{"id":"https://openalex.org/W1999100714","doi":"https://doi.org/10.1108/mi-11-2013-0059","title":"Tape casting and properties of Pr2O3-doped ZnO multilayer varistors","display_name":"Tape casting and properties of Pr2O3-doped ZnO multilayer varistors","publication_year":2014,"publication_date":"2014-08-04","ids":{"openalex":"https://openalex.org/W1999100714","doi":"https://doi.org/10.1108/mi-11-2013-0059","mag":"1999100714"},"language":"en","primary_location":{"id":"doi:10.1108/mi-11-2013-0059","doi":"https://doi.org/10.1108/mi-11-2013-0059","is_oa":false,"landing_page_url":"https://doi.org/10.1108/mi-11-2013-0059","pdf_url":null,"source":{"id":"https://openalex.org/S159533830","display_name":"Microelectronics International","issn_l":"1356-5362","issn":["1356-5362","1758-812X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-40","russia-white-list-3"],"host_organization":"https://openalex.org/P4310319811","host_organization_name":"Emerald Publishing Limited","host_organization_lineage":["https://openalex.org/P4310319811"],"host_organization_lineage_names":["Emerald Publishing Limited"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics International","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5066451433","display_name":"Jan Kulawik","orcid":"https://orcid.org/0000-0002-7409-3305","observed_orcids":["https://orcid.org/0000-0002-7409-3305"]},"institutions":[{"id":"https://openalex.org/I4210118827","display_name":"Institute of Electron Technology","ror":"https://ror.org/02khfkr46","country_code":"PL","type":"facility","lineage":["https://openalex.org/I4210118827","https://openalex.org/I4210129336","https://openalex.org/I4405259767"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Jan Kulawik","raw_affiliation_strings":["Institute of Electron Technology, Krakow, Poland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Electron Technology, Krakow, Poland","institution_ids":["https://openalex.org/I4210118827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077588140","display_name":"Dorota Szwagierczak","orcid":"https://orcid.org/0000-0002-4388-3259","observed_orcids":["https://orcid.org/0000-0002-4388-3259"]},"institutions":[{"id":"https://openalex.org/I4210118827","display_name":"Institute of Electron Technology","ror":"https://ror.org/02khfkr46","country_code":"PL","type":"facility","lineage":["https://openalex.org/I4210118827","https://openalex.org/I4210129336","https://openalex.org/I4405259767"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Dorota Szwagierczak","raw_affiliation_strings":["Krak\u00f3w Division, Institute of Electron Technology, Krak\u00f3w, Poland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Krak\u00f3w Division, Institute of Electron Technology, Krak\u00f3w, Poland","institution_ids":["https://openalex.org/I4210118827"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5079118227","display_name":"Beata Synkiewicz-Musialska","orcid":"https://orcid.org/0000-0001-5772-8383","observed_orcids":["https://orcid.org/0000-0001-5772-8383"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Beata Synkiewicz","raw_affiliation_strings":["Department of Microelectronics, Institute of Electron Technology, Krak\u00f3w, Poland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Microelectronics, Institute of Electron Technology, Krak\u00f3w, Poland","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.6735,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.64617146,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":97},"biblio":{"volume":"31","issue":"3","first_page":"163","last_page":"168"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13249","display_name":"Dielectric properties of ceramics","score":0.9648000001907349,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13249","display_name":"Dielectric properties of ceramics","score":0.9648000001907349,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13251","display_name":"Electrical and Thermal Properties of Materials","score":0.023800000548362732,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10090","display_name":"ZnO doping and properties","score":0.006200000178068876,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/zinc-oxide","display_name":"zinc oxide","score":0.8029999732971191},{"id":"https://openalex.org/keywords/tape-casting","display_name":"tape casting","score":0.8619999885559082},{"id":"https://openalex.org/keywords/low-temperature-co-fired-ceramic","display_name":"low temperature co-fired ceramic","score":0.8870000243186951},{"id":"https://openalex.org/keywords/grain-growth-inhibition","display_name":"grain growth inhibition","score":0.6880000233650208},{"id":"https://openalex.org/keywords/nonlinear-current-voltage-characteristics","display_name":"nonlinear current-voltage characteristics","score":0.8500000238418579},{"id":"https://openalex.org/keywords/breakdown-voltage","display_name":"breakdown voltage","score":0.8740000128746033},{"id":"https://openalex.org/keywords/sintering-temperature","display_name":"sintering temperature","score":0.9810000061988831},{"id":"https://openalex.org/keywords/dielectric-properties","display_name":"dielectric properties","score":0.9010000228881836},{"id":"https://openalex.org/keywords/microstructure","display_name":"microstructure","score":0.34599998593330383}],"concepts":[{"id":"https://openalex.org/C58289394","wikidata":"https://www.wikidata.org/wiki/Q465115","display_name":"Varistor","level":3,"score":0.9629058837890625},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.8682591915130615},{"id":"https://openalex.org/C87976508","wikidata":"https://www.wikidata.org/wiki/Q1498213","display_name":"Microstructure","level":2,"score":0.7514441013336182},{"id":"https://openalex.org/C26771246","wikidata":"https://www.wikidata.org/wiki/Q321095","display_name":"Scanning electron microscope","level":2,"score":0.7005115747451782},{"id":"https://openalex.org/C147438087","wikidata":"https://www.wikidata.org/wiki/Q386334","display_name":"Energy-dispersive X-ray spectroscopy","level":3,"score":0.5393078327178955},{"id":"https://openalex.org/C137637335","wikidata":"https://www.wikidata.org/wiki/Q899604","display_name":"Crystallite","level":2,"score":0.5367525815963745},{"id":"https://openalex.org/C134132462","wikidata":"https://www.wikidata.org/wiki/Q45621","display_name":"Ceramic","level":2,"score":0.5056982040405273},{"id":"https://openalex.org/C57863236","wikidata":"https://www.wikidata.org/wiki/Q1130571","display_name":"Doping","level":2,"score":0.5025773048400879},{"id":"https://openalex.org/C2777581544","wikidata":"https://www.wikidata.org/wiki/Q844613","display_name":"Sintering","level":2,"score":0.4683752655982971},{"id":"https://openalex.org/C7040849","wikidata":"https://www.wikidata.org/wiki/Q899580","display_name":"Dielectric spectroscopy","level":4,"score":0.43134909868240356},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.421028196811676},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.41769659519195557},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.2651973366737366},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.2536126971244812},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.17900708317756653},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1644999384880066},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C52859227","wikidata":"https://www.wikidata.org/wiki/Q7877","display_name":"Electrochemistry","level":3,"score":0.0},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1108/mi-11-2013-0059","doi":"https://doi.org/10.1108/mi-11-2013-0059","is_oa":false,"landing_page_url":"https://doi.org/10.1108/mi-11-2013-0059","pdf_url":null,"source":{"id":"https://openalex.org/S159533830","display_name":"Microelectronics International","issn_l":"1356-5362","issn":["1356-5362","1758-812X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-40","russia-white-list-3"],"host_organization":"https://openalex.org/P4310319811","host_organization_name":"Emerald Publishing Limited","host_organization_lineage":["https://openalex.org/P4310319811"],"host_organization_lineage_names":["Emerald Publishing Limited"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics International","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1854592699","https://openalex.org/W1971806599","https://openalex.org/W1977292801","https://openalex.org/W2002679917","https://openalex.org/W2013080747","https://openalex.org/W2034261608","https://openalex.org/W2046967572","https://openalex.org/W2066172190","https://openalex.org/W2069043829","https://openalex.org/W2081906277","https://openalex.org/W2089279496","https://openalex.org/W2132359293","https://openalex.org/W2132965330","https://openalex.org/W4211124699"],"related_works":["https://openalex.org/W2726190200","https://openalex.org/W1993737986","https://openalex.org/W2965039501","https://openalex.org/W2069043829","https://openalex.org/W2586046738","https://openalex.org/W2088196955","https://openalex.org/W2375098097","https://openalex.org/W2366614318","https://openalex.org/W2166544703","https://openalex.org/W2577966648"],"abstract_inverted_index":{"Purpose":[0],"\u2013":[1,13,86,170],"This":[2],"paper":[3],"aims":[4],"to":[5,53,77,121,220],"fabricate":[6],"and":[7,35,46,58,89,113,148,153,207,214,234],"characterize":[8,78],"ZnO-based":[9],"multilayer":[10,22,138,193],"varistors.":[11,64,84],"Design/methodology/approach":[12],"Tape":[14],"casting":[15],"technique":[16],"was":[17,119,237],"utilized":[18],"for":[19,150,192],"preparation":[20],"of":[21,62,81,95,135,146,182,189,204,224,231],"varistors":[23,139,194],"based":[24],"on":[25],"ZnO":[26,99,130],"doped":[27],"with":[28,98,142,165,211],"Pr,":[29],"Bi,":[30],"Sb,":[31],"Co,":[32],"Cr,":[33],"Mn":[34],"Si":[36],"oxides.":[37],"Scanning":[38],"electron":[39],"microscope":[40],"(SEM),":[41],"energy-dispersive":[42],"X-ray":[43,47],"spectroscopy":[44],"(EDS)":[45],"diffraction":[48],"(XRD)":[49],"methods":[50],"were":[51,67,75,140,161],"used":[52],"study":[54],"the":[55,63,82,129,136,143,151,199,202,212,222,225],"microstructure,":[56],"elemental":[57],"phase":[59],"compositions,":[60],"respectively,":[61],"Dielectric":[65],"properties":[66],"investigated":[68],"by":[69,105],"impedance":[70,216],"spectroscopy.":[71],"Current\u2013voltage":[72],"(I\u2013U)":[73],"dependences":[74,217],"measured":[76],"nonlinear":[79],"behavior":[80],"fabricated":[83,137],"Findings":[85],"XRD,":[87,205],"SEM":[88,206],"EDS":[90,208],"studies":[91,209],"revealed":[92],"dense":[93],"microstructure":[94],"ceramic":[96],"layers":[97],"grains":[100,112],"sized":[101],"1-4":[102],"\u03bcm":[103],"surrounded":[104],"nanometric":[106],"Bi-rich":[107],"films,":[108],"submicrometer":[109],"Zn7Sb2O12":[110],"spinel":[111],"needle-shaped":[114],"Pr3SbO7":[115],"crystallites.":[116],"Praseodymium":[117],"oxide":[118],"found":[120],"be":[122],"very":[123],"effective":[124],"as":[125],"an":[126],"additive":[127],"restricting":[128],"grain":[131],"growth.":[132],"I\u2013U":[133,213],"characteristics":[134],"nonlinear,":[141],"nonlinearity":[144],"coefficients":[145],"23-27":[147],"19-51":[149],"lower":[152],"higher":[154],"Pr2O3":[155],"content,":[156],"respectively.":[157],"The":[158,229],"breakdown":[159],"voltages":[160],"60-150":[162],"V,":[163],"decreasing":[164],"increasing":[166],"sintering":[167,232],"temperature.":[168],"Originality/value":[169],"Low-temperature":[171],"cofired":[172],"ceramics":[173],"technology":[174,191],"enables":[175],"attaining":[176],"a":[177],"significant":[178],"progress":[179],"in":[180],"miniaturization":[181],"electronic":[183],"passive":[184],"components.":[185],"Literature":[186],"concerning":[187],"application":[188],"this":[190],"fabrication":[195],"is":[196],"limited.":[197],"In":[198],"present":[200],"work,":[201],"results":[203],"along":[210],"complex":[215],"are":[218],"analyzed":[219],"elucidate":[221],"origin":[223],"observed":[226],"varistor":[227],"effect.":[228],"influence":[230],"temperature":[233],"Pr2O3-doping":[235],"level":[236],"investigated.":[238]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":3},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":2}],"updated_date":"2026-10-30T12:39:25.321706","created_date":"2016-06-24T00:00:00"}