{"id":"https://openalex.org/W1998434006","doi":"https://doi.org/10.1364/oft.2004.otud5","title":"Stitching subaperture data for testing aspheric surfaces","display_name":"Stitching subaperture data for testing aspheric surfaces","publication_year":2004,"publication_date":"2004-01-01","ids":{"openalex":"https://openalex.org/W1998434006","doi":"https://doi.org/10.1364/oft.2004.otud5","mag":"1998434006"},"language":"en","primary_location":{"id":"doi:10.1364/oft.2004.otud5","doi":"https://doi.org/10.1364/oft.2004.otud5","is_oa":false,"landing_page_url":"https://doi.org/10.1364/oft.2004.otud5","pdf_url":null,"source":{"id":"https://openalex.org/S2764597819","display_name":"Frontiers in Optics","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310315679","host_organization_name":"Optica Publishing Group","host_organization_lineage":["https://openalex.org/P4310315679"],"host_organization_lineage_names":["Optica Publishing Group"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Frontiers in Optics 2004/Laser Science XXII/Diffractive Optics and Micro-Optics/Optical Fabrication and Testing","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5112460441","display_name":"Greg W. Forbes","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210162143","display_name":"QED Technologies (United States)","ror":"https://ror.org/04wz8fg60","country_code":"US","type":"company","lineage":["https://openalex.org/I4210162143"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Greg Forbes","raw_affiliation_strings":["QED Technologies Inc., 1040 University Ave, Rochester NY 14607"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"QED Technologies Inc., 1040 University Ave, Rochester NY 14607","institution_ids":["https://openalex.org/I4210162143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085282887","display_name":"Paul E. Murphy","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210162143","display_name":"QED Technologies (United States)","ror":"https://ror.org/04wz8fg60","country_code":"US","type":"company","lineage":["https://openalex.org/I4210162143"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Paul Murphy","raw_affiliation_strings":["QED Technologies Inc., 1040 University Ave, Rochester NY 14607"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"QED Technologies Inc., 1040 University Ave, Rochester NY 14607","institution_ids":["https://openalex.org/I4210162143"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5067034831","display_name":"Jon F. Fleig","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210162143","display_name":"QED Technologies (United States)","ror":"https://ror.org/04wz8fg60","country_code":"US","type":"company","lineage":["https://openalex.org/I4210162143"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jon Fleig","raw_affiliation_strings":["QED Technologies Inc., 1040 University Ave, Rochester NY 14607"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"QED Technologies Inc., 1040 University Ave, Rochester NY 14607","institution_ids":["https://openalex.org/I4210162143"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210162143"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.12129645,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":null,"issue":null,"first_page":"OTuD5","last_page":"OTuD5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9937000274658203,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9937000274658203,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11484","display_name":"Adaptive optics and wavefront sensing","score":0.0020000000949949026,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.0013000000035390258,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/sub-aperture-stitching","display_name":"sub-aperture stitching","score":0.8730000257492065},{"id":"https://openalex.org/keywords/aspheric-surfaces","display_name":"aspheric surfaces","score":0.8289999961853027},{"id":"https://openalex.org/keywords/interferometric-testing","display_name":"interferometric testing","score":0.8859999775886536}],"concepts":[{"id":"https://openalex.org/C29081049","wikidata":"https://www.wikidata.org/wiki/Q1364242","display_name":"Image stitching","level":2,"score":0.9796245098114014},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7178913354873657},{"id":"https://openalex.org/C166689943","wikidata":"https://www.wikidata.org/wiki/Q850283","display_name":"Interferometry","level":2,"score":0.6088741421699524},{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.5556570291519165},{"id":"https://openalex.org/C121684516","wikidata":"https://www.wikidata.org/wiki/Q7600677","display_name":"Computer graphics (images)","level":1,"score":0.4097248911857605},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3762078881263733},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3569044768810272},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.2816731929779053},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.06427067518234253}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1364/oft.2004.otud5","doi":"https://doi.org/10.1364/oft.2004.otud5","is_oa":false,"landing_page_url":"https://doi.org/10.1364/oft.2004.otud5","pdf_url":null,"source":{"id":"https://openalex.org/S2764597819","display_name":"Frontiers in Optics","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310315679","host_organization_name":"Optica Publishing Group","host_organization_lineage":["https://openalex.org/P4310315679"],"host_organization_lineage_names":["Optica Publishing Group"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Frontiers in Optics 2004/Laser Science XXII/Diffractive Optics and Micro-Optics/Optical Fabrication and Testing","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2972218587","https://openalex.org/W2046957407","https://openalex.org/W1982521527","https://openalex.org/W2369948495","https://openalex.org/W2330636674","https://openalex.org/W2313981179","https://openalex.org/W2265719726","https://openalex.org/W1748704566","https://openalex.org/W2759757314","https://openalex.org/W2467547451"],"abstract_inverted_index":{"Stitching":[0],"methods":[1],"can":[2],"boost":[3],"aperture":[4],"and":[5,12,31],"aspheric-departure":[6],"capabilities":[7],"as":[8,10],"well":[9],"resolution":[11],"accuracy":[13],"in":[14],"interferometric":[15],"testing.":[16],"However,":[17],"non-trivial":[18],"subaperture":[19],"configurations":[20],"are":[21],"required":[22],"for":[23],"figure":[24],"metrology":[25],"on":[26],"aspheres.":[27],"We":[28],"discuss":[29],"strategies":[30],"recent":[32],"results.":[33]},"counts_by_year":[{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-10-26T11:51:55.731654","created_date":"2016-06-24T00:00:00"}