{"id":"https://openalex.org/W1999175246","doi":"https://doi.org/10.2307/1270052","title":"Handbook of Statistical Methods in Manufacturing","display_name":"Handbook of Statistical Methods in Manufacturing","publication_year":1992,"publication_date":"1992-08-01","ids":{"openalex":"https://openalex.org/W1999175246","doi":"https://doi.org/10.2307/1270052","mag":"1999175246"},"language":"en","primary_location":{"id":"doi:10.2307/1270052","doi":"https://doi.org/10.2307/1270052","is_oa":false,"landing_page_url":"https://doi.org/10.2307/1270052","pdf_url":null,"source":{"id":"https://openalex.org/S985303","display_name":"Technometrics","issn_l":"0040-1706","issn":["0040-1706","1537-2723"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["abdc-a","anvur-class-a","anvur-scientific","cwts-core","dongbi-c","doyens","jufo-2","norway-2","poland-140","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320547","host_organization_name":"Taylor & Francis","host_organization_lineage":["https://openalex.org/P4310320547","https://openalex.org/P4310320449"],"host_organization_lineage_names":["Taylor & Francis","Informa"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Technometrics","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5085738501","display_name":"Richard M. Brugger","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Richard M. Brugger","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5068529636","display_name":"Richard Barrett Clements","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Richard Barrett Clements","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.6725,"has_fulltext":false,"cited_by_count":15,"citation_normalized_percentile":{"value":0.71324933,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"34","issue":"3","first_page":"360","last_page":"360"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.9775000214576721,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.9775000214576721,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T13706","display_name":"Management and Optimization Techniques","score":0.013500000350177288,"subfield":{"id":"https://openalex.org/subfields/1408","display_name":"Strategy and Management"},"field":{"id":"https://openalex.org/fields/14","display_name":"Business, Management and Accounting"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T13141","display_name":"Statistical Methods and Applications","score":0.0017999999690800905,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/statistical-quality-control","display_name":"statistical quality control","score":0.8029999732971191},{"id":"https://openalex.org/keywords/manufacturing-processes","display_name":"production process","score":0.5410000085830688},{"id":"https://openalex.org/keywords/process-monitoring","display_name":"process monitoring","score":0.6259999871253967},{"id":"https://openalex.org/keywords/statistical-process-control","display_name":"statistical process control","score":0.6259999871253967},{"id":"https://openalex.org/keywords/quality-improvement","display_name":"quality improvement","score":0.3199999928474426}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.41654306650161743},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.3425612449645996},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.30875906348228455}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.2307/1270052","doi":"https://doi.org/10.2307/1270052","is_oa":false,"landing_page_url":"https://doi.org/10.2307/1270052","pdf_url":null,"source":{"id":"https://openalex.org/S985303","display_name":"Technometrics","issn_l":"0040-1706","issn":["0040-1706","1537-2723"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["abdc-a","anvur-class-a","anvur-scientific","cwts-core","dongbi-c","doyens","jufo-2","norway-2","poland-140","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320547","host_organization_name":"Taylor & Francis","host_organization_lineage":["https://openalex.org/P4310320547","https://openalex.org/P4310320449"],"host_organization_lineage_names":["Taylor & Francis","Informa"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Technometrics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W4302465758","https://openalex.org/W4302790773","https://openalex.org/W4235166168","https://openalex.org/W4205138534","https://openalex.org/W4236028589","https://openalex.org/W4233866471","https://openalex.org/W4238929197","https://openalex.org/W1980674892","https://openalex.org/W4254370084","https://openalex.org/W2792090607"],"abstract_inverted_index":null,"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":2}],"updated_date":"2026-08-15T07:11:24.734988","created_date":"2016-06-24T00:00:00"}