{"id":"https://openalex.org/W1998791787","doi":"https://doi.org/10.1016/0029-554x(68)90342-x","title":"Accurate determination of the ionization energy in semiconductor detectors","display_name":"Accurate determination of the ionization energy in semiconductor detectors","publication_year":1968,"publication_date":"1968-02-01","ids":{"openalex":"https://openalex.org/W1998791787","doi":"https://doi.org/10.1016/0029-554x(68)90342-x","mag":"1998791787"},"language":"en","primary_location":{"id":"doi:10.1016/0029-554x(68)90342-x","doi":"https://doi.org/10.1016/0029-554x(68)90342-x","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0029-554x(68)90342-x","pdf_url":null,"source":{"id":"https://openalex.org/S44816201","display_name":"Nuclear Instruments and Methods","issn_l":"0029-554X","issn":["0029-554X","1878-3759"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Nuclear Instruments and Methods","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://escholarship.org/content/qt3c66h522/qt3c66h522.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5030500080","display_name":"Richard H. Pehl","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I148283060","display_name":"Lawrence Berkeley National Laboratory","ror":"https://ror.org/02jbv0t02","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I148283060","https://openalex.org/I39565521"]},{"id":"https://openalex.org/I95457486","display_name":"University of California, Berkeley","ror":"https://ror.org/01an7q238","country_code":"US","type":"education","lineage":["https://openalex.org/I95457486"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R.H. Pehl","raw_affiliation_strings":["Lawrence Radiation Laboratory, University of California, Berkeley, California, U.S.A"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Lawrence Radiation Laboratory, University of California, Berkeley, California, U.S.A","institution_ids":["https://openalex.org/I148283060","https://openalex.org/I95457486"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111363824","display_name":"Frederick S. Goulding","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I148283060","display_name":"Lawrence Berkeley National Laboratory","ror":"https://ror.org/02jbv0t02","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I148283060","https://openalex.org/I39565521"]},{"id":"https://openalex.org/I95457486","display_name":"University of California, Berkeley","ror":"https://ror.org/01an7q238","country_code":"US","type":"education","lineage":["https://openalex.org/I95457486"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"F.S. Goulding","raw_affiliation_strings":["Lawrence Radiation Laboratory, University of California, Berkeley, California, U.S.A"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Lawrence Radiation Laboratory, University of California, Berkeley, California, U.S.A","institution_ids":["https://openalex.org/I148283060","https://openalex.org/I95457486"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053340418","display_name":"Donald A. Landis","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I148283060","display_name":"Lawrence Berkeley National Laboratory","ror":"https://ror.org/02jbv0t02","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I148283060","https://openalex.org/I39565521"]},{"id":"https://openalex.org/I95457486","display_name":"University of California, Berkeley","ror":"https://ror.org/01an7q238","country_code":"US","type":"education","lineage":["https://openalex.org/I95457486"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"D.A. Landis","raw_affiliation_strings":["Lawrence Radiation Laboratory, University of California, Berkeley, California, U.S.A"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Lawrence Radiation Laboratory, University of California, Berkeley, California, U.S.A","institution_ids":["https://openalex.org/I148283060","https://openalex.org/I95457486"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5057155110","display_name":"Martin Lenzlinger","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I148283060","display_name":"Lawrence Berkeley National Laboratory","ror":"https://ror.org/02jbv0t02","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I148283060","https://openalex.org/I39565521"]},{"id":"https://openalex.org/I95457486","display_name":"University of California, Berkeley","ror":"https://ror.org/01an7q238","country_code":"US","type":"education","lineage":["https://openalex.org/I95457486"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M. Lenzlinger","raw_affiliation_strings":["Lawrence Radiation Laboratory, University of California, Berkeley, California, U.S.A"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Lawrence Radiation Laboratory, University of California, Berkeley, California, U.S.A","institution_ids":["https://openalex.org/I148283060","https://openalex.org/I95457486"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":10.7121,"has_fulltext":true,"cited_by_count":193,"citation_normalized_percentile":{"value":0.98889946,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":88,"max":99},"biblio":{"volume":"59","issue":"1","first_page":"45","last_page":"55"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11044","display_name":"Particle Detector Development and Performance","score":0.5264000296592712,"subfield":{"id":"https://openalex.org/subfields/3106","display_name":"Nuclear and High Energy Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11044","display_name":"Particle Detector Development and Performance","score":0.5264000296592712,"subfield":{"id":"https://openalex.org/subfields/3106","display_name":"Nuclear and High Energy Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.336899995803833,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11216","display_name":"Radiation Detection and Scintillator Technologies","score":0.10989999771118164,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ionization-potential","display_name":"ionization potential","score":0.984000027179718},{"id":"https://openalex.org/keywords/semiconductor-detectors","display_name":"semiconductor detectors","score":0.7400000095367432},{"id":"https://openalex.org/keywords/silicon-detectors","display_name":"silicon detectors","score":0.7739999890327454},{"id":"https://openalex.org/keywords/germanium-detectors","display_name":"germanium detectors","score":0.9449999928474426},{"id":"https://openalex.org/keywords/electron-hole-pair-generation","display_name":"electron-hole pair generation","score":0.8659999966621399},{"id":"https://openalex.org/keywords/gamma-radiation","display_name":"gamma radiation","score":0.699999988079071},{"id":"https://openalex.org/keywords/alpha-particles","display_name":"alpha particles","score":0.8009999990463257},{"id":"https://openalex.org/keywords/electrons","display_name":"electrons","score":0.8410000205039978},{"id":"https://openalex.org/keywords/temperature-dependence","display_name":"temperature dependence","score":0.9309999942779541},{"id":"https://openalex.org/keywords/energy-loss","display_name":"energy loss","score":0.3160000145435333}],"concepts":[{"id":"https://openalex.org/C550623735","wikidata":"https://www.wikidata.org/wiki/Q867","display_name":"Germanium","level":3,"score":0.8838709592819214},{"id":"https://openalex.org/C148704626","wikidata":"https://www.wikidata.org/wiki/Q257415","display_name":"Semiconductor detector","level":3,"score":0.8134939074516296},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.7168022394180298},{"id":"https://openalex.org/C108225325","wikidata":"https://www.wikidata.org/wiki/Q11456","display_name":"Semiconductor","level":2,"score":0.671970009803772},{"id":"https://openalex.org/C147120987","wikidata":"https://www.wikidata.org/wiki/Q2225","display_name":"Electron","level":2,"score":0.653844952583313},{"id":"https://openalex.org/C198291218","wikidata":"https://www.wikidata.org/wiki/Q190382","display_name":"Ionization","level":3,"score":0.6236605048179626},{"id":"https://openalex.org/C184779094","wikidata":"https://www.wikidata.org/wiki/Q26383","display_name":"Atomic physics","level":1,"score":0.5822620987892151},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.5817530751228333},{"id":"https://openalex.org/C2778541603","wikidata":"https://www.wikidata.org/wiki/Q152763","display_name":"Lithium (medication)","level":2,"score":0.5588245391845703},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5308011174201965},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3424077033996582},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.29349642992019653},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.289428174495697},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.19459667801856995},{"id":"https://openalex.org/C145148216","wikidata":"https://www.wikidata.org/wiki/Q36496","display_name":"Ion","level":2,"score":0.1637762486934662},{"id":"https://openalex.org/C134018914","wikidata":"https://www.wikidata.org/wiki/Q162606","display_name":"Endocrinology","level":1,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.1016/0029-554x(68)90342-x","doi":"https://doi.org/10.1016/0029-554x(68)90342-x","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0029-554x(68)90342-x","pdf_url":null,"source":{"id":"https://openalex.org/S44816201","display_name":"Nuclear Instruments and Methods","issn_l":"0029-554X","issn":["0029-554X","1878-3759"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Nuclear Instruments and Methods","raw_type":"journal-article"},{"id":"pmh:qt3c66h522","doi":null,"is_oa":true,"landing_page_url":"http://www.escholarship.org/uc/item/3c66h522","pdf_url":"https://escholarship.org/content/qt3c66h522/qt3c66h522.pdf","source":{"id":"https://openalex.org/S4306400115","display_name":"eScholarship (California Digital Library)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I2801248553","host_organization_name":"California Digital Library","host_organization_lineage":["https://openalex.org/I2801248553"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Pehl, Richard H.; Goulding, Fred S.; Landis, Donald A.; & Lenzlinger, Martin.(1967). ACCURATE DETERMINATION OF THE IONIZATION ENERGY IN SEMICONDUCTOR DETECTORS. Lawrence Berkeley National Laboratory: Lawrence Berkeley National Laboratory. Retrieved from: http://www.escholarship.org/uc/item/3c66h522","raw_type":"article"},{"id":"pmh:oai:escholarship.org/ark:/13030/qt3c66h522","doi":null,"is_oa":false,"landing_page_url":"https://escholarship.org/uc/item/3c66h522","pdf_url":null,"source":{"id":"https://openalex.org/S4306400115","display_name":"eScholarship (California Digital Library)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I2801248553","host_organization_name":"California Digital Library","host_organization_lineage":["https://openalex.org/I2801248553"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"article"},{"id":"mag:2199049673","doi":null,"is_oa":false,"landing_page_url":"http://www.osti.gov/scitech/biblio/4800718-accurate-determination-ionization-energy-semiconductor-detectors","pdf_url":null,"source":{"id":"https://openalex.org/S4306402487","display_name":"OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I139351228","host_organization_name":"Office of Scientific and Technical Information","host_organization_lineage":["https://openalex.org/I139351228"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null}],"best_oa_location":{"id":"pmh:qt3c66h522","doi":null,"is_oa":true,"landing_page_url":"http://www.escholarship.org/uc/item/3c66h522","pdf_url":"https://escholarship.org/content/qt3c66h522/qt3c66h522.pdf","source":{"id":"https://openalex.org/S4306400115","display_name":"eScholarship (California Digital Library)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I2801248553","host_organization_name":"California Digital Library","host_organization_lineage":["https://openalex.org/I2801248553"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Pehl, Richard H.; Goulding, Fred S.; Landis, Donald A.; & Lenzlinger, Martin.(1967). ACCURATE DETERMINATION OF THE IONIZATION ENERGY IN SEMICONDUCTOR DETECTORS. Lawrence Berkeley National Laboratory: Lawrence Berkeley National Laboratory. Retrieved from: http://www.escholarship.org/uc/item/3c66h522","raw_type":"article"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W1998791787.pdf","grobid_xml":"https://content.openalex.org/works/W1998791787.grobid-xml"},"referenced_works_count":8,"referenced_works":["https://openalex.org/W63309834","https://openalex.org/W1484254794","https://openalex.org/W1974202325","https://openalex.org/W1993311654","https://openalex.org/W2032656263","https://openalex.org/W2059805020","https://openalex.org/W2068819204","https://openalex.org/W2094232536"],"related_works":["https://openalex.org/W1997735584","https://openalex.org/W2083126531","https://openalex.org/W1993311654","https://openalex.org/W2074236806","https://openalex.org/W2068819204","https://openalex.org/W1966178523","https://openalex.org/W2039099749","https://openalex.org/W2083933117","https://openalex.org/W7025056846","https://openalex.org/W807534320"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":6},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":8},{"year":2022,"cited_by_count":8},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":10},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":7},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":5},{"year":2012,"cited_by_count":3}],"updated_date":"2026-11-07T11:25:07.637180","created_date":"2016-06-24T00:00:00"}