{"id":"https://openalex.org/W1994723942","doi":"https://doi.org/10.1016/0040-6090(80)90349-1","title":"Applications of surface acoustic waves to the study of the properties of surface layers and deposits","display_name":"Applications of surface acoustic waves to the study of the properties of surface layers and deposits","publication_year":1980,"publication_date":"1980-11-01","ids":{"openalex":"https://openalex.org/W1994723942","doi":"https://doi.org/10.1016/0040-6090(80)90349-1","mag":"1994723942"},"language":"en","primary_location":{"id":"doi:10.1016/0040-6090(80)90349-1","doi":"https://doi.org/10.1016/0040-6090(80)90349-1","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0040-6090(80)90349-1","pdf_url":null,"source":{"id":"https://openalex.org/S84339699","display_name":"Thin Solid Films","issn_l":"0040-6090","issn":["0040-6090","1879-2731"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-1","norway-1","poland-70","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Thin Solid Films","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5091018311","display_name":"S. Joneli\u016bnas","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"S. Joneli\u016bnas","raw_affiliation_strings":["Polytechnic Institute, Kaunas, Lithuania U.S.S.R"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Polytechnic Institute, Kaunas, Lithuania U.S.S.R","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044830031","display_name":"L.J. Pranevi\u010dius","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"L. Pranevi\u010dius","raw_affiliation_strings":["Polytechnic Institute, Kaunas, Lithuania U.S.S.R"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Polytechnic Institute, Kaunas, Lithuania U.S.S.R","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5055682527","display_name":"R. Valatka","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"R. Valatka","raw_affiliation_strings":["Polytechnic Institute, Kaunas, Lithuania U.S.S.R"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Polytechnic Institute, Kaunas, Lithuania U.S.S.R","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":3120,"currency":"USD","value_usd":3120},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.21019795,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"73","issue":"1","first_page":"193","last_page":"198"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11160","display_name":"Acoustic Wave Resonator Technologies","score":0.9458000063896179,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11160","display_name":"Acoustic Wave Resonator Technologies","score":0.9458000063896179,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10662","display_name":"Ultrasonics and Acoustic Wave Propagation","score":0.025599999353289604,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12166","display_name":"Ion-surface interactions and analysis","score":0.014999999664723873,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/surface-acoustic-waves","display_name":"surface acoustic waves","score":1.0},{"id":"https://openalex.org/keywords/mechanical-properties","display_name":"mechanical properties","score":0.7609999775886536},{"id":"https://openalex.org/keywords/saw-velocity","display_name":"SAW velocity","score":0.7730000019073486},{"id":"https://openalex.org/keywords/ion-dose-dependence","display_name":"ion dose dependence","score":0.7620000243186951},{"id":"https://openalex.org/keywords/in-situ-characterization","display_name":"in situ characterization","score":0.640999972820282},{"id":"https://openalex.org/keywords/surface-heterogeneity","display_name":"surface heterogeneity","score":0.843999981880188},{"id":"https://openalex.org/keywords/surficial-deposits","display_name":"surficial deposits","score":0.5830000042915344}],"concepts":[{"id":"https://openalex.org/C26771246","wikidata":"https://www.wikidata.org/wiki/Q321095","display_name":"Scanning electron microscope","level":2,"score":0.669002115726471},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5718399286270142},{"id":"https://openalex.org/C2778759172","wikidata":"https://www.wikidata.org/wiki/Q424047","display_name":"Scanning acoustic microscope","level":4,"score":0.5640367865562439},{"id":"https://openalex.org/C2781117724","wikidata":"https://www.wikidata.org/wiki/Q4674694","display_name":"Acoustic microscopy","level":3,"score":0.5532073378562927},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.530763566493988},{"id":"https://openalex.org/C204723758","wikidata":"https://www.wikidata.org/wiki/Q3882459","display_name":"Acoustic wave","level":2,"score":0.5289416909217834},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.4968753159046173},{"id":"https://openalex.org/C138268822","wikidata":"https://www.wikidata.org/wiki/Q1051925","display_name":"Resolution (logic)","level":2,"score":0.489467978477478},{"id":"https://openalex.org/C162954803","wikidata":"https://www.wikidata.org/wiki/Q424074","display_name":"Surface acoustic wave","level":2,"score":0.47563791275024414},{"id":"https://openalex.org/C145148216","wikidata":"https://www.wikidata.org/wiki/Q36496","display_name":"Ion","level":2,"score":0.4197508692741394},{"id":"https://openalex.org/C3020199158","wikidata":"https://www.wikidata.org/wiki/Q210521","display_name":"High resolution","level":2,"score":0.41517436504364014},{"id":"https://openalex.org/C199289684","wikidata":"https://www.wikidata.org/wiki/Q83353","display_name":"Mineralogy","level":1,"score":0.37003374099731445},{"id":"https://openalex.org/C147080431","wikidata":"https://www.wikidata.org/wiki/Q1074953","display_name":"Microscopy","level":2,"score":0.29528331756591797},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.2741718292236328},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.17094925045967102},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.17065152525901794},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.14224573969841003},{"id":"https://openalex.org/C62649853","wikidata":"https://www.wikidata.org/wiki/Q199687","display_name":"Remote sensing","level":1,"score":0.06912693381309509},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.05458208918571472},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/0040-6090(80)90349-1","doi":"https://doi.org/10.1016/0040-6090(80)90349-1","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0040-6090(80)90349-1","pdf_url":null,"source":{"id":"https://openalex.org/S84339699","display_name":"Thin Solid Films","issn_l":"0040-6090","issn":["0040-6090","1879-2731"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-1","norway-1","poland-70","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Thin Solid Films","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W1986851582","https://openalex.org/W1988203259","https://openalex.org/W1993902670","https://openalex.org/W2079775349"],"related_works":["https://openalex.org/W2071915623","https://openalex.org/W2093177340","https://openalex.org/W1965847369","https://openalex.org/W2046443253","https://openalex.org/W2152180746","https://openalex.org/W2064102784","https://openalex.org/W1971164481","https://openalex.org/W4235731636","https://openalex.org/W4321263402","https://openalex.org/W2011199881"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-09-22T06:50:58.402377","created_date":"2016-06-24T00:00:00"}