{"id":"https://openalex.org/W1998374178","doi":"https://doi.org/10.1109/mdt.2012.2205609","title":"Testing of Stuck-Open Faults in Nanometer Technologies","display_name":"Testing of Stuck-Open Faults in Nanometer Technologies","publication_year":2012,"publication_date":"2012-06-21","ids":{"openalex":"https://openalex.org/W1998374178","doi":"https://doi.org/10.1109/mdt.2012.2205609","mag":"1998374178"},"language":"en","primary_location":{"id":"doi:10.1109/mdt.2012.2205609","doi":"https://doi.org/10.1109/mdt.2012.2205609","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdt.2012.2205609","pdf_url":null,"source":{"id":"https://openalex.org/S73404582","display_name":"IEEE Design & Test of Computers","issn_l":"0740-7475","issn":["0740-7475","1558-1918"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test of Computers","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5038219219","display_name":"Victor H. Champac","orcid":"https://orcid.org/0000-0002-4440-3800","observed_orcids":["https://orcid.org/0000-0002-4440-3800"]},"institutions":[{"id":"https://openalex.org/I39824353","display_name":"National Institute of Astrophysics, Optics and Electronics","ror":"https://ror.org/00bpmmc63","country_code":"MX","type":"facility","lineage":["https://openalex.org/I39824353"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Victor Champac","raw_affiliation_strings":["Department of Electronic Engineering, Instituto Nacional de Astrof\u00edsica, \u00d3ptica y Electr\u00f3nica (INAOE), Tonantzintla, Puebla, Mexico","Dept. of Electron. Eng., Inst. Nac. de Astrofis., Opt. y Electron. (INAOE), Puebla, Mexico"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Instituto Nacional de Astrof\u00edsica, \u00d3ptica y Electr\u00f3nica (INAOE), Tonantzintla, Puebla, Mexico","institution_ids":["https://openalex.org/I39824353"]},{"raw_affiliation_string":"Dept. of Electron. Eng., Inst. Nac. de Astrofis., Opt. y Electron. (INAOE), Puebla, Mexico","institution_ids":["https://openalex.org/I39824353"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Julio Vazquez Hernandez","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I39824353","display_name":"National Institute of Astrophysics, Optics and Electronics","ror":"https://ror.org/00bpmmc63","country_code":"MX","type":"facility","lineage":["https://openalex.org/I39824353"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Julio Vazquez Hernandez","raw_affiliation_strings":["Instituto Nacional de Astrof\u00edsica, \u00d3ptica y Electr\u00f3nica (INAOE), Mexico"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Instituto Nacional de Astrof\u00edsica, \u00d3ptica y Electr\u00f3nica (INAOE), Mexico","institution_ids":["https://openalex.org/I39824353"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012493714","display_name":"Salvador Barcel\u00f3","orcid":"https://orcid.org/0000-0003-4425-0186","observed_orcids":["https://orcid.org/0000-0003-4425-0186"]},"institutions":[{"id":"https://openalex.org/I4061448","display_name":"Universidad de Sonora","ror":"https://ror.org/00c32gy34","country_code":"MX","type":"education","lineage":["https://openalex.org/I4061448"]},{"id":"https://openalex.org/I50441567","display_name":"Universitat de les Illes Balears","ror":"https://ror.org/03e10x626","country_code":"ES","type":"education","lineage":["https://openalex.org/I50441567"]}],"countries":["ES","MX"],"is_corresponding":false,"raw_author_name":"Salvador Barcelo","raw_affiliation_strings":["University of Sonora, Mexico","Univ. of Balearic Islands, Palma de Mallorca, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Sonora, Mexico","institution_ids":["https://openalex.org/I4061448"]},{"raw_affiliation_string":"Univ. of Balearic Islands, Palma de Mallorca, Spain","institution_ids":["https://openalex.org/I50441567"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Roberto Gomez","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4061448","display_name":"Universidad de Sonora","ror":"https://ror.org/00c32gy34","country_code":"MX","type":"education","lineage":["https://openalex.org/I4061448"]},{"id":"https://openalex.org/I50441567","display_name":"Universitat de les Illes Balears","ror":"https://ror.org/03e10x626","country_code":"ES","type":"education","lineage":["https://openalex.org/I50441567"]}],"countries":["ES","MX"],"is_corresponding":false,"raw_author_name":"Roberto Gomez","raw_affiliation_strings":["University of Balearic Islands, Spain","Center for Res. on Phys., Univ. of Sonora, Sonora, Mexico"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Balearic Islands, Spain","institution_ids":["https://openalex.org/I50441567"]},{"raw_affiliation_string":"Center for Res. on Phys., Univ. of Sonora, Sonora, Mexico","institution_ids":["https://openalex.org/I4061448"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112856494","display_name":"Chuck Hawkins","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I169521973","display_name":"University of New Mexico","ror":"https://ror.org/05fs6jp91","country_code":"US","type":"education","lineage":["https://openalex.org/I169521973"]},{"id":"https://openalex.org/I50441567","display_name":"Universitat de les Illes Balears","ror":"https://ror.org/03e10x626","country_code":"ES","type":"education","lineage":["https://openalex.org/I50441567"]}],"countries":["ES","US"],"is_corresponding":false,"raw_author_name":"Chuck Hawkins","raw_affiliation_strings":["University of Balearic Islands, Spain","ECE Dept, University of New Mexico, Albuquerque NM, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Balearic Islands, Spain","institution_ids":["https://openalex.org/I50441567"]},{"raw_affiliation_string":"ECE Dept, University of New Mexico, Albuquerque NM, USA","institution_ids":["https://openalex.org/I169521973"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077705720","display_name":"J. Segura","orcid":"https://orcid.org/0000-0001-9742-2936","observed_orcids":["https://orcid.org/0000-0001-9742-2936"]},"institutions":[{"id":"https://openalex.org/I169521973","display_name":"University of New Mexico","ror":"https://ror.org/05fs6jp91","country_code":"US","type":"education","lineage":["https://openalex.org/I169521973"]},{"id":"https://openalex.org/I50441567","display_name":"Universitat de les Illes Balears","ror":"https://ror.org/03e10x626","country_code":"ES","type":"education","lineage":["https://openalex.org/I50441567"]}],"countries":["ES","US"],"is_corresponding":false,"raw_author_name":"Jaume Segura","raw_affiliation_strings":["University of New Mexico, USA","Univ. of Balearic Islands, Palma de Mallorca, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of New Mexico, USA","institution_ids":["https://openalex.org/I169521973"]},{"raw_affiliation_string":"Univ. of Balearic Islands, Palma de Mallorca, Spain","institution_ids":["https://openalex.org/I50441567"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.1497,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":{"value":0.91049711,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":88,"max":99},"biblio":{"volume":"29","issue":"4","first_page":"80","last_page":"91"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.00039999998989515007,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.00039999998989515007,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/stuck-open-faults","display_name":"stuck-open faults","score":0.9869999885559082},{"id":"https://openalex.org/keywords/fault-testing","display_name":"fault testing","score":0.8539999723434448},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"nanotechnology","score":0.8349999785423279},{"id":"https://openalex.org/keywords/testability","display_name":"testability","score":0.39399999380111694}],"concepts":[{"id":"https://openalex.org/C77066764","wikidata":"https://www.wikidata.org/wiki/Q178674","display_name":"Nanometre","level":2,"score":0.6489970684051514},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5122482180595398},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.37454158067703247},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.36582809686660767},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.29867932200431824},{"id":"https://openalex.org/C42360764","wikidata":"https://www.wikidata.org/wiki/Q83588","display_name":"Chemical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mdt.2012.2205609","doi":"https://doi.org/10.1109/mdt.2012.2205609","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdt.2012.2205609","pdf_url":null,"source":{"id":"https://openalex.org/S73404582","display_name":"IEEE Design & Test of Computers","issn_l":"0740-7475","issn":["0740-7475","1558-1918"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test of Computers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321739","display_name":"Consejo Nacional de Ciencia y Tecnolog\u00eda","ror":"https://ror.org/059ex5q34"},{"id":"https://openalex.org/F4320323737","display_name":"Ministerio de Ciencia y Tecnolog\u00eda","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1637395447","https://openalex.org/W1897845056","https://openalex.org/W1958909498","https://openalex.org/W1982495910","https://openalex.org/W2046817879","https://openalex.org/W2069410692","https://openalex.org/W2097497265","https://openalex.org/W2105018445","https://openalex.org/W2127984980","https://openalex.org/W2131862714","https://openalex.org/W2135107374","https://openalex.org/W2138536155","https://openalex.org/W2139164696","https://openalex.org/W2141096523","https://openalex.org/W2143643276","https://openalex.org/W2145903110","https://openalex.org/W2146562059","https://openalex.org/W2153197104","https://openalex.org/W2157058323","https://openalex.org/W2159301721","https://openalex.org/W2160580687","https://openalex.org/W2167236639","https://openalex.org/W2171407599","https://openalex.org/W4234217119"],"related_works":["https://openalex.org/W1598175676","https://openalex.org/W3014799266","https://openalex.org/W3142035778","https://openalex.org/W97180957","https://openalex.org/W2105018445","https://openalex.org/W7027476397","https://openalex.org/W2777360490","https://openalex.org/W2148385379","https://openalex.org/W2103729129","https://openalex.org/W283469121"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2015,"cited_by_count":7},{"year":2014,"cited_by_count":1}],"updated_date":"2026-11-08T12:12:28.789561","created_date":"2016-06-24T00:00:00"}