{"id":"https://openalex.org/W1995156208","doi":"https://doi.org/10.1063/1.1423631","title":"Modeling the acceleration field and objective lens for an aberration corrected photoemission electron microscope","display_name":"Modeling the acceleration field and objective lens for an aberration corrected photoemission electron microscope","publication_year":2002,"publication_date":"2002-03-01","ids":{"openalex":"https://openalex.org/W1995156208","doi":"https://doi.org/10.1063/1.1423631","mag":"1995156208"},"language":"en","primary_location":{"id":"doi:10.1063/1.1423631","doi":"https://doi.org/10.1063/1.1423631","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.1423631","pdf_url":null,"source":{"id":"https://openalex.org/S31010182","display_name":"Review of Scientific Instruments","issn_l":"0034-6748","issn":["0034-6748","1089-7623","1527-2400"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","ki-jl-1","medline","norway-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Review of Scientific Instruments","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://www.osti.gov/servlets/purl/795331","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5080883026","display_name":"Jun Feng","orcid":"https://orcid.org/0000-0002-5292-8842","observed_orcids":["https://orcid.org/0000-0002-5292-8842"]},"institutions":[{"id":"https://openalex.org/I148283060","display_name":"Lawrence Berkeley National Laboratory","ror":"https://ror.org/02jbv0t02","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I148283060","https://openalex.org/I39565521"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J. Feng","raw_affiliation_strings":["ALS, Lawrence Berkeley National Laboratory, Berkeley, California\u200994710"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ALS, Lawrence Berkeley National Laboratory, Berkeley, California\u200994710","institution_ids":["https://openalex.org/I148283060"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081966546","display_name":"Howard A. Padmore","orcid":"https://orcid.org/0000-0003-0172-4871","observed_orcids":["https://orcid.org/0000-0003-0172-4871"]},"institutions":[{"id":"https://openalex.org/I148283060","display_name":"Lawrence Berkeley National Laboratory","ror":"https://ror.org/02jbv0t02","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I148283060","https://openalex.org/I39565521"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"H. Padmore","raw_affiliation_strings":["ALS, Lawrence Berkeley National Laboratory, Berkeley, California\u200994710"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ALS, Lawrence Berkeley National Laboratory, Berkeley, California\u200994710","institution_ids":["https://openalex.org/I148283060"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024858919","display_name":"Der\u2010Hsin Wei","orcid":"https://orcid.org/0000-0002-6877-602X","observed_orcids":["https://orcid.org/0000-0002-6877-602X"]},"institutions":[{"id":"https://openalex.org/I4210094216","display_name":"National Synchrotron Radiation Research Center","ror":"https://ror.org/00k575643","country_code":"TW","type":"facility","lineage":["https://openalex.org/I4210094216","https://openalex.org/I4210128167"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"D. H. Wei","raw_affiliation_strings":["SRRC, No. 1 R&D Road VI, Hsinchu 300, Taiwan, Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"SRRC, No. 1 R&D Road VI, Hsinchu 300, Taiwan, Republic of China","institution_ids":["https://openalex.org/I4210094216"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044586034","display_name":"Simone Anders","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210085935","display_name":"IBM Research - Almaden","ror":"https://ror.org/005w8dd04","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210085935","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S. Anders","raw_affiliation_strings":["IBM, Almaden Research Center, 650 Harry Road, San Jose, California\u200995120"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM, Almaden Research Center, 650 Harry Road, San Jose, California\u200995120","institution_ids":["https://openalex.org/I4210085935"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028037865","display_name":"Y. Wu","orcid":"https://orcid.org/0000-0001-8129-0561","observed_orcids":["https://orcid.org/0000-0001-8129-0561"]},"institutions":[{"id":"https://openalex.org/I148283060","display_name":"Lawrence Berkeley National Laboratory","ror":"https://ror.org/02jbv0t02","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I148283060","https://openalex.org/I39565521"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Y. Wu","raw_affiliation_strings":["ALS, Lawrence Berkeley National Laboratory, Berkeley, California\u200994710"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ALS, Lawrence Berkeley National Laboratory, Berkeley, California\u200994710","institution_ids":["https://openalex.org/I148283060"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064920164","display_name":"A. Sch\u00f6ll","orcid":"https://orcid.org/0000-0002-1990-4769","observed_orcids":["https://orcid.org/0000-0002-1990-4769"]},"institutions":[{"id":"https://openalex.org/I148283060","display_name":"Lawrence Berkeley National Laboratory","ror":"https://ror.org/02jbv0t02","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I148283060","https://openalex.org/I39565521"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Scholl","raw_affiliation_strings":["ALS, Lawrence Berkeley National Laboratory, Berkeley, California\u200994710"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ALS, Lawrence Berkeley National Laboratory, Berkeley, California\u200994710","institution_ids":["https://openalex.org/I148283060"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5066102441","display_name":"David A. R. Robin","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I148283060","display_name":"Lawrence Berkeley National Laboratory","ror":"https://ror.org/02jbv0t02","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I148283060","https://openalex.org/I39565521"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"D. Robin","raw_affiliation_strings":["ALS, Lawrence Berkeley National Laboratory, Berkeley, California\u200994710"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ALS, Lawrence Berkeley National Laboratory, Berkeley, California\u200994710","institution_ids":["https://openalex.org/I148283060"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.7823,"has_fulltext":false,"cited_by_count":17,"citation_normalized_percentile":{"value":0.65240406,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":87,"max":95},"biblio":{"volume":"73","issue":"3","first_page":"1514","last_page":"1517"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10857","display_name":"Advanced Electron Microscopy Techniques and Applications","score":0.6176999807357788,"subfield":{"id":"https://openalex.org/subfields/1315","display_name":"Structural Biology"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},"topics":[{"id":"https://openalex.org/T10857","display_name":"Advanced Electron Microscopy Techniques and Applications","score":0.6176999807357788,"subfield":{"id":"https://openalex.org/subfields/1315","display_name":"Structural Biology"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.2653999924659729,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13418","display_name":"Photocathodes and Microchannel Plates","score":0.07819999754428864,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electron-optics","display_name":"electron optics","score":0.49399998784065247},{"id":"https://openalex.org/keywords/objective-lens","display_name":"objective lens","score":0.6850000023841858},{"id":"https://openalex.org/keywords/acceleration-field","display_name":"acceleration field","score":0.8159999847412109},{"id":"https://openalex.org/keywords/aberration-correction","display_name":"aberration correction","score":0.7120000123977661},{"id":"https://openalex.org/keywords/relativistic-effects","display_name":"relativistic effects","score":0.9629999995231628},{"id":"https://openalex.org/keywords/ray-tracing","display_name":"ray tracing","score":0.9449999928474426},{"id":"https://openalex.org/keywords/electron-mirrors","display_name":"electron mirrors","score":0.7409999966621399}],"concepts":[{"id":"https://openalex.org/C15336307","wikidata":"https://www.wikidata.org/wiki/Q1766051","display_name":"Lens (geology)","level":2,"score":0.7370383739471436},{"id":"https://openalex.org/C121483023","wikidata":"https://www.wikidata.org/wiki/Q7298343","display_name":"Ray tracing (physics)","level":2,"score":0.7298696637153625},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.7078499794006348},{"id":"https://openalex.org/C67649825","wikidata":"https://www.wikidata.org/wiki/Q196538","display_name":"Microscope","level":2,"score":0.6113307476043701},{"id":"https://openalex.org/C70638346","wikidata":"https://www.wikidata.org/wiki/Q2913798","display_name":"Spherical aberration","level":3,"score":0.5811355113983154},{"id":"https://openalex.org/C117896860","wikidata":"https://www.wikidata.org/wiki/Q11376","display_name":"Acceleration","level":2,"score":0.5600127577781677},{"id":"https://openalex.org/C31885709","wikidata":"https://www.wikidata.org/wiki/Q905233","display_name":"Electron optics","level":3,"score":0.5594296455383301},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.5552416443824768},{"id":"https://openalex.org/C131397105","wikidata":"https://www.wikidata.org/wiki/Q2980681","display_name":"Electrostatic lens","level":3,"score":0.5360735654830933},{"id":"https://openalex.org/C138673069","wikidata":"https://www.wikidata.org/wiki/Q322229","display_name":"Tracing","level":2,"score":0.5233151912689209},{"id":"https://openalex.org/C147120987","wikidata":"https://www.wikidata.org/wiki/Q2225","display_name":"Electron","level":2,"score":0.5014398097991943},{"id":"https://openalex.org/C2779132550","wikidata":"https://www.wikidata.org/wiki/Q639","display_name":"Optical aberration","level":3,"score":0.4918539524078369},{"id":"https://openalex.org/C2780751119","wikidata":"https://www.wikidata.org/wiki/Q1257398","display_name":"Photoemission electron microscopy","level":3,"score":0.443654328584671},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.4135511517524719},{"id":"https://openalex.org/C93877712","wikidata":"https://www.wikidata.org/wiki/Q132560","display_name":"Electron microscope","level":2,"score":0.40164172649383545},{"id":"https://openalex.org/C165699331","wikidata":"https://www.wikidata.org/wiki/Q461533","display_name":"Wavefront","level":2,"score":0.21142876148223877},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.19131383299827576},{"id":"https://openalex.org/C74650414","wikidata":"https://www.wikidata.org/wiki/Q11397","display_name":"Classical mechanics","level":1,"score":0.1214083731174469},{"id":"https://openalex.org/C168834538","wikidata":"https://www.wikidata.org/wiki/Q3705329","display_name":"Beam (structure)","level":2,"score":0.09985870122909546},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":7,"locations":[{"id":"doi:10.1063/1.1423631","doi":"https://doi.org/10.1063/1.1423631","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.1423631","pdf_url":null,"source":{"id":"https://openalex.org/S31010182","display_name":"Review of Scientific Instruments","issn_l":"0034-6748","issn":["0034-6748","1089-7623","1527-2400"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","ki-jl-1","medline","norway-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Review of Scientific Instruments","raw_type":"journal-article"},{"id":"pmh:oai:osti.gov:795331","doi":null,"is_oa":true,"landing_page_url":"https://www.osti.gov/biblio/795331","pdf_url":"https://www.osti.gov/servlets/purl/795331","source":{"id":"https://openalex.org/S4306402487","display_name":"OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I139351228","host_organization_name":"Office of Scientific and Technical Information","host_organization_lineage":["https://openalex.org/I139351228"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null},{"id":"pmh:info:ark/67531/metadc736563","doi":null,"is_oa":false,"landing_page_url":"https://digital.library.unt.edu/ark:/67531/metadc736563/","pdf_url":null,"source":{"id":"https://openalex.org/S4306400792","display_name":"University of North Texas Digital Library (University of North Texas)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I123534392","host_organization_name":"University of North Texas","host_organization_lineage":["https://openalex.org/I123534392"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Journal Name: Review of Scientific Instruments; Journal Volume: 73; Journal Issue: 3 PT2; Other Information: Journal Publication Date: March 2002","raw_type":"Article"},{"id":"pmh:oai:escholarship.org/ark:/13030/qt0qf5x0kc","doi":null,"is_oa":false,"landing_page_url":"https://escholarship.org/uc/item/0qf5x0kc","pdf_url":null,"source":{"id":"https://openalex.org/S4306400115","display_name":"eScholarship (California Digital Library)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I2801248553","host_organization_name":"California Digital Library","host_organization_lineage":["https://openalex.org/I2801248553"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Review of Scientific Instruments, vol 73, iss 3 PT2","raw_type":"article"},{"id":"pmh:oai:escholarship.org/ark:/13030/qt19k5j5f4","doi":null,"is_oa":false,"landing_page_url":"https://escholarship.org/uc/item/19k5j5f4","pdf_url":null,"source":{"id":"https://openalex.org/S4306400115","display_name":"eScholarship (California Digital Library)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I2801248553","host_organization_name":"California Digital Library","host_organization_lineage":["https://openalex.org/I2801248553"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"article"},{"id":"pmh:qt0qf5x0kc","doi":null,"is_oa":false,"landing_page_url":"http://www.escholarship.org/uc/item/0qf5x0kc","pdf_url":null,"source":{"id":"https://openalex.org/S4306400115","display_name":"eScholarship (California Digital Library)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I2801248553","host_organization_name":"California Digital Library","host_organization_lineage":["https://openalex.org/I2801248553"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Feng, J.; Padmore, H.; Wei, D.H.; Anders, S.; Wu, Y.; Scholl, A.; \u00c2\u00a0et al.(2001). Modeling the acceleration field and objective lens for an aberration corrected photoemission electron microscope. Review of Scientific Instruments, 73(3 PT2). Lawrence Berkeley National Laboratory: Lawrence Berkeley National Laboratory. Retrieved from: http://www.escholarship.org/uc/item/0qf5x0kc","raw_type":"article"},{"id":"pmh:qt19k5j5f4","doi":null,"is_oa":false,"landing_page_url":"http://www.escholarship.org/uc/item/19k5j5f4","pdf_url":null,"source":{"id":"https://openalex.org/S4306400115","display_name":"eScholarship (California Digital Library)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I2801248553","host_organization_name":"California Digital Library","host_organization_lineage":["https://openalex.org/I2801248553"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Robin, D.(2001). Modeling the acceleration field and objective lens for an aberration corrected photoemission electron microscope. Lawrence Berkeley National Laboratory: Lawrence Berkeley National Laboratory. Retrieved from: http://www.escholarship.org/uc/item/19k5j5f4","raw_type":"article"}],"best_oa_location":{"id":"pmh:oai:osti.gov:795331","doi":null,"is_oa":true,"landing_page_url":"https://www.osti.gov/biblio/795331","pdf_url":"https://www.osti.gov/servlets/purl/795331","source":{"id":"https://openalex.org/S4306402487","display_name":"OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I139351228","host_organization_name":"Office of Scientific and Technical Information","host_organization_lineage":["https://openalex.org/I139351228"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W1995156208.pdf","grobid_xml":"https://content.openalex.org/works/W1995156208.grobid-xml"},"referenced_works_count":8,"referenced_works":["https://openalex.org/W632683880","https://openalex.org/W1985496437","https://openalex.org/W1999115497","https://openalex.org/W2019807083","https://openalex.org/W2034321118","https://openalex.org/W2051852612","https://openalex.org/W2094121646","https://openalex.org/W2140238117"],"related_works":["https://openalex.org/W1908255321","https://openalex.org/W350702898","https://openalex.org/W2025148348","https://openalex.org/W7054332098","https://openalex.org/W1884724351","https://openalex.org/W2004256433","https://openalex.org/W2060327327","https://openalex.org/W2000749626","https://openalex.org/W2956107867","https://openalex.org/W1605159464"],"abstract_inverted_index":{"The":[0],"modeling":[1],"of":[2,6,13,26,40,71,89,95],"the":[3,7,24,27,41,65,69,74,87,96,102,122],"optical":[4,44],"properties":[5],"acceleration":[8,97],"field":[9,29],"and":[10,32,46,99,107],"objective":[11,100],"lens":[12],"a":[14,58,90],"photoemission":[15],"electron":[16,43,138],"microscope":[17],"(PEEM)":[18],"is":[19,76],"presented.":[20],"Theory":[21],"to":[22,34,112,120],"calculate":[23],"aberrations":[25,47,72],"extraction":[28],"was":[30],"derived,":[31],"extended":[33],"include":[35],"relativistic":[36],"effects.":[37],"An":[38],"analysis":[39],"microscope\u2019s":[42],"performance":[45],"has":[48,64],"been":[49],"performed":[50],"using":[51],"an":[52,135],"analytical":[53,80,109,129],"model":[54],"as":[55,57,134],"well":[56],"ray":[59,105,123],"tracing":[60,63,106,124],"method.":[61],"Ray":[62],"flexibility":[66],"needed":[67],"for":[68,79],"assessment":[70],"where":[73,128],"geometry":[75],"too":[77],"complex":[78],"methods.":[81],"This":[82,116],"work":[83],"shows":[84],"that":[85],"in":[86,126],"case":[88],"simple":[91],"PEEM":[92],"front":[93],"end":[94],"gap":[98],"lens,":[101],"all":[103],"orders":[104],"full":[108],"treatments":[110],"agree":[111],"very":[113],"high":[114],"precision.":[115],"allows":[117],"us":[118],"now":[119],"use":[121],"method":[125],"situations":[127],"methods":[130],"are":[131],"difficult,":[132],"such":[133],"aberration":[136],"compensating":[137],"mirror.":[139]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2017,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2026-10-08T09:06:37.294493","created_date":"2016-06-24T00:00:00"}