{"id":"https://openalex.org/W1990621603","doi":"https://doi.org/10.1016/s0921-4534(00)01031-5","title":"Investigation of buffer layers for YBCO coated conductors","display_name":"Investigation of buffer layers for YBCO coated conductors","publication_year":2000,"publication_date":"2000-11-01","ids":{"openalex":"https://openalex.org/W1990621603","doi":"https://doi.org/10.1016/s0921-4534(00)01031-5","mag":"1990621603"},"language":"en","primary_location":{"id":"doi:10.1016/s0921-4534(00)01031-5","doi":"https://doi.org/10.1016/s0921-4534(00)01031-5","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0921-4534(00)01031-5","pdf_url":null,"source":{"id":"https://openalex.org/S139340696","display_name":"Physica C Superconductivity","issn_l":"0921-4534","issn":["0921-4534","1873-2143"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-d","jufo-1","norway-1","poland-70","russia-white-list-3"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Physica C: Superconductivity","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5001277763","display_name":"G. Sipos","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1325886976","display_name":"Siemens (Germany)","ror":"https://ror.org/059mq0909","country_code":"DE","type":"company","lineage":["https://openalex.org/I1325886976"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"G. Sipos","raw_affiliation_strings":["Siemens AG, Corporate Technology, D-91050 Erlangen, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Siemens AG, Corporate Technology, D-91050 Erlangen, Germany","institution_ids":["https://openalex.org/I1325886976"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028821377","display_name":"B. Utz","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1325886976","display_name":"Siemens (Germany)","ror":"https://ror.org/059mq0909","country_code":"DE","type":"company","lineage":["https://openalex.org/I1325886976"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"B. Utz","raw_affiliation_strings":["Siemens AG, Corporate Technology, D-91050 Erlangen, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Siemens AG, Corporate Technology, D-91050 Erlangen, Germany","institution_ids":["https://openalex.org/I1325886976"]}]},{"author_position":"middle","author":{"id":null,"display_name":"W. Schmidt","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1325886976","display_name":"Siemens (Germany)","ror":"https://ror.org/059mq0909","country_code":"DE","type":"company","lineage":["https://openalex.org/I1325886976"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"W. Schmidt","raw_affiliation_strings":["Siemens AG, Corporate Technology, D-91050 Erlangen, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Siemens AG, Corporate Technology, D-91050 Erlangen, Germany","institution_ids":["https://openalex.org/I1325886976"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109529082","display_name":"H.-W. Neumueller","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1325886976","display_name":"Siemens (Germany)","ror":"https://ror.org/059mq0909","country_code":"DE","type":"company","lineage":["https://openalex.org/I1325886976"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"H.-W. Neumueller","raw_affiliation_strings":["Siemens AG, Corporate Technology, D-91050 Erlangen, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Siemens AG, Corporate Technology, D-91050 Erlangen, Germany","institution_ids":["https://openalex.org/I1325886976"]}]},{"author_position":"last","author":{"id":null,"display_name":"P. Mueller","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I181369854","display_name":"Friedrich-Alexander-Universit\u00e4t Erlangen-N\u00fcrnberg","ror":"https://ror.org/00f7hpc57","country_code":"DE","type":"education","lineage":["https://openalex.org/I181369854"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"P. Mueller","raw_affiliation_strings":["University of Erlangen-Nuremberg, Phys. Inst. Dep. III, D-91054 Erlangen, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Erlangen-Nuremberg, Phys. Inst. Dep. III, D-91054 Erlangen, Germany","institution_ids":["https://openalex.org/I181369854"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2400,"currency":"USD","value_usd":2400},"apc_paid":null,"fwci":0.4226,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.65805124,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":"341-348","issue":null,"first_page":"1457","last_page":"1458"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11808","display_name":"Superconducting Materials and Applications","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11808","display_name":"Superconducting Materials and Applications","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10037","display_name":"Physics of Superconductivity and Magnetism","score":0.0019000000320374966,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12588","display_name":"Electronic and Structural Properties of Oxides","score":0.0003000000142492354,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ybco-coated-conductors","display_name":"YBCO coated conductors","score":0.9739999771118164},{"id":"https://openalex.org/keywords/oxide-buffer-layers","display_name":"oxide buffer layers","score":0.949999988079071},{"id":"https://openalex.org/keywords/ybco-thin-films","display_name":"YBCO thin films","score":0.8700000047683716},{"id":"https://openalex.org/keywords/pulsed-laser-deposition","display_name":"pulsed laser deposition","score":0.9319999814033508},{"id":"https://openalex.org/keywords/critical-current-density","display_name":"critical current density","score":0.9800000190734863},{"id":"https://openalex.org/keywords/cerium-oxide","display_name":"cerium oxide","score":0.7149999737739563},{"id":"https://openalex.org/keywords/yttrium-oxide","display_name":"yttrium oxide","score":0.9670000076293945},{"id":"https://openalex.org/keywords/yttria-stabilized-zirconia","display_name":"yttria-stabilized zirconia","score":0.9300000071525574},{"id":"https://openalex.org/keywords/columnar-growth","display_name":"columnar growth","score":0.5669999718666077}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.8491213321685791},{"id":"https://openalex.org/C145018004","wikidata":"https://www.wikidata.org/wiki/Q4985944","display_name":"Buffer (optical fiber)","level":2,"score":0.8453308343887329},{"id":"https://openalex.org/C2777289219","wikidata":"https://www.wikidata.org/wiki/Q7632154","display_name":"Substrate (aquarium)","level":2,"score":0.6450923681259155},{"id":"https://openalex.org/C202374169","wikidata":"https://www.wikidata.org/wiki/Q124291","display_name":"Electrical conductor","level":2,"score":0.5416304469108582},{"id":"https://openalex.org/C2779942774","wikidata":"https://www.wikidata.org/wiki/Q414015","display_name":"Yttrium barium copper oxide","level":4,"score":0.5190834999084473},{"id":"https://openalex.org/C192157962","wikidata":"https://www.wikidata.org/wiki/Q4087243","display_name":"Bilayer","level":3,"score":0.5056979656219482},{"id":"https://openalex.org/C96410337","wikidata":"https://www.wikidata.org/wiki/Q4383445","display_name":"Yttria-stabilized zirconia","level":4,"score":0.49920225143432617},{"id":"https://openalex.org/C2781463530","wikidata":"https://www.wikidata.org/wiki/Q904053","display_name":"Ion beam-assisted deposition","level":4,"score":0.4946279227733612},{"id":"https://openalex.org/C2779851234","wikidata":"https://www.wikidata.org/wiki/Q50690","display_name":"Oxide","level":2,"score":0.4728950560092926},{"id":"https://openalex.org/C54101563","wikidata":"https://www.wikidata.org/wiki/Q124131","display_name":"Superconductivity","level":2,"score":0.46822047233581543},{"id":"https://openalex.org/C69357855","wikidata":"https://www.wikidata.org/wiki/Q163214","display_name":"Diffusion","level":2,"score":0.4290462136268616},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3671914339065552},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.34315750002861023},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.3344985842704773},{"id":"https://openalex.org/C50774322","wikidata":"https://www.wikidata.org/wiki/Q644248","display_name":"Ion beam","level":3,"score":0.2590871751308441},{"id":"https://openalex.org/C109613756","wikidata":"https://www.wikidata.org/wiki/Q846667","display_name":"High-temperature superconductivity","level":3,"score":0.24090397357940674},{"id":"https://openalex.org/C145148216","wikidata":"https://www.wikidata.org/wiki/Q36496","display_name":"Ion","level":2,"score":0.1875014305114746},{"id":"https://openalex.org/C134132462","wikidata":"https://www.wikidata.org/wiki/Q45621","display_name":"Ceramic","level":2,"score":0.16810142993927002},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.12453588843345642},{"id":"https://openalex.org/C123609680","wikidata":"https://www.wikidata.org/wiki/Q225666","display_name":"Cubic zirconia","level":3,"score":0.1209864616394043},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.09471678733825684},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.08947330713272095},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.08637619018554688},{"id":"https://openalex.org/C41625074","wikidata":"https://www.wikidata.org/wiki/Q176088","display_name":"Membrane","level":2,"score":0.06750458478927612},{"id":"https://openalex.org/C111368507","wikidata":"https://www.wikidata.org/wiki/Q43518","display_name":"Oceanography","level":1,"score":0.0},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/s0921-4534(00)01031-5","doi":"https://doi.org/10.1016/s0921-4534(00)01031-5","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0921-4534(00)01031-5","pdf_url":null,"source":{"id":"https://openalex.org/S139340696","display_name":"Physica C Superconductivity","issn_l":"0921-4534","issn":["0921-4534","1873-2143"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-d","jufo-1","norway-1","poland-70","russia-white-list-3"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Physica C: Superconductivity","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W2030707609","https://openalex.org/W2031389130","https://openalex.org/W2064244572","https://openalex.org/W2099214301"],"related_works":["https://openalex.org/W870069068","https://openalex.org/W2074359906","https://openalex.org/W2047427409","https://openalex.org/W2012455648","https://openalex.org/W2291715172","https://openalex.org/W4293870646","https://openalex.org/W2023628919","https://openalex.org/W1679925359","https://openalex.org/W2030707609","https://openalex.org/W2043431721"],"abstract_inverted_index":null,"counts_by_year":[{"year":2013,"cited_by_count":1}],"updated_date":"2026-11-04T10:54:05.112534","created_date":"2016-06-24T00:00:00"}