{"id":"https://openalex.org/W1997251095","doi":"https://doi.org/10.1109/cleo.2000.906725","title":"High-performance mid-IR type-II interband cascade lasers","display_name":"High-performance mid-IR type-II interband cascade lasers","publication_year":2000,"publication_date":"2000-01-01","ids":{"openalex":"https://openalex.org/W1997251095","doi":"https://doi.org/10.1109/cleo.2000.906725","mag":"1997251095"},"language":"en","primary_location":{"id":"doi:10.1109/cleo.2000.906725","doi":"https://doi.org/10.1109/cleo.2000.906725","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cleo.2000.906725","pdf_url":null,"source":{"id":"https://openalex.org/S4306418073","display_name":"Conference on Lasers and Electro-Optics","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Conference on Lasers and Electro-Optics (CLEO 2000). Technical Digest. Postconference Edition. TOPS Vol.39 (IEEE Cat. No.00CH37088)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"W.-Y. Hwang","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210157229","display_name":"Applied Optoelectronics (United States)","ror":"https://ror.org/05vxv5b07","country_code":"US","type":"company","lineage":["https://openalex.org/I4210157229"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"W.-Y. Hwang","raw_affiliation_strings":["Appl. Optoelectron. Inc., Sugar Land, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Appl. Optoelectron. Inc., Sugar Land, TX, USA","institution_ids":["https://openalex.org/I4210157229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112327307","display_name":"S. V. Zaitsev","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210157229","display_name":"Applied Optoelectronics (United States)","ror":"https://ror.org/05vxv5b07","country_code":"US","type":"company","lineage":["https://openalex.org/I4210157229"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S.V. Zaitsev","raw_affiliation_strings":["Applied Optoelectronics Inc., Sugar Land, Texas 77478, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Applied Optoelectronics Inc., Sugar Land, Texas 77478, USA","institution_ids":["https://openalex.org/I4210157229"]}]},{"author_position":"middle","author":{"id":null,"display_name":"C.H. Kuo","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210157229","display_name":"Applied Optoelectronics (United States)","ror":"https://ror.org/05vxv5b07","country_code":"US","type":"company","lineage":["https://openalex.org/I4210157229"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"C.H. Kuo","raw_affiliation_strings":["Applied Optoelectronics Inc., Sugar Land, Texas 77478, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Applied Optoelectronics Inc., Sugar Land, Texas 77478, USA","institution_ids":["https://openalex.org/I4210157229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060630255","display_name":"Chih\u2010Hsiang Lin","orcid":"https://orcid.org/0000-0003-1193-4485","observed_orcids":["https://orcid.org/0000-0003-1193-4485"]},"institutions":[{"id":"https://openalex.org/I4210157229","display_name":"Applied Optoelectronics (United States)","ror":"https://ror.org/05vxv5b07","country_code":"US","type":"company","lineage":["https://openalex.org/I4210157229"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Chih-Hsiang Lin","raw_affiliation_strings":["Applied Optoelectronics Inc., Sugar Land, Texas 77478, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Applied Optoelectronics Inc., Sugar Land, Texas 77478, USA","institution_ids":["https://openalex.org/I4210157229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056878788","display_name":"J.-W. Um","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210157229","display_name":"Applied Optoelectronics (United States)","ror":"https://ror.org/05vxv5b07","country_code":"US","type":"company","lineage":["https://openalex.org/I4210157229"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J. Um","raw_affiliation_strings":["Applied Optoelectronics Inc., Sugar Land, Texas 77478, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Applied Optoelectronics Inc., Sugar Land, Texas 77478, USA","institution_ids":["https://openalex.org/I4210157229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111705078","display_name":"Albert Delaney","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210157229","display_name":"Applied Optoelectronics (United States)","ror":"https://ror.org/05vxv5b07","country_code":"US","type":"company","lineage":["https://openalex.org/I4210157229"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Delaney","raw_affiliation_strings":["Applied Optoelectronics Inc., Sugar Land, Texas 77478, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Applied Optoelectronics Inc., Sugar Land, Texas 77478, USA","institution_ids":["https://openalex.org/I4210157229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027815608","display_name":"Jun Zheng","orcid":"https://orcid.org/0000-0001-6329-4518","observed_orcids":["https://orcid.org/0000-0001-6329-4518"]},"institutions":[{"id":"https://openalex.org/I44461941","display_name":"University of Houston","ror":"https://ror.org/048sx0r50","country_code":"US","type":"education","lineage":["https://openalex.org/I44461941"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jun Zheng","raw_affiliation_strings":["University of Houston, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Houston, USA","institution_ids":["https://openalex.org/I44461941"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010527872","display_name":"Stefan J. Murry","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I44461941","display_name":"University of Houston","ror":"https://ror.org/048sx0r50","country_code":"US","type":"education","lineage":["https://openalex.org/I44461941"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S.J. Murry","raw_affiliation_strings":["University of Houston, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Houston, USA","institution_ids":["https://openalex.org/I44461941"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103094768","display_name":"A. Liu","orcid":"https://orcid.org/0009-0006-9773-9208","observed_orcids":["https://orcid.org/0009-0006-9773-9208"]},"institutions":[{"id":"https://openalex.org/I44461941","display_name":"University of Houston","ror":"https://ror.org/048sx0r50","country_code":"US","type":"education","lineage":["https://openalex.org/I44461941"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Liu","raw_affiliation_strings":["University of Houston, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Houston, USA","institution_ids":["https://openalex.org/I44461941"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112204111","display_name":"Han Q. Le","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I44461941","display_name":"University of Houston","ror":"https://ror.org/048sx0r50","country_code":"US","type":"education","lineage":["https://openalex.org/I44461941"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"H.Q. Le","raw_affiliation_strings":["University of Houston, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Houston, USA","institution_ids":["https://openalex.org/I44461941"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Y. Mu","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210157229","display_name":"Applied Optoelectronics (United States)","ror":"https://ror.org/05vxv5b07","country_code":"US","type":"company","lineage":["https://openalex.org/I4210157229"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Y. Mu","raw_affiliation_strings":["Applied Optoelectronics Inc., Sugar Land, Texas 77478, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Applied Optoelectronics Inc., Sugar Land, Texas 77478, USA","institution_ids":["https://openalex.org/I4210157229"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111476732","display_name":"S. S. Pei","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I44461941","display_name":"University of Houston","ror":"https://ror.org/048sx0r50","country_code":"US","type":"education","lineage":["https://openalex.org/I44461941"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S.S. Pei","raw_affiliation_strings":["University of Houston, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Houston, USA","institution_ids":["https://openalex.org/I44461941"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.9681,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.69614763,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"59","last_page":"62"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":0.45509999990463257,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":0.45509999990463257,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.39259999990463257,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11111","display_name":"Spectroscopy and Laser Applications","score":0.12139999866485596,"subfield":{"id":"https://openalex.org/subfields/1607","display_name":"Spectroscopy"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/interband-cascade-lasers","display_name":"interband cascade lasers","score":0.8519999980926514},{"id":"https://openalex.org/keywords/mid-infrared-lasers","display_name":"mid-infrared lasers","score":0.9089999794960022},{"id":"https://openalex.org/keywords/environmental-sensing","display_name":"environmental sensing","score":0.49300000071525574},{"id":"https://openalex.org/keywords/gas-absorption-spectroscopy","display_name":"gas absorption spectroscopy","score":0.7229999899864197},{"id":"https://openalex.org/keywords/contaminant-detection","display_name":"contamination detection","score":0.6759999990463257},{"id":"https://openalex.org/keywords/semiconductor-lasers","display_name":"semiconductor lasers","score":0.45500001311302185}],"concepts":[{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.7480339407920837},{"id":"https://openalex.org/C121477167","wikidata":"https://www.wikidata.org/wiki/Q17154002","display_name":"Semiconductor laser theory","level":3,"score":0.7010805010795593},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.6715525984764099},{"id":"https://openalex.org/C108225325","wikidata":"https://www.wikidata.org/wiki/Q11456","display_name":"Semiconductor","level":2,"score":0.6156864762306213},{"id":"https://openalex.org/C34146451","wikidata":"https://www.wikidata.org/wiki/Q5048094","display_name":"Cascade","level":2,"score":0.6107083559036255},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5450485348701477},{"id":"https://openalex.org/C125287762","wikidata":"https://www.wikidata.org/wiki/Q1758948","display_name":"Absorption (acoustics)","level":2,"score":0.5198593735694885},{"id":"https://openalex.org/C6260449","wikidata":"https://www.wikidata.org/wiki/Q41364","display_name":"Wavelength","level":2,"score":0.5153912305831909},{"id":"https://openalex.org/C97749803","wikidata":"https://www.wikidata.org/wiki/Q3753940","display_name":"Tunable laser","level":3,"score":0.44606250524520874},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.42319101095199585},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2798502445220947},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.12132847309112549},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cleo.2000.906725","doi":"https://doi.org/10.1109/cleo.2000.906725","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cleo.2000.906725","pdf_url":null,"source":{"id":"https://openalex.org/S4306418073","display_name":"Conference on Lasers and Electro-Optics","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Conference on Lasers and Electro-Optics (CLEO 2000). Technical Digest. Postconference Edition. TOPS Vol.39 (IEEE Cat. No.00CH37088)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1849073942","https://openalex.org/W1965639139","https://openalex.org/W1968831902","https://openalex.org/W1986303055","https://openalex.org/W1993407563","https://openalex.org/W2002348844","https://openalex.org/W2026572776","https://openalex.org/W2033809330","https://openalex.org/W2035944411","https://openalex.org/W2079654046","https://openalex.org/W2083463247","https://openalex.org/W2084947500","https://openalex.org/W2099539402","https://openalex.org/W2119880276","https://openalex.org/W2130251353","https://openalex.org/W2140294755","https://openalex.org/W2200540542","https://openalex.org/W2576226653"],"related_works":["https://openalex.org/W1664371853","https://openalex.org/W2323281468","https://openalex.org/W849555576","https://openalex.org/W4410403417","https://openalex.org/W2067405626","https://openalex.org/W2001364750","https://openalex.org/W2920977354","https://openalex.org/W2146938318","https://openalex.org/W2321264529","https://openalex.org/W1965559037"],"abstract_inverted_index":{"Summary":[0],"form":[1],"only":[2],"given.The":[3],"wavelengths":[4],"spanning":[5],"from":[6],"2":[7],"to":[8],"13":[9],"/spl":[10],"mu/m":[11],"include":[12],"the":[13,25,51,60],"absorption":[14],"lines":[15],"of":[16,27,59],"most":[17],"target":[18],"gases":[19],"and":[20],"pollutants,":[21],"which":[22],"are":[23],"currently":[24],"object":[26],"environmental":[28],"sensing":[29],"applications.":[30,42],"A":[31],"compact":[32],"NIR":[33],"semiconductor":[34,61],"laser":[35],"would":[36],"be":[37],"extremely":[38],"useful":[39],"for":[40],"those":[41],"Here,":[43],"we":[44],"have":[45],"used":[46],"two":[47],"InAs":[48],"layers":[49],"in":[50],"active":[52,57],"region,":[53],"so":[54],"called":[55],"W":[56],"region":[58],"laser.":[62]},"counts_by_year":[],"updated_date":"2026-10-26T11:51:55.731654","created_date":"2016-06-24T00:00:00"}