{"id":"https://openalex.org/W1998630075","doi":"https://doi.org/10.1063/1.1702342","title":"Reliability of Probe Measurements in Hot Cathode Gas Diodes","display_name":"Reliability of Probe Measurements in Hot Cathode Gas Diodes","publication_year":1952,"publication_date":"1952-09-01","ids":{"openalex":"https://openalex.org/W1998630075","doi":"https://doi.org/10.1063/1.1702342","mag":"1998630075"},"language":"en","primary_location":{"id":"doi:10.1063/1.1702342","doi":"https://doi.org/10.1063/1.1702342","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.1702342","pdf_url":null,"source":{"id":"https://openalex.org/S187991544","display_name":"Journal of Applied Physics","issn_l":"0021-8979","issn":["0021-8979","1089-7550","1520-8850"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-d","jufo-1","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Applied Physics","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111817452","display_name":"Gottfried K. Wehner","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I2799950915","display_name":"Wright-Patterson Air Force Base","ror":"https://ror.org/0097e1k27","country_code":"US","type":"other","lineage":["https://openalex.org/I1330347796","https://openalex.org/I2799950915","https://openalex.org/I4210089612","https://openalex.org/I4210102105"]},{"id":"https://openalex.org/I4405253433","display_name":"United States Air Force Aeronautical Systems Center","ror":"https://ror.org/00nj2dc54","country_code":"US","type":"government","lineage":["https://openalex.org/I1330347796","https://openalex.org/I4210102105","https://openalex.org/I4389425425","https://openalex.org/I4402554125","https://openalex.org/I4405253433"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Gottfried Wehner","raw_affiliation_strings":["Components and Systems Laboratory, Wright Air Development Center, Wright-Patterson Air Force Base, Ohio"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Components and Systems Laboratory, Wright Air Development Center, Wright-Patterson Air Force Base, Ohio","institution_ids":["https://openalex.org/I2799950915","https://openalex.org/I4405253433"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5047447177","display_name":"Gustav Medicus","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I2799950915","display_name":"Wright-Patterson Air Force Base","ror":"https://ror.org/0097e1k27","country_code":"US","type":"other","lineage":["https://openalex.org/I1330347796","https://openalex.org/I2799950915","https://openalex.org/I4210089612","https://openalex.org/I4210102105"]},{"id":"https://openalex.org/I4405253433","display_name":"United States Air Force Aeronautical Systems Center","ror":"https://ror.org/00nj2dc54","country_code":"US","type":"government","lineage":["https://openalex.org/I1330347796","https://openalex.org/I4210102105","https://openalex.org/I4389425425","https://openalex.org/I4402554125","https://openalex.org/I4405253433"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Gustav Medicus","raw_affiliation_strings":["Components and Systems Laboratory, Wright Air Development Center, Wright-Patterson Air Force Base, Ohio"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Components and Systems Laboratory, Wright Air Development Center, Wright-Patterson Air Force Base, Ohio","institution_ids":["https://openalex.org/I2799950915","https://openalex.org/I4405253433"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":3500,"currency":"USD","value_usd":3500},"apc_paid":null,"fwci":1.561,"has_fulltext":false,"cited_by_count":105,"citation_normalized_percentile":{"value":0.80682415,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":97},"biblio":{"volume":"23","issue":"9","first_page":"1035","last_page":"1046"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10781","display_name":"Plasma Diagnostics and Applications","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10781","display_name":"Plasma Diagnostics and Applications","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12077","display_name":"Vacuum and Plasma Arcs","score":0.001500000013038516,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11175","display_name":"Gyrotron and Vacuum Electronics Research","score":0.000699999975040555,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/langmuir-probes","display_name":"Langmuir probes","score":0.8539999723434448},{"id":"https://openalex.org/keywords/tungsten-probe","display_name":"tungsten probe","score":0.6809999942779541},{"id":"https://openalex.org/keywords/oxygen-adsorption","display_name":"oxygen adsorption","score":0.7879999876022339},{"id":"https://openalex.org/keywords/sputtering","display_name":"sputtering","score":0.800000011920929},{"id":"https://openalex.org/keywords/maxwell-boltzmann-distribution","display_name":"Maxwell-Boltzmann distribution","score":0.8379999995231628}],"concepts":[{"id":"https://openalex.org/C176118016","wikidata":"https://www.wikidata.org/wiki/Q903002","display_name":"Langmuir probe","level":4,"score":0.873409628868103},{"id":"https://openalex.org/C49110097","wikidata":"https://www.wikidata.org/wiki/Q175233","display_name":"Cathode","level":2,"score":0.8214443922042847},{"id":"https://openalex.org/C115235246","wikidata":"https://www.wikidata.org/wiki/Q783800","display_name":"Work function","level":3,"score":0.7812364101409912},{"id":"https://openalex.org/C47645306","wikidata":"https://www.wikidata.org/wiki/Q1365473","display_name":"Hot cathode","level":3,"score":0.6367155909538269},{"id":"https://openalex.org/C143979616","wikidata":"https://www.wikidata.org/wiki/Q215259","display_name":"Thermionic emission","level":3,"score":0.6263752579689026},{"id":"https://openalex.org/C2779851234","wikidata":"https://www.wikidata.org/wiki/Q50690","display_name":"Oxide","level":2,"score":0.6117523908615112},{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.5950484275817871},{"id":"https://openalex.org/C61441594","wikidata":"https://www.wikidata.org/wiki/Q132814","display_name":"Evaporation","level":2,"score":0.5842797756195068},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.5222712159156799},{"id":"https://openalex.org/C542268612","wikidata":"https://www.wikidata.org/wiki/Q743","display_name":"Tungsten","level":2,"score":0.5184516310691833},{"id":"https://openalex.org/C82706917","wikidata":"https://www.wikidata.org/wiki/Q10251","display_name":"Plasma","level":2,"score":0.5159252882003784},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5034996867179871},{"id":"https://openalex.org/C43503373","wikidata":"https://www.wikidata.org/wiki/Q7201771","display_name":"Plasma diagnostics","level":3,"score":0.4561424255371094},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.43719547986984253},{"id":"https://openalex.org/C22423302","wikidata":"https://www.wikidata.org/wiki/Q898444","display_name":"Sputtering","level":3,"score":0.4283401072025299},{"id":"https://openalex.org/C147120987","wikidata":"https://www.wikidata.org/wiki/Q2225","display_name":"Electron","level":2,"score":0.4227296710014343},{"id":"https://openalex.org/C184779094","wikidata":"https://www.wikidata.org/wiki/Q26383","display_name":"Atomic physics","level":1,"score":0.42169812321662903},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.3570329546928406},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.2700948119163513},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.2077210545539856},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.15917080640792847},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08789774775505066},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.08622777462005615},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1063/1.1702342","doi":"https://doi.org/10.1063/1.1702342","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.1702342","pdf_url":null,"source":{"id":"https://openalex.org/S187991544","display_name":"Journal of Applied Physics","issn_l":"0021-8979","issn":["0021-8979","1089-7550","1520-8850"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-d","jufo-1","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Applied Physics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1491921450","https://openalex.org/W1499948147","https://openalex.org/W1978125160","https://openalex.org/W1987619862","https://openalex.org/W1991245429","https://openalex.org/W2012490638","https://openalex.org/W2016010067","https://openalex.org/W2039223624","https://openalex.org/W2041353210","https://openalex.org/W2043406728","https://openalex.org/W2054328907","https://openalex.org/W2065033562","https://openalex.org/W2081742188","https://openalex.org/W2093595197","https://openalex.org/W2612985469","https://openalex.org/W4236641648"],"related_works":["https://openalex.org/W2016464679","https://openalex.org/W2082932470","https://openalex.org/W2040212246","https://openalex.org/W2028114986","https://openalex.org/W2070700023","https://openalex.org/W2018130518","https://openalex.org/W3119216219","https://openalex.org/W2071646843","https://openalex.org/W1990230090","https://openalex.org/W142508653"],"abstract_inverted_index":{"Experimental":[0],"investigations":[1],"show":[2],"that":[3],"Langmuir":[4],"probe":[5,24,57,67,86,100,134],"measurements":[6],"can":[7],"give":[8],"quite":[9],"erroneous":[10],"results,":[11],"due":[12],"to":[13,81,106],"work":[14,28,61],"function":[15,62],"changes":[16],"of":[17,33,38,44,63,71,117,127,131],"the":[18,23,34,42,51,56,60,85,98,113,118],"probe,":[19],"insulating":[20],"layers":[21],"on":[22],"surface,":[25],"or":[26],"different":[27,31],"functions":[29],"at":[30],"places":[32],"probe.":[35],"The":[36],"deposition":[37],"evaporated":[39],"cathode":[40,75,139],"compounds,":[41],"adsorption":[43],"oxygen":[45],"released":[46],"from":[47,55,112],"oxide":[48,74,138],"cathodes,":[49],"and":[50,53],"sputtering":[52],"evaporation":[54],"may":[58],"change":[59],"a":[64,125],"pure":[65],"tungsten":[66],"in":[68,102,133,137],"time":[69],"scales":[70],"seconds.":[72],"In":[73],"tubes":[76,140],"especially,":[77],"it":[78],"is":[79],"necessary":[80],"measure":[82],"immediately":[83],"after":[84],"has":[87],"been":[88,147],"thoroughly":[89],"cleaned.":[90],"An":[91],"X":[92],"-":[93],"Y":[94],"plotter,":[95],"which":[96],"recorded":[97],"whole":[99],"characteristic":[101],"seconds,":[103],"was":[104],"found":[105,123,148],"be":[107,122],"most":[108],"suitable.":[109],"No":[110],"deviation":[111],"Maxwellian":[114],"velocity":[115],"distribution":[116],"plasma":[119],"electrons":[120],"could":[121],"over":[124],"range":[126],"nearly":[128],"four":[129],"orders":[130],"magnitude":[132],"current,":[135],"even":[136],"under":[141],"conditions":[142],"where":[143],"such":[144],"deviations":[145],"have":[146],"by":[149],"other":[150],"authors.":[151]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":3},{"year":2012,"cited_by_count":2}],"updated_date":"2026-09-22T06:50:58.402377","created_date":"2016-06-24T00:00:00"}