{"id":"https://openalex.org/W1996808256","doi":"https://doi.org/10.1145/343647.343801","title":"On applying incremental satisfiability to delay fault testing","display_name":"On applying incremental satisfiability to delay fault testing","publication_year":2000,"publication_date":"2000-01-01","ids":{"openalex":"https://openalex.org/W1996808256","doi":"https://doi.org/10.1145/343647.343801","mag":"1996808256"},"language":"en","primary_location":{"id":"doi:10.1145/343647.343801","doi":"https://doi.org/10.1145/343647.343801","is_oa":false,"landing_page_url":"https://doi.org/10.1145/343647.343801","pdf_url":null,"source":{"id":"https://openalex.org/S4306418181","display_name":"Design, Automation, and Test in Europe","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the conference on Design, automation and test in Europe","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://eprints.soton.ac.uk/262033/1/jpms-date00b.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100739352","display_name":"Joonyoung Kim","orcid":"https://orcid.org/0000-0001-5287-607X","observed_orcids":["https://orcid.org/0000-0001-5287-607X","https://orcid.org/0009-0008-9740-0700"]},"institutions":[{"id":"https://openalex.org/I27837315","display_name":"University of Michigan","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Joonyoung Kim","raw_affiliation_strings":["University of Michigan, USA","Michigan Univ., MI, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Michigan, USA","institution_ids":["https://openalex.org/I27837315"]},{"raw_affiliation_string":"Michigan Univ., MI, USA","institution_ids":["https://openalex.org/I27837315"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018420375","display_name":"Jesse Whittemore","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I27837315","display_name":"University of Michigan","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J. Whittemore","raw_affiliation_strings":["University of Michigan, USA","(University of Michigan)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Michigan, USA","institution_ids":["https://openalex.org/I27837315"]},{"raw_affiliation_string":"(University of Michigan)","institution_ids":["https://openalex.org/I27837315"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002246957","display_name":"Jo\u00e3o P. Marques-Silva","orcid":"https://orcid.org/0000-0002-6632-3086","observed_orcids":["https://orcid.org/0000-0002-6632-3086"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"J.P. Marques-Silva","raw_affiliation_strings":["IST/INESC, Cadence European Laboratories#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IST/INESC, Cadence European Laboratories#TAB#","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077314055","display_name":"Karem A. Sakallah","orcid":"https://orcid.org/0000-0002-5819-9089","observed_orcids":["https://orcid.org/0000-0002-5819-9089"]},"institutions":[{"id":"https://openalex.org/I27837315","display_name":"University of Michigan","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"K. Sakallah","raw_affiliation_strings":["University of Michigan, USA","(University of Michigan)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Michigan, USA","institution_ids":["https://openalex.org/I27837315"]},{"raw_affiliation_string":"(University of Michigan)","institution_ids":["https://openalex.org/I27837315"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.0637,"has_fulltext":true,"cited_by_count":30,"citation_normalized_percentile":{"value":0.7451895,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"380","last_page":"384"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9634000062942505,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9634000062942505,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10142","display_name":"Formal Methods in Verification","score":0.02539999969303608,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.005200000014156103,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/delay-fault-testing","display_name":"delay fault testing","score":0.9539999961853027},{"id":"https://openalex.org/keywords/boolean-satisfiability","display_name":"Boolean satisfiability","score":0.9580000042915344},{"id":"https://openalex.org/keywords/decision-sequences","display_name":"decision sequences","score":0.8040000200271606},{"id":"https://openalex.org/keywords/execution-time-reduction","display_name":"execution time reduction","score":0.4699999988079071},{"id":"https://openalex.org/keywords/combinational-circuits","display_name":"combinational circuits","score":0.6869999766349792}],"concepts":[{"id":"https://openalex.org/C6943359","wikidata":"https://www.wikidata.org/wiki/Q875276","display_name":"Boolean satisfiability problem","level":2,"score":0.7032514214515686},{"id":"https://openalex.org/C168773769","wikidata":"https://www.wikidata.org/wiki/Q1350299","display_name":"Satisfiability","level":2,"score":0.6912161111831665},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6395463347434998},{"id":"https://openalex.org/C187455244","wikidata":"https://www.wikidata.org/wiki/Q942353","display_name":"Boolean function","level":2,"score":0.6148554682731628},{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.5700099468231201},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5623809099197388},{"id":"https://openalex.org/C64260653","wikidata":"https://www.wikidata.org/wiki/Q1194864","display_name":"Electronic design automation","level":2,"score":0.48358649015426636},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.4260132908821106},{"id":"https://openalex.org/C111797529","wikidata":"https://www.wikidata.org/wiki/Q17080584","display_name":"Maximum satisfiability problem","level":3,"score":0.4162348508834839},{"id":"https://openalex.org/C80444323","wikidata":"https://www.wikidata.org/wiki/Q2878974","display_name":"Theoretical computer science","level":1,"score":0.3811982274055481},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.33001938462257385},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.0}],"mesh":[],"locations_count":5,"locations":[{"id":"doi:10.1145/343647.343801","doi":"https://doi.org/10.1145/343647.343801","is_oa":false,"landing_page_url":"https://doi.org/10.1145/343647.343801","pdf_url":null,"source":{"id":"https://openalex.org/S4306418181","display_name":"Design, Automation, and Test in Europe","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the conference on Design, automation and test in Europe","raw_type":"proceedings-article"},{"id":"doi:10.1109/date.2000.840299","doi":"https://doi.org/10.1109/date.2000.840299","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2000.840299","pdf_url":null,"source":{"id":"https://openalex.org/S4306418181","display_name":"Design, Automation, and Test in Europe","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings Design, Automation and Test in Europe Conference and Exhibition 2000 (Cat. No. PR00537)","raw_type":"proceedings-article"},{"id":"pmh:oai:eprints.soton.ac.uk:262033","doi":null,"is_oa":true,"landing_page_url":"https://eprints.soton.ac.uk/262033/1/jpms-date00b.pdf","pdf_url":"https://eprints.soton.ac.uk/262033/1/jpms-date00b.pdf","source":{"id":"https://openalex.org/S4306401019","display_name":"ePrints Soton (University of Southampton)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I43439940","host_organization_name":"University of Southampton","host_organization_lineage":["https://openalex.org/I43439940"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Conference or Workshop Item"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.132.2172","doi":null,"is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.132.2172","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://eprints.ecs.soton.ac.uk/12033/1/jpms-date00b.pdf","raw_type":"text"},{"id":"mag:2263477563","doi":null,"is_oa":false,"landing_page_url":"https://eprints.soton.ac.uk/262033/","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null}],"best_oa_location":{"id":"pmh:oai:eprints.soton.ac.uk:262033","doi":null,"is_oa":true,"landing_page_url":"https://eprints.soton.ac.uk/262033/1/jpms-date00b.pdf","pdf_url":"https://eprints.soton.ac.uk/262033/1/jpms-date00b.pdf","source":{"id":"https://openalex.org/S4306401019","display_name":"ePrints Soton (University of Southampton)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I43439940","host_organization_name":"University of Southampton","host_organization_lineage":["https://openalex.org/I43439940"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Conference or Workshop Item"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W1996808256.pdf","grobid_xml":"https://content.openalex.org/works/W1996808256.grobid-xml"},"referenced_works_count":20,"referenced_works":["https://openalex.org/W1511155470","https://openalex.org/W1512404515","https://openalex.org/W1605187320","https://openalex.org/W1929998202","https://openalex.org/W1963606877","https://openalex.org/W2005319125","https://openalex.org/W2048051309","https://openalex.org/W2106257389","https://openalex.org/W2108637261","https://openalex.org/W2110134350","https://openalex.org/W2135802341","https://openalex.org/W2138797245","https://openalex.org/W2152426072","https://openalex.org/W2402975211","https://openalex.org/W3121841464","https://openalex.org/W3140154188","https://openalex.org/W4229840182","https://openalex.org/W6630663818","https://openalex.org/W6640122991","https://openalex.org/W6679764571"],"related_works":["https://openalex.org/W2263477563","https://openalex.org/W7099179467","https://openalex.org/W2147964671","https://openalex.org/W2755789283","https://openalex.org/W1571782891","https://openalex.org/W2125024536","https://openalex.org/W1520424600","https://openalex.org/W4241989857","https://openalex.org/W4247744500","https://openalex.org/W2885676664"],"abstract_inverted_index":{"The":[0],"Boolean":[1],"satisfiability":[2,64],"problem":[3,36],"(SAT)":[4],"has":[5,23],"various":[6],"applications":[7],"in":[8,106],"electronic":[9],"design":[10],"automation":[11],"(EDA)":[12],"fields":[13],"such":[14],"as":[15,29,37,114,141],"testing,":[16],"timing":[17],"analysis":[18],"and":[19,121],"logic":[20],"verification.":[21],"SAT":[22,39,45,60],"been":[24],"typically":[25],"applied":[26],"to":[27,54,78,93,116,130],"EDA":[28],"follows:":[30],"(1)":[31],"formulation":[32],"of":[33,43,82,88,128,151],"the":[34,44,68,94,118,148],"given":[35],"a":[38,52,73,86],"instance":[40,124],"(2)":[41],"solution":[42],"instance.":[46],"In":[47,66],"this":[48,112,158],"paper":[49],"we":[50,101,110],"present":[51],"method":[53],"simultaneously":[55],"solve":[56,79],"several":[57],"closely":[58],"related":[59],"instances":[61],"using":[62,157],"incremental":[63,138],"(ISAT).":[65],"ISAT,":[67],"decision":[69,119],"sequence":[70],"made":[71],"for":[72,147],"\"prefix\"":[74],"function":[75],"is":[76,134],"used":[77],"another":[80],"set":[81],"functions":[83],"which":[84],"have":[85],"number":[87],"new":[89],"constraints":[90],"(extensions)":[91],"added":[92],"prefix":[95],"function.":[96],"Our":[97],"experiments":[98],"show":[99],"that":[100],"can":[102],"achieve":[103],"significant":[104],"gains":[105],"total":[107],"runtime":[108],"when":[109],"use":[111],"methodology":[113],"opposed":[115],"resetting":[117],"sequences":[120],"solving":[122],"each":[123],"from":[125],"scratch.":[126],"Application":[127],"ISAT":[129,143],"delay":[131],"fault":[132],"testing":[133],"presented":[135],"by":[136],"formulating":[137],"path":[139],"sensitization":[140],"an":[142],"problem.":[144],"Non-robust":[145],"tests":[146],"combinational":[149],"portion":[150],"ISCAS":[152],"89":[153],"circuits":[154],"are":[155],"generated":[156],"method.":[159]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":2},{"year":2012,"cited_by_count":3}],"updated_date":"2026-11-08T12:12:28.789561","created_date":"2016-06-24T00:00:00"}