{"id":"https://openalex.org/W1997305249","doi":"https://doi.org/10.1016/0304-3991(95)00054-5","title":"Symmetry analysis of the RHEED patterns from the Si(001)\u22122 \u00d7 1 surfaces","display_name":"Symmetry analysis of the RHEED patterns from the Si(001)\u22122 \u00d7 1 surfaces","publication_year":1995,"publication_date":"1995-08-01","ids":{"openalex":"https://openalex.org/W1997305249","doi":"https://doi.org/10.1016/0304-3991(95)00054-5","mag":"1997305249"},"language":"en","primary_location":{"id":"doi:10.1016/0304-3991(95)00054-5","doi":"https://doi.org/10.1016/0304-3991(95)00054-5","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0304-3991(95)00054-5","pdf_url":null,"source":{"id":"https://openalex.org/S27731274","display_name":"Ultramicroscopy","issn_l":"0304-3991","issn":["0304-3991","1879-2723"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-a","jufo-1","ki-jl-1","medline","norway-1","poland-140","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Ultramicroscopy","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5073725331","display_name":"Yuanjing Ma","orcid":"https://orcid.org/0000-0003-3885-1604","observed_orcids":["https://orcid.org/0000-0003-3885-1604"]},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Y Ma","raw_affiliation_strings":["Materials Research Laboratory; University of Illinois at Urbana-Champaign; Urbana IL 61801 USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Materials Research Laboratory; University of Illinois at Urbana-Champaign; Urbana IL 61801 USA","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059040562","display_name":"Scott Lordi","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S Lordi","raw_affiliation_strings":["Materials Research Laboratory; University of Illinois at Urbana-Champaign; Urbana IL 61801 USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Materials Research Laboratory; University of Illinois at Urbana-Champaign; Urbana IL 61801 USA","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5112738608","display_name":"J. A. Eades","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J.A Eades","raw_affiliation_strings":["Materials Research Laboratory; University of Illinois at Urbana-Champaign; Urbana IL 61801 USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Materials Research Laboratory; University of Illinois at Urbana-Champaign; Urbana IL 61801 USA","institution_ids":["https://openalex.org/I157725225"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I157725225"],"apc_list":{"value":3760,"currency":"USD","value_usd":3760},"apc_paid":null,"fwci":0.2116,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.43450163,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":95},"biblio":{"volume":"60","issue":"1","first_page":"137","last_page":"152"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13531","display_name":"Surface and Thin Film Phenomena","score":0.9678000211715698,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13531","display_name":"Surface and Thin Film Phenomena","score":0.9678000211715698,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.026399999856948853,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.003100000089034438,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/si-100-21-surface","display_name":"Si(100)-2\u00d71 surface","score":0.8899999856948853},{"id":"https://openalex.org/keywords/surface-reconstruction","display_name":"surface reconstruction","score":0.6919999718666077},{"id":"https://openalex.org/keywords/reflection-high-energy-electron-diffraction","display_name":"reflection high-energy electron diffraction","score":0.8270000219345093},{"id":"https://openalex.org/keywords/multislice-method","display_name":"multislice method","score":0.6309999823570251},{"id":"https://openalex.org/keywords/surface-structure","display_name":"surface structure","score":0.4129999876022339},{"id":"https://openalex.org/keywords/surface-electronic-properties","display_name":"surface electronic properties","score":0.6880000233650208},{"id":"https://openalex.org/keywords/silicon-surface","display_name":"silicon surface","score":0.3490000069141388}],"concepts":[{"id":"https://openalex.org/C200096950","wikidata":"https://www.wikidata.org/wiki/Q455003","display_name":"Reflection high-energy electron diffraction","level":4,"score":0.8453356027603149},{"id":"https://openalex.org/C2779886137","wikidata":"https://www.wikidata.org/wiki/Q21030012","display_name":"Symmetry (geometry)","level":2,"score":0.5568962097167969},{"id":"https://openalex.org/C77557913","wikidata":"https://www.wikidata.org/wiki/Q864822","display_name":"Electron diffraction","level":3,"score":0.4506429135799408},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.41815388202667236},{"id":"https://openalex.org/C8010536","wikidata":"https://www.wikidata.org/wiki/Q160398","display_name":"Crystallography","level":1,"score":0.39530834555625916},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.3444285988807678},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.3359116315841675},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.32214853167533875},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.2015913426876068},{"id":"https://openalex.org/C207114421","wikidata":"https://www.wikidata.org/wiki/Q133900","display_name":"Diffraction","level":2,"score":0.14799076318740845},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.11537361145019531},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.09293884038925171}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/0304-3991(95)00054-5","doi":"https://doi.org/10.1016/0304-3991(95)00054-5","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0304-3991(95)00054-5","pdf_url":null,"source":{"id":"https://openalex.org/S27731274","display_name":"Ultramicroscopy","issn_l":"0304-3991","issn":["0304-3991","1879-2723"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-a","jufo-1","ki-jl-1","medline","norway-1","poland-140","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Ultramicroscopy","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":82,"referenced_works":["https://openalex.org/W1964854889","https://openalex.org/W1965677667","https://openalex.org/W1965998191","https://openalex.org/W1968706406","https://openalex.org/W1970711747","https://openalex.org/W1973237615","https://openalex.org/W1974664861","https://openalex.org/W1974824444","https://openalex.org/W1977816721","https://openalex.org/W1977973449","https://openalex.org/W1981003329","https://openalex.org/W1981700392","https://openalex.org/W1982927205","https://openalex.org/W1984497749","https://openalex.org/W1990060905","https://openalex.org/W1991364145","https://openalex.org/W1992114075","https://openalex.org/W1993200300","https://openalex.org/W1993415811","https://openalex.org/W1997872291","https://openalex.org/W1999134779","https://openalex.org/W1999915818","https://openalex.org/W2008597722","https://openalex.org/W2008759772","https://openalex.org/W2010375817","https://openalex.org/W2010723940","https://openalex.org/W2013680709","https://openalex.org/W2017374384","https://openalex.org/W2019806407","https://openalex.org/W2019989182","https://openalex.org/W2020361642","https://openalex.org/W2020636406","https://openalex.org/W2020983705","https://openalex.org/W2021678748","https://openalex.org/W2022511777","https://openalex.org/W2023823032","https://openalex.org/W2025171701","https://openalex.org/W2025756761","https://openalex.org/W2027433038","https://openalex.org/W2029463403","https://openalex.org/W2031040916","https://openalex.org/W2031671878","https://openalex.org/W2033802804","https://openalex.org/W2034137747","https://openalex.org/W2034177524","https://openalex.org/W2034472206","https://openalex.org/W2034917090","https://openalex.org/W2037883832","https://openalex.org/W2039519447","https://openalex.org/W2040731443","https://openalex.org/W2041597938","https://openalex.org/W2042597525","https://openalex.org/W2049983937","https://openalex.org/W2054982816","https://openalex.org/W2055155238","https://openalex.org/W2056313271","https://openalex.org/W2056908108","https://openalex.org/W2059631143","https://openalex.org/W2059960144","https://openalex.org/W2060231870","https://openalex.org/W2062256266","https://openalex.org/W2062677926","https://openalex.org/W2065339936","https://openalex.org/W2066038783","https://openalex.org/W2068248872","https://openalex.org/W2069845974","https://openalex.org/W2069946400","https://openalex.org/W2070444092","https://openalex.org/W2074045165","https://openalex.org/W2074466210","https://openalex.org/W2075050032","https://openalex.org/W2076620087","https://openalex.org/W2078831502","https://openalex.org/W2079645233","https://openalex.org/W2083065588","https://openalex.org/W2086798543","https://openalex.org/W2131226436","https://openalex.org/W2136426106","https://openalex.org/W2136819243","https://openalex.org/W2347233652","https://openalex.org/W2396733410","https://openalex.org/W4233977909"],"related_works":["https://openalex.org/W2020225969","https://openalex.org/W2064437454","https://openalex.org/W1968706406","https://openalex.org/W2025756761","https://openalex.org/W2037462933","https://openalex.org/W2274997943","https://openalex.org/W2008759772","https://openalex.org/W2092570387","https://openalex.org/W2084454731","https://openalex.org/W3035820554"],"abstract_inverted_index":null,"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2015,"cited_by_count":2}],"updated_date":"2026-09-22T06:50:58.402377","created_date":"2016-06-24T00:00:00"}