{"id":"https://openalex.org/W1995639733","doi":"https://doi.org/10.1587/transele.e97.c.546","title":"Chip Level Simulation of Substrate Noise Coupling and Interference in RF ICs with CMOS Digital Noise Emulator","display_name":"Chip Level Simulation of Substrate Noise Coupling and Interference in RF ICs with CMOS Digital Noise Emulator","publication_year":2014,"publication_date":"2014-01-01","ids":{"openalex":"https://openalex.org/W1995639733","doi":"https://doi.org/10.1587/transele.e97.c.546","mag":"1995639733"},"language":"en","primary_location":{"id":"doi:10.1587/transele.e97.c.546","doi":"https://doi.org/10.1587/transele.e97.c.546","is_oa":false,"landing_page_url":"https://doi.org/10.1587/transele.e97.c.546","pdf_url":null,"source":{"id":"https://openalex.org/S2489501747","display_name":"IEICE Transactions on Electronics","issn_l":"0916-8524","issn":["0916-8524","1745-1353"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-20","russia-white-list-3"],"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Transactions on Electronics","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5074135131","display_name":"Naoya Azuma","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I65837984","display_name":"Kobe University","ror":"https://ror.org/03tgsfw79","country_code":"JP","type":"education","lineage":["https://openalex.org/I65837984"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Naoya AZUMA","raw_affiliation_strings":["Graduate School of System Informatics, Kobe University","Graduate School of System Informatics, #R##N#Kobe University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of System Informatics, Kobe University","institution_ids":["https://openalex.org/I65837984"]},{"raw_affiliation_string":"Graduate School of System Informatics, #R##N#Kobe University","institution_ids":["https://openalex.org/I65837984"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011574865","display_name":"S. Shimazaki","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I65837984","display_name":"Kobe University","ror":"https://ror.org/03tgsfw79","country_code":"JP","type":"education","lineage":["https://openalex.org/I65837984"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shunsuke SHIMAZAKI","raw_affiliation_strings":["Graduate School of System Informatics, Kobe University","Graduate School of System Informatics, #R##N#Kobe University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of System Informatics, Kobe University","institution_ids":["https://openalex.org/I65837984"]},{"raw_affiliation_string":"Graduate School of System Informatics, #R##N#Kobe University","institution_ids":["https://openalex.org/I65837984"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032938283","display_name":"Noriyuki Miura","orcid":"https://orcid.org/0000-0002-0072-6114","observed_orcids":["https://orcid.org/0000-0002-0072-6114","https://orcid.org/0009-0002-1605-9296"]},"institutions":[{"id":"https://openalex.org/I65837984","display_name":"Kobe University","ror":"https://ror.org/03tgsfw79","country_code":"JP","type":"education","lineage":["https://openalex.org/I65837984"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Noriyuki MIURA","raw_affiliation_strings":["Graduate School of System Informatics, Kobe University","Graduate School of System Informatics, #R##N#Kobe University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of System Informatics, Kobe University","institution_ids":["https://openalex.org/I65837984"]},{"raw_affiliation_string":"Graduate School of System Informatics, #R##N#Kobe University","institution_ids":["https://openalex.org/I65837984"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070370721","display_name":"Makoto Nagata","orcid":"https://orcid.org/0000-0002-0625-9107","observed_orcids":["https://orcid.org/0000-0002-0625-9107"]},"institutions":[{"id":"https://openalex.org/I65837984","display_name":"Kobe University","ror":"https://ror.org/03tgsfw79","country_code":"JP","type":"education","lineage":["https://openalex.org/I65837984"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Makoto NAGATA","raw_affiliation_strings":["Graduate School of System Informatics, Kobe University","Graduate School of System Informatics, #R##N#Kobe University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of System Informatics, Kobe University","institution_ids":["https://openalex.org/I65837984"]},{"raw_affiliation_string":"Graduate School of System Informatics, #R##N#Kobe University","institution_ids":["https://openalex.org/I65837984"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109982799","display_name":"Tomomitsu Kitamura","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I75636454","display_name":"Renesas Electronics (United States)","ror":"https://ror.org/014775w70","country_code":"US","type":"company","lineage":["https://openalex.org/I4210153176","https://openalex.org/I75636454"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Tomomitsu KITAMURA","raw_affiliation_strings":["Renesas Mobile Corporation"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Renesas Mobile Corporation","institution_ids":["https://openalex.org/I75636454"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050010293","display_name":"Satoru Takahashi","orcid":"https://orcid.org/0000-0002-6555-9409","observed_orcids":["https://orcid.org/0000-0002-6555-9409"]},"institutions":[{"id":"https://openalex.org/I75636454","display_name":"Renesas Electronics (United States)","ror":"https://ror.org/014775w70","country_code":"US","type":"company","lineage":["https://openalex.org/I4210153176","https://openalex.org/I75636454"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Satoru TAKAHASHI","raw_affiliation_strings":["Renesas Mobile Corporation"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Renesas Mobile Corporation","institution_ids":["https://openalex.org/I75636454"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005213477","display_name":"M. Murakami","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210153176","display_name":"Renesas Electronics (Japan)","ror":"https://ror.org/058wb7691","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210153176"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Motoki MURAKAMI","raw_affiliation_strings":["Renesas Electronics Corporation"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Renesas Electronics Corporation","institution_ids":["https://openalex.org/I4210153176"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066943092","display_name":"Kazuaki Hori","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210153176","display_name":"Renesas Electronics (Japan)","ror":"https://ror.org/058wb7691","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210153176"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kazuaki HORI","raw_affiliation_strings":["Renesas Electronics Corporation"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Renesas Electronics Corporation","institution_ids":["https://openalex.org/I4210153176"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018620798","display_name":"Atsushi Nakamura","orcid":"https://orcid.org/0000-0003-0788-2221","observed_orcids":["https://orcid.org/0000-0003-0788-2221"]},"institutions":[{"id":"https://openalex.org/I4210153176","display_name":"Renesas Electronics (Japan)","ror":"https://ror.org/058wb7691","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210153176"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Atsushi NAKAMURA","raw_affiliation_strings":["Renesas Electronics Corporation"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Renesas Electronics Corporation","institution_ids":["https://openalex.org/I4210153176"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113959245","display_name":"Kenta Tsukamoto","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kenta TSUKAMOTO","raw_affiliation_strings":["NEC Corporation"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NEC Corporation","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085235913","display_name":"Mizuki Iwanami","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Mizuki IWANAMI","raw_affiliation_strings":["NEC Corporation"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NEC Corporation","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046239956","display_name":"Eiji Hankui","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Eiji HANKUI","raw_affiliation_strings":["NEC Corporation"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NEC Corporation","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002936511","display_name":"Sho Muroga","orcid":"https://orcid.org/0000-0003-0567-4752","observed_orcids":["https://orcid.org/0000-0003-0567-4752"]},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Sho MUROGA","raw_affiliation_strings":["Tohoku University","Tohoku Univ.#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tohoku University","institution_ids":["https://openalex.org/I201537933"]},{"raw_affiliation_string":"Tohoku Univ.#TAB#","institution_ids":["https://openalex.org/I201537933"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051751580","display_name":"Yasushi Endo","orcid":"https://orcid.org/0000-0002-7813-7977","observed_orcids":["https://orcid.org/0000-0002-7813-7977"]},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yasushi ENDO","raw_affiliation_strings":["Tohoku University","Tohoku Univ.#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tohoku University","institution_ids":["https://openalex.org/I201537933"]},{"raw_affiliation_string":"Tohoku Univ.#TAB#","institution_ids":["https://openalex.org/I201537933"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003140792","display_name":"Satoshi Tanaka","orcid":"https://orcid.org/0000-0003-2720-775X","observed_orcids":["https://orcid.org/0000-0003-2720-775X"]},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Satoshi TANAKA","raw_affiliation_strings":["Tohoku University","Tohoku Univ.#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tohoku University","institution_ids":["https://openalex.org/I201537933"]},{"raw_affiliation_string":"Tohoku Univ.#TAB#","institution_ids":["https://openalex.org/I201537933"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077884354","display_name":"Masahiro Yamaguchi","orcid":"https://orcid.org/0000-0002-3601-7619","observed_orcids":["https://orcid.org/0000-0002-3601-7619"]},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masahiro YAMAGUCHI","raw_affiliation_strings":["Tohoku University","Tohoku Univ.#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tohoku University","institution_ids":["https://openalex.org/I201537933"]},{"raw_affiliation_string":"Tohoku Univ.#TAB#","institution_ids":["https://openalex.org/I201537933"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.10434346,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"E97.C","issue":"6","first_page":"546","last_page":"556"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9771000146865845,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9771000146865845,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.013399999588727951,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.004699999932199717,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/substrate-noise-coupling","display_name":"substrate noise coupling","score":0.9629999995231628},{"id":"https://openalex.org/keywords/rf-receiver-front-end","display_name":"RF receiver front-end","score":0.8220000267028809},{"id":"https://openalex.org/keywords/lte","display_name":"LTE","score":0.5460000038146973},{"id":"https://openalex.org/keywords/65-nm-cmos","display_name":"65 nm CMOS","score":0.8209999799728394},{"id":"https://openalex.org/keywords/noise-source-modeling","display_name":"noise source modeling","score":0.46399998664855957},{"id":"https://openalex.org/keywords/mixed-signal-simulation","display_name":"mixed-signal simulation","score":0.7200000286102295}],"concepts":[{"id":"https://openalex.org/C51674796","wikidata":"https://www.wikidata.org/wiki/Q7632167","display_name":"Substrate coupling","level":4,"score":0.7251107692718506},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6076347231864929},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5883891582489014},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5450624823570251},{"id":"https://openalex.org/C112806910","wikidata":"https://www.wikidata.org/wiki/Q746825","display_name":"Noise figure","level":4,"score":0.4820293188095093},{"id":"https://openalex.org/C52660251","wikidata":"https://www.wikidata.org/wiki/Q17083145","display_name":"Noise temperature","level":3,"score":0.47352883219718933},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4647810459136963},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4622630178928375},{"id":"https://openalex.org/C155332784","wikidata":"https://www.wikidata.org/wiki/Q1151304","display_name":"Low-noise amplifier","level":4,"score":0.44708070158958435},{"id":"https://openalex.org/C74342258","wikidata":"https://www.wikidata.org/wiki/Q2133526","display_name":"Noise generator","level":5,"score":0.4348505437374115},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.37076008319854736},{"id":"https://openalex.org/C89631360","wikidata":"https://www.wikidata.org/wiki/Q1428766","display_name":"Phase noise","level":2,"score":0.3420391082763672},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2615250051021576},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.18876636028289795},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.1807052493095398},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C155310634","wikidata":"https://www.wikidata.org/wiki/Q1852785","display_name":"Trench","level":3,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1587/transele.e97.c.546","doi":"https://doi.org/10.1587/transele.e97.c.546","is_oa":false,"landing_page_url":"https://doi.org/10.1587/transele.e97.c.546","pdf_url":null,"source":{"id":"https://openalex.org/S2489501747","display_name":"IEICE Transactions on Electronics","issn_l":"0916-8524","issn":["0916-8524","1745-1353"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-20","russia-white-list-3"],"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Transactions on Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W1490674876","https://openalex.org/W1520187900","https://openalex.org/W1963793664","https://openalex.org/W1996279584","https://openalex.org/W1996718405","https://openalex.org/W2026695748","https://openalex.org/W2045740192","https://openalex.org/W2053235480","https://openalex.org/W2062664760","https://openalex.org/W2064521245","https://openalex.org/W2072627139","https://openalex.org/W2098859370","https://openalex.org/W2105047277","https://openalex.org/W2112875661","https://openalex.org/W2124565735","https://openalex.org/W2159199312","https://openalex.org/W2170046261","https://openalex.org/W2176814745","https://openalex.org/W2180333551","https://openalex.org/W2478503558","https://openalex.org/W2532724619","https://openalex.org/W2587398465"],"related_works":["https://openalex.org/W2532724619","https://openalex.org/W1978316811","https://openalex.org/W4410536586","https://openalex.org/W2148928420","https://openalex.org/W3130416625","https://openalex.org/W2988474682","https://openalex.org/W7074138099","https://openalex.org/W2427103793","https://openalex.org/W2536712906","https://openalex.org/W4225146252"],"abstract_inverted_index":{"Substrate":[0],"noise":[1,33,58,68,77,86,98,105,125,139],"coupling":[2,69],"in":[3,25,39,48,106,144],"RF":[4,50,95],"receiver":[5,51],"front-end":[6],"circuitry":[7],"for":[8],"LTE":[9],"wireless":[10],"communication":[11,146],"was":[12],"examined":[13],"by":[14],"full-chip":[15,65],"level":[16,66],"simulation":[17,62,93],"and":[18,43,109,116],"on-chip":[19],"measurements,":[20],"with":[21,80,112,118],"a":[22,26,40,71,81,107],"demonstrator":[23],"built":[24],"65nm":[27],"CMOS":[28,31,138],"technology.":[29],"A":[30,60],"digital":[32],"emulator":[34,140],"injects":[35],"high-order":[36],"harmonic":[37],"noises":[38],"silicon":[41],"substrate":[42,57,67,76,104,124],"induces":[44],"in-band":[45],"spurious":[46,142],"tones":[47,143],"an":[49],"on":[52],"the":[53,110,119,127,133,137,145],"same":[54],"chip":[55,108],"through":[56],"interference.":[59],"complete":[61],"flow":[63],"of":[64,85,94,103,123,130,136],"uses":[70],"decoupled":[72],"modeling":[73],"approach,":[74],"where":[75],"waveforms":[78],"drawn":[79],"unified":[82],"package-chip":[83],"model":[84],"source":[87],"circuits":[88],"are":[89,114],"given":[90],"to":[91],"mixed-level":[92],"chains":[96],"as":[97],"sensitive":[99],"circuits.":[100],"The":[101,121],"distribution":[102],"attenuation":[111],"distance":[113],"simulated":[115],"compared":[117],"measurements.":[120],"interference":[122],"at":[126,148],"17th":[128],"harmonics":[129],"124.8MHz":[131],"\u2014":[132],"operating":[134],"frequency":[135],"creates":[141],"bandwidth":[147],"2.1GHz.":[149]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1}],"updated_date":"2026-09-24T07:57:37.273135","created_date":"2016-06-24T00:00:00"}