{"id":"https://openalex.org/W1998428595","doi":"https://doi.org/10.1109/lmwc.2012.2236887","title":"Estimating the Reduction of Radiated Emissions From Microstrip Components Using Network Analyzer With a Bulk Current Injection Probe","display_name":"Estimating the Reduction of Radiated Emissions From Microstrip Components Using Network Analyzer With a Bulk Current Injection Probe","publication_year":2013,"publication_date":"2013-01-18","ids":{"openalex":"https://openalex.org/W1998428595","doi":"https://doi.org/10.1109/lmwc.2012.2236887","mag":"1998428595"},"language":"en","primary_location":{"id":"doi:10.1109/lmwc.2012.2236887","doi":"https://doi.org/10.1109/lmwc.2012.2236887","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lmwc.2012.2236887","pdf_url":null,"source":{"id":"https://openalex.org/S37189094","display_name":"IEEE Microwave and Wireless Components Letters","issn_l":"1531-1309","issn":["1531-1309","1558-1764"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","poland-20"],"host_organization":"https://openalex.org/P4310320754","host_organization_name":"IEEE Microwave Theory and Techniques Society","host_organization_lineage":["https://openalex.org/P4310320754"],"host_organization_lineage_names":["IEEE Microwave Theory and Techniques Society"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Microwave and Wireless Components Letters","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102274278","display_name":"Cheng-Yu Ho","orcid":"https://orcid.org/0009-0008-3092-1624","observed_orcids":["https://orcid.org/0009-0008-3092-1624"]},"institutions":[{"id":"https://openalex.org/I142974352","display_name":"National Sun Yat-sen University","ror":"https://ror.org/00mjawt10","country_code":"TW","type":"education","lineage":["https://openalex.org/I142974352"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Cheng-Yu Ho","raw_affiliation_strings":["Department of Electrical Engineering, National Sun Yat-Sen University, Kaohsiung, Taiwan","Dept. of Electr. Eng., Nat. Sun Yat-sen Univ., Kaohsiung, , Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Sun Yat-Sen University, Kaohsiung, Taiwan","institution_ids":["https://openalex.org/I142974352"]},{"raw_affiliation_string":"Dept. of Electr. Eng., Nat. Sun Yat-sen Univ., Kaohsiung, , Taiwan","institution_ids":["https://openalex.org/I142974352"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046047157","display_name":"Kai-Syaun Chen","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I142974352","display_name":"National Sun Yat-sen University","ror":"https://ror.org/00mjawt10","country_code":"TW","type":"education","lineage":["https://openalex.org/I142974352"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Kai-Syaun Chen","raw_affiliation_strings":["Department of Electrical Engineering, National Sun Yat-Sen University, Kaohsiung, Taiwan","Dept. of Electr. Eng., Nat. Sun Yat-sen Univ., Kaohsiung, , Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Sun Yat-Sen University, Kaohsiung, Taiwan","institution_ids":["https://openalex.org/I142974352"]},{"raw_affiliation_string":"Dept. of Electr. Eng., Nat. Sun Yat-sen Univ., Kaohsiung, , Taiwan","institution_ids":["https://openalex.org/I142974352"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5055676018","display_name":"Tzyy\u2010Sheng Horng","orcid":"https://orcid.org/0000-0002-9821-8619","observed_orcids":["https://orcid.org/0000-0002-9821-8619"]},"institutions":[{"id":"https://openalex.org/I142974352","display_name":"National Sun Yat-sen University","ror":"https://ror.org/00mjawt10","country_code":"TW","type":"education","lineage":["https://openalex.org/I142974352"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Tzyy-Sheng Horng","raw_affiliation_strings":["Department of Electrical Engineering, National Sun Yat-Sen University, Kaohsiung, Taiwan","Dept. of Electr. Eng., Nat. Sun Yat-sen Univ., Kaohsiung, , Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Sun Yat-Sen University, Kaohsiung, Taiwan","institution_ids":["https://openalex.org/I142974352"]},{"raw_affiliation_string":"Dept. of Electr. Eng., Nat. Sun Yat-sen Univ., Kaohsiung, , Taiwan","institution_ids":["https://openalex.org/I142974352"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I142974352"],"apc_list":null,"apc_paid":null,"fwci":1.1787,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.80164048,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":97},"biblio":{"volume":"23","issue":"2","first_page":"108","last_page":"110"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.611299991607666,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.611299991607666,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.3637999892234802,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.022199999541044235,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/radiated-emissions","display_name":"radiated emissions","score":0.7789999842643738},{"id":"https://openalex.org/keywords/network-analyzer","display_name":"network analyzer","score":0.7089999914169312},{"id":"https://openalex.org/keywords/rf-microwave-circuits","display_name":"RF/microwave circuits","score":0.906000018119812},{"id":"https://openalex.org/keywords/electromagnetic-compatibility","display_name":"electromagnetic compatibility","score":0.6169999837875366}],"concepts":[{"id":"https://openalex.org/C123657345","wikidata":"https://www.wikidata.org/wiki/Q639055","display_name":"Microstrip","level":2,"score":0.7601709365844727},{"id":"https://openalex.org/C99101257","wikidata":"https://www.wikidata.org/wiki/Q1529374","display_name":"Network analyzer (electrical)","level":2,"score":0.753067135810852},{"id":"https://openalex.org/C149712133","wikidata":"https://www.wikidata.org/wiki/Q332774","display_name":"Anechoic chamber","level":2,"score":0.7237945199012756},{"id":"https://openalex.org/C44838205","wikidata":"https://www.wikidata.org/wiki/Q127995","display_name":"Microwave","level":2,"score":0.5946623086929321},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.5577685832977295},{"id":"https://openalex.org/C158007255","wikidata":"https://www.wikidata.org/wiki/Q1055222","display_name":"Spectrum analyzer","level":2,"score":0.5532811284065247},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5219206809997559},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.46280211210250854},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.45720013976097107},{"id":"https://openalex.org/C125470083","wikidata":"https://www.wikidata.org/wiki/Q747288","display_name":"Electromagnetic compatibility","level":2,"score":0.42924246191978455},{"id":"https://openalex.org/C147788027","wikidata":"https://www.wikidata.org/wiki/Q2718101","display_name":"Band-pass filter","level":2,"score":0.41656601428985596},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.35338202118873596},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3123040497303009},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2438027560710907},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.17639127373695374},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/lmwc.2012.2236887","doi":"https://doi.org/10.1109/lmwc.2012.2236887","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lmwc.2012.2236887","pdf_url":null,"source":{"id":"https://openalex.org/S37189094","display_name":"IEEE Microwave and Wireless Components Letters","issn_l":"1531-1309","issn":["1531-1309","1558-1764"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","poland-20"],"host_organization":"https://openalex.org/P4310320754","host_organization_name":"IEEE Microwave Theory and Techniques Society","host_organization_lineage":["https://openalex.org/P4310320754"],"host_organization_lineage_names":["IEEE Microwave Theory and Techniques Society"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Microwave and Wireless Components Letters","raw_type":"journal-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.714.6000","doi":null,"is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.714.6000","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.ee.nsysu.edu.tw/uploadPDF/PDF/P41640061911379.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W2064553307","https://openalex.org/W2064748199","https://openalex.org/W2099399130","https://openalex.org/W2103188185","https://openalex.org/W2118992064","https://openalex.org/W2124941505","https://openalex.org/W2125080123","https://openalex.org/W2132103439","https://openalex.org/W2137597786","https://openalex.org/W2152031368","https://openalex.org/W2152991466","https://openalex.org/W2153075823","https://openalex.org/W2165723643","https://openalex.org/W2168833644","https://openalex.org/W4299689903"],"related_works":["https://openalex.org/W1971714026","https://openalex.org/W2184728801","https://openalex.org/W2162246164","https://openalex.org/W1982796687","https://openalex.org/W2067473159","https://openalex.org/W1837280644","https://openalex.org/W4403276925","https://openalex.org/W1980331450","https://openalex.org/W4253060435","https://openalex.org/W2054999924"],"abstract_inverted_index":{"This":[0],"work":[1],"presents":[2],"a":[3,8,12,51],"novel":[4],"measurement":[5,35,83],"method":[6,57],"using":[7],"network":[9],"analyzer":[10],"with":[11],"bulk":[13],"current":[14],"injection":[15],"(BCI)":[16],"probe":[17],"to":[18,48],"measure":[19],"the":[20,33,60,66,79,82],"common-mode":[21],"conversion":[22],"coefficient":[23],"of":[24,69,81],"microstrip":[25,41,70],"components":[26,42],"in":[27,50],"an":[28],"RF/microwave":[29],"circuit.":[30],"Based":[31],"on":[32],"proposed":[34,56],"method,":[36],"far-field":[37],"radiated":[38,61],"emissions":[39],"from":[40],"are":[43],"obtained,":[44],"which":[45],"closely":[46],"corresponds":[47],"measurements":[49],"fully":[52],"anechoic":[53],"chamber.":[54],"The":[55],"also":[58],"estimates":[59],"emission":[62],"reduction":[63],"by":[64],"miniaturizing":[65],"physical":[67],"size":[68],"bandpass":[71],"filters":[72],"(BPFs).":[73],"Full-wave":[74],"electromagnetic":[75],"simulation":[76],"further":[77],"demonstrates":[78],"effectiveness":[80],"method.":[84]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2015,"cited_by_count":4},{"year":2013,"cited_by_count":2}],"updated_date":"2026-10-16T09:59:22.235173","created_date":"2016-06-24T00:00:00"}