{"id":"https://openalex.org/W1997895412","doi":"https://doi.org/10.1117/12.2032207","title":"Development of III-N UVAPDs for ultraviolet sensor applications","display_name":"Development of III-N UVAPDs for ultraviolet sensor applications","publication_year":2013,"publication_date":"2013-09-19","ids":{"openalex":"https://openalex.org/W1997895412","doi":"https://doi.org/10.1117/12.2032207","mag":"1997895412"},"language":"en","primary_location":{"id":"doi:10.1117/12.2032207","doi":"https://doi.org/10.1117/12.2032207","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.2032207","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103512983","display_name":"Ashok K. Sood","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210092759","display_name":"Magnolia Optical Technologies (United States)","ror":"https://ror.org/00nag1e52","country_code":"US","type":"company","lineage":["https://openalex.org/I4210092759"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ashok K. Sood","raw_affiliation_strings":["Magnolia Optical Technologies, Inc. (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Magnolia Optical Technologies, Inc. (United States)","institution_ids":["https://openalex.org/I4210092759"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068812333","display_name":"Robert A. Richwine","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210092759","display_name":"Magnolia Optical Technologies (United States)","ror":"https://ror.org/00nag1e52","country_code":"US","type":"company","lineage":["https://openalex.org/I4210092759"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Robert A. Richwine","raw_affiliation_strings":["Magnolia Optical Technologies, Inc. (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Magnolia Optical Technologies, Inc. (United States)","institution_ids":["https://openalex.org/I4210092759"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022793916","display_name":"Roger E. Welser","orcid":"https://orcid.org/0000-0002-1217-7263","observed_orcids":["https://orcid.org/0000-0002-1217-7263"]},"institutions":[{"id":"https://openalex.org/I4210092759","display_name":"Magnolia Optical Technologies (United States)","ror":"https://ror.org/00nag1e52","country_code":"US","type":"company","lineage":["https://openalex.org/I4210092759"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Roger E. Welser","raw_affiliation_strings":["Magnolia Optical Technologies, Inc. (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Magnolia Optical Technologies, Inc. (United States)","institution_ids":["https://openalex.org/I4210092759"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032050620","display_name":"Yash R. Puri","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210092759","display_name":"Magnolia Optical Technologies (United States)","ror":"https://ror.org/00nag1e52","country_code":"US","type":"company","lineage":["https://openalex.org/I4210092759"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yash R. Puri","raw_affiliation_strings":["Magnolia Optical Technologies, Inc. (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Magnolia Optical Technologies, Inc. (United States)","institution_ids":["https://openalex.org/I4210092759"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037158638","display_name":"Russell D. Dupuis","orcid":"https://orcid.org/0000-0003-4691-1208","observed_orcids":["https://orcid.org/0000-0003-4691-1208"]},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Russell D. Dupuis","raw_affiliation_strings":["Georgia Institute of Technology (United States)","Georgia Institute of Technology, United States#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology (United States)","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"Georgia Institute of Technology, United States#TAB#","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016028348","display_name":"Mi\u2010Hee Ji","orcid":"https://orcid.org/0000-0002-8160-6463","observed_orcids":["https://orcid.org/0000-0002-8160-6463"]},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mi-Hee Ji","raw_affiliation_strings":["Georgia Institute of Technology (United States)","Georgia Institute of Technology, United States#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology (United States)","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"Georgia Institute of Technology, United States#TAB#","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032555206","display_name":"Jeomoh Kim","orcid":"https://orcid.org/0000-0003-4988-4946","observed_orcids":["https://orcid.org/0000-0003-4988-4946"]},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jeomoh Kim","raw_affiliation_strings":["Georgia Institute of Technology (United States)","Georgia Institute of Technology, United States#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology (United States)","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"Georgia Institute of Technology, United States#TAB#","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006761418","display_name":"Theeradetch Detchprohm","orcid":"https://orcid.org/0000-0001-5844-0015","observed_orcids":["https://orcid.org/0000-0001-5844-0015"]},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Theeradetch Detchprohm","raw_affiliation_strings":["Georgia Institute of Technology (United States)","Georgia Institute of Technology, United States#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology (United States)","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"Georgia Institute of Technology, United States#TAB#","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064151822","display_name":"Nibir K. Dhar","orcid":"https://orcid.org/0000-0002-6663-2209","observed_orcids":["https://orcid.org/0000-0002-6663-2209"]},"institutions":[{"id":"https://openalex.org/I1280581677","display_name":"Defense Advanced Research Projects Agency","ror":"https://ror.org/02caytj08","country_code":"US","type":"government","lineage":["https://openalex.org/I1280581677","https://openalex.org/I1296703163","https://openalex.org/I1330347796"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nibir K. Dhar","raw_affiliation_strings":["Defense Advanced Research Projects Agency (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Defense Advanced Research Projects Agency (United States)","institution_ids":["https://openalex.org/I1280581677"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5009559422","display_name":"Roy L. Peters","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1335927249","display_name":"United States Department of the Interior","ror":"https://ror.org/03v0pmy70","country_code":"US","type":"government","lineage":["https://openalex.org/I1335927249"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Roy L. Peters","raw_affiliation_strings":["U.S. Dept. of the Interior (United States)","U.S. Department of the Interior (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"U.S. Dept. of the Interior (United States)","institution_ids":["https://openalex.org/I1335927249"]},{"raw_affiliation_string":"U.S. Department of the Interior (United States)","institution_ids":["https://openalex.org/I1335927249"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.6291,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.80538507,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":93,"max":95},"biblio":{"volume":"8868","issue":null,"first_page":"88680T","last_page":"88680T"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.6743000149726868,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.6743000149726868,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":0.1696999967098236,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13418","display_name":"Photocathodes and Microchannel Plates","score":0.044599998742341995,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/iii-nitride-semiconductors","display_name":"III-nitride semiconductors","score":0.7940000295639038},{"id":"https://openalex.org/keywords/dark-current-noise","display_name":"dark noise","score":0.8600000143051147},{"id":"https://openalex.org/keywords/1-f-noise","display_name":"1/f noise","score":0.9990000128746033},{"id":"https://openalex.org/keywords/wide-bandgap-semiconductors","display_name":"wide bandgap semiconductors","score":0.8659999966621399},{"id":"https://openalex.org/keywords/small-pixel-size","display_name":"small pixel size","score":0.4429999887943268},{"id":"https://openalex.org/keywords/uv-imaging","display_name":"ultraviolet imaging","score":0.5419999957084656}],"concepts":[{"id":"https://openalex.org/C193265955","wikidata":"https://www.wikidata.org/wiki/Q73116","display_name":"APDS","level":4,"score":0.9330848455429077},{"id":"https://openalex.org/C109679912","wikidata":"https://www.wikidata.org/wiki/Q175932","display_name":"Avalanche photodiode","level":3,"score":0.8468097448348999},{"id":"https://openalex.org/C180651308","wikidata":"https://www.wikidata.org/wiki/Q1265973","display_name":"Dark current","level":3,"score":0.6755698323249817},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.5662527680397034},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.535577654838562},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.5183799862861633},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5038880705833435},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.484394371509552},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3190588355064392},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1117/12.2032207","doi":"https://doi.org/10.1117/12.2032207","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.2032207","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2025417195","https://openalex.org/W2077926115","https://openalex.org/W1989492101","https://openalex.org/W2050912520","https://openalex.org/W1728114236","https://openalex.org/W2030502452","https://openalex.org/W2973113467","https://openalex.org/W3080440953","https://openalex.org/W2946431445","https://openalex.org/W1700687670"],"abstract_inverted_index":{"High-resolution":[0],"imaging":[1],"in":[2,9,71,109,162,175,188],"ultraviolet":[3],"(UV)":[4],"bands":[5],"has":[6],"many":[7],"applications":[8],"defense":[10],"and":[11,28,80,113,123,144,152,177,186],"commercial":[12],"systems.":[13],"The":[14,46,165],"shortest":[15],"wavelength":[16],"is":[17,49],"desired":[18,85],"for":[19,25,83,136,159,181],"increased":[20],"spatial":[21],"resolution,":[22],"which":[23],"allows":[24],"small":[26,182],"pixels":[27],"large":[29],"formats.":[30],"In":[31],"past":[32],"work,":[33],"UV":[34,73,86,111],"avalanche":[35],"photodiodes":[36],"(APDs)":[37],"have":[38],"been":[39],"reported":[40],"as":[41],"discrete":[42],"devices":[43],"demonstrating":[44],"gain.":[45],"next":[47],"frontier":[48],"to":[50,57],"develop":[51],"UVAPD":[52],"arrays":[53,119],"with":[54,77,102,120,124],"high":[55,103],"gain":[56,79,122,187],"demonstrate":[58],"highresolution":[59],"imaging.":[60],"We":[61,127,147],"will":[62,128,148,167],"discuss":[63,149,169],"a":[64,84],"model":[65],"that":[66,155],"can":[67,93],"predict":[68],"sensor":[69],"performance":[70],"the":[72,110,114,133,170,173,178,189],"band":[74,87,112],"using":[75,117],"APDs":[76,135,161],"various":[78,100,150],"other":[81],"parameters":[82],"of":[88,172],"interest.":[89],"Signal-to-noise":[90],"ratios":[91],"(SNRs)":[92],"be":[94],"modeled":[95],"from":[96],"illuminated":[97],"targets":[98],"at":[99],"distances":[101],"resolution":[104],"under":[105],"standard":[106],"atmospheric":[107],"conditions":[108],"solar-blind":[115],"region":[116],"detector":[118,139],"unity":[121],"high-gain":[125],"APDs.":[126,190],"present":[129],"recent":[130],"data":[131],"on":[132],"GaN-based":[134],"their":[137],"gain,":[138],"response,":[140],"dark":[141],"current":[142],"noise,":[143],"1/f":[145],"noise.":[146],"approaches":[151],"device":[153],"designs":[154],"are":[156],"being":[157],"evaluated":[158],"developing":[160],"wide-bandgap":[163],"semiconductors.":[164],"paper":[166],"also":[168],"state":[171],"art":[174],"UVAPDs":[176],"future":[179],"directions":[180],"unit":[183],"cell":[184],"size":[185]},"counts_by_year":[{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":2}],"updated_date":"2026-10-01T08:54:57.152042","created_date":"2016-06-24T00:00:00"}