{"id":"https://openalex.org/W1997308560","doi":"https://doi.org/10.1063/1.1576308","title":"Domain structure study of SrBi2Ta2O9 ferroelectric thin films by scanning capacitance microscopy","display_name":"Domain structure study of SrBi2Ta2O9 ferroelectric thin films by scanning capacitance microscopy","publication_year":2003,"publication_date":"2003-05-15","ids":{"openalex":"https://openalex.org/W1997308560","doi":"https://doi.org/10.1063/1.1576308","mag":"1997308560"},"language":"en","primary_location":{"id":"doi:10.1063/1.1576308","doi":"https://doi.org/10.1063/1.1576308","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.1576308","pdf_url":null,"source":{"id":"https://openalex.org/S105243760","display_name":"Applied Physics Letters","issn_l":"0003-6951","issn":["0003-6951","1077-3118","1520-8842"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-a","jufo-3","ki-jl-1","norway-2","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Applied Physics Letters","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109978574","display_name":"Ching\u2010Chich Leu","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Ching-Chich Leu","raw_affiliation_strings":["National Nano Device Laboratories, Hsinchu\u200930043, Taiwan, Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Nano Device Laboratories, Hsinchu\u200930043, Taiwan, Republic of China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109965251","display_name":"Chih-Yuan Chen","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Chih-Yuan Chen","raw_affiliation_strings":["National Nano Device Laboratories, Hsinchu\u200930043, Taiwan, Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Nano Device Laboratories, Hsinchu\u200930043, Taiwan, Republic of China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103364267","display_name":"Chao-Hsin Chien","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Chao-Hsin Chien","raw_affiliation_strings":["National Nano Device Laboratories, Hsinchu\u200930043, Taiwan, Republic of China","Institute of Electronics"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Nano Device Laboratories, Hsinchu\u200930043, Taiwan, Republic of China","institution_ids":[]},{"raw_affiliation_string":"Institute of Electronics","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103505815","display_name":"Mao-Nan Chang","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Mao-Nan Chang","raw_affiliation_strings":["National Nano Device Laboratories, Hsinchu\u200930043, Taiwan, Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Nano Device Laboratories, Hsinchu\u200930043, Taiwan, Republic of China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044734110","display_name":"Fan\u2010Yi Hsu","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Fan-Yi Hsu","raw_affiliation_strings":["Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu\u200930043, Taiwan, Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu\u200930043, Taiwan, Republic of China","institution_ids":["https://openalex.org/I25846049"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111534552","display_name":"Chen\u2010Ti Hu","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chen-Ti Hu","raw_affiliation_strings":["Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu\u200930043, Taiwan, Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu\u200930043, Taiwan, Republic of China","institution_ids":["https://openalex.org/I25846049"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.1222,"has_fulltext":false,"cited_by_count":87,"citation_normalized_percentile":{"value":0.8604965,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"82","issue":"20","first_page":"3493","last_page":"3495"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10107","display_name":"Ferroelectric and Piezoelectric Materials","score":0.9839000105857849,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10107","display_name":"Ferroelectric and Piezoelectric Materials","score":0.9839000105857849,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.013500000350177288,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10886","display_name":"Multiferroics and related materials","score":0.000699999975040555,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/srbi2ta2o9","display_name":"SrBi2Ta2O9","score":0.9990000128746033},{"id":"https://openalex.org/keywords/ferroelectric-thin-films","display_name":"ferroelectric thin films","score":0.9480000138282776},{"id":"https://openalex.org/keywords/domain-structure","display_name":"domain structure","score":0.8240000009536743},{"id":"https://openalex.org/keywords/scanning-capacitance-microscopy","display_name":"scanning capacitance microscopy","score":0.843999981880188},{"id":"https://openalex.org/keywords/sol-gel-thin-films","display_name":"sol-gel thin films","score":0.8220000267028809},{"id":"https://openalex.org/keywords/domain-switching","display_name":"domain switching","score":0.531000018119812},{"id":"https://openalex.org/keywords/grain-size-effects","display_name":"grain size effects","score":0.765999972820282},{"id":"https://openalex.org/keywords/polarization-reversal","display_name":"polarization reversal","score":0.7129999995231628}],"concepts":[{"id":"https://openalex.org/C79090758","wikidata":"https://www.wikidata.org/wiki/Q1045739","display_name":"Ferroelectricity","level":3,"score":0.832232654094696},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.8200668096542358},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.706260085105896},{"id":"https://openalex.org/C205049153","wikidata":"https://www.wikidata.org/wiki/Q2698605","display_name":"Polarization (electrochemistry)","level":2,"score":0.6291259527206421},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.47935277223587036},{"id":"https://openalex.org/C147080431","wikidata":"https://www.wikidata.org/wiki/Q1074953","display_name":"Microscopy","level":2,"score":0.4747229814529419},{"id":"https://openalex.org/C192191005","wikidata":"https://www.wikidata.org/wiki/Q466491","display_name":"Grain size","level":2,"score":0.41030603647232056},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3667060136795044},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3221553862094879},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.2142343521118164},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.17733052372932434},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.09671485424041748},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.09214213490486145},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1063/1.1576308","doi":"https://doi.org/10.1063/1.1576308","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.1576308","pdf_url":null,"source":{"id":"https://openalex.org/S105243760","display_name":"Applied Physics Letters","issn_l":"0003-6951","issn":["0003-6951","1077-3118","1520-8842"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-a","jufo-3","ki-jl-1","norway-2","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Applied Physics Letters","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"sustainable_development_goals_aurora":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W216087655","https://openalex.org/W635537200","https://openalex.org/W1493021168","https://openalex.org/W1994732712","https://openalex.org/W1995071972","https://openalex.org/W2003111314","https://openalex.org/W2014117514","https://openalex.org/W2022792589","https://openalex.org/W2030197921","https://openalex.org/W2038085574","https://openalex.org/W2050060802","https://openalex.org/W2055094134","https://openalex.org/W2057372517","https://openalex.org/W2075385031","https://openalex.org/W2087903210","https://openalex.org/W2117415710"],"related_works":["https://openalex.org/W2100978595","https://openalex.org/W1546477499","https://openalex.org/W1994732712","https://openalex.org/W1633323082","https://openalex.org/W1982808921","https://openalex.org/W2207073425","https://openalex.org/W1978995863","https://openalex.org/W2090005144","https://openalex.org/W2024134539","https://openalex.org/W2051653747"],"abstract_inverted_index":{"Scanning":[0],"capacitance":[1],"microscopy":[2],"was":[3,22,43],"used":[4],"to":[5,29],"image":[6,20],"the":[7,25,30,35,39,49,63],"polarization-induced":[8],"microstructural":[9],"patterns":[10],"of":[11,67],"sol-gel":[12],"derivative":[13],"SrBi2Ta2O9":[14],"(SBT)":[15],"thin":[16,41],"films.":[17],"A":[18],"sharp":[19],"contrast":[21],"induced":[23],"between":[24],"nanosized":[26],"domains":[27],"owing":[28],"various":[31],"polarities,":[32],"so":[33],"that":[34,62],"domain":[36,70],"structure":[37],"in":[38,79],"SBT":[40],"film":[42],"clearly":[44],"revealed.":[45],"As":[46],"a":[47,68,75,80],"result,":[48],"switched":[50],"and":[51],"unswitched":[52],"regions":[53],"could":[54],"be":[55],"unequivocally":[56],"identified.":[57],"This":[58],"investigation":[59],"also":[60],"confirms":[61],"reversal":[64],"polarization":[65],"process":[66],"ferroelectric":[69],"is":[71],"much":[72],"easier":[73],"inside":[74],"large":[76],"grain":[77],"than":[78],"small":[81],"grain.":[82]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":5},{"year":2019,"cited_by_count":8},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":6},{"year":2015,"cited_by_count":7},{"year":2014,"cited_by_count":7},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":6}],"updated_date":"2026-10-12T09:40:04.860316","created_date":"2016-06-24T00:00:00"}