{"id":"https://openalex.org/W1996587958","doi":"https://doi.org/10.1063/1.3573481","title":"Work function engineering in silicides: Chlorine doping in NiSi","display_name":"Work function engineering in silicides: Chlorine doping in NiSi","publication_year":2011,"publication_date":"2011-04-15","ids":{"openalex":"https://openalex.org/W1996587958","doi":"https://doi.org/10.1063/1.3573481","mag":"1996587958"},"language":"en","primary_location":{"id":"doi:10.1063/1.3573481","doi":"https://doi.org/10.1063/1.3573481","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.3573481","pdf_url":null,"source":{"id":"https://openalex.org/S187991544","display_name":"Journal of Applied Physics","issn_l":"0021-8979","issn":["0021-8979","1089-7550","1520-8850"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-d","jufo-1","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Applied Physics","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5043756911","display_name":"Alexander Slepko","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Alexander Slepko","raw_affiliation_strings":["The University of Texas at Austin 1 Department of Physics, , Austin, Texas 78712, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The University of Texas at Austin 1 Department of Physics, , Austin, Texas 78712, USA","institution_ids":["https://openalex.org/I86519309"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080915325","display_name":"Alexander A. Demkov","orcid":"https://orcid.org/0000-0003-4241-3519","observed_orcids":["https://orcid.org/0000-0003-4241-3519"]},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Alexander A. Demkov","raw_affiliation_strings":["The University of Texas at Austin 1 Department of Physics, , Austin, Texas 78712, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The University of Texas at Austin 1 Department of Physics, , Austin, Texas 78712, USA","institution_ids":["https://openalex.org/I86519309"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113687158","display_name":"Wei Yip Loh","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"W.-Y. Loh","raw_affiliation_strings":["SEMATECH 2 , 2706 Montopolis Dr., Austin, Texas 78741, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"SEMATECH 2 , 2706 Montopolis Dr., Austin, Texas 78741, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5114141793","display_name":"P. Majhi","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"P. Majhi","raw_affiliation_strings":["SEMATECH 2 , 2706 Montopolis Dr., Austin, Texas 78741, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"SEMATECH 2 , 2706 Montopolis Dr., Austin, Texas 78741, USA","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5030704805","display_name":"Gennadi I. Bersuker","orcid":"https://orcid.org/0000-0003-4461-1172","observed_orcids":["https://orcid.org/0000-0003-4461-1172"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"G. Bersuker","raw_affiliation_strings":["SEMATECH 2 , 2706 Montopolis Dr., Austin, Texas 78741, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"SEMATECH 2 , 2706 Montopolis Dr., Austin, Texas 78741, USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":3500,"currency":"USD","value_usd":3500},"apc_paid":null,"fwci":0.3739,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.53813206,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":87,"max":95},"biblio":{"volume":"109","issue":"8","first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13531","display_name":"Surface and Thin Film Phenomena","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10624","display_name":"Silicon and Solar Cell Technologies","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/nickel-silicide","display_name":"nickel silicide","score":0.7609999775886536},{"id":"https://openalex.org/keywords/chlorine-doping","display_name":"chlorine doping","score":0.7680000066757202},{"id":"https://openalex.org/keywords/work-function-engineering","display_name":"work function engineering","score":0.8410000205039978},{"id":"https://openalex.org/keywords/schottky-barrier","display_name":"Schottky barrier","score":0.9399999976158142},{"id":"https://openalex.org/keywords/substitutional-impurities","display_name":"substitutional impurities","score":0.7559999823570251},{"id":"https://openalex.org/keywords/impurity-scattering","display_name":"impurity scattering","score":0.8510000109672546},{"id":"https://openalex.org/keywords/electrical-conductivity","display_name":"electrical conductivity","score":0.6980000138282776},{"id":"https://openalex.org/keywords/surface-energy","display_name":"surface energy","score":0.7519999742507935},{"id":"https://openalex.org/keywords/metal-semiconductor-junction","display_name":"metal-semiconductor contacts","score":0.6190000176429749}],"concepts":[{"id":"https://openalex.org/C152365726","wikidata":"https://www.wikidata.org/wiki/Q1048589","display_name":"Density functional theory","level":2,"score":0.7386636734008789},{"id":"https://openalex.org/C37243968","wikidata":"https://www.wikidata.org/wiki/Q648961","display_name":"Orthorhombic crystal system","level":3,"score":0.7322172522544861},{"id":"https://openalex.org/C57863236","wikidata":"https://www.wikidata.org/wiki/Q1130571","display_name":"Doping","level":2,"score":0.6647522449493408},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6468079686164856},{"id":"https://openalex.org/C16115445","wikidata":"https://www.wikidata.org/wiki/Q2391942","display_name":"Schottky barrier","level":3,"score":0.5796351432800293},{"id":"https://openalex.org/C115235246","wikidata":"https://www.wikidata.org/wiki/Q783800","display_name":"Work function","level":3,"score":0.5741266012191772},{"id":"https://openalex.org/C505241676","wikidata":"https://www.wikidata.org/wiki/Q688","display_name":"Chlorine","level":2,"score":0.5695197582244873},{"id":"https://openalex.org/C71987851","wikidata":"https://www.wikidata.org/wiki/Q7216430","display_name":"Impurity","level":2,"score":0.5668462514877319},{"id":"https://openalex.org/C131540310","wikidata":"https://www.wikidata.org/wiki/Q907564","display_name":"Conductivity","level":2,"score":0.5397812128067017},{"id":"https://openalex.org/C18762648","wikidata":"https://www.wikidata.org/wiki/Q42213","display_name":"Work (physics)","level":2,"score":0.48041844367980957},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.38259053230285645},{"id":"https://openalex.org/C147597530","wikidata":"https://www.wikidata.org/wiki/Q369472","display_name":"Computational chemistry","level":1,"score":0.27623251080513},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.2630620002746582},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.25976330041885376},{"id":"https://openalex.org/C8010536","wikidata":"https://www.wikidata.org/wiki/Q160398","display_name":"Crystallography","level":1,"score":0.24206510186195374},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.21355268359184265},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.1957680583000183},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.14650964736938477},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.09363523125648499},{"id":"https://openalex.org/C115624301","wikidata":"https://www.wikidata.org/wiki/Q895901","display_name":"Crystal structure","level":2,"score":0.06601840257644653},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.06010943651199341},{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.0},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1063/1.3573481","doi":"https://doi.org/10.1063/1.3573481","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.3573481","pdf_url":null,"source":{"id":"https://openalex.org/S187991544","display_name":"Journal of Applied Physics","issn_l":"0021-8979","issn":["0021-8979","1089-7550","1520-8850"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-d","jufo-1","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Applied Physics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[{"id":"https://openalex.org/G4474457599","display_name":"CAREER: Theory of Epitaxial-Oxide-Semiconductor Nanosystems","funder_award_id":"0548182","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"}],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W296585704","https://openalex.org/W1970127494","https://openalex.org/W1979544533","https://openalex.org/W1989880368","https://openalex.org/W1993184078","https://openalex.org/W1998290403","https://openalex.org/W1999219717","https://openalex.org/W2006477547","https://openalex.org/W2007395042","https://openalex.org/W2016290247","https://openalex.org/W2021671091","https://openalex.org/W2023055350","https://openalex.org/W2023700150","https://openalex.org/W2028131423","https://openalex.org/W2034210026","https://openalex.org/W2034687638","https://openalex.org/W2036113194","https://openalex.org/W2063932148","https://openalex.org/W2067112372","https://openalex.org/W2069970015","https://openalex.org/W2071246696","https://openalex.org/W2076982249","https://openalex.org/W2079105963","https://openalex.org/W2079486690","https://openalex.org/W2080935017","https://openalex.org/W2082014402","https://openalex.org/W2083222334","https://openalex.org/W2100438472","https://openalex.org/W2121690588","https://openalex.org/W2124303408","https://openalex.org/W3189290307"],"related_works":["https://openalex.org/W1983222747","https://openalex.org/W2112090175","https://openalex.org/W2795932009","https://openalex.org/W2121690588","https://openalex.org/W2024220459","https://openalex.org/W3098906699","https://openalex.org/W2890470519","https://openalex.org/W2148331290","https://openalex.org/W4403344503","https://openalex.org/W1994236022"],"abstract_inverted_index":{"We":[0,82],"present":[1],"a":[2],"study":[3],"of":[4,8,16,28,91,111,117],"the":[5,25,39,48,63,76,79,88,101,109,112,127],"electronic":[6],"properties":[7],"chlorine-doped":[9],"NiSi":[10,34,92,118],"and":[11,35,46,99],"ClNiSi/Si":[12],"contacts":[13],"by":[14,53,93],"means":[15],"density":[17],"functional":[18],"theory":[19],"(DFT).":[20],"Using":[21],"DFT,":[22],"we":[23],"consider":[24],"theoretical":[26],"effect":[27],"Cl":[29,60,85,130],"doping":[30],"in":[31,50],"orthorhombic":[32],"Pbnm":[33],"its":[36],"impact":[37],"on":[38,47,62,108],"work":[40,89],"function,":[41],"Schottky":[42,102],"barrier":[43,103],"with":[44,104],"Si,":[45],"change":[49],"conductivity":[51,116],"caused":[52],"impurity":[54],"scattering.":[55],"Our":[56],"calculations":[57],"suggest":[58],"that":[59,73,84,100],"substitution":[61],"Si":[64,105],"site":[65],"is":[66,119],"energetically":[67],"preferable.":[68],"The":[69],"thermodynamic":[70],"analysis":[71],"shows":[72],"chlorine":[74],"at":[75],"surface":[77,80],"lowers":[78],"energy.":[81],"find":[83],"can":[86],"reduce":[87],"function":[90],"as":[94,96],"much":[95],"\u223c100":[97],"meV,":[98],"strongly":[106],"depends":[107],"position":[110],"substitutional":[113],"chlorine.":[114],"Electric":[115],"found":[120],"to":[121],"be":[122],"significantly":[123],"reduced":[124],"even":[125],"for":[126],"lowest":[128],"calculated":[129],"concentration.":[131],"Both":[132],"findings":[133],"are":[134],"validated":[135],"experimentally.":[136]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":2}],"updated_date":"2026-10-02T10:15:12.560889","created_date":"2016-06-24T00:00:00"}