display_name":"Measurement Techniques","issn_l":"0543-1972","issn":["0543-1972","1573-8906"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["dongbi-c","jufo-1","norway-1","poland-20","russia-white-list-4"],"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Measurement Techniques","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5007210532","display_name":"Yu. M. Gryaznov","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yu. M. Gryaznov","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5007074571","display_name":"A. A. Chastov","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"A. A. Chastov","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.27266429,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"9","issue":"3","first_page":"423","last_page":"424"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14158","display_name":"Optical Systems and Laser Technology","score":0.4406999945640564,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14158","display_name":"Optical Systems and Laser Technology","score":0.4406999945640564,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.23499999940395355,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.16140000522136688,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/laser-alignment","display_name":"laser alignment","score":0.7129999995231628},{"id":"https://openalex.org/keywords/spherical-mirrors","display_name":"spherical mirrors","score":0.9860000014305115},{"id":"https://openalex.org/keywords/optical-alignment","display_name":"optical alignment","score":0.3449999988079071}],"concepts":[{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.7168484926223755},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5501549243927002},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.4555966854095459},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2048656940460205}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/bf00975843","doi":"https://doi.org/10.1007/bf00975843","is_oa":false,"landing_page_url":"https://doi.org/10.1007/bf00975843","pdf_url":null,"source":{"id":"https://openalex.org/S127523745","display_name":"Measurement Techniques","issn_l":"0543-1972","issn":["0543-1972","1573-8906"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["dongbi-c","jufo-1","norway-1","poland-20","russia-white-list-4"],"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Measurement Techniques","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W1998030372","https://openalex.org/W2008378423","https://openalex.org/W2002496262","https://openalex.org/W1978043128","https://openalex.org/W2328670168","https://openalex.org/W1969500083","https://openalex.org/W3106904603","https://openalex.org/W1968806201","https://openalex.org/W3147426474","https://openalex.org/W3068303462"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2016-06-24T00:00:00"}