{"id":"https://openalex.org/W1997861920","doi":"https://doi.org/10.1109/icsens.2011.6127396","title":"Optically interrogated, microfabricated wall shear stress sensor","display_name":"Optically interrogated, microfabricated wall shear stress sensor","publication_year":2011,"publication_date":"2011-10-01","ids":{"openalex":"https://openalex.org/W1997861920","doi":"https://doi.org/10.1109/icsens.2011.6127396","mag":"1997861920"},"language":"en","primary_location":{"id":"doi:10.1109/icsens.2011.6127396","doi":"https://doi.org/10.1109/icsens.2011.6127396","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icsens.2011.6127396","pdf_url":null,"source":{"id":"https://openalex.org/S4210192710","display_name":"Proceedings of IEEE Sensors/Proceedings of IEEE Sensors ...","issn_l":"1930-0395","issn":["1930-0395","2168-9229","2168-9237"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE SENSORS Proceedings","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5018525182","display_name":"Daniel J. Sullivan","orcid":"https://orcid.org/0000-0001-6703-3905","observed_orcids":["https://orcid.org/0000-0001-6703-3905"]},"institutions":[{"id":"https://openalex.org/I4210099556","display_name":"Research Support Instruments (United States)","ror":"https://ror.org/00zmtvv40","country_code":"US","type":"company","lineage":["https://openalex.org/I4210099556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Daniel J. Sullivan","raw_affiliation_strings":["Research Support Instruments, Inc, Hopewell, NJ 08525, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research Support Instruments, Inc, Hopewell, NJ 08525, USA","institution_ids":["https://openalex.org/I4210099556"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112208996","display_name":"Jemma F. Kline","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210099556","display_name":"Research Support Instruments (United States)","ror":"https://ror.org/00zmtvv40","country_code":"US","type":"company","lineage":["https://openalex.org/I4210099556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jemma F. Kline","raw_affiliation_strings":["Research Support Instruments, Inc, Hopewell, NJ 08525, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research Support Instruments, Inc, Hopewell, NJ 08525, USA","institution_ids":["https://openalex.org/I4210099556"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024454575","display_name":"Maria Salamon","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210099556","display_name":"Research Support Instruments (United States)","ror":"https://ror.org/00zmtvv40","country_code":"US","type":"company","lineage":["https://openalex.org/I4210099556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Maria Salamon","raw_affiliation_strings":["Research Support Instruments, Inc, Hopewell, NJ 08525, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research Support Instruments, Inc, Hopewell, NJ 08525, USA","institution_ids":["https://openalex.org/I4210099556"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100824440","display_name":"Sohail Zaidi","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I20089843","display_name":"Princeton University","ror":"https://ror.org/00hx57361","country_code":"US","type":"education","lineage":["https://openalex.org/I20089843"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sohail Zaidi","raw_affiliation_strings":["Applied Physics Group, Princeton University, NJ 08540, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Applied Physics Group, Princeton University, NJ 08540, USA","institution_ids":["https://openalex.org/I20089843"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103080298","display_name":"Richard B. Miles","orcid":"https://orcid.org/0000-0002-6774-224X","observed_orcids":["https://orcid.org/0000-0002-6774-224X","https://orcid.org/0000-0002-0409-7706"]},"institutions":[{"id":"https://openalex.org/I20089843","display_name":"Princeton University","ror":"https://ror.org/00hx57361","country_code":"US","type":"education","lineage":["https://openalex.org/I20089843"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Richard Miles","raw_affiliation_strings":["Applied Physics Group, Princeton University, NJ 08540, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Applied Physics Group, Princeton University, NJ 08540, USA","institution_ids":["https://openalex.org/I20089843"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.08158642,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"97","last_page":"100"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10205","display_name":"Advanced Fiber Optic Sensors","score":0.43309998512268066,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10205","display_name":"Advanced Fiber Optic Sensors","score":0.43309998512268066,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10360","display_name":"Fluid Dynamics and Turbulent Flows","score":0.16519999504089355,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13928","display_name":"Advanced Sensor Technologies Research","score":0.060100000351667404,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/wall-shear-stress-sensor","display_name":"wall shear stress sensor","score":0.9309999942779541},{"id":"https://openalex.org/keywords/microfabricated-sensors","display_name":"microfabricated sensors","score":0.824999988079071},{"id":"https://openalex.org/keywords/optical-interrogation","display_name":"optical interrogation","score":0.7549999952316284},{"id":"https://openalex.org/keywords/reflectivity-change","display_name":"reflectivity change","score":0.7739999890327454},{"id":"https://openalex.org/keywords/aerodynamic-surfaces","display_name":"aerodynamic surfaces","score":0.843999981880188},{"id":"https://openalex.org/keywords/shear-stress-distribution","display_name":"shear stress distribution","score":0.8939999938011169},{"id":"https://openalex.org/keywords/supersonic-flow","display_name":"supersonic flow","score":0.8460000157356262},{"id":"https://openalex.org/keywords/subsonic-flow","display_name":"subsonic flow","score":0.9800000190734863},{"id":"https://openalex.org/keywords/flow-measurement","display_name":"flow measurement","score":0.35600000619888306}],"concepts":[{"id":"https://openalex.org/C21141959","wikidata":"https://www.wikidata.org/wiki/Q657936","display_name":"Shear stress","level":2,"score":0.7334333658218384},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7037365436553955},{"id":"https://openalex.org/C205991772","wikidata":"https://www.wikidata.org/wiki/Q221337","display_name":"Supersonic speed","level":2,"score":0.6574735641479492},{"id":"https://openalex.org/C13393347","wikidata":"https://www.wikidata.org/wiki/Q8424","display_name":"Aerodynamics","level":2,"score":0.617990255355835},{"id":"https://openalex.org/C96035792","wikidata":"https://www.wikidata.org/wiki/Q43606218","display_name":"Shear (geology)","level":2,"score":0.5417109727859497},{"id":"https://openalex.org/C21036866","wikidata":"https://www.wikidata.org/wiki/Q181767","display_name":"Stress (linguistics)","level":2,"score":0.5239508152008057},{"id":"https://openalex.org/C135768490","wikidata":"https://www.wikidata.org/wiki/Q2250602","display_name":"Shear flow","level":2,"score":0.44294828176498413},{"id":"https://openalex.org/C57879066","wikidata":"https://www.wikidata.org/wiki/Q41217","display_name":"Mechanics","level":1,"score":0.3898046612739563},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.3664073050022125},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3416934013366699},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.32625699043273926},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.2875458300113678},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14456358551979065},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10290840268135071},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icsens.2011.6127396","doi":"https://doi.org/10.1109/icsens.2011.6127396","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icsens.2011.6127396","pdf_url":null,"source":{"id":"https://openalex.org/S4210192710","display_name":"Proceedings of IEEE Sensors/Proceedings of IEEE Sensors ...","issn_l":"1930-0395","issn":["1930-0395","2168-9229","2168-9237"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE SENSORS Proceedings","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W2036102423","https://openalex.org/W2059173499","https://openalex.org/W2157652864"],"related_works":["https://openalex.org/W2335094913","https://openalex.org/W2324159642","https://openalex.org/W2319031952","https://openalex.org/W3216560168","https://openalex.org/W2208132362","https://openalex.org/W2149479967","https://openalex.org/W2955249320","https://openalex.org/W1980771703","https://openalex.org/W4394747396","https://openalex.org/W2320581070"],"abstract_inverted_index":{"A":[0],"microfabricated":[1],"optically-interrogated":[2],"wall":[3],"shear":[4,18,28,50],"stress":[5,19,29,51],"sensor":[6,42,57],"has":[7,58],"been":[8,59],"developed":[9],"which":[10,43],"will":[11],"allow":[12],"for":[13],"accurate":[14],"measurement":[15,47],"of":[16,27,37,40,48,55],"the":[17,35,38,41,56],"distribution":[20],"present":[21],"on":[22],"aerodynamic":[23],"surfaces.":[24],"The":[25,53,69],"application":[26],"results":[30],"in":[31,34,62],"a":[32,45],"change":[33],"reflectivity":[36],"surface":[39],"provides":[44],"direct":[46],"local":[49],"distribution.":[52],"operation":[54],"experimentally":[60],"verified":[61],"both":[63],"subsonic":[64],"and":[65,79],"supersonic":[66],"flow":[67],"regimes.":[68],"experimental":[70,80],"set-up":[71],"used":[72],"to":[73],"validate":[74],"its":[75],"performance":[76],"is":[77,82],"described,":[78],"data":[81],"presented.":[83]},"counts_by_year":[],"updated_date":"2026-11-04T10:54:05.112534","created_date":"2016-06-24T00:00:00"}